SENSOR+TEST 2009 at a Glance

Sensors & Transducers
Volume 105, Issue 6
June 2009
www.sensorsportal.com
ISSN 1726-5479
Editor-in-Chief: professor Sergey Y. Yurish, phone: +34 696067716, fax: +34 93 4011989, e-mail: editor@sensorsportal.com
Editors for Western Europe
Meijer, Gerard C.M., Delft University of Technology, The Netherlands
Ferrari, Vittorio, Universitá di Brescia, Italy
Editor South America
Costa-Felix, Rodrigo, Inmetro, Brazil
Editors for North America
Datskos, Panos G., Oak Ridge National Laboratory, USA
Fabien, J. Josse, Marquette University, USA
Katz, Evgeny, Clarkson University, USA
Editor for Asia
Ohyama, Shinji, Tokyo Institute of Technology, Japan
Editor for Eastern Europe
Sachenko, Anatoly, Ternopil State Economic University, Ukraine
Editor for Asia-Pacific
Mukhopadhyay, Subhas, Massey University, New Zealand
Editorial Advisory Board
Abdul Rahim, Ruzairi, Universiti Teknologi, Malaysia
Ahmad, Mohd Noor, Nothern University of Engineering, Malaysia
Annamalai, Karthigeyan, National Institute of Advanced Industrial Science
and Technology, Japan
Arcega, Francisco, University of Zaragoza, Spain
Arguel, Philippe, CNRS, France
Ahn, Jae-Pyoung, Korea Institute of Science and Technology, Korea
Arndt, Michael, Robert Bosch GmbH, Germany
Ascoli, Giorgio, George Mason University, USA
Atalay, Selcuk, Inonu University, Turkey
Atghiaee, Ahmad, University of Tehran, Iran
Augutis, Vygantas, Kaunas University of Technology, Lithuania
Avachit, Patil Lalchand, North Maharashtra University, India
Ayesh, Aladdin, De Montfort University, UK
Bahreyni, Behraad, University of Manitoba, Canada
Baliga, Shankar, B., General Monitors Transnational, USA
Baoxian, Ye, Zhengzhou University, China
Barford, Lee, Agilent Laboratories, USA
Barlingay, Ravindra, RF Arrays Systems, India
Basu, Sukumar, Jadavpur University, India
Beck, Stephen, University of Sheffield, UK
Ben Bouzid, Sihem, Institut National de Recherche Scientifique, Tunisia
Benachaiba, Chellali, Universitaire de Bechar, Algeria
Binnie, T. David, Napier University, UK
Bischoff, Gerlinde, Inst. Analytical Chemistry, Germany
Bodas, Dhananjay, IMTEK, Germany
Borges Carval, Nuno, Universidade de Aveiro, Portugal
Bousbia-Salah, Mounir, University of Annaba, Algeria
Bouvet, Marcel, CNRS – UPMC, France
Brudzewski, Kazimierz, Warsaw University of Technology, Poland
Cai, Chenxin, Nanjing Normal University, China
Cai, Qingyun, Hunan University, China
Campanella, Luigi, University La Sapienza, Italy
Carvalho, Vitor, Minho University, Portugal
Cecelja, Franjo, Brunel University, London, UK
Cerda Belmonte, Judith, Imperial College London, UK
Chakrabarty, Chandan Kumar, Universiti Tenaga Nasional, Malaysia
Chakravorty, Dipankar, Association for the Cultivation of Science, India
Changhai, Ru, Harbin Engineering University, China
Chaudhari, Gajanan, Shri Shivaji Science College, India
Chavali, Murthy, VIT University, Tamil Nadu, India
Chen, Jiming, Zhejiang University, China
Chen, Rongshun, National Tsing Hua University, Taiwan
Cheng, Kuo-Sheng, National Cheng Kung University, Taiwan
Chiang, Jeffrey (Cheng-Ta), Industrial Technol. Research Institute, Taiwan
Chiriac, Horia, National Institute of Research and Development, Romania
Chowdhuri, Arijit, University of Delhi, India
Chung, Wen-Yaw, Chung Yuan Christian University, Taiwan
Corres, Jesus, Universidad Publica de Navarra, Spain
Cortes, Camilo A., Universidad Nacional de Colombia, Colombia
Courtois, Christian, Universite de Valenciennes, France
Cusano, Andrea, University of Sannio, Italy
D'Amico, Arnaldo, Università di Tor Vergata, Italy
De Stefano, Luca, Institute for Microelectronics and Microsystem, Italy
Deshmukh, Kiran, Shri Shivaji Mahavidyalaya, Barshi, India
Dickert, Franz L., Vienna University, Austria
Dieguez, Angel, University of Barcelona, Spain
Dimitropoulos, Panos, University of Thessaly, Greece
Ding, Jianning, Jiangsu Polytechnic University, China
Djordjevich, Alexandar, City University of Hong Kong, Hong Kong
Donato, Nicola, University of Messina, Italy
Donato, Patricio, Universidad de Mar del Plata, Argentina
Dong, Feng, Tianjin University, China
Drljaca, Predrag, Instersema Sensoric SA, Switzerland
Dubey, Venketesh, Bournemouth University, UK
Enderle, Stefan, Univ.of Ulm and KTB Mechatronics GmbH, Germany
Erdem, Gursan K. Arzum, Ege University, Turkey
Erkmen, Aydan M., Middle East Technical University, Turkey
Estelle, Patrice, Insa Rennes, France
Estrada, Horacio, University of North Carolina, USA
Faiz, Adil, INSA Lyon, France
Fericean, Sorin, Balluff GmbH, Germany
Fernandes, Joana M., University of Porto, Portugal
Francioso, Luca, CNR-IMM Institute for Microelectronics and
Microsystems, Italy
Francis, Laurent, University Catholique de Louvain, Belgium
Fu, Weiling, South-Western Hospital, Chongqing, China
Gaura, Elena, Coventry University, UK
Geng, Yanfeng, China University of Petroleum, China
Gole, James, Georgia Institute of Technology, USA
Gong, Hao, National University of Singapore, Singapore
Gonzalez de la Rosa, Juan Jose, University of Cadiz, Spain
Granel, Annette, Goteborg University, Sweden
Graff, Mason, The University of Texas at Arlington, USA
