Alexey Petrukhin - the CMS group at DESY!
Transcription
Alexey Petrukhin - the CMS group at DESY!
Pixel module testing at DESY Alexey Petrukhin, DESY 24/02/2012 • Installation at DESY • Progress since visit to PSI • Some test results Setup at DESY Module adapter Pixel module Support finger Universal pixel test board A. Petrukhin: Module testing at DESY 2 Upgrade meeting, 24.02.2012 Pixel module Signal & power cables High Density Interconnect (HDI) Silicon sensor 16 ROCs Base stripes A. Petrukhin: Module testing at DESY 3 Upgrade meeting, 24.02.2012 Module testing procedure • Progress since visit to PSI: we can see Ultra Black level now! Ultra Black level is used to mark the beginning of the data packet and to separate individual ROC information. It needed a code and a configureation modification: thanks to Beat Meyer! • 'Pretest': making a set of new DAC parameters for each ROC. Total time per module = 15 min. • 'Full test': making most important tests for module qualification. Total time = 1 hour. • Trimming procedure: setting Trim bits for each pixel to unify thresholds. Total time = 80 min. • Gain calibration: extract 4160 calibration factors for each ROC. Total time = 7 hours (can be still optimized by time delays) A. Petrukhin: Module testing at DESY 4 Upgrade meeting, 24.02.2012 psi46 DACs, Pretest 13 VIBias_Bus 30 14 Vbias_sf 10 15 VoffsetOp 55 16 VIbiasOp 115 17 VOffsetR0 120 18 VIon 115 19 VIbias_PH 130 20 Ibias_DAC 122 21 VIbias_roc 220 1 Vdig 6 2 Vana 150 3 Vsf 160 4 Vcomp 10 5 Vleak_comp 0 6 VrgPr 0 7 VwllPr 35 8 VrgSh 0 9 VwllSh 35 10 VhldDel 130 11 12 253 254 Vtrim 7 VthrComp 124 CtrlReg WBC A. Petrukhin: Module testing at DESY 0 20 5 22 23 24 VIColOr 100 Vnpix 0 VSumCol 0 25 26 27 Vcal 200 CalDel 125 RangeTemp 0 Upgrade meeting, 24.02.2012 psi46 pixel readout chip 4 trim bits adjustable by programmable DAC, per ROC programmable register, per pixel A. Petrukhin: Module testing at DESY 6 Upgrade meeting, 24.02.2012 psi46 pixel readout chip adjustable by programmable DAC A. Petrukhin: Module testing at DESY 7 Upgrade meeting, 24.02.2012 Some test results A. Petrukhin: Module testing at DESY 8 Upgrade meeting, 24.02.2012 Module readout • Arm 1 pixel in ROC 0 • ADC Count 70 Data: -724 -725 -731 -8 -196 -191 -190 176 : -698 12 585 : -170 12 555 202 -171 -73 : -695 26 569 : -698 -18 591 : -673 23 660 : -702 -13 534 : -686 -3 569 : -706 12 611 : -699 -12 532 : -697 -4 576 : -700 -39 555 : -697 9 619 : -700 -7 551 : -701 -6 543 : -693 25 636 -700 -7 566 : -702 -1 534 : -731 -722 -17 -5 -183 167 -191 176 A. Petrukhin: Module testing at DESY 9 (TBM header) (ROC with 1 hit) (3 empty ROCs) (3 empty ROCs) (3 empty ROCs) (3 empty ROCs) (3 empty ROCs) (TBM trailer) Upgrade meeting, 24.02.2012 Analog data Ed Bartz (Rutgers University) A. Petrukhin: Module testing at DESY 10 Upgrade meeting, 24.02.2012 TBM Header – Trailer format Ed Bartz (Rutgers University) A. Petrukhin: Module testing at DESY 11 Upgrade meeting, 24.02.2012 GUI Calibrations Individual tests Parameter adjusting A. Petrukhin: Module testing at DESY 12 Upgrade meeting, 24.02.2012 counts DACs after Pretest DAC value DACs for 16 ROCs changed after Pretest: Vana – analog voltage regulator Vtrim – trim bits scale factor VthrComp – comparator threshold A. Petrukhin: Module testing at DESY VoffsetOp – shifts PH range Ibias_DAC – analogue ROCs level CalDel – delay of calib. signal 13 Upgrade meeting, 24.02.2012 Power dissipation M 1207 ● ● Module power consumption increased by factor of ~13 Different current behavior for single ROC and Module ROC 2 A. Petrukhin: Module testing at DESY 14 Upgrade meeting, 24.02.2012 CalDel and Time walk • Pulse one pixel, read data noise limit • Vcal 200 small DAC. earlier later 50 % of width BC BC • Set by Pretest: ‣ VthrComp=105 ‣ CalDel=80 50 DAC units Vcal too small A. Petrukhin: Module testing at DESY • Moving the threshold shifts the timing: Threshold ‣ time walk. 15 Upgrade meeting, 24.02.2012 Threshold Scan and Power (Nov'11) Id [mA] • Chip 2 (no sensor) • Id (mA) vs VthrComp • Threshold into noise • Chip consumes 2.5 times more power at low threshold (high VthrComp) VthrComp [DAC] Ia [mA] • Chip 2 (no sensor) • Ia (mA) vs VthrComp • Small effect at low threshold • The same trend for Chip 6 (sensor) VthrComp [DAC] A. Petrukhin: Module testing at DESY 16 Upgrade meeting, 24.02.2012 Threshold Scan of M1207 noise peak hard threshold • Drive threshold into noise: • Chip consumes 2 times more power at low threshold (high VthrComp) • The effect is not observed for Ia A. Petrukhin: Module testing at DESY 17 Upgrade meeting, 24.02.2012 Threshold optimization algorithm ● ● ● ● If comparator thresholds are adjusted with global VthrComp only: spread of thresholds in ROC ~300 e- due to transistor mismatches Unify pixel thresholds by 4 trim bits (values from 0 to 15) and scale with Vtrim DAC Each trim bit value is set such that Vcal-threshold of the pixel differs least from the selected target threshold in the procedure Use as low target Vcal as possible: good charge sharing, good for radiated chips with low charges A. Petrukhin: Module testing at DESY 18 Upgrade meeting, 24.02.2012 16 threshold maps, trimmed • M1207, all pixels • 4160x16 TrimBits set (target Vcal=60) • 340 e threshold variation • 6% spread: better than single chip before trimming • Peak is higher than expected: 5.2 ke instead of 3.9 ke ? A. Petrukhin: Module testing at DESY 19 Upgrade meeting, 24.02.2012 Trimming results, M1207 TrimVcal=60 TrimVcal=50 TrimVcal=40 Underflows: bad fit of Scurves Peaks are ~30% higher than expected (?) A. Petrukhin: Module testing at DESY 20 Upgrade meeting, 24.02.2012 Summary • Last trip to PSI was very useful: many new tests are working now • The Module testing procedure is installed at DESY • It gives the reasonable results • Some issues in Trimming procedure → under investigation • More tests are not really applied yet: the Cold Box test, IV test, usage of DB ... A. Petrukhin: Module testing at DESY 21 Upgrade meeting, 24.02.2012 Back up A. Petrukhin: Module testing at DESY 22 Upgrade meeting, 24.02.2012 Gain and linear range • One pixel. preamp/shaper saturation • CtrlReg 4: ‣ 450 e/DAC • Linearity is important for spatial resolution using charge sharing. 450 e/DAC • Saturation around 45'000 e (~2 MIP). A. Petrukhin: Module testing at DESY 23 Upgrade meeting, 24.02.2012
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