The de-facto standard for nano- and microscale

The de-facto standard for nano- and microscale
image processing and 3D visualization
Download free copy now at:
www.imagemet.com
Image Metrology
Image Metrology was founded in 1998. Today, we are
a world wide leading supplier of software for nanoand microscale image processing. Our mission is to
provide our customers with state-of-the-art image
processing software for microscopy, including:
• Correction tools for creating the most accurate
presentation of the “true” surface
• Automated analysis techniques ensuring high accuracy, quality and cost efficiency
• Visualization and reporting tools enabling convincing and impressive communication of results
Jan F. Jørgensen, PhD. CEO and founder of Image Metrology.
We are a highly innovative company constantly developing new solutions meeting the demands from our
customers. We supply our products directly to end
users and through our global distribution network.
Over the years, the Scanning Probe Image Processor,
SPIP™, has become the de-facto standard for image
processing at nanoscale. SPIP™ was first released in
1995. However, the founder of Image Metrology, Dr.
Jan F. Jørgensen, started developing the software 5
years earlier as part of his industrial PhD project in
cooperation with IBM Denmark, the Danish Institute
of Fundamental Metrology, and the Technical University of Denmark.
Image Metrology A/S
Lyngsø Allé 3A
2970 Hørsholm
Denmark
www.imagemet.com
info@imagemet.com
Phone: +45 469 234 00
Fax: +45 469 234 01
2
The Scanning Probe Image
P r o c e s s o r, S P I P™
Leading research institutes and high-tech companies
in more than 42 countries use SPIP™ for image processing applications within semiconductor inspection,
physics, material science, chemistry, biology, metrology, and nano technology.
SPIP™ supports a variety of microscope types and
their file formats including Scanning Probe Microscopes (SPM), interference microscopes, Scanning
Electron Microscopes (SEM), confocal microscopes,
optical microscopes, and profilers. Whether you are
an expert user or new to the field of image processing, SPIP™ lets you produce the results you need with
just a few mouse clicks.
SPIP™ is a modular software package offered as a basic module and 13 optional add-on modules. The Basic
Module includes essential features such as file reading, profiling, and plane correction. The add-on modules are dedicated to specific purposes within calibration, noise reduction, analysis, and 3D visualization.
On the following pages you will find a description of
each module and learn how you can improve the efficiency and quality of your work.
• Scanning Probe Microscopes
(SPM)
• Scanning Electron Microscopes
(SEM)
• Transmission Electron
Microscopes (TEM)
• Interferometers
• Confocal Microscopes
• Profilers
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S P I P™ m o d u l e s
Get Started
- Basic, 6
Calibrate and Characterize
- Calibration, 10
- Tip Characterization, 12
Reduce Noise and Enhance Features
- Correlation Averaging, 14
- Filter, 16
- Extended Fourier Analysis, 18
Measure and Analyze
- Grain Analysis, 20
- Roughness & Hardness Analysis, 22
- Force Curve Analysis, 24
- CITS Continuous Imaging Tunneling Spectroscopy, 26
Visualize
- 3D Visualization Studio, 28
- Movie & Time Series Analysis, 30
Gain Productivity
- Batch Processor & Active Reporter, 32
Organize
- ImageMet Explorer™, 34
Customize
- Plug-in Interface, 36
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W hat our customers say
“I am pleased with the SPIP
package, especially, with the
fact that SPIP not only reads and
processes images from commercial
atomic force microscopes, but also
reads and processes images from
common white light interference
microscopes. This dramatically
increases the flexibility and wide
scale usage of SPIP.”
Louis Hector, Jr., Dr. , General Motors R&D
“I think SPIP is very user friendly
and versalite software. I´ve used
other commercial softwares also,
but the options available in SPIP are
simply immense.”
“I rely heavily on SPIP and
appreciate the support that I and
my students have received from
Image Metrology. The availablility
of the SPIP software has played
a crucial role in enabling me to
extract the kind of quantitative
information that I really want out
of my AFM images.
Harry J. Ploehn, Prof. , University of South Carolina,
Department of Chemical Engineering
“Great software - very powerful
and versatile.”
Kevin Robbie, Assistant Prof. and Canada Research
Chair in Nanostructured Materials, Queen´s University
Loveleen Kaur Brar, Indian Institute of Science
“SPIP is a good software and it is
easy to work with it.”
Bernard Desbat, Directeur de Recherche, Centre
National de la Recherche Scientifique (CNRS)
“SPIP is the standard program for
processing and presenting AFM
data in our lab since 4 years. We
appreciate that SPIP is frequently
updated and that our suggestions
and requirements were integrated
in SPIP.”
