TSL

OIM Analysis
OIM scan data will be analyzed in form of Map, Chart, Plot and combined
them. It will be analyze the texture or micro structure to know the
relationship between these texture and properties of the sample.
• Information from OIM scan data analysis will depends on capability
or knowledge of people who analyze the data.
TSL
Solutions
OIM School
OIM Analysis
OIM scan data is analyzed in form of Map, Chart, Plot and combined them.
TSL
Solutions
OIM School
OIM Analysis: Structure of Main window
Standard
Toolbar
Highlighting
Toolbar
Crystal
Utilities
Toolbar
QuickGen
Toolbar
Chart
Map
Project
Tree
Texture Plot
Summary
Window
Document
Selector
TSL
Solutions
Main View
Pane
Status bar
OIM School
Secondary
View Pane
Project Tree
In OIM a project contains all of the documents created during
an analysis session.
Project
A chart that combines results from any partition in the
project
OIM Datasets
Partitions. Essentially subsets of the data that meet some
user prescribed criteria.
A “Chart” – e.g. grain size distribution, IQ distribution…
A map
A discrete orientation plot such as a pole figure or an “ODF”
– I.e. discrete points plotted in Euler space.
A “Texture” – this contains all of the results for a given
calculations. I.e. for a user prescribed set of parameters.
Texture plots (of intensities) such as a Pole Figures or
ODFs.
TSL
Solutions
OIM School
Layer structure of the program
Parameters which control the program and analysis
Preference
Parameters which control whole program.
Project
Dataset
[ Multi Chart ]
Dataset
・・・・・・・・・・・・・
Dataset
Functions which affect to all partition
under each Dataset
Partition
Partition
Partition
Partition
Parameters which define properties of analysis for
each partition.
（Grain size, boundaries, etc）
The parameters or functions will affects to all under that level.
TSL
Solutions
OIM School
OIM Analysis
Let’s draw OIM map
Each scan data will be opened under Project.
The scan data is called as ‘Dataset’. And
partition, ‘All data’, will be created
automatically. Map, Plot, or Chat will be
drawn under partition.
TSL
Solutions
OIM School
Practice:
Let’s draw OIM map using ‘Alpha-Steel’
Open ‘Alpha-Steel’ data and draw following maps using ‘Quick Gen buttons’
• Image Quality map (IQ map)
• Inverse Pole Figure map （IPF map）
• Grain map (Unique Grain Color map)
IQ map
Let’s use these Quick Gen buttons.
TSL
Solutions
OIM School
IPF map
Grain map
Maps
Gray Scale
Image Quality
Confidence Index
Fit
Detector Signal
Grain Size
Grain Shape Orientation
Grain Shape Aspect Ratio
Grain Average IQ
Grain Average CI
Grain Average Video Signal
Kernel Average Misorientation
Grain Orientation Spread
Grain Average Misorientation
Grain Reference Orientation
Deviation
Taylor Factor
Schmid Factor
Import Data
Boundaries
Rotation Angle
Rotation Axis
Axis/Angle
Grain
Phase
CSL
Shape Ellipses
Reconstructed
Reconstructed Twins
TSL
Solutions
OIM School
Color Scale
Image Quality
Confidence Index
Fit
Detector Signal
Phase
EDS
Inverse Pole Figure
Crystal Direction
Crystal Orientation
Euler Angle RGB
Unique Grain Color
Grain Size
Grain Shape Orientation
Grain Shape Aspect Ratio
Grain Average IQ
Grain Average CI
Grain Average Fit
Grain Average Video Signal
Kernel Average Misorientation
Grain Orientation Spread
Grain Average Misorientation
Taylor Factor
Schmid Factor
Elastic Stiffness
Twin Parent/Daughter
Import Data
Maps
Non-Orientation Scalar maps – IQ, CI, fit, Other detectors (FSD,
SED, X-Ray), phase…
Grain Based Maps – size, shape, avg IQ, orientation spread…
Orientation based maps – IPF map (2D), Euler Angle map,
Component maps
Misorientation Based Maps – local misorientation (strain)…
Property Maps – Taylor or Schmid Factor, Elastic Modulus
TSL
Solutions
OIM School
Maps: Image Quality map
84.9
Image Quality : 195.3
21.6
Image Quality : 62.6
IQ map is drawn based on the peak intensity of Hough transformation. If the pattern is
clear which means the crystal has less distortion. If IQ value is low, that point has more
distortion with crystal, or contaminated or damaged.
TSL
Solutions
OIM School
Maps: Confidence Index map
V −V
CI =
V
1
2
ideal
CI (Confidence Index) is a parameter which shows confidence
of indexing which is calculated using above equation. The CI
map is drawing using this parameter. Be careful that CI=0.4
and CI=0.8 has almost no difference. But CI=0.05 and CI=0.1
is a big difference. So the meaning is not liner scale.