Guan, Shan, Eastman Kodak, USA
Guillet, Bruno, University of Caen, France
Guo, Zhen, New Jersey Institute of Technology, USA
Gupta, Narendra Kumar, Napier University, UK
Hadjiloucas, Sillas, The University of Reading, UK
Haider, Mohammad R., Sonoma State University, USA
Hashsham, Syed, Michigan State University, USA
Hasni, Abdelhafid, Bechar University, Algeria
Hernandez, Alvaro, University of Alcala, Spain
Hernandez, Wilmar, Universidad Politecnica de Madrid, Spain
Homentcovschi, Dorel, SUNY Binghamton, USA
Horstman, Tom, U.S. Automation Group, LLC, USA
Hsiai, Tzung (John), University of Southern California, USA
Huang, Jeng-Sheng, Chung Yuan Christian University, Taiwan
Huang, Star, National Tsing Hua University, Taiwan
Huang, Wei, PSG Design Center, USA
Hui, David, University of New Orleans, USA
Jaffrezic-Renault, Nicole, Ecole Centrale de Lyon, France
Jaime Calvo-Galleg, Jaime, Universidad de Salamanca, Spain
James, Daniel, Griffith University, Australia
Janting, Jakob, DELTA Danish Electronics, Denmark
Jiang, Liudi, University of Southampton, UK
Jiang, Wei, University of Virginia, USA
Jiao, Zheng, Shanghai University, China
John, Joachim, IMEC, Belgium
Kalach, Andrew, Voronezh Institute of Ministry of Interior, Russia
Kang, Moonho, Sunmoon University, Korea South
Kaniusas, Eugenijus, Vienna University of Technology, Austria
Katake, Anup, Texas A&M University, USA
Kausel, Wilfried, University of Music, Vienna, Austria
Kavasoglu, Nese, Mugla University, Turkey
Ke, Cathy, Tyndall National Institute, Ireland
Khan, Asif, Aligarh Muslim University, Aligarh, India
Sapozhnikova, Ksenia, D.I.Mendeleyev Institute for Metrology, Russia
Kim, Min Young, Kyungpook National University, Korea South
Ko, Sang Choon, Electronics and Telecommunications Research Institute,
Korea South
Kockar, Hakan, Balikesir University, Turkey
Kotulska, Malgorzata, Wroclaw University of Technology, Poland
Kratz, Henrik, Uppsala University, Sweden
Kumar, Arun, University of South Florida, USA
Kumar, Subodh, National Physical Laboratory, India
Kung, Chih-Hsien, Chang-Jung Christian University, Taiwan
Lacnjevac, Caslav, University of Belgrade, Serbia
Lay-Ekuakille, Aime, University of Lecce, Italy
Lee, Jang Myung, Pusan National University, Korea South
Lee, Jun Su, Amkor Technology, Inc. South Korea
Lei, Hua, National Starch and Chemical Company, USA
Li, Genxi, Nanjing University, China
Li, Hui, Shanghai Jiaotong University, China
Li, Xian-Fang, Central South University, China
Liang, Yuanchang, University of Washington, USA
Liawruangrath, Saisunee, Chiang Mai University, Thailand
Liew, Kim Meow, City University of Hong Kong, Hong Kong
Lin, Hermann, National Kaohsiung University, Taiwan
Lin, Paul, Cleveland State University, USA
Linderholm, Pontus, EPFL - Microsystems Laboratory, Switzerland
Liu, Aihua, University of Oklahoma, USA
Liu Changgeng, Louisiana State University, USA
Liu, Cheng-Hsien, National Tsing Hua University, Taiwan
Liu, Songqin, Southeast University, China
Lodeiro, Carlos, Universidade NOVA de Lisboa, Portugal
Lorenzo, Maria Encarnacio, Universidad Autonoma de Madrid, Spain
Lukaszewicz, Jerzy Pawel, Nicholas Copernicus University, Poland
Ma, Zhanfang, Northeast Normal University, China
Majstorovic, Vidosav, University of Belgrade, Serbia
Marquez, Alfredo, Centro de Investigacion en Materiales Avanzados,
Mexico
Matay, Ladislav, Slovak Academy of Sciences, Slovakia
Mathur, Prafull, National Physical Laboratory, India
Maurya, D.K., Institute of Materials Research and Engineering, Singapore
Mekid, Samir, University of Manchester, UK
Melnyk, Ivan, Photon Control Inc., Canada
Mendes, Paulo, University of Minho, Portugal
Mennell, Julie, Northumbria University, UK
Mi, Bin, Boston Scientific Corporation, USA
Minas, Graca, University of Minho, Portugal
Moghavvemi, Mahmoud, University of Malaya, Malaysia
Mohammadi, Mohammad-Reza, University of Cambridge, UK
Molina Flores, Esteban, Benemérita Universidad Autónoma de Puebla,
Mexico
Moradi, Majid, University of Kerman, Iran
Morello, Rosario, University "Mediterranea" of Reggio Calabria, Italy
Mounir, Ben Ali, University of Sousse, Tunisia
Mulla, Imtiaz Sirajuddin, National Chemical Laboratory, Pune, India
Neelamegam, Periasamy, Sastra Deemed University, India
Neshkova, Milka, Bulgarian Academy of Sciences, Bulgaria
Oberhammer, Joachim, Royal Institute of Technology, Sweden
Ould Lahoucine, Cherif, University of Guelma, Algeria
Pamidighanta, Sayanu, Bharat Electronics Limited (BEL), India
Pan, Jisheng, Institute of Materials Research & Engineering, Singapore
Park, Joon-Shik, Korea Electronics Technology Institute, Korea South
Penza, Michele, ENEA C.R., Italy
Pereira, Jose Miguel, Instituto Politecnico de Setebal, Portugal
Petsev, Dimiter, University of New Mexico, USA
Pogacnik, Lea, University of Ljubljana, Slovenia
Post, Michael, National Research Council, Canada
Prance, Robert, University of Sussex, UK
Prasad, Ambika, Gulbarga University, India
Prateepasen, Asa, Kingmoungut's University of Technology, Thailand
Pullini, Daniele, Centro Ricerche FIAT, Italy
Pumera, Martin, National Institute for Materials Science, Japan
