IT Report---960719

Transcription

IT Report---960719

CERTIFICATE
Issued Date: May. 28, 2007
Report No.: 074L146-ITCEP11V04
This is to certify that the following designated product
Product
: Notebook
Trade Name
: MSI
Model Number : MS-16342
Company Name : MICRO-STAR INT’L Co., LTD.
This product, which has been issued the test report listed as above in QuieTek
Laboratory, is based on a single evaluation of one sample and confirmed to
comply with the requirements of the following EMC standard.
EN 55022: 1998+A1: 2000+A2: 2003
EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2: 2000
IEC 61000-4-2 Edition 1.2: 2001-04
EN 61000-3-3: 1995 + A1: 2001
IEC 61000-4-3: 2002+A1: 2002
IEC 61000-4-4: 2004
IEC 61000-4-5 Edition 1.1: 2001-04
IEC 61000-4-6 Edition 2.1: 2004-11
IEC 61000-4-8 Edition 1.1: 2001-03
IEC 61000-4-11 Second Edition: 2004-03
AS/NZS CISPR 22: 2004
TEST LABORATORY
Gene Chang / President
No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:service@quietek.com http://www.quietek.com
Test Report
Product Name ： Notebook
： MS-16342
Model No.
Applicant ： MICRO-STAR INT’L Co., LTD.
Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien,
Taiwan, R.O.C.
Date of Receipt ： 2007/04/24
Issued Date
： 2007/05/28
Report No.
： 074L146-ITCEP11V04
The test results relate only to the samples tested.
The test results shown in the test report are traceable to the national/international standard through the calibration
of the equipment and evaluated measurement uncertainty herein.
This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Declaration of Conformity
The following product is herewith confirmed to comply with the requirements set out in the
Council Directive on the Approximation of the laws of the Member States relating to
Electromagnetic Compatibility Directive (2004/108/EC). The listed standards as below were
applied:
The following Equipment:
Product
: Notebook
Trade Name
: MSI
Model Number
: MS-16342
This product is herewith confirmed to comply with the requirements set out in the
Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding
EMC, the following standards were applied:
RFI Emission:
EN 55022:1998+A1: 2000+A2: 2003 Class B
: Product family standard
EN 61000-3-2:2000 Class D
: Limits for harmonic current emission
EN 61000-3-3:1995+A1: 2001
: Limitation of voltage fluctuation and flicker
in low-voltage supply system
Immunity:
EN 55024:1998+A1:2001+A2:2003
The following importer/manufacturer is responsible for this declaration:
Company Name
:
Company Address :
Telephone
:
Facsimile :
Person is responsible for marking this declaration:
Name (Full Name)
Position/ Title
Date
Legal Signature
QTK No.: 074L146-ITCEP11V04
Statement of Conformity
This certifies that the following designated product:
Product
: Notebook
Trade Name
: MSI
Model Number
: MS-16342
Company Name
: MICRO-STAR INT’L Co., LTD.
This product is herewith confirmed to comply with the requirements set out in the
Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding
EMC, the following standards were applied:
RFI Emission:
EN 55022:1998+A1: 2000+A2: 2003 Class B
EN 61000-3-2:2000 Class D
: Limits for harmonic current emission
EN 61000-3-3:1995+A1: 2001
: Limitation of voltage fluctuation and flicker
in low-voltage supply system
Immunity:
EN 55024:1998+A1:2001+A2:2003
TEST LABORATORY
0914
Gene Chang / President
The verification is based on a single evaluation of one sample of above-mentioned products. It does
not imply an assessment of the whole production and does not permit the use of the test lab. Logo.
QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com
Report No： 074L146-ITCEP11V04
Test Report Certification
Issued Date
Report No.
: 2007/05/28
: 074L146-ITCEP11V04
Product Name
:
Notebook
Applicant
:
MICRO-STAR INT’L Co., LTD.
Address
:
No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.
Manufacturer
:
MICRO-STAR INT’L Co., LTD.
Model No.
:
MS-16342
Rated Voltage
:
AC 230 V / 50 Hz
EUT Voltage
:
AC 100-240V, 50/60Hz
Trade Name
:
MSI
Applicable Standard
:
EN 55022: 1998+A1: 2000+A2: 2003 Class B
EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2:2000, EN 61000-3-3:1995+A1: 2001
Test Result
:
Complied
Performed Location
:
Quietek Corporation (Linkou Laboratory)
No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang,
Taipei, 244 Taiwan, R.O.C.
TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789
Documented By
:
(
Reviewed By
Senior Engineering Adm.
Specialist / Anita Chou )
:
(
Approved By
Engineer / Ken Chiu
)
:
(
President / Gene Chang
Page: 2 of 141
)
Laboratory Information
We , QuieTek Corporation, are an independent EMC and safety consultancy that was
established the whole facility in our laboratories. The test facility has been accredited by the
following accreditation Bodies in compliance with ISO 17025, EN 45001 and Guide 25:
Taiwan R.O.C.
:
BSMI, DGT, CNLA
Germany
:
TUV Rheinland
Norway
:
Nemko, DNV
USA
:
FCC, NVLAP
Japan
:
VCCI
The related certificate for our laboratories about the test site and management system can be downloaded
from QuieTek Corporation’s Web Site : http://tw.quietek.com/modules/myalbum/
The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site :
http://www.quietek.com/
If you have any comments, Please don’t hesitate to contact us. Our contact information is as below:
HsinChu Testing Laboratory :
No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307,
Taiwan, R.O.C.
TEL:+886-3-592-8858 / FAX:+886-3-592-8859
E-Mail : service@quietek.com
1313
LinKou Testing Laboratory :
No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C.
TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789
E-Mail : service@quietek.com
0914
Page: 3 of 141
TABLE OF CONTENTS
Description
Page
1. General Information .................................................................................................... 7
1.1. EUT Description ...................................................................................................... 7
1.2. Mode of Operation ................................................................................................ 10
1.3. Tested System Details........................................................................................... 14
1.4. Configuration of Tested System ............................................................................ 15
1.5. EUT Exercise Software ......................................................................................... 16
2. Technical Test ........................................................................................................... 17
2.1. Summary of Test Result ........................................................................................ 17
2.2. List of Test Equipment ........................................................................................... 18
2.3. Measurement Uncertainty ..................................................................................... 21
2.4. Test Environment .................................................................................................. 23
3. Conducted Emission (Main Terminals)...................................................................... 25
3.1. Test Specification .................................................................................................. 25
3.2. Test Setup ............................................................................................................. 25
3.3. Limit....................................................................................................................... 25
3.4. Test Procedure ...................................................................................................... 26
3.5. Deviation from Test Standard ................................................................................ 26
3.6. Test Result ............................................................................................................ 27
3.7. Test Photograph .................................................................................................... 39
4. Conducted Emissions (Telecommunication Ports).................................................... 41
4.2. Test Setup ............................................................................................................. 41
4.3. Limit....................................................................................................................... 41
4.4. Test Procedure ...................................................................................................... 42
4.6. Test Result ............................................................................................................ 43
4.7. Test Photograph .................................................................................................... 73
5. Radiated Emission.................................................................................................... 79
5.2. Test Setup ............................................................................................................. 79
5.3. Limit....................................................................................................................... 79
5.4. Test Procedure ...................................................................................................... 80
5.6. Test Result ............................................................................................................ 81
5.7. Test Photograph .................................................................................................... 85
6. Harmonic Current Emission ...................................................................................... 87
Page: 4 of 141
6.2. Test Setup ............................................................................................................. 87
6.3. Limit....................................................................................................................... 87
6.4. Test Procedure ...................................................................................................... 89
6.6. Test Result ............................................................................................................ 90
6.7. Test Photograph .................................................................................................... 94
7. Voltage Fluctuation and Flicker ................................................................................. 95
7.2. Test Setup ............................................................................................................. 95
7.3. Limit....................................................................................................................... 95
7.4. Test Procedure ...................................................................................................... 96
7.6. Test Result ............................................................................................................ 97
7.7. Test Photograph .................................................................................................... 99
8. Electrostatic Discharge ........................................................................................... 100
8.1. Test Specification ................................................................................................ 100
8.2. Test Setup ........................................................................................................... 100
8.3. Limit..................................................................................................................... 100
8.4. Test Procedure .................................................................................................... 101
8.5. Deviation from Test Standard .............................................................................. 101
8.6. Test Result .......................................................................................................... 102
8.7. Test Photograph .................................................................................................. 104
9. Radiated Susceptibility ........................................................................................... 105
9.1. Test Specification ................................................................................................ 105
9.2. Test Setup ........................................................................................................... 105
9.3. Limit..................................................................................................................... 105
9.4. Test Procedure .................................................................................................... 106
9.5. Deviation from Test Standard .............................................................................. 106
9.6. Test Result .......................................................................................................... 107
9.7. Test Photograph .................................................................................................. 109
10.
Electrical Fast Transient/Burst............................................................................. 110
10.1.
Test Specification ............................................................................................. 110
10.2.
Test Setup........................................................................................................ 110
10.3.
Limit ................................................................................................................. 110
10.4.
Test Procedure .................................................................................................111
10.5.
Deviation from Test Standard............................................................................111
10.6.
Test Result....................................................................................................... 112
Page: 5 of 141
10.7.
Test Photograph .............................................................................................. 114
11.
Surge................................................................................................................... 116
11.1.
11.2.
Test Setup........................................................................................................ 116
11.3.
Limit ................................................................................................................. 116
11.4.
Test Procedure ................................................................................................ 117
11.5.
Deviation from Test Standard........................................................................... 117
11.6.
Test Result....................................................................................................... 118
11.7.