Hermann Schillers, Dr. , Westfälische WilhelmsUniversität Münster, Institute of Physiology II
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S P I P™ m o d u l e s
Basic
The Basic Module covers features that are essential
to most professionals working with microscopy. The
Basic Module is the backbone of SPIP™, and it is therefore required for any configuration of the software.
File Reading
With the Basic Module you can open all the file formats supported by SPIP™. The file formats are listed
on page 38.
You can even open files that are not directly supported by SPIP™. The Heuristic File Importer guesses
the file structure and allows you to provide additional
information about the format. This way, you will be
able to read almost any image file.
Data courtesy of Interdisciplinary Nanoscience Center (iNANO)
and Institute of Physics and Astronomy, University of Aarhus.
Data also used for cover page.
Image Processing
The Basic Module includes a wide range of image processing features. The following list shows some of the
most important features:
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Plane Correction (Flattening)
Cross-section Profile Analysis
Histogram Analysis
Fourier Transform
Auto Correlation
Cross Correlation
Gradient Images
Image Arithmetic
Color Manipulation
Contrast Enhancement
Zoom
Mirror and Rotation
Copy, Print, and Save
Area of Interest (AOI)
XY Scaling Tool
Customizable User Interface
“Sniffer” for Opening New Files Automatically
The Color Scale Editor allows you to easily define your own
surface colors which will be used in both images and histograms.
Basic
• Plane correction (flattening)
Profiling
With the profiling tools you can perform detailed
measurements interactively using multiple cursors.
The Curve Fitting tools enable you to fit a curve to
your profile and subtract it automatically. Furthermore, you can perform 1D Fourier analysis and interactively fit cone angle and radius of curvature on your
profiles.
Using the Average Profile tool you can average any
number of scan lines in your profile.
The “Multi-profiling” facilities enables detailed comparison of images by monitoring profiles at the exact
same positions while moving the cross section line.
• Cross-section profile analysis
• Histogram analysis
• Fourier transform
• Auto and cross correlation
• Image arithmetic
• Color manipulation
• Zoom, mirror, rotate, copy,
print, and save functions
• “Sniffer” for opening new files
automatically
Cone angle fitting and profile measurements by dimension
readout.
Display and fit multiple profiles in one window.
Fourier transform and wavelength detection of profile.
Fitting of multiple profiles and calculation of Mean profile.
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S P I P™ m o d u l e s
Plane Correction (Flattening)
Plane correction or flattening is one of the most important aspects of SPM image analysis, in particular,
when performing Z-calibration and Roughness Analysis.
This is due to the fact that several distortion phenomenons can be of the same or even higher magnitude
than the surface corrugations.
SPIP™ includes a set of powerful plane correction
tools that allow automated correction of plane distortions by polynomial functions and elimination of
z-offset errors for single scan lines.
The example on these pages demonstrates the plane
correction effect on a distorted image.
In the upper left image, there is significant bow and
z-offset errors which are reflected in the profile. The
histogram indicates the two levels, but they cannot
be estimated accurately.
In the corrected image on the right, the histogram
peaks are sharp and it is easy to determine the step
height precisely.
You can perform the plane correction by a single
mouse click, and it is fully supported by the Batch
Processor & Active Reporter.
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Before
Basic
After
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S P I P™ m o d u l e s
Calibration
Calibration can be a complicated affaire. By use of
the Calibration Module and calibration samples it is
done easily.
In addition, the Calibration Module enables you to
perform measurements with sub-pixel accuracy.
Vertical Calibration
Step heights can be measured very accurately and a
proper correction factor for the Z-dimension is calculated. The measurements can be based on automated
histogram analysis or the ISO 5436 standard method.
Critical Dimensions
Z-Measurement and Calibration by an ISO 5436 Based Algorithm
The philosophy behind the ISO 5436 standard is to measure
the average heights at plateaus with some distance from the
edges and thereby achieve robust results not influenced by the
edges. For line and groove structures the active measurement
areas are indicated as A, B, and C. These areas are found and
measured automatically by SPIP™.
In addition to delivering a robust step height measurement the ISO 5436 method can also deliver Critical Dimensions such as line width and side wall angles.
Lateral Calibration
The lateral calibration is done in three easy steps:
• Acquire an image by your instrument
• Load the image file into SPIP™
• Enter the reference values
Critical Dimensions
The upper and lower width are calculated together with the
sidewall slopes measured in degrees.
… and with a few mouse clicks you will have the most
accurate calculations of a comprehensive set of correction parameters, including scaling factors, the X-Y
coupling factor, and linearity parameters described
by third order polynomials.