Radhakrishnan, S. National Chemical Laboratory, Pune, India
Rajanna, K., Indian Institute of Science, India
Ramadan, Qasem, Institute of Microelectronics, Singapore
Rao, Basuthkar, Tata Inst. of Fundamental Research, India
Raoof, Kosai, Joseph Fourier University of Grenoble, France
Reig, Candid, University of Valencia, Spain
Restivo, Maria Teresa, University of Porto, Portugal
Robert, Michel, University Henri Poincare, France
Rezazadeh, Ghader, Urmia University, Iran
Royo, Santiago, Universitat Politecnica de Catalunya, Spain
Rodriguez, Angel, Universidad Politecnica de Cataluna, Spain
Rothberg, Steve, Loughborough University, UK
Sadana, Ajit, University of Mississippi, USA
Sadeghian Marnani, Hamed, TU Delft, The Netherlands
Sandacci, Serghei, Sensor Technology Ltd., UK
Saxena, Vibha, Bhbha Atomic Research Centre, Mumbai, India
Schneider, John K., Ultra-Scan Corporation, USA
Seif, Selemani, Alabama A & M University, USA
Seifter, Achim, Los Alamos National Laboratory, USA
Sengupta, Deepak, Advance Bio-Photonics, India
Shearwood, Christopher, Nanyang Technological University, Singapore
Shin, Kyuho, Samsung Advanced Institute of Technology, Korea
Shmaliy, Yuriy, Kharkiv National Univ. of Radio Electronics, Ukraine
Silva Girao, Pedro, Technical University of Lisbon, Portugal
Singh, V. R., National Physical Laboratory, India
Slomovitz, Daniel, UTE, Uruguay
Smith, Martin, Open University, UK
Soleymanpour, Ahmad, Damghan Basic Science University, Iran
Somani, Prakash R., Centre for Materials for Electronics Technol., India
Srinivas, Talabattula, Indian Institute of Science, Bangalore, India
Srivastava, Arvind K., Northwestern University, USA
Stefan-van Staden, Raluca-Ioana, University of Pretoria, South Africa
Sumriddetchka, Sarun, National Electronics and Computer Technology
Center, Thailand
Sun, Chengliang, Polytechnic University, Hong-Kong
Sun, Dongming, Jilin University, China
Sun, Junhua, Beijing University of Aeronautics and Astronautics, China
Sun, Zhiqiang, Central South University, China
Suri, C. Raman, Institute of Microbial Technology, India
Sysoev, Victor, Saratov State Technical University, Russia
Szewczyk, Roman, Industrial Research Inst. for Automation and
Measurement, Poland
Tan, Ooi Kiang, Nanyang Technological University, Singapore,
Tang, Dianping, Southwest University, China
Tang, Jaw-Luen, National Chung Cheng University, Taiwan
Teker, Kasif, Frostburg State University, USA
Thumbavanam Pad, Kartik, Carnegie Mellon University, USA
Tian, Gui Yun, University of Newcastle, UK
Tsiantos, Vassilios, Technological Educational Institute of Kaval, Greece
Tsigara, Anna, National Hellenic Research Foundation, Greece
Twomey, Karen, University College Cork, Ireland
Valente, Antonio, University, Vila Real, - U.T.A.D., Portugal
Vaseashta, Ashok, Marshall University, USA
Vazquez, Carmen, Carlos III University in Madrid, Spain
Vieira, Manuela, Instituto Superior de Engenharia de Lisboa, Portugal
Vigna, Benedetto, STMicroelectronics, Italy
Vrba, Radimir, Brno University of Technology, Czech Republic
Wandelt, Barbara, Technical University of Lodz, Poland
Wang, Jiangping, Xi'an Shiyou University, China
Wang, Kedong, Beihang University, China
Wang, Liang, Advanced Micro Devices, USA
Wang, Mi, University of Leeds, UK
Wang, Shinn-Fwu, Ching Yun University, Taiwan
Wang, Wei-Chih, University of Washington, USA
Wang, Wensheng, University of Pennsylvania, USA
Watson, Steven, Center for NanoSpace Technologies Inc., USA
Weiping, Yan, Dalian University of Technology, China
Wells, Stephen, Southern Company Services, USA
Wolkenberg, Andrzej, Institute of Electron Technology, Poland
Woods, R. Clive, Louisiana State University, USA
Wu, DerHo, National Pingtung Univ. of Science and Technology, Taiwan
Wu, Zhaoyang, Hunan University, China
Xiu Tao, Ge, Chuzhou University, China
Xu, Lisheng, The Chinese University of Hong Kong, Hong Kong
Xu, Tao, University of California, Irvine, USA
Yang, Dongfang, National Research Council, Canada
Yang, Wuqiang, The University of Manchester, UK
Yang, Xiaoling, University of Georgia, Athens, GA, USA
Yaping Dan, Harvard University, USA
Ymeti, Aurel, University of Twente, Netherland
Yong Zhao, Northeastern University, China
Yu, Haihu, Wuhan University of Technology, China
Yuan, Yong, Massey University, New Zealand
Yufera Garcia, Alberto, Seville University, Spain
Zagnoni, Michele, University of Southampton, UK
Zamani, Cyrus, Universitat de Barcelona, Spain
Zeni, Luigi, Second University of Naples, Italy
Zhang, Minglong, Shanghai University, China
Zhang, Qintao, University of California at Berkeley, USA
Zhang, Weiping, Shanghai Jiao Tong University, China
Zhang, Wenming, Shanghai Jiao Tong University, China
Zhang, Xueji, World Precision Instruments, Inc., USA
Zhong, Haoxiang, Henan Normal University, China
Zhu, Qing, Fujifilm Dimatix, Inc., USA
Zorzano, Luis, Universidad de La Rioja, Spain
Zourob, Mohammed, University of Cambridge, UK
Sensors & Transducers Journal (ISSN 1726-5479) is a peer review international journal published monthly online by International Frequency Sensor Association (IFSA).