Confidence Index は OIM-DC の指数付の項で説明したように、
TSL
Solutions
OIM School
Maps: Orientation map
Inverse Pole Figure （IPF map)
方位を表現する試料の方向を
指定する。
Reference
Direction
Transverse
Direction
Normal
Direction
In case of IPF map, it should be first specified some sample plane, such as ND plane, then
find which crystal plane becomes parallel to this specified sample plane. Then each pixel
is pained depends on the crystal plane using right color key.
TSL
Solutions
OIM School
Maps: IPF map
ND(Z)
TD(Y)
(Z)
RD(X)
(Y)
(X)
ND
TD
RD
Orientation map such as IPF map is made based on sample coordinate, not the
sample surface. If ND sample plane is specified, the crystal plane which parallel to
the ND normal plane for each pixel. It doesn’t mean the same as sample surface.
So it should be always careful about sample coordinate system.
TSL
Solutions
OIM School
Maps: IPF map
Sample Surface
normal direction
If we want to know the crystal
indices of this fractures surface,
we need to know the plane
normal direction.
If we find the plane normal
direction, (RD,TD,ND), is (1,3,11),
Then we can know the crystal
indices of this fractures surface
by input these data to specify
sample surface.
TD
ND
RD
If we select ‘Map Data’ at Status bar text in
Preference shown by red arrows, then after
specifying the sample surface, the point data
specify cursor will be shown as below. .
RD
TD
TSL
Solutions
OIM School
ND
Maps: Orientation map
Crystal Direction Map
It picked up the pixels which has specified crystal
Direction along with also specified sample direction. It
specify only one direction. It doesn’t care the rotation
around specified sample direction.
(It is not the crystal plane normal direction. )
Specify crystal direction or crystal plane normal.
Specify sample direction
TSL
Solutions
OIM School
Maps: Orientation map
Crystal Orientation Map
TSL
Solutions
It pick up the pixels which has the specific crystal
orientation shown by (hkl)<uvw> presentation. (hkl) shows
the crystal plane parallel to the sample ND normal plane.
<uvw> shows the crystal direction of sample RD direction.
(hkl) normal direction and <uvw> is perpendicular.
OIM School
Maps: Area fraction of specified data
It is also possible to know area fraction of each specified area of Crystal
Direction map or Crystal Orientation map.
TSL
Solutions
OIM School
Difference of IPF Maps and Crystal Direction Map
IPF map Sn sample
PF and IPF are defined by crystal plane,
not crystal direction. It is common that
crystal plane normal and crystal
direction with same Millar indices are
not the same.
(10 0 3)
Pick up the grains which (10 0 3)
plane becomes normal to the
sample ND plane.
TSL
Solutions
OIM School
Crystal Direction map
Pixels which has <10 0 3>
crystal direction is nearly
same as (11 0 1) plane
normal, not (10 0 3).
Maps: Map Color
Map color can be selected following color bar
list. Or it can be specified by user preferences.
TSL
Solutions
OIM School
Practice:
Let’s draw Crystal Direction Map using Sn-Solder scan data.
1
2
Put 1, 1, 2 either Crystal Direction(1) or
Pole(Plane) (2) and see the difference.
TSL
Solutions
OIM School
Practice
Let’s paint in different color for following area in Crystal Direction Map.
Specify (001) plane normal along with ND direction with following rejoin.
0゜～ 5゜
5゜ ～ 10゜
10゜ ～ 15゜
15゜ ～ 20゜
TSL
Solutions
OIM School
Grains in OIM
Grains in OIM is defined by Tolerance Angle and Minimum Grain Size (number of grains).
Neighbor pixels within this tolerance angle are considered to belong to the same grain and if
pixels equal or more than Minimum Grain Size are connected within the Tolerance angle, they
are considered as independent gain. This definition is same as connecting boundary more
than Tolerance angle and make closed loop or touch to the scan boundary. Under this
definition, we may see the boundary more than Tolerance Angle in grains as shown in below.
A
B
TSL
Solutions
C
OIM School
Grains in OIM
Grains in Unique Grain Color map are very much depends on the grain definition (Tolerance
Angle and Minimum Grain Size). As following example of Alpha-Steel, we can see big changes
of grain size depending on the definition. Users need to think how they define the grain
thinking about their objects of Analysis.
Tolerance Angle =
2 deg.
TSL
Solutions
Tolerance Angle =
3 deg.
OIM School
Tolerance Angle =
5 deg.
