JTAG Technologies Symphony APT-9000 Boundary

Data Sheet
JTAG Technologies Symphony APT-9000
Boundary-Scan Upgrade for Takaya APT-9000 Series
of Flying Probe Testers
Fixtureless testing extended to complex digital designs
Features
•
Seamless, low-cost integration of two leading technologies, boundary-scan from JTAG Technologies and flying probe from Takaya
•
Maximizes test coverage by use of
boundary-scan for inaccessible nets
and pins at BGAs and flying probe
for non-scannable nets
•
Delivers fixtureless testing for analog and complex digital designs
•
Dynamic testing of parallel I/O using
flying probes driven by boundaryscan test, for higher coverage of
cluster nets than possible with static
methods
•
Reduces overall test time
•
Off-line automatic generation of
test patterns for infrastructure,
interconnect, clusters, memories,
FIFOs, and resistors using proven, mature boundary-scan test algorithms
•
High-speed in-system programming for flash memories and CPLDs with wide variety of formats
•
Easy to port applications to production environment
•
Fault detection and advanced diagnostics to the net and pin levels, test results and statistics reported for each test run
•
Sequencer for automatic test execution of independent tests and in-system programming with user specified
order including conditional branching
•
High-performance, scalable boundary-scan controllers
•
Easy to retrofit to existing testers and programs
The Impact of High-Density PCB Design on Testing and
Time-to-Market
As electronics designers continue to achieve greater densities on their printed circuit boards, testing for the
occurrence of manufacturing faults and the drive for shorter time-to-market lead times become increasingly
difficult challenges for test engineers. These facts are causing test professionals to reconsider existing test
methods and to look for effective and budget-minded solutions by combining available test techniques in an
optimized test strategy for maximum value.
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Boundary Scan Upgrades
for Flying Probe Testers
Test Strategy Considerations
Flying probe testing is a very effective test method
for prototypes, new product introductions, and low
volume production of products with a high concentration of analog circuits. The benefits arise because
of the short test program development time and the
low costs associated with flying probe tests. The flying
probe tester does not require complex, expensive test
fixtures and offers great flexibility to implement design
changes.
While the flying probe tester is very effective for
analog parts of the board, boundary-scan has evolved
as an ideal test method for complex digital boards,
especially those containing BGA packages. In combination, boundary-scan and flying probe testing are
highly complementary, resulting in a very effective
test strategy for mixed-signal designs.
Boundary-scan increases the fault coverage by
testing, for example, opens on connections at BGAs
related to inaccessible nets inside the circuit board.
These ‘buried’ nets are not laid out on the top or
bottom layers of the circuit board, nor are they connected to any vias, and are therefore inaccessible to the
flying probes.
One particularly valuable test platform to realize such
a strategy is the JTAG Technologies Symphony
APT-9000 package, which combines the standard,
proven boundary-scan solution of JTAG Technologies
within Takaya’s APT-9000 Flying Probe Tester Series.
The combination forms a powerful and cost effective
solution with the benefits of both boundary-scan and
flying probe testing. Test applications are prepared
with minimum effort, resulting in excellent test
coverage even for complex high-density printed
circuit board assemblies.
Figure 1. Dynamic scan
probing to increase
test coverage
The JTAG Technologies
Solution
Symphony APT-9000 by JTAG
Technologies is unique in its architecture,
delivering the benefits of both boundaryscan and flying probe testing without disrupting an
existing test methodology. Tests and in-system programming applications are automatically generated
on JTAG Technologies’ industry-leading development
tools using additional information from the APT-9000
CAD software, listing the probe-accessible I/O points.
Next, the generated applications are easily ported to
the flying probe testing system. There, the applications
run within the APT-9000 environment using a highperformance JTAG Technologies’ JT 37x7 hardware
controller and the JT 2148 Quad Pod Transceiver with
programmable voltages. The JT 37x7 hardware architecture is scalable providing easy upgrading at minimal cost, if required for programming applications.
Genuine JTAG Technologies run-time software delivers the highest execution performance of standard
boundary-scan tests (infrastructure, interconnect,
memory interconnect and clusters) as well as the parallel I/O of the board. This feature uses the flying probes
dynamically in combination with the boundary-scan
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tests, providing a high degree of test coverage for edge
connectors and non-scan clusters. Figure 1 shows the
use of dynamic scan probing for increased coverage.
Diagnostics of detected faults are fully supported by
the JTAG Technologies BSD software with pin-level
accuracy.
The integration of JTAG Technologies’ boundary-scan
tools with the Takaya APT-9000 Flying Probe Tester
is performed under the Option Mode of the standard
APT-9000 software. Also, in the Data Mode, individual test programs can be enabled or disabled as
required to support the user’s test strategy. By
simply inserting the appropriate steps into the
APT-9000 Flying Probe test program, full control
over the fixed and flying probes is achieved to
perform integrated boundary-scan testing and
flash/CPLD programming steps within any given
APT-9000 test program. When faults are detected
by the boundary-scan test, the output of JTAG
Technologies’ advanced diagnostic software is
displayed within the graphical user interface, clearly
specifying the cause of the fault down to the net and
pin level.
Boundary Scan Upgrades
for Flying Probe Testers
Figure 2 is a chart of the process flow showing off-line
application development including probe information,
integrated testing in production and diagnostics and
repair. The Takaya APT-9000 flying probes are fully
under control of JTAG Technologies software while the
boundary-scan test steps are executed.