Test Photograph .............................................................................................. 120
12.
Conducted Susceptibility ..................................................................................... 121
12.1.
12.2.
Test Setup........................................................................................................ 121
12.3.
Limit ................................................................................................................. 122
12.4.
Test Procedure ................................................................................................ 122
12.5.
12.6.
Test Result....................................................................................................... 123
12.7.
Test Photograph .............................................................................................. 125
13.
Power Frequency Magnetic Field ........................................................................ 127
13.1.
13.2.
Test Setup........................................................................................................ 127
13.3.
Limit ................................................................................................................. 127
13.4.
Test Procedure ................................................................................................ 127
13.5.
13.6.
Test Result....................................................................................................... 128
13.7.
Test Photograph .............................................................................................. 130
14.
Voltage Dips and Interruption .............................................................................. 131
14.1.
14.2.
Test Setup........................................................................................................ 131
14.3.
Limit ................................................................................................................. 131
14.4.
Test Procedure ................................................................................................ 132
14.5.
14.6.
Test Result....................................................................................................... 133
14.7.
Test Photograph .............................................................................................. 135
Attachment..................................................................................................................... 136
EUT Photograph.................................................................................................. 136
Page: 6 of 141
1. General Information
1.1. EUT Description
Product Name
Trade Name
Model No.
Notebook
MSI
MS-16342
Keypart List
Item
Vendor
AMD
AMD
AMD
CPU
HDD
AMD
Vendor P/N
Description
SMS3200HAX4CM
AMD SMS3200 1.6GHz SEMPRON 25W 3200+ 512KB L2
SMS3400HAX3CM
SMS3500HAX4CM
SMD3800HAX3CH
(S1 SOCKET)
(S1 SOCKET)
(S1 SOCKET)
(S1 SOCEKET)
AMD
TMDTL50HAX4CT
AMD TL50 1.6GHz TURION64-31W 256KB L2 (S1 SOCKET)
AMD
TMDTL52HAX5CT
AMD
TMDTL56HAX5CT
AMD
TMDTL60HAX5CT
AMD
TMDTL64HAX5CT
AMD TL64 2.2GHz TURION64-35W 1MB L2
Fujitsu
MHV2040BH (RoHS)
40G
Toshiba
MK4032GSX (RoHS)
40G
FUJITSU
MHW2040BH
40GB
TOSHIBA
MK4034GSH
40GB
Hitachi
HTS541040G9SA00
(RoHS)
40G
Fujitsu
MHV2060BH (RoHS)
60G
Toshiba
MK6034GSX (RoHS)
60G
Hitachi
HTS541060G9SA00
(RoHS)
60G
FUJITSU
MHW2060BH
60GB
Fujitsu
MHV2080BH (RoHS)
80G
Toshiba
MK8032GSX (RoHS)
80G
Hitachi
HTS541080G9SA00
(RoHS)
80G
FUJITSU
MHW2080BH
80GB
WD
WDC800BEVS-22RSTO
80GB
TOSHIBA
MK8034GSX
80GB
Fujitsu
MHV2100BH (RoHS)
100G
Toshiba
MK1032GSX (RoHS)
100G
Hitachi
HTS541010G9SA00
(RoHS)
100G
FUJITSU
MHW2100BH
100GB
TOSHIBA
MK1034GSH
100GB
Toshiba
MK1234GSX (RoHS)
120G
Fujitsu
MHV2120BH (RoHS)
120G
FUJITSU
MHW2120BH
120GB
WD
WD1200BEVS
120GB
WD
WDC1600BEVS-22RSTO 160GB
Page: 7 of 141
(S1 SOCKET)
ODD
DIMM
TOSHIBA
MK1637GSX
160GB
HLDS
GCC-4244N
DVD Combo
Lite On
SSC-2485K
DVD Combo
PHILIPS
SCB5265
DVD Combo
HLDS
GWA-4082N
DVD Dual
Lite On
SSW-8015S
DVD Dual
PHILIPS
SDVD8441
DVD Dual
HLDS
GMA-4082N
Super multi
HLDS
GSA-T10N
Super multi
PHILIPS
SDVD8821
Super multi
HLDS
GMA-4084N
Light Scribe
HLDS
GCC-T10N
Combo
HLDS
GSA-T20N
Super Multi
Transcend (Samsung)
TS64MSQ64V5J
DDRII 533 512MB
Transcend (Hynix 32x16)
TS64MSQ64V5J
DDRII 533 512MB
Transcend (Elpida wBGA) TS64MSQ64V5J
DDRII 533 512MB
Apacer (Elpida wBGA)
78.92G51.421
DDRII 533 512MB
Nanya
NT512T64VH8A1FN-37B
DDRII 533 512MB
Apacer (Hynix)
78.92G51.AF1
DDRII 533 512MB
DDRII 667 512MB
Transcend (Samsung)
DDRII 667 512MB
TS64MSQ64V6J
A-DATA (A-DATA)
ADOPE1908342
DDRII 667 512MB
A-DATA (Elpida)
ELOPE190834Z
DDRII 667 512MB
78.92G63.421
DDRII 667 512MB
TS64MSQ64V6M
DDRII 667 512MB
TS64MSQ64V6J
DDRII 667 512MB
Apacer (Hynix)
78.92G63.AF2
DDRII 667 512MB
Nanya
NT512T64UH8A1FN-3C
DDRII 667 512MB
Transcend (Micron)
TS64MSQ64V6J
DDRII 667 512MB
78.02G51.423
DDRII 533 1GB
Transcend (Samsung)
TS128MSQ64V5J
DDRII 533 1GB
DDRII 667 1GB
78.02G63.423
DDRII 667 1GB
Transcend (Samsung)
TS128MSQ64V6J
DDRII 667 1GB
A-DATA (A-DATA)
ADOPE1A16332
DDRII 667 1GB
Apacer (Hynix)
78.02G63.AF3
DDRII 667 1GB
Nanya
NT1GT64U8HA0BN-3C
DDRII 667 1GB
Transcend
TS256MSQ64V5N
DDRII 533 2GB
Transcend
TS256MSQ64V6N
DDRII 667 2GB
BISON
BN30M4SD11300_V1.0
ACME
901-0001-11
Agere systems Inc
Athens AM2
Lite-on Technology Corp.
PA-1900-04
Camera
MDC
AC-Adapter
DDRII 533 1GB
1.3M Pixels/BISON/BN30M4SD11300_V1.0
OPTICAL MODULE/CMOS CAMERA MODULE/
1.3M Pixels/ACME/901-0001-11
MODEM/QCOM/MA560-3 01*./MDC1.5 FORM FACTOR V.92
DUAL MODE MODEM CARD/MS-16332,RoHS COMPLIANCE
POWER SUPPLY ADAPTOR/90W/90-264Vin/
4.74A/19Vout/LITEON/PA-1900-04RM, R33275
Li Shin International
LSE0202C1990
Enterprise Corp.
OPTICAL MODULE/CMOS CAMERA MOUDLE/
POWER SUPPLY ADAPTOR/90W/90-264Vin/
4.74A/19Vout/LI SHIN/LSE0202C1990, R43011
Page: 8 of 141
Wireless LAN Atheros
Bluetooth
Battery
Touch Pad
RC6 Module
TV-tuner
Inverter
AR5BXB63
WIRELESS, TWINHAN /AW-GE780, WLAN,802.11b/g, MINI-PCI
MSI
MS-6837D
TOSHIBA software (for vista)
welltop
BTY-M65
Celxpert Energy Corp.
CBPIL44
CBPIL44
CBPIL72
MSI
BTY-M66
SYNAPTICS
TM61PDZG307
Elantech
810701-1503
Formsa
SYS, BATTERYPACK, LITHIUM-ION, WELLTOP/
GMS-BMS161ABA00-G, SONY/3.7V/2400mAh, 6CELLS/
3S2P, 11.1V, 4800mAh, 18650, BLACK
SYS, BATTERY PACK, LITHIUM-ION, CELXPERT/
91NMSBMLD4SU1,SAMSUNG/3.7V/2200mAh, 6CELLS/
3S2P, 11.1V, 4400mAh, 18650,BLACK
90NITLILD4SU2, SAMSUNG SDI/3.7V/2200mAh,
6CELLS/3S2P, 11.1V, 4400mAh, 18650, BLACK
90NITLILG2SU2, SAMSUNG SDI/3.7V/2400mAh, 9CELLS/3S3P,
11.1V, 7200mAh, 18650, BLACK
,SYS,BATTERY PACK,LITHIUM-ION,WELLTOP/
GMS-BMS161ABA00-G,SONY/3.7V/2400mAh,6CELLS/3S2P,11.