Advanced sub-pixel Fourier and correlation algorithms ensure the highest accuracy.
You can apply the parameters for off-line correction
or transfer them to your instrument for on-line correction.
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Analysis of Entire Image
Height measurements for all horizontal cross-sections of an
image as shown can be performed automatically. This will
generate a mean step height value with a low uncertainty.
C alib r atio n
• Vertical calibration
• Lateral calibration
• Off-line or on-line correction
• Automatic measurement of critical
dimensions including step height,
width, and side wall angle
• Advanced sub-pixel Fourier and
correlation algorithms ensure the
highest accuracy
Linearity Distortion
The image shows a waffle calibration structure with the best
fitting lattice grid super imposed. A careful inspection reveals
that the grid does not fit perfectly due to linearity distortion
of the scanner. The red arrows are error vectors pointing in
the direction of the lateral distortion and their sizes indicate
the relative magnitude of the errors.
Distortion in X and Y
Distortion after Correction
The graphs show how the error relates to the position in the
image. The upper graph shows how the distortion in the x-direction relates to the x-position while the lower graph shows
the distortion for the y-direction. It is seen that the errors are
within a few pixels, but that there is a systematic behavior
which can be modeled well by third order polynomials.
These graphs show the distortion after correction on the same
scale as before. There is a significant improvement, and all
errors are now in the sub-pixel range
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S P I P™ m o d u l e s
Tip Characterization
The Tip Characterization Module allows you to characterize the tip or stylus used for scanning and to
compensate for tip shape artifacts by “Tip Deconvolution”.
The tip is the most critical part of scanning probe instruments, and knowledge about its form is essential
for any evaluation of a surface image.
The full geometry of the tip is calculated with a few
mouse clicks. The tip radius and cone angle are extracted automatically.
When combined with the 3D Visualization Studio,
the calculated tip can be shown in 3D view in 1:1:1
aspect ratio to give a correct impression of the tip
geometry.
• Calculate the full geometry of
the tip, including tip radius and
cone angle
• Compensate for tip shape
artifacts by “Tip Deconvolution”
• Algorithm based on a “Blind Tip
Reconstruction” method
• Works on most images of
surfaces containing slopes
steeper than the tip
• No precise knowledge of the
surface required
The tip characterization algorithm is based on a
”Blind Tip Reconstruction” method. Therefore, no
precise knowledge of the surface is required. The algorithm works on most images of surfaces containing
slopes steeper than the tip.
The example on the right page shows a successful calculation of the tip used for scanning and reduction of
the tip artifact by “Tip Deconvolution”.
The tip characterization algorithm has been verified
by SEM images as seen in the example images on this
page.
SEM image of an AFM Si3N4 tip used for scanning a TGT01 silicon based tip characterizer from
Mikromasch.
SEM data courtesy of the Danish Institute of Fundamental Metrology.
Tip calculated by SPIP™. Note that the shape is in
good agreement with the SEM image.
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Tip Character ization
The original image shown in 3D. The structure is a TGT01 silicon based tip characterizer from Mikromasch. Note the double
tip created artifact.
Calculated tip. The tip is shown in 1:1:1 aspect ratio to provide
the correct geometrical understanding. Note the double tip.
The reconstructed surface. Note that the double tip artifact
has been removed.
X-profile of the tip. The tip is shown in 1:1 aspect ratio to get
the correct impression of the geometry. The estimated cone
angle and tip radius are shown.
The illustrations on the right describe the imaging
process, and how the tip shape will influence the resulting image. Note how the scanning of steep slopes
reveal parts of the tip shape.
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S P I P™ m o d u l e s
Correlation Averaging
The Correlation Averaging Module allows you to enhance weak structures in repeated patterns, such
as atomic crystals, self assembled molecules, and
etched patterns.
When measuring on the nanometer scale the signalto-noise ratio is often very small. Traditional filters
cannot remove random noise without removing parts
of the real surface structure.
• Enhance weak structures in
repeated patterns
• Reduce non-correlated
noise and enhance repeated
structures at the same time
However, by the advanced Correlation Averaging
technique it is possible to reduce non-correlated
noise and enhance repeated structures at the same
time.
In the example shown on these pages, a self-assembled Didodecyl-benzene molecules from an STM
image have been averaged.
The Average Image exhibits finer details of the inner
molecular structure.
The Standard Deviation image has the lowest values
on the right side of the benzene ring reflecting the
least dynamic part of the molecule and revealing how
it is attached to the graphite substrate.
The technique can be performed by a single mouse
click, and it can be advantageous to combine it with
different types of measurements, for example stepheight and uniformity evaluations.