Partitions Properties
Minimum angle to separate pixels
into two grains
Minimum number of pixels to
consists of grains
Specify that the edged
grains are included or
not in the analysis.
If we change some
parameters in Partition
Properties, all the maps,
charts and plots under
this partition are affected.
The definition of Grain is one of the most important parameter.
TSL
Solutions
OIM School
Practice
Let’s check the changes of grains by changing the definition of grain.
• See the difference of grains by changing the parameter of Tolerance Angle and Minimum
Grain Size in Partition Property .
Data :
TSL
Solutions
Alpha_Steel
Grain Tolerance Angle = 3 and 5 deg.
OIM School
Partitions Properties
Partition Properties の働きを理解しよう。
If we change some
parameters in Partition
Properties, all the maps,
charts and plots under
this partition are affected.
TSL
Solutions
CI, IQ, Video Signal (SEM singnal)・・・・can be used to filter the scan data.
Mathematical operant can be used to combine the filter condition.
OIM School
Partitions Properties
Clear difference of IQ between
Cu line area and isolator area
Cab be used to separate the
scam data.
TSL
Solutions
OIM School
Partitions Properties
The condition specified in Partition/Formula
will affect all data under this partition.
IQ > 50 is set in Partition/Formula. This
means pixels which has IQ value more than
50 will be used for analysis.
TSL
Solutions
OIM School
Partitions Properties
The data with pixels IQ < 50 are
excluded from the analysis.
It is included not desirable data for analysis.
TSL
Solutions
OIM School
Practice
• Let’s check how parameters in Formula in Partition Property will affects to the
analysis of scan data.
Data :
TSL
Solutions
Cu IC Line
Check IQ or CI to remove un-necessary data from the
scan data.
OIM School
Maps: Misorientation Map
Grain Orientation Spread
For a given grain calculate the
average misorientation between all
data points in the grain.
TSL
Solutions
Grain Average Misorientation
For a given grain calculate the
average misorientation between all
neighboring data points in the grain.
OIM School
Kernel Average Misorientation
For a given data point calculate the
average misorientation between the
data point and all of it’s neighbors
(exclude misorientations greater than
some prescribed value - 5° in this
case)
Maps: Misorientation Map
Grain Reference Orientation Deviation
Show the deviation of each point in the grain with respect to a reference orientation. Two
types of references are possible: 1) The average orientation for the grain and 2) the
orientation of the point in the grain with the lowest Average Kernel Misorientation.
TSL
Solutions
OIM School
Grain Average Misorientation map
Cross section of Al ample under bending test was
observed. Grain Average Misorientaion maps were
made for each bended condition. We can see that the
Grain Average Misorientation Value is increasing
according to bending angle.
0.0mm
TSL
Solutions
3.0mm
5.0mm
OIM School
7.0mm
7.0mm 曲げた状態
8.0mm
Practice
Draw following 4 maps using ‘Part-Rx Steel’ data and think the meaning of
these maps.
Grain Orientation
Spread
TSL
Solutions
Grain Average
misorientation
Kernel Average
misorientation
OIM School
Grain reference
orientation deviation
Maps: Phase map
All data 以外に各相のPartition
が自動的に作られる。
TSL
Solutions
OIM School
Maps: Phase map
In case of multi phase data, All
partition and partitions for each
Phase will be made
automatically.
TSL
Solutions
OIM School
Maps: Phase map
If two phases with same crystal structure, it is not
possible to distinguish these two phases. Then it
becomes messy map.
CI map of above
phase map.
CI map of
appropriate scan.
TSL
Solutions
OIM School
Grain Boundary in OIM
If edge between two pixels exceeds the specified rotation angle, the edge
is considered as boundary.
OIM has three types of boundaries.
z
Basic boundaries which is used for boundary
fraction. It contains all sub-grain boundary.
z
Boundary to define grains
Boundary must be closed or connected to scan
boundaries.
(Same as the definition in material science)
z
Boundaries which are used to boundaries.
These boundaries are defined by rotation angle
or axis angle, twins or CLS.
TSL
Solutions
OIM School
Δg
This one segment becomes
a unit of grain boundaries.
Boundary menu in OIM Software
Select the type of boundary
from this area.
TSL
Solutions
OIM School
Definition of Grain boundary
Two parameters are necessary to
define boundary character.
1. Rotation Angle/ Common Axis
2. Boundary plane
Boundary
Grain 1
Grain 2
* It is not possible to distinguish these two
difference without boundary plane info.
Boundary plane
• EBSD doesn’t have info in depth direction. So there is
no info about Boundary plane in EBSD analysis.