Available in electronic and on CD. Copyright © 2009 by International Frequency Sensor Association. All rights reserved.
Sensors & Transducers Journal
Contents
Volume 105
Issue 6
June 2009
www.sensorsportal.com
ISSN 1726-5479
Editorial
Sensors Systems Need Smart Sensors: SENSOR+TEST 2009 at a Glance
Sergey Y. Yurish…………………………………………………………………………………………….
I
Research Articles
Development of an Intelligent Capacitive Mass Sensor Based on Co-axial Cylindrical
Capacitor
Amir Abu_Al_Aish, Mahfoozur Rehman, Anwar Hasni Abu Hassan and Mohd Rizal Arshad...........
1
Accurate Measurement of ‘Q’ Factor of An Inductive Coil Using a Modified Maxwell Wein
Bridge Network
Subrata Chattopadhyay, Bijnan. R. Maity and Sagarika Pal..............................................................
10
New Type Small-angle Sensor Based on the TIR and SPR Theories in Heterodyne
Interferomery
Shinn-Fwu Wang, Jyh-Shyan Chiu, Lung-Hsiang Lee, Cheng-Min Lee, Rong-Moo Hong ................
18
A Real Time Embedded set up Based on Digital Signal Controller for Detection of BioSignals Using Sensors
Dipali Bansal, Munna Khan, Ashok K. Salhan ...................................................................................
26
Development of Hardware Dual Modality Tomography System
R. M. Zain, R. Abdul Rahim................................................................................................................
33
Designing of Water Quality Detector Using pH Sensor
Pavika Sharma, Prerna Garg, and P. A. Alvi......................................................................................
42
Design and Modeling a New Optical Modulator
Mohammad Mezaael ..........................................................................................................................
50
Study of a Modified Design of a Potential Transformer
S. C. Bera and D. N. Kole...................................................................................................................
56
Simulation Study of IMC and Fuzzy Controller for HVAC System
Umamaheshwari and P. Sivashanmugam .........................................................................................
66
Digital Position Control System of a Motorized Valve in a Process Plant Using Hybrid
Stepper Motor as Actuator
Subrata Chattopadhyay, Utpal Chakraborty, Arindam Bhakta and Sagarika Pal ..............................
73
Modeling and Analysis of a Bimorph PZT Cantilever Beam Based Micropower Generator
Jyoti Ajitsaria, Song-Yul Choe, Phil Ozmun, Dongna Shen and Dong-Joo Kim. ...............................
81
PPY-PVA Blend Thin Films as a Ammines Gas Sensor
D. B. Dupare, M. D. Shirsat and A. S. Aswar .....................................................................................
94
Sanguinarine and its Electropolymerization onto Indium Tin Oxide as a Mediator for
Biosensing
Ravindra P. Singh, Byung-Keun Oh and Jeong-Woo Choi................................................................
104
Effect of Dilution and Model Analysis of Distillery Effluent Using Dissolved Oxygen as
Parameter
J. Sumathi, S. Sundaram....................................................................................................................
113
Growth and Characterization of Nanocrystalline ZnO Thin Films by Spray Pyrolysis: Effect
of Molarity of Precursor Solution
Dharmendra Mishra, K. C. Dubey, R. K. Shukla, Anchal Srivastava and Atul Srivastava .................
119
pH Homeostasis of a Biosensor in Renal Function Regulation Linked with UTI
T. K. Basak, T. Ramanujam, V. Cyrilraj, G. Gunshekharan Asha Khanna, Deepali Garg,
Poonam Goyal, Arpita Gupta..............................................................................................................
127
Micro-Flow Based Differential Pressure Sensor
Microbridge Technologies, White Paper ............................................................................................
135
Authors are encouraged to submit article in MS Word (doc) and Acrobat (pdf) formats by e-mail: editor@sensorsportal.com
Please visit journal’s webpage with preparation instructions: http://www.sensorsportal.com/HTML/DIGEST/Submition.htm
International Frequency Sensor Association (IFSA).
Sensors & Transducers Journal, Vol.105, Issue 6, June 2009, pp.I-X
Sensors & Transducers
ISSN 1726-5479
© 2009 by IFSA
http://www.sensorsportal.com
Sensors Systems Need Smart Sensors:
SENSOR+TEST 2009 at a Glance
Sergey Y. YURISH
International Frequency Sensor Association (IFSA), European Office,
CDEI-UPC, C/Llorens Artigas, 4-6, planta 0, Edifici U, Campus Sud,
08028, Barcelona, Spain
Tel.: +34 696067716, fax: +34 93 4011989
E-mail: ifsa@sensorsportal.com
1. Brief Event Details
The 16th International Trade Fair for Sensor, Measuring, and Testing Technology SENSOR+TEST
2009 organized by AMA Association for Sensor Technology has taken place from 26 to 28 May on the
fair grounds in Nürnberg. This worldwide biggest event in the sensor industry, complemented by
numerous conferences and forums, has been attended by approximately 7,000 visitors and 537
exhibitors on 18,000 m² of floor space, including the major technology and market leaders of most
product groups. 147 exhibitors where coming from abroad.
For the first time there were three parallel conferences at the same time: 14th International Conference
on Sensors, Technologies, Electronics and Applications (SENSOR 2009), 9th International OPTO
Conference and 11th International IRS2 Conference.