STM image of self-assembled Didodecyl-benzene molecules.
Model of the Didodecyl-benzene molecule.
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Co r rel atio n Ave r ag in g
Raw zoom.
Average image.
Standard deviation image.
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S P I P™ m o d u l e s
Filter
The Filter Module provides a comprehensive set of
tools for designing dedicated spatial filters. Use the
filters to eliminate noise and get robust measurements and correct representations of your images.
Examples of supported filter types:
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Low-Pass (smoothing)
High-Pass
Sharpening
Laplacian of Gaussian
ISO 11562 Gaussian
ISO 13565 Filtering of Deep Valleys
Median
Statistical Difference
Edge Enhancement (Roberts, Prewitt, Sobel)
Unsharp Masking
Outlier Filter
• Large set of tools for designing
dedicated spatial filters
• Eliminate noise and get robust
measurements and nice
presentations of your images
• Easy customization of filters
• Monitor the filtered result while
changing the filter parameters
in almost real-time
• Waviness filtering
Filters can be customized easily by a few mouse
clicks.
While modifying the filter parameters you can monitor the filtered result in almost real-time, and it is
optional to view the difference image and the filter
kernel in 3D simultaneously.
Outlier Filtering
Before
After
The image on the left contains a fiber structure suffering from contamination particles.
On the right side, an interpolation method
has been applied to change the values of the
contamination pixels, and it is seen that the
particles have been successfully “removed”
with very little or no damage to the surrounding data.
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Filte r
Filtering Directional Noise
Before
After
The image contains horizontal scanning artifacts observed as white stripes.
The median filter has successfully removed the
line artifacts.
The difference image between the original and
the filter result documents which parts of the
image have changed. It is seen that main difference is the horizontal line artifacts.
Waviness Filtering for Roughness Analysis
Raw Image
Waviness
Roughness
The example shows how an image can be separated into Waviness and Roughness images by
use of a large Gaussian Filter kernel. This is
often desirable when measuring roughness in
a specific wavelength interval.
The smoothening effect of the large filter creates the Waviness image where only the long
waves are seen.
The difference between the original image and
the Waviness image is the Roughness image
where only the short waves are seen.
It is often desirable to measure the roughness
on the roughness image rather than the raw
image, which can be dominated by the long
waves.
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S P I P™ m o d u l e s
Extended Fourier Analysis
The Fourier Analysis Module enables you to detect
and quantify repetitive patterns, such as atomic lattice structures, and to perform advanced filtering.
Fourier spectrums contain important information
about surface structures and distortion phenomena,
but they can be difficult to interpret.
By a sub-pixel Fourier algorithm SPIP™ provides accurate information about selectable Fourier peaks, including wavelengths and the corresponding frequencies in Hz. This is particularly useful for diagnosing
noise and vibration problems.
• Automatically detect and
quantify repetitive patterns
• Calculate spatial unit cells
• Perform advanced filtering
• Sub-pixel Fourier algorithm
• Edit spectrum, perform Fourier
filtering, and learn how Fourier
components correspond to
image structures
By defining a pair of Fourier peaks associated with
the reciprocal unit cell, the spatial unit cell can be
calculated automatically.
It is possible to edit the spectrum, perform Fourier
filtering and learn how Fourier components correspond to image structures.
Thus, in addition to being a strong analytical tool,
the Extended Fourier Analysis Module can bring new
understanding to the relation between the spatial domain and the Fourier domain and serve as an educational toolbox.
On this page, it is shown how to calculate different
unit cells simply by marking the corresponding peaks
in the Fourier image. SPIP™ finds the peak positions
at sub-pixel level to assure the highest accuracy and
draws the lattice structure. The image contains Ag on
Ni(111), 7 nm x 7 nm.
The example on the right page demonstrates an interactive filtering process of a Highly Oriented Pyrolytic
Graphite image where Fourier components not associated with the atomic lattice structure are removed.
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Data courtesy of Interdisciplinary Nanoscience Center (iNANO)
and Institute of Physics and Astronomy, University of Aarhus.
Data also used for cover page.
E x tended Four ier A nalysis
Raw STM image of graphite.
The filtered result is obtained by inverse Fourier transform
of the Fourier image.
In this image, three Fourier components associated with the
HOPG lattice are marked.
Fourier Image after filtering. All the unmarked Fourier
components have now been removed. Note that the mirror
points of the marked areas are preserved.
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S P I P™ m o d u l e s
Grain Analysis
The Grain Analysis Module contains powerful tools
for detecting and quantifying grains (particles) and
pores, even in situations with background waviness.
The Grain Analysis Module offers a very fast threshold method for detecting segments by their height
values. In addition, you can apply the advanced Watershed Multi Scale Segmentation for more complex
images.