1V,4800mAh,18650,BLACK
NOTEBOOK TOUCHPAD
MODULE/ELANTECH/810701-1503/75.04*43.82mm
--
捷超(PRO-NETS)
HM100E
捷超(PRO-NETS)
DM100A
SYNAPTICS/TM61PDZG307/76.9mm*44.6mm
IR MODULE/FORMOSA/MB603-860/USB PORT
Hybrid DVB-T Mini card
Digital DVB-T Mini card
SYS/MODULE/INVERTER/SUMIDA/IV14080/T-LF/DC-AC
Sumida
IV14080/T-LF
Sumida
IV14080/T-LF
SUMIDA/IV14080/T-LF/DC-AC INVERTER
SAMPO
YIVNMS0018D11
SAMPO/YIVNMS0018D11
Samsung
LTN154X3-L01
INVERTER/O2MICRO IC,RoHS(EU EXEMPTION)
,SYS DISPLAY MODULE,15.4 inch,WXGA,1280x800,
ANTI-GLARE,SAMSUNG/LTN154X3-L01,CCFL,,RoHS
COMPLIANCE
LCD
AU
B154EW01 V1
SYS DISPLAY MODULE,15.4 inch,WXGA,1280x800,
GLARE,AU/B154EW01 V9,CCFL,,RoHS COMPLIANCE
Page: 9 of 141
1.2. Mode of Operation
QuieTek has verified the construction and function in typical operation. All the test modes were
carried out with the EUT in normal operation, which was shown in this test report and defined as:
Pre-Test Mode
Mode 1
Mode 2
Mode 8
Mode 9
Mode 15
Mode 16
Mode 22
Mode 23
Mode 3
Mode 10
Mode 17
Mode 24
Mode 4
Mode 11
Mode 18
Mode 25
Mode 5
Mode 12
Mode 19
Mode 26
Mode 6
Mode 13
Mode 20
Mode 27
Mode 7
Mode 14
Mode 21
Final Test Mode
Emission
Immunity
Mode 1
Mode 2
Mode 1
Mode 2
CPU
LCD
HDD
ODD
MODE 1
AMD SMS 3200 1.6G
Samsung-LTN154X3-L01
WD-120GB
HLDS-GSA-T20N
RAM
Transcend-DDR2 667 512MB*2 Transcend-DDR2 667 2G*2
BATTERY
AC-ADAPTER
TOUCH PAD
MDC MODEM
WLAN
BLUETOOTH
CAMERA
INVENTER
TV-TUNER
Celxpert-9 cells 7200mAh
LITEON-PA-1900-04
SYNAPTICS-TM61PDZG307
Qcomm-ma560-3
Atheros / AR5BXB63
MSI-MS-6837D
ACME-901-0001-11
Sumida-IV14080/T-LF
PRO-NETS-DM100A
LCD+CRT 1280*800 60Hz
WELLTOP-6 cells 4800mAh
LI SHIN-LSE0202C1990
ELANTECH-810701-1503
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
Bison-BN30M4SD11300_V1.0
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
LCD+HDMI 1280*800 60Hz
MODE 4
AMD SMS 3800 2.2G
Fujitsu-40GB
HLDS-GWA-4082N
MODE 5
AMD TL60 2.0G
AU-B154EW01
Fujitsu-80GB
HLDS-GMA-4082N
CPU
LCD
HDD
ODD
RAM
BATTERY
AC-ADAPTER
TOUCH PAD
MDC MODEM
WLAN
BLUETOOTH
CAMERA
INVENTER
TV-TUNER
MODE 2
AMD TL64 2.2G
AU-B154EW01
TOSHIBA-160GB
HLDS-GSA-T20N
MODE 3
AMD SMS 3400 1.6G
WD-160GB
HLDS-GCC-4244N
Transcend DDR2 533
1GB+Apacer DDR2 533 1GB
LITEON-PA-1900-04
Qcomm-ma560-3
Atheros / AR5BXB63
MSI-MS-6837D
ACME-901-0001-11
Sumida-IV14080
PRO-NETS-HM100E
CRT+HDMI 1027*768 60Hz
MODE 6
AMD TL50 1.6G
FUJITSU-100GB
Lite On-gsw-8015S
Transcend DDR2 533
Transcend-DDR2 533 512MB*2 Apacer-DDR2 533 512MB*2
512MB+Nanya DDR2 533 512mB
LITEON-PA-1900-04
LITEON-PA-1900-04
Qcomm-ma560-3
Qcomm-ma560-4
Qcomm-ma560-3
Atheros / AR5BXB63
Atheros / AR5BXB63
Atheros / AR5BXB63
MSI-MS-6837D
MSI-MS-6837D
MSI-MS-6837D
ACME-901-0001-11
Bison-BN30M4SD11300_V1.0 ACME-901-0001-11
Sumida-IV14080/T-LF
SAMPO-YIVNMS0018D11
Sumida-IV14080
PRO-NETS-DM100A
PRO-NETS-HM100E
PRO-NETS-HM100E
LCD+CRT 1024*768 60Hz
LCD+S-VIDEO 1280*800 60Hz LCD+HDMI 800*600 60Hz
Page: 10 of 141
CPU
LCD
HDD
ODD
RAM
BATTERY
AC-ADAPTER
TOUCH PAD
MDC MODEM
WLAN
BLUETOOTH
CAMERA
INVENTER
TV-TUNER
CPU
LCD
HDD
ODD
RAM
BATTERY
AC-ADAPTER
TOUCH PAD
MDC MODEM
WLAN
BLUETOOTH
CAMERA
INVENTER
TV-TUNER
CPU
LCD
HDD
ODD
RAM
BATTERY
AC-ADAPTER
TOUCH PAD
MDC MODEM
WLAN
BLUETOOTH
CAMERA
INVENTER
TV-TUNER
MODE 7
AMD SMS3500 1.8G
AU-B154EW01
HITACHI-80GB
PHILIPS-SCB5265
Transcend-DDR2 667 512MB*2
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
CRT+S-VIDEO 800*600 60Hz
MODE 8
AMD TL56 1.8G
Fujitsu-120GB
HLDS-GCC-T10N
A-DATA DDR2 667 1GB*2
LITEON-PA-1900-04
Qcomm-ma560-3
Atheros / AR5BXB63
MSI-MS-6837D
ACME-901-0001-11
Sumida-IV14080/T-LF
PRO-NETS-DM100A
MODE 9
AMD TL52 1.6G
AU-B154EW01
FUJITSU-120GB
PHILIPS-SDVD8441
A-DATA DDR2 667 512MB*2
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
LCD+CRT 1024*768 60Hz
MODE 10
AMD SMS 3200 1.6G
Toshiba-40GB
LiteON-SSC-2485K
MODE 11
MODE 12
AMD TL64 2.2G
AMD SMS 3400 1.6G
AU-B154EW01
FUJITSU-40GB
TOSHIBA-100GB
HLDS-GSA-T10N
PHILIPS-SDVD8821
Apacer DDR2 667 512MB+Nanya
Transcend DDR2 667 1GB*2
Transcend-DDR2 667 512MB*2
DDR2 667 512MB
LITEON-PA-1900-04
LITEON-PA-1900-04
Qcomm-ma560-3
Qcomm-ma560-4
Qcomm-ma560-3
Atheros / AR5BXB63
Atheros / AR5BXB63
Atheros / AR5BXB63
MSI-MS-6837D
MSI-MS-6837D
MSI-MS-6837D
ACME-901-0001-11
ACME-901-0001-11
Sumida-IV14080/T-LF
SAMPO-YIVNMS0018D11
Sumida-IV14080
PRO-NETS-DM100A
PRO-NETS-HM100E
PRO-NETS-HM100E
LCD+CRT 1024*768 60Hz
MODE 13
AMD SMS 3800 2.2G
Hitachi-40GB
HLDS-GMA-4084N
Transcend-DDR2 533 1GB
LITEON-PA-1900-04
Qcomm-ma560-3
Atheros / AR5BXB63
MSI-MS-6837D
ACME-901-0001-11
Sumida-IV14080/T-LF
PRO-NETS-DM100A
LCD+CRT 1024*768 60Hz
MODE 14
AMD TL60 2.0G
AU-B154EW01
TOSHIBA-80GB
HLDS-GSA-T20N
Apacer-DDR2 667 1GB
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
LCD+S-VIDEO 1280*800 60Hz
Page: 11 of 141
MODE 15
AMD TL50 1.6G
Toshiba-120GB
HLDS-GSA-T20N
Apacer-DDR2 667 512MB
LITEON-PA-1900-04
Qcomm-ma560-3
Atheros / AR5BXB63
MSI-MS-6837D
ACME-901-0001-11
Sumida-IV14080
PRO-NETS-HM100E
CPU
LCD
HDD
ODD
RAM
BATTERY
AC-ADAPTER
TOUCH PAD
MDC MODEM
WLAN
BLUETOOTH
CAMERA
INVENTER
TV-TUNER
MODE 16
AMD SMS3500 1.8G
AU-B154EW01
TOSHIBA-40GB
HLDS-GCC-4244N
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
MODE 17
AMD TL56 1.8G
Fujitsu-60GB
HLDS-GWA-4082N
Apacer DDR2 667 1GB
LITEON-PA-1900-04
Qcomm-ma560-3
Atheros / AR5BXB63
MSI-MS-6837D
ACME-901-0001-11
Sumida-IV14080/T-LF
PRO-NETS-DM100A
MODE 18
AMD TL52 1.6G
AU-B154EW01
Toshiba-60GB
PHILPS-SDVD8441
Nanya DDR2 667 1GB
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
CPU
LCD
HDD
ODD
RAM
BATTERY
AC-ADAPTER
TOUCH PAD
MDC MODEM
WLAN
BLUETOOTH
CAMERA
INVENTER
TV-TUNER
MODE 19
AMD SMS3500 1.8G
AU-B154EW01
Hitachi-100GB
HLDS-GCC-4244N
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
MODE 20
AMD SMS3500 1.8G
FUJITSU-60GB
HLDS-GWA-4082N
Apacer DDR2 667 1GB
LITEON-PA-1900-04
Qcomm-ma560-3
Atheros / AR5BXB63
MSI-MS-6837D
ACME-901-0001-11
Sumida-IV14080/T-LF
PRO-NETS-DM100A
MODE 21
AMD TL52 1.6G
AU-B154EW01
Toshiba-100GB
PHILPS-SDVD8441
Nanya DDR2 667 1GB
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
CPU
LCD
HDD
ODD
RAM
BATTERY
AC-ADAPTER
TOUCH PAD
MDC MODEM
WLAN
BLUETOOTH
CAMERA
INVENTER
TV-TUNER
MODE 22
AMD SMS3500 1.8G
AU-B154EW01
Hitachi-60GB
HLDS-GCC-4244N
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
MODE 23
AMD TL56 1.8G
FUJITSU-80GB
HLDS-GWA-4082N
Apacer DDR2 667 1GB
LITEON-PA-1900-04
Qcomm-ma560-3
Atheros / AR5BXB63
MSI-MS-6837D
ACME-901-0001-11
Sumida-IV14080/T-LF
PRO-NETS-DM100A
LCD+CRT 1024*768 60Hz
MODE 24
AMD TL52 1.6G
AU-B154EW01
Toshiba-80GB
PHILPS-SDVD8441
Nanya DDR2 667 1GB
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
Page: 12 of 141
CPU
LCD
HDD
ODD
RAM
BATTERY
AC-ADAPTER
TOUCH PAD
MDC MODEM
WLAN
BLUETOOTH
CAMERA
INVENTER
TV-TUNER
MODE 25
AMD SMS3500 1.8G
AU-B154EW01
Hitachi-80GB
HLDS-GCC-4244N
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
LCD+CRT 800*600 60Hz
MODE 26
AMD TL56 1.8G
WD-80GB
HLDS-GWA-4082N
Apacer DDR2 667 1GB
LITEON-PA-1900-04
Qcomm-ma560-3
Atheros / AR5BXB63
MSI-MS-6837D
ACME-901-0001-11
Sumida-IV14080/T-LF
PRO-NETS-DM100A
Page: 13 of 141
MODE 27
AMD TL60 2.0G
AU-B154EW01
Fujitsu-100GB
HLDS-GSA-T20N
Apacer-DDR2 667 1GB
Qcomm-ma560-4
Atheros / AR5BXB63
MSI-MS-6837D
SAMPO-YIVNMS0018D11
PRO-NETS-HM100E
1.3. Tested System Details
The types for all equipments, plus descriptions of all cables used in the tested system (including
inserted cards) are:
Product
Manufacturer
Model No.