The event again was an interesting and exciting forum for engineers and scientists working in research,
development and application of sensors and measuring technology; and exhibitors’ expectations are
clearly surpassed.
2. Event Background: Recession Reaches Sensor Industry
Although it achieved a growth rate of approx. 3 % in 2008, towards the end of the year the sensor
industry too was experiencing a decline in revenue. A new member poll by AMA Association for
Sensor Technology ascertains that during the fourth quarter 2008 the sensor industry experienced
approx. 9 % decline and another approx. 11 % during the first quarter 2009.
Already by the publishing date for results from 2008, current developments had rendered obsolete data
presented at the AMA Press Conference Day in February 2009. In view of inconsistent expectations
published in the business press, and in order to provide reliable data to its members, AMA Association
I
Sensors & Transducers Journal, Vol.105, Issue 6, June 2009, pp.I-X
for Sensor Technology therefore resolved to launch its own regular quarterly survey. The survey might
be discontinued when the economic situation stabilizes sufficiently again.
Covering approx. 15 % of all businesses in the sector in central Europe, the survey can be considered
to be representative. Its necessity becomes immediately apparent when one considers the changes
registered during the interval from third quarter 2008 to first quarter 2009. During this time, revenues
fell by almost 20 %, which threw the sector back to a level comparable to mid 2006. Striking about
this is that during this time, the smallest enterprises still achieved growth: more than +6 %. At 5 %,
enterprises with 11-50 employees still outperformed the larger companies, which had to absorb an
average of 9.5 % and 13 % during the last quarter 2008 and the first quarter 2009, respectively. Thus
most of the larger enterprises were forced to revise their business plans.
Obviously, this revenue slump also had its effect on production capacity planning. This was quite
dramatic, since it was preceded by an exceptionally dynamic year during which the sector raised its
workforce by approx. 5,500 additional employees, which included workplace build up and training. In
an attempt to salvage this effort, many employers were forced to place their employees on short hours
– something which in such breadth the sensor sector had never before experienced. Whereas this
instrument was used only sporadically during the final quarter 2008, during the first quarter 2009 it
affected about 14% of all employees in the sector and about 30 % of production capability. Even
among the smallest sensor companies with less than 11 employees, almost one out of ten employees
was affected by reduced working hours. Middle sized companies placed approx. 1/3 of their employees
on short hours.
II
Sensors & Transducers Journal, Vol.105, Issue 6, June 2009, pp.I-X
During recent weeks the AMA have observed some tentative signs that this dramatic development
might be stabilizing. However this turnaround must still be corroborated through this quarter’s
upcoming survey.
3. Exhibition: Good Omens Despite Economic Situation
Sensor, measuring, and testing technologies in an automated world are decisive key technologies for
economic success in all industries.
Today there are about 800 manufacturers of industrial
measuring systems in Germany. Together with exclusive
importers of sensor products they have a turnover of
approximately 24 billion euros per year. Moreover,
about 2,300 companies and institutes operate in the area
of sensor technology, which generate revenues
amounting to 30 billion euros. Based on various
definitions and allocations, estimates by commercial
market researchers indicate a world market potential of
60 to 90 billion euros. About 35 to 40 % of the sensor
systems produced in Germany are direct exports. If
indirect exports are added – which depend of course on
the export quota of the machines, systems, and products in which they are integrated – the actual
export quota of German measuring systems comes to 60 to 70 %.
The products for the SENSOR+TEST measuring fair described below show that continued advances
in the sensor industry again bring forth a great variety of innovations this year.
“Despite the tough economic situation, the SENSOR+TEST is holding its own this year and in
comparison to last year can almost reach the same number of exhibitors,” says Holger Bödeker, CEO
of the AMA Service GmbH, the organizers of the event. “Sensor, measurement, and testing technology
is a cross-section industry and thus impacted by the economic slump, especially in the automotive and
engineering sectors. The robust trade-fair figures nevertheless confirm the concept that we have
developed for the SENSOR+TEST as the worldwide leading event in the industry.” Besides the
traditional trade fair activities, the SENSOR+TEST offers a plethora of additional information
opportunities for both, visitors and exhibitors.
As usually, it was really pleasure to see our IFSA members among exhibitors: Avantes, Endevco,
Entran, EPCOS, FOS&S, Honeywell, KELLER, m-u-t, MAZeT, MEGATRON, Melexis, Merit,
Microdul, Paroscientific, PCB Piezotronics, ProWave, rotronic, SenGenuity, Sensirion, Sensor
Technology, Sensortechnics, Testo and YOKOGAVA.
It was also my great personal pleasure to take an
opportunity and to present certificates of 10 Top Sensors
Products 2008, selected by Sensors & Transducers’
editors [1] directly to the following exhibitors:
SenGenuity (Vectron International's Division), FISO
Technologies, Inc., ZMDI AG, and FUTEK Advanced
Sensor Technology, Inc.
As usually I will be focused in my current event review on
sensors and transducers with frequency (period), dutyIII
Sensors & Transducers Journal, Vol.105, Issue 6, June 2009, pp.I-X
cycle and pulse width modulated (PWM) output as
most perspective for the use in smart sensors
systems as well as to data acquisition systems for
such sensors. Detailed descriptions of all mentioned
in this review sensors products and links to
manufacturers web sites are available in appropriate
sensors sections at Sensors Web Portal
(http://www.sensorsportal.com). In additional, other
new sensor products, exhibited at SENSOR+TEST
2009 are described in Sensors & Transducers
Magazine (e-Digest), No.6, June 2009 [2] available
online.
Melexis demonstrated MLX75304XD/XE light to
frequency converters of Sensor EyeCTM family in two
type of packages (8- and 10-pins) and two temperature
ranges: from -20 0C to … +85 0C and
-40 0C …+125 0C (Figure 1), [3]. It is an easy-to-use
light sensor that converts light intensity into an output
frequency (1 Hz …1 MHz). The MLX75304 features
highly linear response over a huge dynamical light
input range of more than 100 dB. The sensor is
designed for high-volume applications like ambient
light detection, LCD screen backlight dimming and
LED light control, automotive applications and
responds in a range of 500 nm to 1000 nm.