TSL
Solutions
OIM School
Boundaries
Rotation Angle –
A line segment is drawn between two neighboring points if the
misorientation falls in a given range (e.g. between 5 and 15 degrees)
Axis/Angle –
A line segment is drawn between two neighboring points if the
misorientation between the two points is within a given tolerance of a
specified ideal misorientation where defined by an axis/angle pair (e.g. 60
degrees about <111>).
Grain –
A line segment is drawn between two neighboring points if they belong to
two different grains.
Phase –
A line segment is drawn between two neighboring points if they belong to
two different phases.
CSL –
A line segment is drawn between two neighboring points if they are within a
given tolerance of specified CSL (coincident site lattice boundary).
Shape Ellipses –
An ellipse is fit to each grain in the map and then overlaid on the map.
TSL
Solutions
OIM School
Boundary: Grains & Phase
Grain –
A line segment is drawn between two neighboring points if they belong to two
different grains.
Phase –
A line segment is drawn between two neighboring points if they belong to two
different phases.
TSL
Solutions
OIM School
Baoundary: Rotation Angle
Rotation Angle –
A line segment is drawn between two neighboring points if the
misorientation falls in a given range. (60° ± 5° in this example.)
This is very basic way to show the boundary in OIM. This boundary
is just for display. And it is not necessary to be closed loop.
TSL
Solutions
OIM School
Boundary : Minimum Misorientation
In OIM Analysis software, ‘Minimum boundary misorientation’ is set as a criteria for
recognize boundaries. All segments between pixels exceeding this value is considered as
boundary. This value is different from the Tolerance angle to define grains. It is set in ‘Preferences’
window under Setting.
Total length of boundary is
necessary to calculate
Fraction of boundaries.
TSL
Solutions
OIM School
Preferences
OIM-A5.2
TSL
Solutions
OIM School
Boundary : Minimum Misorientation
Attention must be paid that the Rotation Angle boundaries which rotation angle is less than
‘Minimum Boundary Misorientation ‘ will be ignored to display the boundary.
minimum boundary misorientation
= 2 degrees
TSL
Solutions
minimum boundary misorientation
= 0.5 degrees
OIM School
Practice
Let’s draw rotation angle boundary using Rolled Steel data.
• Draw rotation angle boundary with rotation Angle , 1~5、5~15 and
15~180(65) deg. on Image Quality map.
• Change ‘Minimum Boundary Misorientation’ value in Preference.
TSL
Solutions
OIM School
Boundaries: Axis/Angle
Rotation Angle – A line segment is
drawn between two neighboring points if
the misorientation falls in a given range.
(60° ± 5° in this example.)
Rotation Axis – A line segment is drawn
between two neighboring points if the
two orientations have specified
directions aligned within a specified
tolerance. (<111> crystal directions
aligned within 5° of each other in this
example.)
Axis/Angle – A line segment is drawn
between two neighboring points if the
misorientation between the two points is
within a given tolerance of a specified
ideal misorientation where defined by an
axis/angle pair. (within 10° of 60°
about <111> in this example.)
TSL
Solutions
OIM School
Boundaries: CSL
CSL – A line segment is
drawn between two
neighboring points if they
are within a given tolerance
of specified CSL (coincident
site lattice boundary).
Coincident site lattice
boundaries are special
boundaries where a given
fraction of the atoms at the
boundary are in coincident
positions. The number
fraction of coincident atom
sites are given by 1/Σ. An
example is given for Σ5
which corresponds to a
36.9° rotation about <001>.
The tolerance is given by
K/Σn. The default settings
correspond to Brandon’s
criterion (K=15° and n = ½).
TSL
Solutions
OIM School
Equivalency in Grain Boundary
Ni Annealed twins
Grain 1 is…..
Rotated 60 deg/ <1 1 1>
These are
exactly same.
Rotated 70.5 deg/ <1 -1 0>
<1 1 1>
1
2
<1 -1 0>
Grain boundaries are calculated based on
relationship between rotation angle and common
axis. Sometimes two (or more) different rotation
angle and common axis relations show the same
relations.
TSL
Solutions
OIM School
Practice
Let’s draw the following boundaries using Ni-Std_small-area data.
• Rotation angle: Rotation angle more than 15 deg.
• Axis Angle :
60 deg rotation around <111> common axis.
• CSL boundary : Σ3 boundary
TSL
Solutions
OIM School
Boundaries: Reconstructed
Reconstructed – A line is fit to a set of “grain” boundary line
segments and drawn on the map. It is drawn between two triple
junctions.
*Reconstructed Twins – Reconstructed boundaries can be
colored according to their fit to specific twin boundary criteria –
both in terms of misorientation and twin plane/boundary alignment.