The results are shown graphically, and the detected
segments can be discriminated interactively based on
their size and shape.
Numerical results include the surface coverage ratio
and more than 40 parameters quantifying the individual grains and pores, for example, the area and
perimeter.
In addition, most parameters can be presented graphically in histograms.
• Particle size distribution analysis
• Detect and quantify grains
(particles) and pores
• Fast threshold method for
detecting segments by their
height values
• The advanced Watershed Multi
Scale Segmentation for complex
images
• More than 40 parameters
quantifying the individual grains
and pores
• Parameters can be presented
graphically in histograms
• Interactive handling of detected
segments
Raw Image with Particles
Contour Image
The Segment Image
The particles are located at different height
levels which makes the detection complex.
The detected particles are indicated by contour lines in different colors.
In this image, the detected particles are filled
by high contrast colors for easy identification.
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Grain A nalysis
Results
More than 40 parameters are calculated for each segment. Results are shown in a spread sheet
style grid and in histograms.
Area histogram.
Volume histogram.
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S P I P™ m o d u l e s
Roughness Analysis
With the Roughness & Hardness Analysis Module you
can characterize images and cross section profiles by
more than 30 parameters and visualize the results by
several graphs.
If you think it takes more than simple first order statistics to describe a surface, you might choose the
built-in “Birmingham 14” parameter set.
The Fourier angular spectrum is shown in a polar plot
for an easy evaluation of the isotropy of the surface.
Likewise, a polar plot is applied to show the fractal
dimension as function of direction.
Calculation of 1D roughness parameters from image
cross sections or profilometer curves can be done in
agreement with ISO standards when combined with
the Filter Module.
In combination with the ImageMet Explorer™ it is possible to save the results automatically into the database so that you can retrieve, report and compare
results any time later.
• Validated to be consistent with
NIST calculations
• Characterize images and cross
section profiles by more than 30
parameters
• Several graphs for visualization
of results
• 2D roughness calculations
on images based on the
“Birmingham 14” parameter set
• Calculation of 1D roughness
parameters on profiles according
to ISO standards
• Measurement of Vickers,
Contact, and Indentation
hardness
By combining the Roughness Analysis Module with the
Batch Processor & Active Reporter you can save a lot
of time, analyze large series of image files, and report the results to HTML or Microsoft Word format.
Hardness Analysis
With just a single mouse click you can detect indentation marks and automatically measure Vickers, Contact, and Indentation hardness for your experiments.
Indentation Experiment
Indentations are easily detected by a single mouse click.
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Roughness & Hardness
A nalysis
Abbott Curve
Raw Image
The Abbott shows the height distribution of the surface and
is traditionally used by the automotive and similar industries.
Several roughness parameters are deduced from the Abbott
curve.
The image contains a surface of molded polymer and is dominated by a directional structure created by the original polishing process of the mold.
Roughness Chart
Isotropic Area Power Spectral Density
Different roughness parameters can be shown in a chart where
the colors indicate whether or not tolerance values are met.
You can define your own tolerances for each parameter in the
roughness chart.
In this angular average of the 2D power spectrum the rms
roughness can be directly calculated for wavelengths between
the cursors.
Angular Spectrum
Fractal Dimension
The angular spectrum is shown in a polar plot for easy evaluation of the isotropy of the surface.
The fractal dimension is calculated as a function of angle. The
result is shown in a polar plot.
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S P I P™ m o d u l e s
Force Curve Analysis
The Force Curve Analysis Module has strong tools for
analyzing, transforming and reporting force curves
and force volume images.
SPIP™ automatically detects the maximum loading
and pulling force, the point of detachment and fits
various models to the data.
In pulling experiments the Worm Like Chain Model
can be fitted to each rupture event.
SPIP™ can calculate Young’s modulus from indentation
curves using either the sphere-flat Hertz model or the
cone-flat Sneddon model.
In addition to analyzing individual curves or average
curves from force volume images SPIP™ can create adhesion maps, Young’s modulus maps, stiffness maps,
constant force maps and many more.
Results from individual force curves are shown with
statistics, which can easily be exported to other programs.
• Transformation of deflection vs.
height into force vs. separation
• Automatic event detection
• Worm Like Chain Model fit
including measurement of
unloading rate
• Young’s modulus using Hertz
and Sneddon indentation models
• Automatic fit or full user control
• Collection of results for multiple
force curves
• Batch processing of large
number of files
• Force volume image analysis
includes Young’s modulus
mapping, constant force
mapping and more
Raw Force Curve
Force vs. Separation
Recorded force curve of protein unfolding events
The raw data has been baseline and hysteresis corrected and
transformed into force vs. separation. Thereafter, the Worm
Like Chain model has been fitted.