Serial No.
Power Cord
1
Monitor
SONY
CPD-G500
2706563
Non-Shielded, 1.8m
2
Walkman
AIWA
HS-TA164
N/A
N/A
3
Keyboard
Logitech
Y-SM46
867404-0121
N/A
4
USB Mouse
Logitech
M-UV83
HCB54904471
N/A
5
Microphone &
PCHOME
N/A
N/A
Non-Shielded, 2.0m
Earphone
6
USB 2.0 HDD
AACOM
F12-UF
N/A
Power by PC
7
USB 2.0 HDD
AACOM
F12-UF
N/A
Power by PC
8
Printer
EPSON
StyLus C63
FAPY093574
Non-Shielded, 1.9m
9
Monitor
BenQ
LT-20E17
N/A
Non-Shielded, 1.8m
10 TS9980
R&S
N/A
N/A
N/A
11 Notebook PC
DELL
PP18L
36119001664
Non-Shielded, 1.8m
12 Exchange Network
Sun Moon Star
PX-4
95170087
Non-Shielded, 1.8m
Page: 14 of 141
1.4. Configuration of Tested System
Connection Diagram
Signal Cable Type
Signal cable Description
A
Audio Cable
Non-Shielded, 1.6m
B
USB Cable
Shielded, 1.5m
C
USB Cable
Shielded, 1.5m
D
Microphone & Earphone Cable
Non-Shielded, 1.6m
E
USB Cable
Shielded, 1.5m
F
1394 Cable
Shielded, 1.2m
G
HDMI Cable
Shielded, 1m
H
S-VIDEO Cable
Shielded, 1.6m
I
COAXIAL Cable
Shielded, 7.0m
J
LAN Cable
Non-Shielded, 7.0m
K
USB Cable
Shielded, 1.5m
L
D-SUB Cable
Shielded, 1.8m, with two ferrite cores bonded
M
TELECOM Cable
Non-Shielded, 7.0m
N
TELECOM Cable
Non-Shielded, 7.0m
Page: 15 of 141
1.5. EUT Exercise Software
1
Setup the EUT and simulators as shown on 1.4.
2
Turn on the power of all equipment.
3
Notebook reads data from disk.
4
Notebook sends “H” pattern to monitor.
5
Notebook sends “H” pattern to printer, the printer will print “H” pattern on paper.
6
Notebook reads and writes data into and from modem.
7
Notebook will read data from floppy disk and then writes the data into floppy disk , same
operation for hard disk.
8
Repeat the above procedure (4) to (7).
Page: 16 of 141
2. Technical Test
2.1. Summary of Test Result
No deviations from the test standards
Deviations from the test standards as below description:
Emission
Performed Item
Normative References
Conducted Emission
EN 55022:1998+A1:2000+A2:2003 Class B
Test
Performed
Deviation
Yes
No
Yes
No
Yes
No
Impedance Stabilization
EN 55022:1998+A1:2000+A2:2003 Class B
Network
Radiated Emission
EN 55022:1998+A1:2000+A2:2003 Class B
Power Harmonics
EN 61000-3-2:2000
Yes
No
Voltage Fluctuation and
EN 61000-3-3:1995+A1:2001
Yes
No
Flicker
Immunity
Test
Performed Item
Normative References
Electrostatic Discharge
IEC 61000-4-2 Edition 1.2: 2001-04
Yes
No
Radiated susceptibility
IEC 61000-4-3:2002+A1:2002
Yes
No
Electrical fast transient/burst IEC 61000-4-4:2004
Yes
No
Surge
IEC 61000-4-5 Edition 1.1: 2001-04
Yes
No
Conducted susceptibility
IEC 61000-4-6 Edition 2.1: 2004-11
Yes
No
Power frequency magnetic
IEC 61000-4-8 Edition 1.1: 2001-03
Yes
No
Yes
No
Performed
Deviation
field
Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03
Page: 17 of 141
2.2. List of Test Equipment
Conducted Emission / SR1
Instrument
EMI Test Receiver
LISN
LISN
Pulse Limiter
Manufacturer
R&S
R&S
R&S
R&S
Impedance Stabilization Network / SR1
Instrument
Manufacturer
Schaffner NSG 2070
N/A
RF-Generator
Capacitive Voltage Probe
Schaffner
EMI Test Receiver
R&S
LISN
R&S
LISN
R&S
lmpedance Stabilization
Schaffner
Network
Pulse Limiter
R&S
Type No.
ESCS 30
ENV4200
ESH3-Z5
ESH3-Z2
Serial No
836858/022
833209/007
836679/020
357.88.10.52
Cal. Date
2007/02/12
2006/07/13
2007/01/26
2006/09/04
Type No.
Serial No
Cal. Date
N/A
N/A
N/A
CVP2200A
ESCS 30
ESH3-Z5
ENV4200
18331
836858/022
836679/020
833209/007
2006/11/10
2007/02/12
2007/01/26
2006/07/13
ISN T400
19099
2006/07/15
ESH3-Z2
F-65
10KHz~1GHz
357.88.10.52
2006/09/04
198
2006/11/10
Serial No
2704
208
838251/001
838786/004
305
N/A
Cal. Date
2006/08/09
2006/07/25
2007/05/01
2006/06/19
2006/08/10
2007/01/03
925974
2007/01/03
101102468
2007/04/10
RF Current Probe
FCC
Radiated Emission / Site3
Instrument
Bilog Antenna
Broadband Horn Antenna
EMI Test Receiver
EMI Test Receiver
Horn Antenna
Pre-Amplifier
Manufacturer
Schaffner Chase
Schwarzbeck
R&S
R&S
Schwarzbeck
QTK
Pre-Amplifier
MITEQ
Spectrum Analyzer
Advantest
Type No.
CBL6112B
BBHA9170
ESCS 30
ESI26
BBHA9120D
N/A
AMF-4D-18040
0-45-6P
R3162
Manufacturer
Type No.
Serial No
Cal. Date
Schaffner
NSG 1007
HK54148
2006/06/29
Schaffner
CCN 1000-1
X7 1887
2006/06/29
Type No.
Serial No
Cal. Date
NSG 1007
HK54148
2006/06/29
CCN 1000-1
X7 1887
2006/06/29
Power Harmonics / SR3
Instrument
AC Power
Source(Harmonic)
IEC1000-4-X
Analyzer(Flicker)
Voltage Fluctuation and Flicker / SR3
Instrument
Manufacturer
AC Power
Schaffner
Source(Harmonic)
IEC1000-4-X
Schaffner
Analyzer(Flicker)
Page: 18 of 141
Electrostatic Discharge / SR6
Instrument
Manufacturer
ESD Simulator System
KeyTek
Horizontal Coupling
QuieTek
Plane(HCP)
Vertical Coupling
QuieTek
Plane(VCP)
Radiated susceptibility / CB5
Instrument
Manufacturer
Type No.
MZ-15/EC
Serial No
0112372
Cal. Date
2006/08/02
HCP AL50
N/A
N/A
VCP AL50
N/A
N/A
Serial No
Cal. Date
100007
N/A
100137
2450
1085
2007/04/23
2007/01/03
2006/08/02
AF-BOX
R&S
Audio Analyzer
Bilog Antenna
Broad-Band Antenna
CMU200
UNIV.RADIOCOMM
Directional Coupler
Dual Microphone Supply
Mouth Simulator
Power Amplifier
Power Amplifier
Power Meter
Pre-Amplifier
Probe Microphone
R&S
Schaffner Chase
Schwarzbeck
Type No.