First the average misorientation of the segments the reconstructed
boundary represents is calculated. In this case the average
misorientation must be within 9°of a 60°rotation about <111>
(the primary recrystallization twin in fcc materials) and the (111)
plane trace must also be aligned with 9° of the reconstructed
boundary.
“Extraction of Twins from Orientation Imaging Microscopy Scan Data” S. I. Wright, R. J. Larsen,
Journal of Microscopy, 205, 245-252 (2002).
TSL
Solutions
OIM School
Grains without twin boundaries
If you want to remove just coherent twins, specify here.
Add twin boundary condition to
be removed.
It is possible to recognize grains
without twin boundaries.
Common Rotation axis
Rotation Angle
Specify twin boundary
indecies to be removed.
TSL
Solutions
OIM School
Practice
Let’s draw a Unique Grain Color map without twin boundaries using NiStd_smalloarea data.
TSL
Solutions
OIM School
Sub menu for Map display
Additional functions for Map display.
TSL
Solutions
OIM School
Map/FlexView
Unit Cell, Pole Figure and
Reconstructed EBSD pattern
of the point specified by cursor
will be shown in both Flyby or
Static mode on ‘FlexView’ tag.
TSL
Solutions
OIM School
Chart
Image Quality
Confidence Index
Fit
Video Signal
Grain Size (points)
Grain Size (diameter)
Grain Size (area)
Grain Size (ASTM)
Grain Size (Intercept)
Grain Shape Orientation
Grain Shape Aspect Ratio
Grain Average IQ
Grain Average CI
Grain Average Fit
Grain Average Video Signal
Grain Orientation Spread
Grain Average Misorientation
Kernel Average Misorientation
Crystal Orientation
Crystal Direction
Pole Plot
Pseudo Rocking Curve
Kearns Parameter
Taylor Factor
Schmid Factor
Elastic Stiffness
TSL
Solutions
Misorientation Angle
Misorientation Profile
CSL Boundaries
CSL Deviation
GBCD
Boundary Density
Texture Fiber
Texture Index
Texture Gradient
EDS
Phase
All data shown in Maps or Plots can be
shown in Chart, too. There are several
Chart only data in the menu.
OIM School
Chart Menu in OIM
Select required chart
in ‘Type’ and set
detail condition by
opening ‘Edit’.
TSL
Solutions
OIM School
Charts: Grain Size
Grain Size (points): Number of measurement points in a grain
Grain Size (diameter): The diameter (D) is calculated from the area (A) assuming the grain is a circle: D
= (4A/π)1/2.
Grain Size (area): The area (A) of a grain is the number (N) of points in the grain multiplied by a factor of
the step size (s). For square grids: A = Ns2. For hexagonal grids: A = N√3/2s2
Grain Size (ASTM): G = -6.64*log10(D) - 2.95 where D is the grain diameter given in mm
Grain Size (Intercept): Vertical or linear intercepts
TSL
Solutions
OIM School
Charts: Grain Size
The area (A) of a grain is the number (N) of points in the grain
multiplied by a factor of the step size (s).
For square grids: A = Ns2
For hexagonal grids: A = N√3/2s2
The diameter (D) is calculated from the area (A) assuming the
grain is a circle: D = (4A/π)1/2.
Data used for making chart is shown in right side.
TSL
Solutions
OIM School
Charts: Grain Size
Calculation methods for Averaging.
Total area: 100
Average by Number method
8
100/4 = 25
25
59
Average by Area Fraction method
8
Average by Number method
Average by Area Fraction method
TSL
Solutions
OIM School
8*0.16 + 25*0.25 + 59*0.59
= 42.34
Practice
Let’s draw Grain Size chart using Alpha-Steel data.
• Draw a chart using Log scale or Liner Scale.
• Check what happen when Tolerance for grain recognition in Partition
Properties.
TSL
Solutions
OIM School
Chart : Crystal Direction
Cumulative
TSL
Solutions
OIM School
Chart : Misorientation Profile
™ Map data can be plot in addition to
Misorientation data.
IQ Value値
Misorientation between neighbor pixels
Misorientation against start point
TSL
Solutions
OIM School
Practice
Let’s make Profile Vector chart using Alpha-Steel map data. Draw a line on the
map and make the misorientation chart.
Use this Profile Vector icon.
TSL
Solutions
OIM School
Chart : Misorientation Angle
“Misorientation Angle” chart shows the
misorientation angle of boundaries in the map.
We can see that the low angle boundaries are
major part of boundaries.
TSL
Solutions
OIM School
Chart : Graphics
Setting detail condition for the chart.
All Map data and Plot data can be shown in chart
format. Also there are several chart only menus.
TSL
Solutions
OIM School
Chart: Graphics
We can change Chart style
using Graphic properties.
