SEM-FIB Tescan Lyra

Equipment
SEM-FIB Tescan Lyra
Photo:
Technical details:
Applications:
Contact person:
A fully PC controlled SEM with Schottky field emission cathode in
combination with gallium Focused Ion Beam (FIB) column and
with Gas Injection System (GIS).
Accelerating voltage 200 V to 30 kV
Probe current 2 pA to 200 nA
Resolution in High Vacuum Mode 1.2 nm at 30 kV, 4.5 nm at 1 kV
Resolution BSE: 2 nm at 30 kV
Maximum Field of View 6 mm at WD 9 mm, 17 mm at WD 30 mm
Electron Optics Working Modes:
Resolution: High-resolution mode
Depth: Sets the column up in a mode that enhances depth of focus
Field: Optimizes the column to provide a large non-distorted field
of view
Ga Liquid Metal Ion Source 0.5 kV to 30 kV
Probe Current 1 pA to 40 nA
SEM-FIB angle:
55°
Chamber Vacuum:
High Vacuum Mode: < 9x10-3 Pa
Low Vacuum Mode: 7 – 500 Pa
Micromanipulator for TEM lamella preparation.
EDX Oxford X-Max 50 mm2 detector, AZtec software
Applied physics, material science
Martins.Rutkis,
E-mail: Martins.Rutkis@cfi.lu.lv,
Phone: +371 67260787,
Karlis Kundzins,
E-mail: kkarlis@gmail.com,
Phone: +371 67187875, room 124