Fig.1. Light-to-Frequency Converter MLX75304
(Melexis).
Fig. 2. CO2 Sensor Module (Sensecube).
The Sensecube company from South Korea has the
CO2 sensor module for OEM application (Figure 2)
[4] in their catalog. The module has ± 4 % FS + 3 %
reading accuracy, 0~ 2000 ppm, ~ 5000 ppm, ~
10000 ppm measuring range options, 30 ms response
time and PWM (period 1004 ms) output.
During the opening of the SENSOR + TEST
Exhibition, POSIC launched a series of incremental
encoder kits. The single-channel encoder IS1101 with
frequency output (0-40 kHz), is insensitive to
magnetic interference fields and suitable to scan
gears, discs, strips and detect edges of metallic
objects [5], Figure 3.
Fig. 3. Single-Channel Encoder IS1101 (POSIC).
ADZ Nagano Sensortechnik (Germany) exhibited a
pressure transmitter SML-MO-2 with the pressure range
0...4000 bar, 0.5 % accuracy, frequency output (200 Hz
to 2.2 kHz); PWM output (500 Hz, 5 kHz), Figure 4,
[6].
EOS Optronics GmbH (Germany) demonstrated a
Picosecond-Timing System (Figure 5) based on time-todigital converter TDC-GPX from Acam. This timing
system has been developed to use as a flexible timing
Fig. 4. Pressure Transmitter SML-MO-2.
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Sensors & Transducers Journal, Vol.105, Issue 6, June 2009, pp.I-X
processing platform for time interval and event timing applications. The module is typically used in
laser ranging applications where ps resolution and multi-hit stop capability is required. However, other
applications can also be addressed with this board where time-to-digital conversion will be used (e.g.
time interval measurements with statistics). The board has USB, RS232 and JTAG interfaces [7].
A USB incremental system meM-INC has been exhibited by BMC Messsysteme GmbH (Figure 6). It
has counting and frequency measurement functions (max. 64 kHz) and can connects up to 3
incremental encoders (max. 32 kHz) [7].
Fig.5. Picosecond-Timing System.
Fig.6. USB Incremental Systems meM-INC.
A new measuring instrument FQ4 for QMB and SAW sensors up to 500 MHz with simultaneous,
continuous measurement of all channels has been demonstrated by JLM Innovation (Germany),
Figure 7. External oscillators allow to tailor FQ4 to a broad range of different QMB and SAW sensors.
The instrument has a COM port. There are also some optional network interfaces. The same company
also exhibited the JLMQ QMB USB Interface 10/30 MHz with high resolution and 4 measurements
per second [7].
Fig. 7. Four Channel Measurement Instrument for
QMB and SAW sensors.
Fig. 8. Intelligent, Compact Measurement Systems
of C-Series.
IMC GmbH (Germany) exhibited intelligent, compact measurement systems of C-Series. It has 4
counter input for capture of RPM’s, displacement, etc. (Figure 8). C-Series devices may also include a
sensor power supply and TEDS capability [7].
It is also necessary to remind Smartec company, that continue manufacturing of its popular
temperature sensors with duty-cycle output SMT160-30 [8] and IC of Universal Transducers Interface
(UTI) with period modulated output.
Nevertheless there are both: appropriate frequency output sensors and measuring and DAQ systems for
such sensors, many customers do not know till now how to deal with a frequency signal especially in a
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Sensors & Transducers Journal, Vol.105, Issue 6, June 2009, pp.I-X
wide frequency range. Really, such problem was existing for a long time but it is completely solved at
the end of 2004, when the IC of Universal Frequency-to-Digital Converter (UFDC-1) has been
introduced to the market. This precision, multifunctional IC works with any frequency, period, dutycycle, time interval, phase-shift, PWM signals as easily as an ADC works with any analog (voltage or
current) signals [9, 10].
The 10,000-euro SENSOR Innovation Award sponsored by the AMA Association for Sensor
Technology for the 9th time was presented this year to a team from the Institute for Microsystems of
the Technical University Hamburg-Harburg for their development of a miniaturized mass spectrometer
under the direction of Prof. Jörg Müller. The presentation was held on the first day of the fair during
the opening ceremony. “The number of submissions for the award, 63 in all, is a new record,” says
Prof. Dr. Andreas Schütze from the Saarbrücken University, chairman of the jury.
4. Conferences under a Common Umbrella
This year the conference events, held parallel to the SENSOR+TEST, have been placed under a
common umbrella for the first time: the SENSOR+TEST Conference 2009. The comprehensive
conference programme comprises the SENSOR 2009, OPTO 2009, and IRS2 2009 conferences as well
as other first-rate events. The opening presentation will be held by Prof. Dr. Dr. h.c. Gerhard
M. Sessler on the subject of “Novel Silicon Sensors in Acoustics”.
During the three days of the SENSOR+TEST fair, a total
of more than 200 presentations and posters of authors
from 22 countries: Armenia, Austria, Belgium, Bulgaria,
Canada, China, Czech Republic, France, Germany, Japan,
Italy, Netherlands, Palestine, Poland, Russia, Spain, South
Korea, Sweden, Switzerland, Ukraine, United Kingdom
and USA did reflect the current developments and
research results in sensor and measuring technology. The
numbers of presented papers from each of country are
shown in Table.
No.
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
12.
13.
14.
15.
16.
17.
18.
19.
20.
21.
22.
Country
Germany
Austria
Ukraine
The Netherlands
Russia
UK
Belgium
USA
Poland
Czech Republic
France
Japan
Italy
Spain
Switzerland
Armenia
Bulgaria
Canada
China
Palestine
South Korea
Sweden
Number of Papers
155
12
9
7
6
5
4
4
3
2
2
2
2
2
2
1
1
1
1
1
1
1
The substantial increase in participants at the parallel
SENSOR+TEST Conference contributed considerably to
the success of the event. Many presentations at this year
were made by industry representatives.