TSL
Solutions
OIM School
Practice
1.
Let’s draw Misorientation chart using Ni-Std_small-area.
2.
Change character size or make the Chart in 3D format.
TSL
Solutions
OIM School
Chart : Boundary Density
Example of partial annealed steel
20%
60%
‘Boundary Density’ shows the density of the
boundaries with specified angle (total length
of specified boundaries divided by area) in
cumulative format.
TSL
Solutions
OIM School
85%
Multi Chart
TSL
Solutions
OIM School
Practice
1.
Draw charts for IQ value of α phase using Dual Phase Titanium.
2.
Draw multi chart for IQ values of both α phase and β phase using Dual
Phase Titanium.
TSL
Solutions
OIM School
Pole Figure, Inverse Pole Figure, ODF
Discrete Plots
Al Evaporation Film
IPF map (ND)
IPF map (RD)
Pole Figure
Inverse Pole Figure
Euler space
Bunge
Kocks
Roe
Rodrigues Orientation
Rodrigues Misorientation
Axis/Angle Misorientation
Let’s think about Pole Figure, Inverse Pole Figure and ODF
using this example.
Pole Figure : Specify some crystal plane and show the relationship between that crystal plane
normal and sample coordinate using stereo projection.
Inverse Pole Figure :
Specify some sample plane such as ND plane and show the crystal plane normal
which becomes parallel to the specified sample plane.
TSL
Solutions
OIM School
Discrete Plots : Pole Figure
Edit detail display condition
Any crystal plane can be specified, but
generally it uses (001), (101) and (111) planes
in case of cubic.
Specify Crystal plane
Data : Al-film
TSL
Solutions
OIM School
Discrete Plots : Inverse Pole Figure
Select Inverse Pole Figure
Any sample plane can be specified, but
generally it uses RD, TD, ND planes.
[RD, TD, ND] components are shown.
Specify sample plane normal by vector value.
TSL
Solutions
OIM School
Data : Al-film
Discrete Plots: ODF plot
Select Inverse Euler Space
Euler angles of each pixel are plot
directly in 3D display. There is 90
degrees symmetry in cubic, so it is
shown in (90, 90, 90) deg area. 3D
display is not so convenient. It is
generally shown using φ2 as
constant value as shown in left.
We can see that the orientations
are continuously changed.
In ODF plot, one point can display
complete orientation.
Data : Al-film
TSL
Solutions
OIM School
Practice
Let’s draw Pole Figure, Inverse Pole Figure and ODF of Al Extrusion data, and
think about features in texture of data.
IPF(ND) map
TSL
Solutions
OIM School
Intensity Plots : Pole Figure
If the points in Pole Figures overlap each other, we cannot tell how many points are
overlapped. Then we need to convert this discrete plot to intensity plot.
There are two methods to calculate intensity of Pole
Figure or inverse Pole Figure or ODF, Harmonic Series
Expansion and Discrete Binning methods.
Data : Al-film
TSL
Solutions
OIM School
Level key is calculated based on perfect random
distribution. Perfect random becomes intensity 1.
And number of intensity means multiple of perfect
random.
Intensity Plots : Calculation methods
We cannot see so much difference between the results of these two methods in case of Al film
sample, except absolute intensity. But generally it becomes very difficult to calculate the
intensity around the center (around ND axis in the following case) in Discrete Binning . Because
of that the area becomes infinity small at the center. Harmonic Series Expansion doesn’t have
such problem. So Harmonic Series Expansion is better to calculate intensity.
Harmonic Series Expansion
Discrete Binning
Data : Al-film
TSL
Solutions
OIM School
Intensity Plots : Calculation methods
Harmonic Series Expansion is generally better to calculate the intensity. But like following case, a
group of very strong single peak , such as single crystal, the intensity plot becomes very strange
as follows. It becomes from oscillation term of series expansion calculation. The intensity is very
close to 1, so there is actually no problem. But it looks very bad. There is no such problem with
Discrete Intensity method.
Harmonic Series Expansion
Discrete Binning
Data : Ni-Std_small-area
TSL
Solutions
OIM School
Resolution of Intensity calculation.
If we improve the resolution, the peak
becomes shaper, and looks like more real
plot. But it will take a lot of time for
calculation.
L=16
Ω=5゜
TSL
Solutions
OIM School
L=16
Ω=2゜
Intensity Plots : Adjust display
Edit the display methods of
intensity plot by clicking Edit and
open scale window.
2
1
TSL
Solutions
3
OIM School
There will be three major factors to be
adjusted.
1. Iselect ntensity plot or Counter plot.
2. Scale can be set as absolute value
scale.