Figure 3 illustrates use of the flying probes in
combination with boundary-scan for testing I/O’s
and/or clusters. The TAP signals are connected via
the QuadPOD assuring signal integrity throughout
execution of the test program.
Design
Info
Boundary-Scan
Test and ISP
Application
Development
Flying
Prober Info
Test
Engineering
Application
Files
Compiler for
APT-9000
The combined test system delivers the following benefits:
• Ability to test analog portions of the UUT using
inherent APT-9000 capabilities
• Reduced test cost due to fixtureless testing for both
the analog and the digital portions of the board
• Dynamic integration of flying probes and boundary-scan increase test coverage significantly
beyond that attainable with static methods
• Retention of the familiar Takaya APT-9000 operating system and user interface for production
• Off-line development and verification of boundaryscan test and in-system programming applications
using JTAG Technologies tools on a lower-cost PC-based system
• Straightforward porting of applications from the
development system to the APT-9000 for production testing
• Reduced overall test time
Production
Results File
Diagnostic
Module
JTAG
Visualizer
• High speed flash programming using JTAG
Technologies’ Enhanced Throughput Technology™
on the APT-9000 allowing one-stop processing in production with the highest possible throughput
• Easy to retrofit to existing testers and programs
Fault ID
File
Repair
Figure 2. Boundary-scan
process flow
Figure 3. Flying probes
used in combination
with boundary-scan
APT-9000 Series
Flying Probe Tester
Flying
Probes
Unit Under Test
QuadPOD
parallel I/O
drive/sense
channels
CPLDx
JTAG Technologies
Boundary-Scan
Symphony APT-9000
Scan Chain
TAP Signals
µPROC
TAP
Execution of
Integrated
Test and ISP
(Via Fixed Probes)
CPLDy
Flash
Memory
Benefits of boundary-scan testing on high-density boards
Boundary-scan testing, based on the IEEE Std. 1149.1, has been widely adopted by leading manufacturers
to perform testing and in-system programming of flash memories and PLDs on digital circuit boards. In
thousands of manufacturing facilities around the world, boundary-scan, often in combination with other
test methods such as flying probe, has been proven to be extremely effective on even the most crowded
PCBs. The boundary-scan products of JTAG Technologies lead the industry in delivering powerful benefits
to the designer and test engineer:
• High degree of automation in test development, in-system programming applications and fault diagnosis
• Highly effective tools to analyze test coverage
• Unlimited number of boundary-scan test points and scan chains
• Negligible impact on board real estate requirements, with a high degree of design flexibility
• High production line throughput for testing and in-system programming including extremely fast flash
memory programming
• Relatively low cost of ownership and capital investment compared to traditional test methods
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Boundary Scan Upgrades
for Flying Probe Testers
Compatibility Information
JTAG Technologies’ boundary-scan hardware and software can easily be integrated under Windows into the
Takaya APT-9000 Series of Flying Probe Testers for the following models:
• APT-9400 CE/CJ
• APT-9400 SL
• APT-9401 CE/CJ
The Symphony APT-9000 package from JTAG Technologies consists of:
• JT 37x7/PCI DataBlaster high-performance boundary-scan controller
• JT 2149 QuadPOD Transceiver including 4 PODs
• Compilation and runtime software for boundary-scan applications under APT-9000 software
• PM 3790 Boundary-scan Diagnostics software package
• User Manual
Ordering Information
Product Number
Description
Symphony APT-9000 / 07
Boundary-Scan upgrade for Takaya APT-9000 Series using JT 3707 boundary-scan controller
Symphony APT-9000 / 17
Boundary-Scan upgrade for Takaya APT-9000 Series using JT 3717 boundary-scan controller
Symphony APT-9000 / 27
Boundary-Scan upgrade for Takaya APT-9000 Series using JT 3727 boundary-scan controller
USA, Canada and Mexico
United Kingdom
Finland
Phone: (Toll Free) 877 FOR JTAG
Fax : 410 604 2109
Email: info@jtag.com
Phone: +44 (0) 1234 831212
Fax: +44 (0) 1234 831616
Email: sales@jtag.co.uk
France
Germany
Sweden
Phone: +31 (0) 40 2950870
Fax: +31 (0) 40 2468471
Email: france@jtag.com
Phone: +49 (0) 971 699 1064
Fax: +49 (0) 971 699 1192
Email: germany@jtag.com
Phone: +46 (0) 8 754 6200
Fax: +46 (0) 8 754 6200
Email: sweden@jtag.com
Europe and rest of the world
Phone: +31 (0) 40 2950870
Fax: +31 (0) 40 2468471
Email: info@jtag.nl
Phone: +358 (0) 9 22431457
Fax: +358 (0) 9 22431467
Email: finland@jtag.com
China (also Malaysia, Singapore,
Taiwan & Thailand)
Phone: +86 (021) 5831 1577
Fax: +86 (021) 5831 2167
For information on Takaya Flying Probe Testers:
Asia: Takaya Europe: Itochu SysTech GmbH
United Kingdom: Itochu Europe plc
USA, Canada, and Mexico: Itochu Texmac, Inc.
www3.takaya.co.jp/us/index_e.html
www.itochu-systech.com
www.itochu-takaya.co.uk
www.texmac.com/takaya.html
www.jtag.com
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JTAG Technologies B.V. reserves the right to make changes in design or specification at any time without notice.
Data subject to change without notice. Printed July 2008. © 2008 JTAG Technologies.
All brand names or product names mentioned are trademarks or registered trademarks of their respective owners.