AF-BOX
ACCUST
UPL 16
CBL6112B
VULB 9166
R&S
CMU200
104846
2007/04/23
A&R
B&K
B&K
A&R
A&R
R&S
A&R
B&K
22735
2426784
2439692
309453
A285000010
100219
23067
2278070
N/A
2006/08/04
2006/08/04
N/A
N/A
2007/04/22
N/A
2006/08/04
Signal Generator
R&S
DC 6180
5935
4227
30S1G3
100W10000M7
NRVD(P.M)
150A220
4182
SMY02(9K-208
0)
825454/028
2006/09/22
Type No.
Serial No
Cal. Date
N/A
N/A
N/A
Manufacturer
Type No.
Serial No
Cal. Date
N/A
N/A
N/A
N/A
Type No.
Serial No
Cal. Date
N/A
N/A
N/A
Type No.
INA 2141
INA 702
Serial No
6002
199749-020IN
Cal. Date
N/A
N/A
MV3
N/A
N/A
4090
9852
2006/05/30
Electrical fast transient/burst / SR2
Instrument
Manufacturer
Schaffner NSG 2050
N/A
System Mainframe
Surge / SR2
Instrument
Schaffner NSG 2050
System Mainframe
Conducted susceptibility / SR6
Instrument
Manufacturer
Schaffner NSG 2070
N/A
RF-Generator
Power frequency magnetic field / SR3
Instrument
Manufacturer
Induction Coil Interface
Schaffner
Magnetic Loop Coil
Schaffner
Magnetic/Electric field
Lackmann Phymetric
measuring system
Triaxial ELF Magnetic Field
F.B.BELL
Meter
Page: 19 of 141
Voltage dips and interruption / SR2
Instrument
Manufacturer
Schaffner NSG 2050
N/A
System Mainframe
Schaffner NSG 2050 System Mainframe
Instrument
Manufacturer
Burst 4.8KV/16A
Schaffner
Generator with CDN
Damped osc. Wave
Schaffner
100kHz and 1MHz
Double AC Source Variator Schaffner
Hybrid surge pulse
Schaffner
1.2/50uS
PQT Generator
Schaffner
Pulse COUPLING
Schaffner
NETWORK
Schaffner NSG 2070 RF-Generator
Instrument
Manufacturer
CDN
Schaffner
CDN
Schaffner
CDN M016S
Schaffner
CDN M016S
Schaffner
CDN T002
Schaffner
CDN T002
Schaffner
CDN T400
Schaffner
CDN T400
Schaffner
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
EM-CLAMP
Schaffner
Type No.
Serial No
Cal. Date
N/A
N/A
N/A
Type No.
Serial No
PNW2225
200123-098SC 2007/01/12
PNW2056
200124-058SC 2007/01/10
NSG 642A
30910014938
PNW 2050
200117-013SC 2007/01/03
PNW2003
200138-007SC 2007/01/15
CDN131
200124-007SC 2007/01/10
Type No.
CAL U100A
TRA U150
CAL U100A
TRA U150
CAL U100
TRA U150
CAL U100
TRA U150
Serial No
20405
20454
20410
21167
20491
21169
17735
21166
Cal. Date
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
CDN M016S
20822
2007/03/31
CDN M016S
20823
2007/03/31
CDN T002
19018
2007/03/31
CDN T400
21226
2007/03/31
KEMZ 801
21024
2007/03/31
Page: 20 of 141
Cal. Date
2007/01/15
2.3. Measurement Uncertainty
Conducted Emission
The measurement uncertainty is evaluated as ± 2.26 dB.
Impedance Stabilization Network
Radiated Emission
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant ESD standards.
The immunity test signal from the ESD system meet the required specifications in IEC
61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of
voltage and timing as being 1.63 % and 2.76%.
1999[2], the requirements for measurement uncertainty in RS testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant RS standards.
The immunity test signal from the RS system meet the required specifications in IEC
61000-4-3 through the calibration for the uniform field strength and monitoring for the test
level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.
Electrical fast transient/burst
1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to
have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst
standards. The immunity test signal from the EFT/Burst system meet the required
specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty
for the waveform of voltage, frequency and timing as being 1.63 %, 2.8 10-10 and
2.76%.
Surge
1999[2], the requirements for measurement uncertainty in Surge testing are deemed to
have been satisfied, and the testing is reported in accordance with the relevant Surge
standards. The immunity test signal from the Surge system meet the required specifications
in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the
waveform of voltage and timing as being 1.63 % and 2.76%.
Page: 21 of 141
1999[2], the requirements for measurement uncertainty in CS testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant CS standards.
The immunity test signal from the CS system meet the required specifications in IEC
61000-4-6 through the calibration for unmodulated signal and monitoring for the test level
with the uncertainty evaluation report for the injected modulated signal level through CDN
and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.
Power frequency magnetic field
1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant PFM standards.
The immunity test signal from the PFM system meet the required specifications in IEC
61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter
to verify the output level of magnetic field strength as being 2 %.
Voltage dips and interruption
1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant DIP standards.
The immunity test signal from the DIP system meet the required specifications in IEC
61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of
voltage and timing as being 1.63 % and 2.76%.
Page: 22 of 141
2.4. Test Environment
Performed Item
Conducted
Emission
Items
Required
Actual
Temperature (°C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
25
Humidity (%RH)
25-75
50
860-1060
950-1000
Temperature (°C)
15-35
25
Humidity (%RH)
25-75
50
860-1060
950-1000
Temperature (°C)
15-35
21.5
Humidity (%RH)
30-60
52
860-1060
950-1000
Temperature (°C)
15-35
25
Humidity (%RH)
25-75
50
860-1060
950-1000
Temperature (°C)
15-35
21.5
Humidity (%RH)
25-75
52
860-1060
950-1000
Temperature (°C)
15-35
21.5
Humidity (%RH)
10-75
52
860-1060
950-1000
Temperature (°C)
15-35
21.5
Humidity (%RH)
25-75
52
860-1060
950-1000
Temperature (°C)
15-35
21.5
25-75
52
Impedance
Stabilization
Network
Radiated
Emission
Electrostatic
Discharge
Radiated
susceptibility
Electrical fast
transient/burst
Surge
Conducted
susceptibility
Power frequency Humidity (%RH)
Page: 23 of 141
magnetic field
Voltage dips and
interruption
860-1060
950-1000
Temperature (°C)
15-35
21.5
Humidity (%RH)
25-75
52
860-1060
950-1000
Page: 24 of 141
3. Conducted Emission (Main Terminals)
3.1. Test Specification
According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2004
3.2. Test Setup
3.3. Limit
Limits
Frequency
(MHz)
QP
(dBuV)
AV
(dBuV)
0.15 - 0.50
66 - 56
56 – 46
0.50-5.0
56
46
5.0 - 30
60
50
Remarks: In the above table, the tighter limit applies at the band edges.
Page: 25 of 141
3.4. Test Procedure
The EUT and simulators are connected to the main power through a line impedance
stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the
measuring equipment. The peripheral devices are also connected to the main power through
a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination.
(Please refers to the block diagram of the test setup and photographs.)
Both sides of A.C. line are checked for maximum conducted interference. In order to find the
maximum emission, the relative positions of equipment and all of the interface cables must
be changed on conducted measurement.
Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using
a receiver bandwidth of 9kHz.
3.5. Deviation from Test Standard
No deviation.