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Force Cur ve A nalysis
Force volume image (deflection at fixed height). The crosses
represent the positions of the force curve pairs shown below.
All force curves within the box are averaged into a single pair.
Young’s modulus map created from the force volume image by
fitting the Hertz model (sphere-on-plane) to all force curves.
Multiple force curve pairs from the same force volume image.
The orange curve represents the calculated mean pair from
the box in the force volume image.
Young’s modulus calculated from a fully automatic fit using the
Hertz model (hard sphere versus soft flat) after transforming
the deflection vs. height data to force vs. separation. Note:
Separation is equivalent to negative indentation with an offset.
Data Courtesy of:
Page 24: Dr. D. A Smith, Dr. J. Clarkson, Dr. D. Brockwell, Professor S. E. Radford, Professor G. Beddard, Professor J. Trinick, Department of Physics, Biochemistry and Molecular Biology, Chemistry and Human Biology, University of Leeds, UK.
Page 25: Dr. Terry McMaster, Reader in Physics and Admissions
Tutor, H.H. Wills Physics Laboratory and IRC in Nanotechnology, Tyndall Avenue, Bristol, BS8 1TL
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S P I P™ m o d u l e s
CITS Continuous Imaging Tunneling
Spectroscopy
• Visualize and analyze CITS
volume data
The CITS Continuous Imaging Tunneling Spectroscopy
Module is used for visualization and analysis of CITS
volume data.
• Extract current images for
selected bias voltages
The CITS module enables you to visualize and handle
I/V volume data where multiple I/V curves have been
measured at different surface positions.
You can extract individual I/V curves by selecting positions in the topographic image or in the CITS volume
image.
The I/V data can be transferred into conductivity or
Density of State values.
Different current images can be selected easily by
mouse movements, and individual I/V spectroscopy
data can be extracted by clicking at the positions
where the I/V curves were obtained.
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• Extract individual I/V curves
• Average seperate curves and all
curves within selected regions
• Calculate conductivity, density
of states, and more ...
CIT S Continuous Imaging
Tu n n e l i n g S p e c t r o s c o p y
Topographic image.
Current image for a selected bias voltage. The IV curves are
averaged within each selection.
IV Curves
Density of states are calculated by a single mouse click.
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S P I P™ m o d u l e s
3D Visualization Studio
With the 3D Visualization Studio you can generate
spectacular 3D images and animations.
The 3D Visualization Studio enables you to inspect
image details by interactive rotation, positioning and
scaling of your images.
You can work interactively with the surface colors.
Use the SPIP color bar, a fixed color, or overlay the
colors from another image on your 3D surface. In addition, you can add a wireframe to enhance certain
features.
Create spectacular images and reveal otherwise hidden features by use of multiple light sources interacting with surface color properties.
By defining a set of key frames, you can easily create
impressive 3D animations. These can be exported to
AVI and MPEG files.
SPIP™ will take full advantage of 3D graphics cards,
and the intuitive mouse interface provides the feeling
of real-time control.
Data Courtesy of:
Page 28 (bottom): Diedrich Schmidt Olmstead Research Group,
University of Washington, Seattle, WA.
Page 29 (bottom): Interdisciplinary Nanoscience Center (iNANO) and Institute of Physics and Astronomy, University of Aarhus. Data also used for back cover page.
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3D Vis u aliz atio n Stu dio
• Use image overlays, wireframes,
color schemes, and interactive
light sources to enhance your 3D
visualizations
• Inspect image details by
interactive rotation, positioning,
and scaling of images
• Create impressive 3D animations in
AVI and MPEG format
• Intuitive mouse interface provides
the feeling of real-time control
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S P I P™ m o d u l e s
Movie & Time Series Analysis
The Movie & Time Series Analysis Module enables you
to combine image series into drift corrected movies
and study time dependent behavior.
Time series of images are best presented as movies,
but due to drift and long acquisition time, direct creation may cause undesired results. However, with the
Movie & Time Series Analysis Module you can achieve
drift free results.
• Study time dependent behavior
• Achieve drift free results by
SPIP™´s correction functions
• Combine different views into the
movies
• Export your movies to AVI and
MPEG
You can combine different views into the movies: Top
view image, difference image, and 3D view. The movies can be exported to AVI or MPEG including single
windows or screen dumps containing multiple views.
The screen dumps may include zooms, cross section
profiles, histograms, and cross section Fourier.