The conferences review will be focused on new research
results in different frequency output sensors and smart
sensors areas as well as industrial development projects in
the same fields.
Smart Systems are great of interest of the Strategic
Research Agenda defined by the European Technology
Platform on Smart Systems Integration (EPoSS). Mr. Lars
Heinze in his presentation shows that implementation of
such qualities as adaptation, self-diagnosis, etc. would
enable the evolution of classical Microsystems towards
Smart Systems [11].
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Such approach coincidences closely with the IFSA’s conception proposed two years ago [12]. MEMS
based frequency output sensors and programmable frequency-to-digital converters play a particular
role in such smart systems and give a unique opportunity to use any standard frequency (period) output
sensors in intelligent systems.
The importance of such coming direction for Europe has been also emphasized by Mr. T. Sommer
from European Commission in his presentation “From Microsystems towards Smart Miniaturized
Systems: the European Approach”. Let see what were presented suitable for smart sensors systems
design at the conferences.
Interesting results have been presented in the paper entitled “Low-Cost Smart Self-Adaptive Humidity
Sensors with Parametric Adaptation” [13] based on results of European Project MEXT-CT-2005023991 Smart Sensors Systems Design (SMARTSES) in the frame of Marie Curie Chairs Excellence
(EXC) programme [14]. The designed low-cost humidity and temperature sensors system is based on
minimal possible hardware and has intelligent functions as self-adaptation and self-identification. It
can contain any quasi-digital humidity sensors with frequency, period, duty-cycle and PWM or
capacitance output, quasi-digital temperature or resistive output sensors. The device is based on a
novel method for frequency measurements and signal conditioning concept optimal for smart sensor
systems design. The parametric adaptation lets change metrological performance based on measuring
conditions.
A high precision torque measurement system is based on frequency output torque transducer T40 and
appropriate TIM40 signal processing unit is described in [15]. Both enabled the step to be taken from
the transducer to the complete measurement system. It has the following outstanding attributes:
maximum accuracy, higher measurement frequency range with simultaneously high resolution, digital
measurement signal conditioning and self-diagnosis. Two TEDS (Transducer Electronic Data Sheet)
including different templates are available to users who want to use other amplifier systems in addition
to the fieldbus interfaces, for example because of the dynamics of torque measurement or RS422
signals requiring direct analysis. Integrated TEDS devices supply the measuring amplifier with all the
important characteristic transducer data. The TEDS amplifier converts the characteristic transducer
data and automatically makes the correct parameter settings. At this time the system is in the product
launch phase.
Authors from Kavlico Corp. have described in their presentation an integrated capacitive MEMS
structure with on-chip conditioning circuitry (sCAP) for ultra-low power sensing products [16]. It has
the following advantages: 1) The MEMS sensor can be manufactured inexpensively with common
CMOS processes; 2) The capacitive sense element can be excited and detected with significantly less power
than resistive type devices; 3) The size of the capacitive sensing element can be made small because the signal
to noise ratio of the sense element is large and by placing the conditioning circuitry on-chip, the parasitic
“stray” capacitances of the circuit are managed; and 4) the conditioning circuitry creates a digital
output signal that can be directly measured by a standard counter input of a microcontroller. The key
element of a capacitive MEMS sensor is a PWM converter that converts capacitance to electrical pulse
durations [16].
An importance of frequency measurements in a wide frequency ranges from 0.01 Hz up to 160 MHz in
appropriate sensing applications has been discussed in [17].
A described time-based capacitive to digital converter with fast data acquisition and high resolution
has been described in [18]. The converter has period-modulated signal on its output and 14-bit
resolution at measurement time of 100 µs. The interface has been designed for implementation in
0.7 µm CMOS technology. Simulation results show that for 5 pF sensor capacitance with a parasitic
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Sensors & Transducers Journal, Vol.105, Issue 6, June 2009, pp.I-X
capacitance of 50 pF the mentioned performance achieved while power consumption is less than
5 mW.
An interfacing integrated circuit presented in [19] also has period modulated output. The circuit has
been implemented in a standard 0.35 µm CMOS-A process. It has been optimized for low level
voltage output sensors as thermocouples and thermopiles. By applying the autocalibration technique, a
nonlinearity of below 0.06 % has been achieved. The measuring time is 0.5 ms.
As usually, some sensors systems based on quartz crystal microbalance have been presented in
conference for appropriate applications.
Some authors in other presented papers have tried to solve a complex sensor interfacing and signal
conditioning problems by a traditional way in analog signal domain using analog-to-digital converters,
filters, etc. instead of use of more “robust” frequency-time signal domain with the usage of voltage-tofrequency and programmable frequency-to-digital converters. As results, some hardware consumption
solutions and/or very big chip area have been presented. Taking into account a current economic
situation when sensor industry demonstrates some revenue decreasing, it is not likely that such
solutions will be accepted by manufacturers and customers especially for smart systems.
5. Afterworlds
The SENSOR+TEST has again proved the resisting power of the sensor, measuring, and testing
industry. The success of the trade fair shows that this economic sector has not been as adversely
affected by the current situation as was feared. “With a total of 537 exhibitors on 18,000 m² of floor
space, the SENSOR+TEST can indeed be considered a complete success,” says Holger Bödeker,
Managing Director of the AMA Service GmbH, the organizers. In view of the economic situation, the
7,000 visitors are a positive result in themselves. The majority of the exhibitors were also pleased
about this unexpected result. “We’re more than happy so far,” Manfred Walter, product line director at
JUMO GmbH & Co., says. “On the first day of the fair we were able to increase the number of
contacts compared to last year’s figures.”
In times such as these, when companies uphold a strict travel policy, often only employees with
concrete projects are allowed to go to trade fairs. Thus exhibitors confirmed that the high quality of the
visitors has increased even more, resulting in discussions at the stands that related to very concrete
projects.
