High Speed 3D Surface Profiler
Transcription
High Speed 3D Surface Profiler
High Speed 3D Surface Profiler BW-H501 System Diagram High-speed camera Support for a range of microscopes Piezo system CM Series compact microscope MM Series measurement microscope AZ Series stereoscopic microscope LV Series optical microscope Focuscope image processor made by Photron BridgeElements X-Cycle Imager image processing software Specification Optical microscope unit Controller unit Computer Monitor Software Objective lens Observation and measurement range Horizontal (H) μm Vertical (V) μm Working distance (mm) Numerical aperture (NA) Measurement optical system Height measurement LV100D-U etc. Focuscope FCV100C Dell P390 equivalent or higher Dell TFT 20" monitor BridgeElements Two beam interference objective lens (Standard configuration: 20x, other options) 2.5x 5x 10x 20x 3160 1580 790 395 3160 1580 790 395 10.3 9.3 7.4 4.7 0.075 0.13 0.3 0.4 White light interferometry Effective resolving power*2: 0.1 μm Display resolving power*3: NA Repeating accuracy σ: 0.01 μm 50x*1 159 159 3.4 0.55 100x*1 79 79 2.0 0.7 Height measurement time 0.2 second/field Height measurement range 40 μm Correction Surface correction, 4-dimensional curved surface correction Digital enlargement 1/100 sub-pixel processing Roughness measurement 2-dimensional roughness, 3-dimensional roughness Profile display Cursor measurement of distance between two points, cursor measurement of height between two cursor points Output Output of processed images and roughness indices to an Excel file Automatic processing Automatic processing of multiple height images Three dimensional display Direct X display Height calibration Made by VLSI Standard Inc., standard step sample (optional part) *1: Requires a high-brightness illuminator *2: Smallest observable height difference *3: Height data cannot be given because it uses floating point (32-bit) numbers Option Parts High-brightness illuminator Active vibration isolation table Electrostatic adsorption plate MAX-F310 made by Asahi Spectra Co., Ltd., 300 W xenon lamp, lamp service life: 1,000 hours TS-150 made by Herz Co., Ltd., bench dimensions: 400 mm x 450 mm BW-H101-2010T made by Astron Co., Ltd., adsorption area: 200 mm x 100 mm Specifications and equipment are subject to change without any notice or obligation on the part of the manufacturer. October 2008 ©2008 NIKON CORPORATION The products detailed in the brochure are controlled by the Japanese Foreign Exchange and Foreign Trade Law and the International Export Control Regime. If there is a possibility that they may be utilized for the development of weapons of mass destruction, etc., they shall not be exported without authorization from the government. NIKON CORPORATION 6-3, Nishiohi 1-chome, Shinagawa-ku, Tokyo 140-8601, Japan phone: +81-3-3773-9026 fax: +81-3-3773-9062 http://nikon.com/products/instruments/index.htm NIKON INSTRUMENTS INC. 1300 Walt Whitman Road, Melville, N.Y. 11747-3064, U.S.A. phone: +1-631-547-8500; +1-800-52-NIKON (within the U.S.A. only) fax: +1-631-547-0306 http://www.nikoninstruments.com/ NIKON INSTRUMENTS EUROPE B.V. Laan van Kronenburg 2, 1183 AS, Amstelveen, The Netherlands phone: +31-20-44-96-222 fax: +31-20-44-96-298 http://www.nikoninstruments.eu/ NIKON INSTRUMENTS (SHANGHAI) CO., LTD. CHINA phone: +86-21-5836-0050 fax: +86-21-5836-0030 (Beijing branch) phone: +86-10-5869-2255 fax: +86-10-5869-2277 (Guangzhou branch) phone: +86-20-3882-0552 fax: +86-20-3882-0580 Printed in Japan (0810-05) Am/M NIKON SINGAPORE PTE LTD. SINGAPORE phone: +65-6559-3618 fax: +65-6559-3668 NIKON MALAYSIA SDN. BHD. MALAYSIA phone: +60-3-78763887 fax: +60-3-78763387 NIKON INSTRUMENTS KOREA CO., LTD. KOREA phone: +82-2-2186-8410 fax: +82-2-555-4415 NIKON CANADA INC. CANADA phone: +1-905-625-9910 fax: +1-905-625-0103 NIKON FRANCE S.A.S. FRANCE phone: +33-1-45-16-45-16 fax: +33-1-45-16-00-33 NIKON GMBH GERMANY phone: +49-211-9414-0 fax: +49-211-9414-322 NIKON INSTRUMENTS S.p.A. ITALY phone: +39-55-3009601 fax: +39-55-300993 NIKON AG SWITZERLAND phone: +41-43-277-2860 fax: +41-43-277-2861 Code No. 2CE-KGWH-1 NIKON UK LTD. UNITED KINGDOM phone: +44-20-8541-4440 fax: +44-20-8541-4584 NIKON GMBH AUSTRIA AUSTRIA phone: +43-1-972-6111-00 fax: +43-1-972-6111-40 NIKON BELUX BELGIUM phone: +32-2-705-56-65 fax: +32-2-726-66-45 High Speed 3D Surface Profiler X-cycle leads the way to a new world of optical microscopy Piezo actuator + High-speed camera = X-cycle high-speed image acquisition