The images on the next page show four sets of STM
frames from a movie where the stability and dynamics
of Pt dimers on Pt(110)-(1×2) are studied. The frames
have been plane corrected and drift compensated in
x and y by SPIP™.
The left column shows the individual drift compensated topographic frames. The middle column shows
the difference image between the actual and the
previous frame. The profile windows show the average cross-section of 7 parallel lines and their Fourier
transform. The Fourier graphs show the most significant peaks and their calculated wave length.
Data courtesy of Interdisciplinary Nanoscience Center (iNANO)
and Institute of Physics and Astronomy, University of Aarhus.
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M ov ie and Time S er ie s A naly sis
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S P I P™ m o d u l e s
Batch Processor & Active Reporter
The Batch Processor & Active Reporter Module is the
perfect tool and time saver for analyzing large series
of data files and creating impressive reports.
Design your own processing sequences easily by
mouse clicks and apply them on hundreds of images.
There are no programming skills required.
Create customized Microsoft Word reports with full
layout control by the Active Reporter.
• The perfect tool and time saver
for analyzing large series of data
files and creating impressive
reports
• No programming skills required
• Create customized Microsoft
Word or HTML reports
• Use predefined batch sequences
for various common tasks
Generate HTML reports ready for web publication including graphical outputs, individual image results,
and statistics.
The Batch Processor & Active Reporter Module comes
with predefined batch sequences for various tasks,
such as calibration, pitch and step height measurements, roughness analysis, force curve analysis, and
printed output.
The reports shown on next page were generated by
the Batch Processor and the Active Reporter. The top
pages show the result from a roughness batch analysis. The report on the bottom of the right hand page
is a HTML reports for a batch of force curve experiments.
Create your own processing sequence from a list of available functions.
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Batch Processor & Active
Reporter
Microsoft Word roughness report.
HTML force curve report.
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S P I P™ m o d u l e s
Imagemet Explorer™
Imagemet Explorer™ is a file and data management
tool.
• Integrated database allows you
to browse quickly through your
data files
It contains an integrated database that allows you to
browse quickly through your data files and view them
as thumbnails together with numerical results.
• Important analytical results
from SPIP™ can be stored
automatically in the database
Image characteristics can be entered to the database
from where they can be retrieved on the fly while
browsing your files.
• Enter descriptions, assign
categories, and create
hyperlinks to individual files
Important analytical results from SPIP™ can be automatically stored in the database for easy retrieval of
results.
You have the flexibility to enter descriptions, assign
categories, and create hyperlinks to individual files.
ImageMet Explorer™ automatically recognizes all the
file formats supported by SPIP™ and displays them as
thumbnails of optional size.
Three Programs in One
ImageMet Explorer™ integrates three sub-programs
sharing the common database:
ImageMet Browser
Manage and browse your files with thumbnail view
and send images to the SPIP™ main program.
ImageMet Finder
Search the database for files with certain characteristics or numerical results within defined ranges.
ImageMet Reporter
Create image lists in HTML format containing optional
characteristics stored in the data base.
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I m a g e M e t E x p l o r e r™
ImageMet Browser.
ImageMet Finder.
ImageMet Reporter.
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S P I P™ m o d u l e s
Plug-in Interface
The Plug-in Interface Module is included free of
charge with Basic Module. It allows you to program
your own plug-in programs for SPIP™.
In case you want to perform some dedicated analysis, you can use the Plug-in Interface library to create
your own code and interface it to SPIP™.
You will get all the advantages of the SPIP™ processing features, including file handling and visualization
tools while you concentrate on your own specialized
data processing and data creation functions.
// Variables that will keep track of the averaging data
CSpipExchange *AverageData = NULL;
int AverageCnt = 0;
IM _ PWIN AverageWindow = NULL;
//---------------------------------------------------------extern ”C” _ declspec(dllexport)
int Average()
// Read the data of the current data window and include it
// in the average calculation then show the result in the
// AverageWindow.
// To perform multiple averages the user clicks on
// <User Prog->Average Functions->Average> for each window
// to be included.
// After the first average calculation the function can
// conveniently be repeated for other windows by clicking
// Shift+Ctrl+Y
The plug-ins can invoke predefined batch processes
and may integrate with automated acquisition systems.