3. Display color, B&W or Color display.
Practice
Let’s make Pole Figure and Inverse Pole Figure in absolute scale using Al-Bend_00
and Al-Bend_80. The compare it how they are different.
Pole Figure of Al-Bend_00
TSL
Solutions
OIM School
Practice
These are examples of Pole Figure and Inverse Pole Figure. If this sample has these PF and IPF,
please think how IPF map of this sample should look like.
ND
TD
RD
TSL
Solutions
OIM School
Practice
IPF maps of previous sample look like as follows.
IPF map (RD)
TSL
Solutions
IPF map (TD)
IPF map (ND)
OIM School
Highlighting
Highlight is a function to make relationship among Maps, Plots and Charts. It is very
effective to show some specific features of the texture.
TSL
Solutions
OIM School
Highlighting: Toolbar
Record: record highlighting results in
the Interactive pane of the
map window.
Undo：
Redo：
Clear：
Back to previous situation of
Highlighting.
Move forward from ‘Undo’ situation.
Clear all highlight data
Show Interactive Properties by click
right mouse and select properties.
Specify detail of displayed info
in Interactive page.
TSL
Solutions
OIM School
Highlighting: Toolbar
Highlight the point clicked.
Highlight all orientations within
a given tolerance of the point
clicked.
Define the color to be used.
TSL
Solutions
OIM School
Highlighting: Toolbar
Highlight all orientations within
grain and color them according to
the angular distance from the
point clicked.
Define the color to be used.
TSL
Solutions
OIM School
Highlighting: Toolbar
Calculate misorientation between two
points.
Calculate misorientations at a triple
junction. Actually it repeats two points
misorientation calculation three times.
TSL
Solutions
OIM School
Highlighting: Toolbar
Displays a crystal direction
parallel to a line.
TSL
Solutions
OIM School
Highlighting: Toolbar
Define the (hkl) for the plane
traces.
Draw traces of a specified plane (or
plane normal) at a point.
Draw a unit cell representing the
orientation at a point.
TSL
Solutions
OIM School
Highlighting: Toolbar
Tolerance = 30°
Angular tolerance used for various
highlighting modes.
Define the (hkl) for the plane traces.
Use the average grain orientations
when calculating misorientations.
TSL
Solutions
OIM School
Tolerance = 15°
Highlighting: Toolbar
Find all points in the scan within the
angular tolerance of the point clicked in
discrete plot.
Calculate the misorientation between
two points in a discrete plot
Define the color to be used.
TSL
Solutions
OIM School
Highlighting: Toolbar
Select a color for individual
highlights.
Select a color gradient multiple point highlights.
TSL
Solutions
OIM School
Highlighted -> Partition
Crystal Direction map along with TD
direction within 10 deg of CVD-Ta data.
TSL
Solutions
OIM School
Practice
Let’s separate grains into Recrystallized grains and Non-recrystallized grains of
Part-Rx Steel data. Then draw boundary density for both two groups of grains.
Please try to use Multi chart to show the difference of boundary density.
IQ of Part-Rx Steel data
TSL
Solutions
OIM School
Clean Up
Sometimes there are isolated points that are not indexed correctly or at all due to
dust particles or pits on the surface. Various clean up schemes are available to
assign these points an orientation based on their neighbors.
TSL
Solutions
OIM School
Some danger in Clean Up procedure
This is an example of Clean-up
result by Grain Dilation method. If
Clean-up is done by not appropriate
method, it makes artifact to the data.
On the other hand, if Grain boundary
features are studied, it is not
appropriate to analyze them with many
bad points at grain boundary like the
left map. Clean-up is necessary in this
case.
Î Users need to judge what is done in
Clean-up procedures and also need
to check the results are reasonable
or containing artifacts.
TSL
Solutions
OIM School
Clean-Up menu
OIM Analysis Software has many
Clean-up methods as shown in
left Figure. Users need to select
suitable ways to do clean up the
data.
As shown before, Clean-up may
introduce artifacts. So the user
has to check the results
comparing with original data and
find if it is reasonable or
introducing unacceptable artifacts.
TSL
Solutions
OIM School
Grain CI Standardization
Grain CI Standardization is check CI values of all
pixels in recognized grains and change their CI
values to the highest one in the grains as follows.
This method does not change any orientation
data , and only helps to identify points that are
correctly indexed, but may have had a lower
confidence index.
TSL
Solutions
OIM School
Grain CI Standardization
TSL
Solutions
OIM School
Grain CI Standardization
TSL
Solutions
As-collected
Grain CI Standardization
CI>0.1 96.5%
CI>0.1 98.9%
OIM School
Grain CI Standardization
CI map
IPF map (CI>0.3)
CI Chart
After Clean Up
Before Clean Up
Only CI values are changed. Any other date will be stay same.