Enables real-time height observation With the X-cycle method, an objective lens performs cyclical scans, while the optical images generated are captured by a highspeed camera. Height images are calculated at high speed and displayed in real time. Real-time height image High-speed display of height images at 5 frames per second. The heating stage allows you to observe and analyze the deformation process of film and gel samples in real time. High-speed camera Optical microscope Z-axis cyclic scanning using piezo force Image capture at 900 frames per second High precision height measurement High speed image processor Achieves repeatable precision of 10 nm using white light interferometry. With high precision measurement exceeding that of earlier types, it is now possible to analyze and evaluate the surface roughness of objects. Two beam interference objective lens + X-cycle = Fringe cycle high-precision height image capture With the fringe cycle method, the coordinate value on the Z axis with the maximum local focus measure is taken as the height of each pixel. Generating an interference fringe on the surface of the object with a two beam interference objective lens generates a very high focus measure, achieving effective height resolution of 100 nm and repeatable precision of σ = 10 nm, delivering height image capture with high-precision. Z axis Optically diffusive surfaces present no difficulty 1 2 1 Maximum local focus point 2 3 3 1 Observation and analysis of optically diffusive surfaces, a weakness of conventional optical systems, presents no difficulty. The profiler can be used to evaluate the surface of ceramic coated film and diffuser plates. Z axis 2 Metallic cutting work surface Boundary region of the electrode/resin of a PC board 160 μm square measurement results using a 50x objective lens. The single point toolbytes are measured clearly. Metal and plastic parts with a reflection coefficient differing by around 100 times can be measured simultaneously without difficulty. BridgeElements Image Linking Software BridgeElements Base The main BridgeElements screen. Here you can run image input and analysis modules, perform control, and save images. You can also process a number of specified images automatically. Y axis X-Cycle Imager Image Transformer Correct height images captured with X-Cycle Imager, and display roughness indices and cross section profiles. 3 Load Save 1 Image input modules 2 Image processing modules 3 Saved images: The images currently saved in BridgeElements. You can perform a number of processes previously specified with the pointer. Surface correction Set a specified location as a reference plane. Arbitrary height difference measurement Display the difference in height between two points specified on a cross section profile. 4-dimensional curved surface correction Curved surfaces at specified locations are treated as planar, making it easy to detect minute heights on curved surfaces. Roughness index calculation (Two and three dimensional) Calculate and display the two dimensional roughness index for a cross section profile based on the specified standard length, as well as the three dimensional roughness of the surface. 2 Enlargement 2 3 3 Analysis 1 Correction 4 1 Live image: Currently output real-time omnifocal image. 2 Omnifocal image: Displays a freeze-frame omnifocal image of the currently displayed sample. 3 Live height image: Currently output real-time height image. 4 Height Image: Captures live height images and can display them with pseudocolors. * Image File Grabber is also available for capturing images in standard formats such as BMP and JPEG. 3 Image processing Multiple windows can be open. You can easily compare the shapes of samples, change the measurement conditions for comparison, and perform other operations. modules A height image input module unique to BW-H501. Height images for a specified time undergo accumulative addition, and random noise components are suppressed. 2 X axis Maximum local focus point Image input modules Load observed and saved images. 1 1 Output and display at 5 frames per second High-definition enlargement of a specified location using sub-pixel processing. 3D Viewer High-speed, high-definition three dimensional display. In addition to displaying height in pseudocolor, you can paste specified color images. Example: Surface roughness of the merge lip of a hard disk head 1 3D display of height image 2 3D display of height image after 4D curved surface correction 1 2