{
CSpipExchange WindowData;
if (!WindowData.Get _ ImageData())
{::AfxMessageBox(”No data in window”,MB _ OK,NULL); return
0;}
if (!AverageData){
AverageData = new CSpipExchange;
if (!AverageData>Create _ ImageData(WindowData.SizeX,WindowData.SizeY))
{::AfxMessageBox(”No Average Data Created”,MB _ OK,NULL);
return 0;}
for (int i=0;i<AverageData->SizeTotal; i++)
AverageData->Data[i] = WindowData.Data[i];
AverageCnt = 1;
}
else {
if (AverageData->SizeX != WindowData.SizeX ||
AverageData->SizeY != WindowData.SizeY )
{::AfxMessageBox(”Data is not of same form”,MB _ OK,NULL);
return 0;}for (int i=0;i<AverageData->SizeTotal; i++)
AverageData->Data[i] = (AverageData->Data[i]*AverageCnt +
+ WindowData.Data[i])/(AverageCnt+1);
AverageCnt++;
}
char Caption[30];
sprintf(Caption, ”Average %d”, AverageCnt );
AverageData->Put _ Filename( Caption );
AverageData->Show _ ImageData(&AverageWindow, Caption,0);
return true;
}
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Plu g-in Inter face
• Code your own plug-in programs
for SPIP™
• Invoke predefined batch
processes
• Integrate with automated
acquisition systems
• Built-in wizards for Visual Basic
and C++ projects
Create Your Own Dialogs
You can create your own dialogs to control your
plug-ins. In this case the user implemented a
tab dialog with various features for creating
artificial images.
+
=
Image Stitching
With this plug-in the user added the ability to
stich two images into one image.
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Supp or ted File For mat s
SPIP™ is unmatched when it comes to supporting different file formats. We are very eager to maintain this
leadership.
Therefore, we offer to implement generally used
file formats for FREE, if they are sufficiently documented.
File formats not yet implemented in SPIP™ may be
imported by the built-in Heuristic File Importer.
You will find an up-to-date list of supported file formats at www.imagemet.com.
SPIP™ currently supports file formats from these instrument manufacturers:
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A.P.E. Research
Aarhus University
ADE Phase Shift
Agilent Technologies
Ambios Technology
Anfatec
Asylum Research
ATOS GmbH
Dektak
Digital Instruments
Digital Surf
DME Danish Micro Engineering
EXFO Burleigh
FOGALE nanotech
GFMesstechnik
Hitachi Kenki FineTech
Hysitron, Inc.
IBM
JEOL
JPK Instruments
KLA-Tencor
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Molecular Imaging
MTS Nano Instruments
NanoFocus
NanoMagnetics
Nanonics Imaging
Nanonis
Nanosurf
Nanotec Electronica
NT-MDT
Omicron NanoTechnology
Oxford Instruments
Pacific Nanotechnology
Park Scientific
Park Systems
PSIA Corporation
Quesant Instrument
RHK Technology
Sensofar
Shimadzu Corporation
SII Nano Technology
SNU Precision
• Surface Imaging Systems (S.I.S.)
• Taylor Hobson
• ThermoMicroscope
• TopoMetrix
• Toray Engineering
• Unisoku
• Veeco Instruments
• VTS-CreaTec
• Wyko
• Zygo Corporation
and more ...
SPIP™ supports these
generic file formats:
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ASCII
BCR
Bitmap
JPEG
SDF
TIFF
D o w n l o a d Fr e e Ev a l u a t i o n
Ve r s i o n
Please visit our website and download a free evaluation version of SPIP™:
www.imagemet.com/download
Free Support and Software Updates
Requirements
One year of free support and software updates are
included with every SPIP™ license. The software also
comes with on-line help and a printed manual. The
SPIP™ Online pane in SPIP brings you more than 30
video tutorials on SPIP™.
SPIP™ will run on most standard PCs running Windows
NT/2000/XP/2003/Vista.
Our experienced Customer Service and Technical
Support team is available to answer any queries you
may have. We speak English, German, Japanese, and
Danish.
CPU Speed:
Memory:
Graphics Card:
However, we recommend the following minimum
configuration:
Hard Disk:
1 GHz
1 GB
3D accelerated,
1024x768 pixels resolution
100 MB free
Network Installation
With more users in the same group, you can obtain
extensive multi-user discounts on your SPIP™ license.
In addition, you can install a multi user license as a
client/server solution. This makes is easy to maintain
the license, as most updates only have to be installed
on the server.
In order to generate reports using Microsoft Word in the
Batch Processor & Active Reporter Module you need
to have Word 2000 or later installed.
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SPIP™ modules:
• Basic Module with Plug-In Interface
• Calibration
• Tip Characterization
• Correlation Averaging
• Filter
• Extended Fourier Analysis
• Grain Analysis
• Roughness & Hardness Analysis
• Force Curve Analysis
• CITS Continuous Imaging Tunneling Spectroscopy
• 3D Visualization Studio
• Movie & Time Series Analysis
• Batch Processing
• Imagemet Explorer
www.imagemet.com