TSL
Solutions
OIM School
Grain Dilation
Grain Dilation
This clean up method is an iterative method. The routine only acts on points that do not belong to any
grains; yet have neighboring points, which do belong to grains. A point may not belong to any grain due to
the point either not being indexed or due to it belonging to a grain group having fewer members than the
Minimum Grain Size. If the majority of neighbors of a particular point belong to the same grain then the
orientation of the particular point is changed to match that of the majority grain - otherwise the orientation
is randomly changed to match any of the neighboring points, which belong to grains. This process is
repeated until each point in the data set becomes a member of a grain. (Alternatively, the user may set
the code to only perform a single iteration.) In the schematic below, in the left hand figure the data point in
white is not part of any grains. After dilation it's orientation is changed to match that of the neighboring
member of the green grain with the highest CI.
TSL
Solutions
OIM School
Clean up
However, it is important to make sure that the resulting microstructure makes sense also
watch the texture and grain boundary changes.
TSL
Solutions
OIM School
Grain Dilation
Cu IC Lines data
Clean up by Grain Dilation
method w/o single iteration.
IPFﾏｯﾌﾟ
Filtered the clean up data by IQ>50.
After clean up process, it some
artifacts are introduced, there are
some cases we can remove those
artifacts by filtering the data by
other parameters such as IQ, CI…
We should be careful that those
cleaned up pixels has modified
orientation data, CI data.
Clean up with single
Iteration
If single iteration is checked, Grain Dilation Clean up stop the
procedure after it cleans up (expands) the data one pixel layer.
TSL
Solutions
OIM School
Grain Dilation (Single Iteration)
Original IPF
4th Iteration
TSL
Solutions
1st Iteration
2nd Iteration
3rd Iteration
5th Iteration
6th Iteration
7th Iteration
OIM School
Practice
Let’s compare the Misorientation chart of Cu_Cold-Rolled92 data before and
after clean up. ( Use Grain Dilation method.)
TSL
Solutions
OIM School
Data Process at DataSet level
If you use the data process
functions in red box, all the
partition data under this dataset
will be affected by these
processes.
Coarsen removes pixels
every two pixels and the
data 1/4 size.
TSL
Solutions
OIM School
Rotation
Rotate orientation data of dataset.
Be careful!! It rotate only orientation data. It
is not rotate the image data. The image
(grain shape) stay same and only the
orientation data is rotated. So after this
‘rotate’ process, there happens discrepancy
between image data and orientation data.
TSL
Solutions
OIM School
Practice
Let’s draw IPF(ND) map and Pole Figure of CVD-Ta data. The rotate the data
around RD axis by 90 deg. and check the difference from original data.
TSL
Solutions
OIM School
Crop
Cut out the specified area and make it as a new dataset.
Select Single Rectangle or Multiple
Polygons. In case of Multiple Polygons,
continuous left click specify the area
and final right click close the polygon.
TSL
Solutions
OIM School
Merge
™ Datasets can be merged
together.
™ The relative positioning
of the datasets is
controlled by the user.
TSL
Solutions
OIM School
Coarsen
Remove the pixel every two pixels and make the data size 1/4.
It is very convenient to know
the basic features of the data.
Especially it is effective for
Pole Figure, Inverse Pole
Figure and ODF
TSL
Solutions
OIM School
Practice
1.
Crop one grain from Steel_Fcc-Bcc data and check the orientation
relationship between FCC phase and BCC phase.
2.
Merge Al-FSW1, Al-FSW2 and Al-FSW3 data and make them as one dataset.
TSL
Solutions
OIM School
Templates
The conditions to make Map, Plot, Chart can
be saved as Templates. The apply these
templates to other data to draw Map, Plot
and Chart with same condition.
Apply Template to the Partition
Save Template
TSL
Solutions
OIM School
Templates
Map, Plot and Chart conditions can be saved as individual templates. Not only individual
templates, all Map, Plot and Chart conditions can be saved as one partition Template .
It is very convenient to draw same series of data for different dataset .
When Partition Template is applied, it must be
done at one level higher, Dataset level.
Map, Plot and Chart conditions are saved as one
template at Partition level.
TSL
Solutions
OIM School
Templates
User defined templates can be assigned to buttons on the QuickGen Toolbar.
TSL
Solutions
OIM School
Batch Processor
™ A tool to apply a partition template to multiple
sets of data.
™ Includes Rotate, Cleanup, Crop, and Export
functions.
™ An alignment function to align consecutive
sets of data for a sequence of scans, e.g.
from serial sectioning or slices in time.
TSL
Solutions
OIM School