Page: 26 of 141
3.6. Test Result
Site : SR-1
Time : 2007/04/27 - 23:00
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Notebook
Probe : LISN-020(L) - Line1
Power : AC 230V/50Hz
Note : Mode 1
Page: 27 of 141
Site : SR-1
Time : 2007/04/27 - 23:01
Margin : 0
EUT : Notebook
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.334
0.214
47.440
47.654
-13.089
60.743
QUASIPEAK
2
0.681
0.229
46.870
47.099
-8.901
56.000
QUASIPEAK
0.947
0.232
47.570
47.802
-8.198
56.000
QUASIPEAK
4
1.373
0.248
47.120
47.368
-8.632
56.000
QUASIPEAK
5
1.697
0.262
42.520
42.782
-13.218
56.000
QUASIPEAK
6
2.670
0.304
39.090
39.394
-16.606
56.000
QUASIPEAK
3
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 28 of 141
Site : SR-1
Time : 2007/04/27 - 23:01
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Notebook
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.334
0.214
29.120
29.334
-21.409
50.743
AVERAGE
2
0.681
0.229
29.300
29.529
-16.471
46.000
AVERAGE
0.947
0.232
29.540
29.772
-16.228
46.000
AVERAGE
4
1.373
0.248
29.400
29.648
-16.352
46.000
AVERAGE
5
1.697
0.262
28.260
28.522
-17.478
46.000
AVERAGE
6
2.670
0.304
26.770
27.074
-18.926
46.000
AVERAGE
3
*
Note:
Page: 29 of 141
Site : SR-1
Time : 2007/04/27 - 23:02
Margin : 0
EUT : Notebook
Probe : LISN-020(N) - Line2
Note : Mode 1
Page: 30 of 141
Site : SR-1
Time : 2007/04/27 - 23:03
Margin : 0
EUT : Notebook
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.341
0.214
49.970
50.184
-10.359
60.543
QUASIPEAK
2
0.662
0.218
46.530
46.748
-9.252
56.000
QUASIPEAK
0.939
0.232
47.590
47.822
-8.178
56.000
QUASIPEAK
4
1.369
0.248
46.330
46.578
-9.422
56.000
QUASIPEAK
5
2.056
0.277
40.400
40.677
-15.323
56.000
QUASIPEAK
6
3.119
0.321
35.320
35.641
-20.359
56.000
QUASIPEAK
3
*
Note:
Page: 31 of 141
Site : SR-1
Time : 2007/04/27 - 23:03
Margin : 0
EUT : Notebook
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.341
0.214
33.420
33.634
-16.909
50.543
AVERAGE
2
0.662
0.218
25.980
26.198
-19.802
46.000
AVERAGE
0.939
0.232
30.070
30.302
-15.698
46.000
AVERAGE
4
1.369
0.248
28.710
28.958
-17.042
46.000
AVERAGE
5
2.056
0.277
27.680
27.957
-18.043
46.000
AVERAGE
6
3.119
0.321
20.500
20.821
-25.179
46.000
AVERAGE
3
*
Note:
Page: 32 of 141
Site : SR-1
Time : 2007/05/07 - 09:48
Margin : 0
EUT : Notebook
Probe : LISN-L(023) - Line1
Note : Mode 2
Page: 33 of 141
Site : SR-1
Time : 2007/05/07 - 09:50
Margin : 0
EUT : Notebook
Note : Mode 2
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.201
0.643
50.150
50.793
-13.750
64.543
QUASIPEAK
2
0.388
0.300
41.500
41.800
-17.400
59.200
QUASIPEAK
3
0.783
0.310
40.660
40.970
-15.030
56.000
QUASIPEAK
1.689
0.330
43.000
43.330
-12.670
56.000
QUASIPEAK
5
3.318
0.380
42.760
43.140
-12.860
56.000
QUASIPEAK
6
6.638
0.490
39.030
39.520
-20.480
60.000
QUASIPEAK
4
*
Note:
Page: 34 of 141
Site : SR-1
Time : 2007/05/07 - 09:50
Margin : 0
EUT : Notebook
Note : Mode 2
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.201
0.643
45.320
45.963
-8.580
54.543
AVERAGE
2
0.388
0.300
39.810
40.110
-9.090
49.200
AVERAGE
3
0.783
0.310
39.800
40.110
-5.890
46.000
AVERAGE
4
1.689
0.330
40.120
40.450
-5.550
46.000
AVERAGE
3.318
0.380
40.780
41.160
-4.840
46.000
AVERAGE
6.638
0.490
31.800
32.290
-17.710
50.000
AVERAGE
5
6
*
Note:
Page: 35 of 141
Site : SR-1
Time : 2007/05/07 - 09:51
Margin : 0
EUT : Notebook
Probe : LISN-N(023) - Line2
Note : Mode 2
Page: 36 of 141
Site : SR-1
Time : 2007/05/07 - 09:59
Margin : 0
EUT : Notebook
Note : Mode 2
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.197
0.300
54.080
54.380
-10.277
64.657
QUASIPEAK
2
0.521
0.310
40.730
41.040
-14.960
56.000
QUASIPEAK
3
1.103
0.320
43.020
43.340
-12.660
56.000
QUASIPEAK
4
1.750
0.340
41.690
42.030
-13.970
56.000
QUASIPEAK
5
3.119
0.380
42.900
43.280
-12.720
56.000
QUASIPEAK
6
6.165
0.440
41.060
41.500
-18.500
60.000
QUASIPEAK
Note:
Page: 37 of 141
Site : SR-1
Time : 2007/05/07 - 09:59
Margin : 0
EUT : Notebook
Note : Mode 2
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.197
0.300
51.210
51.510
-3.147
54.657
AVERAGE
2
0.521
0.310
39.280
39.590
-6.410
46.000
AVERAGE
3
1.103
0.320
42.520
42.840
-3.160
46.000
AVERAGE
4
1.750
0.340
39.770
40.110
-5.890
46.000
AVERAGE
5
3.119
0.380
38.590
38.970
-7.030
46.000
AVERAGE
6
6.165
0.440
37.240
37.680
-12.320
50.000
AVERAGE
Note:
Page: 38 of 141
3.7. Test Photograph
Test Mode
Description
Test Mode
Description
: Mode 1
: Front View of Conducted Test
: Mode 1
: Back View of Conducted Test
Page: 39 of 141
Test Mode
Description
Test Mode
Description
: Mode 2
: Front View of Conducted Test
: Mode 2
: Back View of Conducted Test
Page: 40 of 141
4. Conducted Emissions (Telecommunication Ports)
According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2004
4.2. Test Setup
4.3. Limit
Limits
Frequency
(MHz)
QP
(dBuV)
AV
(dBuV)
0.15 - 0.50
84 – 74
74 – 64
0.50 - 30
74
64
Remarks:
The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50
MHz.
Page: 41 of 141
4.4. Test Procedure
Telecommunication Port:
The mains voltage shall be supplied to the EUT via the LISN when the measurement of
telecommunication port is performed. The common mode disturbances at the
telecommunication port shall be connected to the ISN, which is 150 ohm impedance.
Both alternative cables are tested related to the LCL requested. The measurement range is
from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz.
The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is
used for alternative one.
No deviation.
Page: 42 of 141
4.6. Test Result
Site : SR-1
Time : 2007/05/07 - 14:16
Limit : ISN_Voltage_B_10db_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN-T400 - Line1
Note : Mode 1 , ISN 10M
Page: 43 of 141
Site : SR-1
Time : 2007/05/07 - 14:17
Margin : 0
EUT : Notebook
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.338
9.880
25.290
35.170
-43.459
78.629
QUASIPEAK
2
0.408
9.874
24.950
34.824
-41.805
76.629
QUASIPEAK
2.048
9.820
48.520
58.340
-15.660
74.000
QUASIPEAK
4
4.998
9.800
45.720
55.520
-18.480
74.000
QUASIPEAK
5
9.986
9.780
57.410
67.190
-16.810
84.000
QUASIPEAK
6
11.673
9.818
35.040
44.858
-39.142
84.000
QUASIPEAK
3
*
Note:
Page: 44 of 141
Site : SR-1
Time : 2007/05/07 - 14:17
Limit : ISN_Voltage_B_10db_00M_AV
Margin : 0
EUT : Notebook
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.338
9.880
9.410
19.290
-49.339
68.629
AVERAGE
2
0.408
9.874
10.990
20.864
-45.765
66.629
AVERAGE
2.048
9.820
48.510
58.330
-5.670
64.000
AVERAGE
4
4.998
9.800
19.250
29.050
-34.950
64.000
AVERAGE
5
9.986
9.780
29.570
39.350
-34.650
74.000
AVERAGE
6
11.673
9.818
14.810
24.628
-49.372
74.000
AVERAGE
3
*
Note:
Page: 45 of 141
Site : SR-1
Time : 2007/05/07 - 14:11
Margin : 0
EUT : Notebook
Note : Mode 1, ISN 100M
Page: 46 of 141
Site : SR-1
Time : 2007/05/07 - 14:13
Margin : 0
EUT : Notebook
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1.021
9.820
56.170
65.990
-8.010
74.000
QUASIPEAK
1.267
9.820
57.390
67.210
-6.790
74.000
QUASIPEAK
3
3.041
9.810
49.140
58.950
-15.050
74.000
QUASIPEAK
4
4.412
9.800
55.320
65.120
-8.880
74.000
QUASIPEAK
5
9.388
9.780
51.790
61.570
-22.430
84.000
QUASIPEAK
6
12.748
9.905
60.490
70.395
-13.605
84.000
QUASIPEAK
2
*
Note:
Page: 47 of 141
Site : SR-1
Time : 2007/05/07 - 14:13
Margin : 0
EUT : Notebook
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
1.021
9.820
42.940
52.760
-11.240
64.000
AVERAGE
2
1.267
9.820
44.360
54.180
-9.820
64.000
AVERAGE
3
3.041
9.810
44.240
54.050
-9.950
64.000
AVERAGE
4
4.412
9.800
46.010
55.810
-8.190
64.000
AVERAGE
5
9.388
9.780
50.320
60.100
-13.900
74.000
AVERAGE
12.748
9.905
57.650
67.555
-6.445
74.000
AVERAGE
6
*
Note:
Page: 48 of 141
Site : SR-1
Time : 2007/05/07 - 14:00
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Note : Mode 1 , TELCOM
Page: 49 of 141
Site : SR-1
Time : 2007/05/07 - 14:01
Margin : 0
EUT : Notebook
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.193
9.896
50.630
60.526
-22.245
82.771
QUASIPEAK
2
0.455
9.870
42.070
51.940
-23.346
75.286
QUASIPEAK
3
2.048
9.820
48.760
58.580
-15.420
74.000
QUASIPEAK
4
2.673
9.810
31.000
40.810
-33.190
74.000
QUASIPEAK
5
12.056
9.852
38.730
48.582
-25.418
74.000
QUASIPEAK
23.998
9.910
53.190
63.100
-10.900
74.000
QUASIPEAK
6
*
Note:
Page: 50 of 141
Site : SR-1
Time : 2007/05/07 - 14:01
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.193