During the three-day fair, the visitors were offered a comprehensive spectrum of information on topics
dealing with sensor, measuring, and testing technology. Besides the many innovations and new
products at the stands, the Action Programme again proved to be a major visitor attraction. Interesting
presentations were given at the exhibitor forums and two podium discussions were held as well. The
Action Area, this year integrated in Hall 11 for the first time, was constantly filled with visitors.
“We were very pleasantly surprised by the number of contacts we made on the first day of the
SENSOR+TEST,” says Rainer Gille, CEO of the Verhoeven Feinmechanik GmbH. The company,
showing for the first time at the fair, exhibited at the community stand “Young Innovative
Enterprises.” The Job Tea-Time and the job exchange tailored to the sensor, measuring, and testing
market have established themselves as a permanent part of the SENSOR+TEST.
The SENSOR+TEST will be held from 18 to 20 May next year again in Nuremberg. The highlight of
the conference programme in 2010 will be on “Sensors and Measuring Systems” under the auspices of
the Informationstechnischen Gesellschaft im VDE (ITG) and the VDI/VDE-Gesellschaft Mess- und
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Sensors & Transducers Journal, Vol.105, Issue 6, June 2009, pp.I-X
Automatisierungstechnik (GMA). This and other attractive events to be offered guarantee a most
interesting programme for next year.
Sensors systems need smart sensors, and smart sensors systems need smart manufacturers and smart
customers. Are you one of them ? See you at SENSOR+TEST 2010 !
References and Web Links
[1]. 10 Top Sensors Products of 2008, available online at:
http://www.sensorsportal.com/HTML/DIGEST/10_Top_Products_2008.htm
[2]. Sensors & Transducers Magazine (e-Digest), No.6, June 2009, available online at:
http://www.sensorsportal.com/HTML/DIGEST/Digest_June_2009.htm
[3]. List of Optical Sensors Manufacturers at Sensors Web Portal (http://www.sensorsportal.com):
http://www.sensorsportal.com/HTML/SENSORS/OptoSens_Manufacturers.htm
[4]. List of Gas Sensors Manufacturers at Sensors Web Portal (http://www.sensorsportal.com):
http://www.sensorsportal.com/HTML/SENSORS/GasSens_Manuf.htm
[5]. List of Rotation Speed Sensors Manufacturers at Sensors Web Portal (http://www.sensorsportal.com):
http://www.sensorsportal.com/HTML/SENSORS/RotationSens_Manuf.htm
[6]. List of Pressure Sensors Manufacturers at Sensors Web Portal (http://www.sensorsportal.com):
http://www.sensorsportal.com/HTML/SENSORS/PresSens_Manuf.htm
[7]. List of DAQ Systems Manufacturers at Sensors Web Portal (http://www.sensorsportal.com):
http://www.sensorsportal.com/HTML/SENSORS/DAQ_Systems_Manufacturers.htm
[8]. List of Temperature Sensors Manufacturers at Sensors Web Portal (http://www.sensorsportal.com):
http://www.sensorsportal.com/HTML/SENSORS/TempSens_Manufacturers.htm
[9]. Universal Frequency-to-Digital Converters UFDC-1 and UFDC-1M-16:
http://www.sensorsportal.com/HTML/E-SHOP/PRODUCTS_4/UFDC_1.htm
[10].Evaluation Board Supports Quick and Easy Sensor Systems Developments, Press Release, Sensors &
Transducers Magazine (e-Digest), No.5, May 2009, available online at:
http://www.sensorsportal.com/HTML/DIGEST/Digest_May_2009.htm
[11].Heinze Lars, Sensors for Smart Systems - Requirements to Sensor Systems, in Proceedings of
SENSOR+TEST 2009 Conference, Nuremberg, Germany, 26-28 May 2009, Vol. I, pp.321-322.
[12].Yurish Sergey, MEMS Based System-on-Chip and System in Package: New Perspectives, Sensors &
Transducers, Vol.78, Issue 4, April 2007, pp.I-IV available online at:
http://www.sensorsportal.com/HTML/DIGEST/E_11.htm
[13].Yurish Sergey, Low-Cost Smart Self-Adaptive Humidity Sensors with Parametric Adaptation, in
Proceedings of SENSOR+TEST 2009 Conference, Nuremberg, Germany, 26-28 May 2009, Vol. II,
pp.117-122.
[14].Smart Sensors Systems Design, Project MEXT-CT-2005-023991 SMARTSES, available online at:
http://www.sensorsportal.com/HTML/Sensors_Systems_Project.htm
[15].Kuhn Sven; Schicker Rainer, High Precision Torque Measurement Systems in Engine Test Benches, in
Proceedings of SENSOR+TEST 2009 Conference, Nuremberg, Germany, 26-28 May 2009, Vol. I,
pp.77-82.
[16].Clifford Mark, Ultra-Low Power Pressure Sensing: a Capacitive Based MEMS Approach, in Proceedings
of SENSOR+TEST 2009 Conference, Nuremberg, Germany, 26-28 May 2009, Vol. I, pp.187-192.
[17].Andle J., Durdag K., Chap M., Haskell R., Threaded Fluid Condition Sensor for Real-Time, On-Line and
In-Line Oil Conditioning Monitoring, , in Proceedings of SENSOR+TEST 2009 Conference, Nuremberg,
Germany, 26-28 May 2009, Vol. II, pp.229-234.
[18].Ali Heidary, Gerard G. C. M. Meijer, A Time-Based Capacitive to Digital Converter with Fast Data
Acquisition and High Resolution, in Proceedings of SENSOR+TEST 2009 Conference, Nuremberg,
Germany, 26-28 May 2009, Vol. I, pp.297-300.
[19].Jia Qi, Li Xiujun, Gerad C.M. Meijer, An Accurate Readout Circuit for Sensors Based on
Thermopiles/Thermocouples, in IRS2 Proceedings of SENSOR+TEST 2009 Conference, Nuremberg,
Germany, 26-28 May 2009, pp.295-300.
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