9.896
47.370
57.266
-15.505
72.771
AVERAGE
2
0.455
9.870
38.530
48.400
-16.886
65.286
AVERAGE
3
2.048
9.820
48.750
58.570
-5.430
64.000
AVERAGE
4
2.673
9.810
28.730
38.540
-25.460
64.000
AVERAGE
5
12.056
9.852
35.340
45.192
-18.808
64.000
AVERAGE
23.998
9.910
50.780
60.690
-3.310
64.000
AVERAGE
6
*
Note:
Page: 51 of 141
Site : SR-1
Time : 2007/05/07 - 13:55
Margin : 0
EUT : Notebook
Probe : CVP-2200A - Line1
Note : Mode 1 , GIGA VOL
Page: 52 of 141
Site : SR-1
Time : 2007/05/07 - 13:56
Margin : 0
EUT : Notebook
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.455
20.200
42.940
63.140
-12.146
75.286
QUASIPEAK
2
0.588
20.200
38.580
58.780
-15.220
74.000
QUASIPEAK
3
1.107
20.200
37.240
57.440
-16.560
74.000
QUASIPEAK
4
2.087
20.200
39.400
59.600
-14.400
74.000
QUASIPEAK
6.912
20.200
42.750
62.950
-11.050
74.000
QUASIPEAK
23.998
20.400
41.010
61.410
-12.590
74.000
QUASIPEAK
5
6
*
Note:
Page: 53 of 141
Site : SR-1
Time : 2007/05/07 - 13:56
Margin : 0
EUT : Notebook
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.455
20.200
39.880
60.080
-5.206
65.286
AVERAGE
2
0.588
20.200
37.370
57.570
-6.430
64.000
AVERAGE
3
1.107
20.200
35.460
55.660
-8.340
64.000
AVERAGE
4
2.087
20.200
37.630
57.830
-6.170
64.000
AVERAGE
5
6.912
20.200
38.070
58.270
-5.730
64.000
AVERAGE
23.998
20.400
40.870
61.270
-2.730
64.000
AVERAGE
6
*
Note:
Page: 54 of 141
Site : SR-1
Time : 2007/05/07 - 13:49
Limit : ISN_Current_B_00M_QP
Margin : 0
EUT : Notebook
Probe :
Note : Mode 1 , GIGA CUR
Page: 55 of 141
- Line1
Site : SR-1
Time : 2007/05/07 - 13:53
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.455
0.200
8.990
9.190
-22.096
31.286
QUASIPEAK
2
0.818
0.200
18.300
18.500
-11.500
30.000
QUASIPEAK
1.123
0.200
24.790
24.990
-5.010
30.000
QUASIPEAK
4
1.300
0.200
22.760
22.960
-7.040
30.000
QUASIPEAK
5
1.685
0.200
22.580
22.780
-7.220
30.000
QUASIPEAK
6
23.998
0.400
11.880
12.280
-17.720
30.000
QUASIPEAK
3
*
Note:
Page: 56 of 141
Site : SR-1
Time : 2007/05/07 - 13:53
Limit : ISN_Current_B_00M_AV
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.455
0.200
5.020
5.220
-16.066
21.286
AVERAGE
2
0.818
0.200
8.890
9.090
-10.910
20.000
AVERAGE
1.123
0.200
16.630
16.830
-3.170
20.000
AVERAGE
4
1.300
0.200
16.410
16.610
-3.390
20.000
AVERAGE
5
1.685
0.200
13.670
13.870
-6.130
20.000
AVERAGE
6
23.998
0.400
10.630
11.030
-8.970
20.000
AVERAGE
3
*
Note:
Page: 57 of 141
Site : SR-1
Time : 2007/05/07 - 11:51
Margin : 0
EUT : Notebook
Probe :
Page: 58 of 141
- Line1
Site : SR-1
Time : 2007/05/07 - 11:43
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.584
0.200
52.190
52.390
-21.610
74.000
QUASIPEAK
2
0.970
0.200
52.780
52.980
-21.020
74.000
QUASIPEAK
3
1.295
0.200
53.180
53.380
-20.620
74.000
QUASIPEAK
4
1.814
0.200
52.900
53.100
-20.900
74.000
QUASIPEAK
5
2.267
0.200
52.320
52.520
-21.480
74.000
QUASIPEAK
9.994
0.200
64.800
65.000
-19.000
84.000
QUASIPEAK
6
*
Note:
Page: 59 of 141
Site : SR-1
Time : 2007/05/07 - 11:43
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.584
0.200
52.180
52.380
-11.620
64.000
AVERAGE
2
0.970
0.200
52.770
52.970
-11.030
64.000
AVERAGE
1.295
0.200
52.890
53.090
-10.910
64.000
AVERAGE
4
1.814
0.200
52.320
52.520
-11.480
64.000
AVERAGE
5
2.267
0.200
51.940
52.140
-11.860
64.000
AVERAGE
6
9.994
0.200
47.140
47.340
-26.660
74.000
AVERAGE
3
*
Note:
Page: 60 of 141
Site : SR-1
Time : 2007/05/07 - 11:47
Margin : 0
EUT : Notebook
Probe :
Page: 61 of 141
- Line1
Site : SR-1
Time : 2007/05/07 - 11:48
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.388
0.200
50.350
50.550
-26.650
77.200
QUASIPEAK
2
0.779
0.200
52.700
52.900
-21.100
74.000
QUASIPEAK
1.361
0.200
53.630
53.830
-20.170
74.000
QUASIPEAK
4
1.880
0.200
53.150
53.350
-20.650
74.000
QUASIPEAK
5
2.916
0.200
50.550
50.750
-23.250
74.000
QUASIPEAK
6
16.228
0.400
60.830
61.230
-22.770
84.000
QUASIPEAK
3
*
Note:
Page: 62 of 141
Site : SR-1
Time : 2007/05/07 - 11:48
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.388
0.200
50.340
50.540
-16.660
67.200
AVERAGE
2
0.779
0.200
52.530
52.730
-11.270
64.000
AVERAGE
1.361
0.200
53.420
53.620
-10.380
64.000
AVERAGE
4
1.880
0.200
52.800
53.000
-11.000
64.000
AVERAGE
5
2.916
0.200
48.950
49.150
-14.850
64.000
AVERAGE
6
16.228
0.400
57.630
58.030
-15.970
74.000
AVERAGE
3
*
Note:
Page: 63 of 141
Site : SR-1
Time : 2007/05/07 - 13:22
Margin : 0
EUT : Notebook
Probe :
Note : Mode 2 , Telecom
Page: 64 of 141
- Line1
Site : SR-1
Time : 2007/05/07 - 13:23
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.392
0.200
41.920
42.120
-34.966
77.086
QUASIPEAK
2
1.045
0.200
50.490
50.690
-23.310
74.000
QUASIPEAK
3
1.693
0.200
50.110
50.310
-23.690
74.000
QUASIPEAK
2.154
0.200
51.660
51.860
-22.140
74.000
QUASIPEAK
5
2.677
0.200
48.290
48.490
-25.510
74.000
QUASIPEAK
6
6.728
0.200
39.720
39.920
-34.080
74.000
QUASIPEAK
4
*
Note:
Page: 65 of 141
Site : SR-1
Time : 2007/05/07 - 13:23
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.392
0.200
41.420
41.620
-25.466
67.086
AVERAGE
2
1.045
0.200
49.820
50.020
-13.980
64.000
AVERAGE
3
1.693
0.200
46.790
46.990
-17.010
64.000
AVERAGE
2.154
0.200
50.490
50.690
-13.310
64.000
AVERAGE
5
2.677
0.200
46.680
46.880
-17.120
64.000
AVERAGE
6
6.728
0.200
34.160
34.360
-29.640
64.000
AVERAGE
4
*
Note:
Page: 66 of 141
Site : SR-1
Time : 2007/05/07 - 13:33
Margin : 10
EUT : Notebook
Probe :
Note : Mode 2 , ISN GIGA VOL
Page: 67 of 141
- Line1
Site : SR-1
Time : 2007/05/07 - 13:35
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.173
0.200
43.800
44.000
-39.343
83.343
QUASIPEAK
2
0.521
0.200
39.070
39.270
-34.730
74.000
QUASIPEAK
3
0.783
0.200
40.640
40.840
-33.160
74.000
QUASIPEAK
2.416
0.200
42.190
42.390
-31.610
74.000
QUASIPEAK
5
7.310
0.200
34.740
34.940
-39.060
74.000
QUASIPEAK
6
14.166
0.400
36.570
36.970
-37.030
74.000
QUASIPEAK
4
*
Note:
Page: 68 of 141
Site : SR-1
Time : 2007/05/07 - 13:35
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.173
0.200
36.180
36.380
-36.963
73.343
AVERAGE
2
0.521
0.200
37.980
38.180
-25.820
64.000
AVERAGE
3
0.783
0.200
38.010
38.210
-25.790
64.000
AVERAGE
2.416
0.200
38.560
38.760
-25.240
64.000
AVERAGE
5
7.310
0.200
29.700
29.900
-34.100
64.000
AVERAGE
6
14.166
0.400
31.130
31.530
-32.470
64.000
AVERAGE
4
*
Note:
Page: 69 of 141
Site : SR-1
Time : 2007/05/07 - 13:37
Margin : 10
EUT : Notebook
Probe :
Note : Mode 2 , ISN GIGA CUR
Page: 70 of 141
- Line1
Site : SR-1
Time : 2007/05/07 - 13:40
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.529
0.200
11.130
11.330
-18.670
30.000
QUASIPEAK
2
0.666
0.200
21.100
21.300
-8.700
30.000
QUASIPEAK
3
1.021
0.200
17.520
17.720
-12.280
30.000
QUASIPEAK
4
1.177
0.200
23.180
23.380
-6.620
30.000
QUASIPEAK
1.675
0.200
25.190
25.390
-4.610
30.000
QUASIPEAK
1.959
0.200
15.480
15.680
-14.320
30.000
QUASIPEAK
5
6
*
Note:
Page: 71 of 141
Site : SR-1
Time : 2007/05/07 - 13:40
Limit : ISN_Current_B_00M_AV
Margin : 0
EUT : Notebook
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.529
0.200
3.310
3.510
-16.490
20.000
AVERAGE
2
0.666
0.200
10.910
11.110
-8.890
20.000
AVERAGE
3
1.021
0.200
11.660
11.860
-8.140
20.000
AVERAGE
4
1.177
0.200
14.020
14.220
-5.780
20.000
AVERAGE
1.675
0.200
15.300
15.500
-4.500
20.000
AVERAGE
1.959
0.200
11.750
11.950
-8.050
20.000
AVERAGE
5
6
*
Note:
Page: 72 of 141
Test Mode
Description
Test Mode
Description
: Mode 1
: Front View of ISN Test
: Mode 1
: Back View of ISN Test
Page: 73 of 141
Test Mode
Description
Test Mode
Description
: Mode 1
: Front View of ISN Test - GIGA VOL
: Mode 1
: Back View of ISN Test - GIGA VOL
Page: 74 of 141
Test Mode
Description
Test Mode
Description
: Mode 1
: Front View of ISN Test - GIGA CUR
: Mode 1
: Back View of ISN Test - GIGA CUR
Page: 75 of 141
Test Mode
Description
Test Mode
Description
: Mode 2
: Front View of ISN Test
: Mode 2
: Back View of ISN Test
Page: 76 of 141
Test Mode
Description
Test Mode
Description
: Mode 2
: Front View of ISN Test - GIGA VOL
: Mode 2
: Back View of ISN Test - GIGA VOL
Page: 77 of 141
Test Mode
Description
Test Mode
Description
: Mode 2
: Front View of ISN Test - GIGA CUR
: Mode 2
: Back View of ISN Test - GIGA CUR
Page: 78 of 141
5. Radiated Emission
According to EMC Standard : EN 55022 and AS/NZS CISPR 22
5.2. Test Setup
5.3. Limit
Limits
Frequency
(MHz)
Distance (m)
dBuV/m
30 – 230
10
30
230 – 1000
10
37
Remark:
1. The tighter limit shall apply at the edge between two frequency bands.
2. Distance refers to the distance in meters between the measuring instrument antenna
and the closed point of any part of the device or system.
Page: 79 of 141
5.4. Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The
turn table can rotate 360 degrees to determine the position of the maximum emission level.
The EUT was positioned such that the distance from antenna to the EUT was 10 meters.
The antenna can move up and down between 1 meter and 4 meters to find out the maximum
emission level.
Both horizontal and vertical polarization of the antenna are set on measurement. In order to
find the maximum emission, all of the interface cables must be manipulated on radiated
measurement.
Radiated emissions were invested over the frequency range from 30MHz to1GHz using a
receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10
meters.
No deviation.
Page: 80 of 141
5.6. Test Result
Site : OATS-3
Time : 2007/05/14 - 17:15
Margin : 6
EUT : Notebook
Probe : LKCBL6112(2704) - HORIZONTAL
Note : Mode 1
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
135.250
14.047
9.900
23.947
-6.053
30.000
QUASIPEAK
2
174.810
11.656
8.800
20.456
-9.544
30.000
QUASIPEAK
3
240.000
13.996
15.700
29.696
-7.304
37.000
QUASIPEAK
4
360.210
17.853
11.900
29.753
-7.247
37.000
QUASIPEAK
5
480.050
21.788
7.140
28.928
-8.072
37.000
QUASIPEAK
6
667.319
24.554
5.910
30.464
-6.536
37.000
QUASIPEAK
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
Page: 81 of 141
Site : OATS-3
Time : 2007/05/14 - 17:16
Margin : 6
EUT : Notebook
Probe : LKCBL6112(2704) - VERTICAL
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
1
51.000
8.137
12.990
21.127
-8.873
30.000
QUASIPEAK
2
126.050
12.732
8.740
21.472
-8.528
30.000
QUASIPEAK
3
188.030
11.061
11.520
22.581
-7.419
30.000
QUASIPEAK
4
360.000
18.481
10.300
28.781
-8.219
37.000
QUASIPEAK
5
480.000
21.498
6.570
28.069
-8.931
37.000
QUASIPEAK
900.000
28.404
2.670
31.074
-5.926
37.000
QUASIPEAK
6
*
Note:
Page: 82 of 141
Site : OATS-3
Time : 2007/05/14 - 19:46
Margin : 6
EUT : Notebook
Probe : LKCBL6112(2704) - HORIZONTAL
Note : Mode 2
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
1
123.200
14.162
10.800
24.962
-5.038
30.000
QUASIPEAK
2
193.510
11.097
12.800
23.896
-6.104
30.000
QUASIPEAK
3
250.335
15.420
13.500
28.920
-8.080
37.000
QUASIPEAK
4
480.118
21.784
5.860
27.644
-9.356
37.000
QUASIPEAK
934.551
27.672
5.800
33.472
-3.528
37.000
QUASIPEAK
999.662
28.921
1.200
30.121
-6.879
37.000
QUASIPEAK
5
6
*
Note:
Page: 83 of 141
-Site : OATS-3
Time : 2007/05/14 - 19:47
Margin : 6
EUT : Notebook
Probe : LKCBL6112(2704) - VERTICAL
Note : Mode 2
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
1
120.220
12.762
8.900
21.662
-8.338
30.000
QUASIPEAK
2
218.550
12.254
10.300
22.554
-7.446
30.000
QUASIPEAK
3
401.800
21.109
6.800
27.909
-9.091
37.000
QUASIPEAK
4
663.210
23.805
3.800
27.605
-9.395
37.000
QUASIPEAK
5
837.215
26.038
6.000
32.038
-4.962
37.000
QUASIPEAK
952.210
28.390
6.700
35.090
-1.910
37.000
QUASIPEAK
6
*
Note:
Page: 84 of 141
Test Mode
Description
Test Mode
Description
: Mode 1
: Front View of Radiated Test
: Mode 1
: Back View of Radiated Test
Page: 85 of 141
Test Mode
Description
Test Mode
Description
: Mode 2
: Front View of Radiated Test
: Mode 2
: Back View of Radiated Test
Page: 86 of 141
6. Harmonic Current Emission
According to EMC Standard : EN 61000-3-2
6.2. Test Setup
6.3. Limit
(a) Limits of Class A Harmonics Currents
Harmonics
Maximum Permissible
Harmonics
Maximum Permissible
Order
harmonic current
Order
harmonic current
n
A
n
A
Odd harmonics
Even harmonics
3
2.30
2
1.08
5
1.14
4
0.43
7
0.77
6
0.30
9
0.40
8 ≤ n ≤ 40
0.23 * 8/n
11
0.33
13
0.21
15 ≤ n ≤ 39
0.15 * 15/n
Page: 87 of 141
(b) Limits of Class B Harmonics Currents
For Class B equipment, the harmonic of the input current shall not exceed the maximum
permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.
(c) Limits of Class C Harmonics Currents
Harmonics Order
Maximum Permissible harmonic current
Expressed as a percentage of the input
current at the fundamental frequency
n
％
2
2
3
30．λ
5
10
7
7
9
5
11 ≤ n ≤ 39
＊
3
(odd harmonics only)
＊λ is the circuit power factor
(d) Limits of Class D Harmonics Currents
Harmonics Order
Maximum Permissible
Maximum Permissible
harmonic current per watt
harmonic current
n
mA/W
A
3
3.4
2.30
5
1.9
1.14
7
1.0
0.77
9
0.5
0.40
11
0.35
0.33
3.85/n
See limit of Class A
11 ≤ n ≤ 39
(odd harmonics only)
Page: 88 of 141
6.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
No deviation.
Page: 89 of 141
6.6. Test Result
Product
Notebook
Test Item
Power Harmonics
Test Mode
Mode 1
Date of Test
2007/04/27
Test Site
Test Result: Pass
No.3 Shielded Room
Source qualification: Normal
0.6
300
0.4
200
0.2
100
0.0
0
-0.2
-100
-0.4
-200
-0.6
-300
Current RMS(Amps)
Harmonics and Class D limit line
European Limits
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
Worst harmonic was #7 with 13.63% of the limit.
Page: 90 of 141
32
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Test Result: Pass
THC(A): 0.06
I-THD(%): 16.94
Highest parameter values during test:
V_RMS (Volts): 229.76
I_Peak (Amps): 0.626
I_Fund (Amps): 0.377
Power (Watts):
86.9
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.000
0.051
0.000
0.030
0.000
0.017
0.000
0.005
0.000
0.001
0.000
0.002
0.000
0.004
0.000
0.003
0.000
0.002
0.000
0.001
0.000
0.001
0.000
0.001
0.000
0.002
0.000
0.001
0.000
0.001
0.000
0.001
0.000
0.001
0.000
0.001
0.000
0.001
0.000
POHC(A): 0.004
Frequency(Hz):
I_RMS (Amps):
Crest Factor:
Power Factor:
POHC Limit(A): 0.037
50.00
0.390
1.669
0.969
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.295
17.2
0.055
0.443
12.35
Pass
0.165
18.1
0.031
0.243
12.54
Pass
0.087
19.6
0.017
0.128
13.63
Pass
0.043
12.4
0.006
0.065
9.28
Pass
0.030
4.4
0.002
0.046
4.42
Pass
0.026
7.2
0.003
0.039
6.62
Pass
0.023
15.7
0.004
0.033
11.76
Pass
0.020
15.1
0.003
0.030
10.75
Pass
0.018
11.5
0.002
0.026
8.71
Pass
0.016
8.9
0.002
0.024
7.12
Pass
0.015
8.2
0.002
0.022
6.98
Pass
0.013
10.6
0.002
0.020
8.72
Pass
0.012
14.9
0.002
0.019
11.55
Pass
0.012
13.0
0.002
0.017
10.18
Pass
0.011
9.3
0.001
0.016
8.11
Pass
0.010
9.2
0.001
0.015
6.89
Pass
0.010
11.0
0.001
0.014
8.25
Pass
0.009
11.8
0.001
0.014
8.62
Pass
0.009
11.3
0.001
0.013
8.46
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the
same window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power
>75W. Others the result should be pass.
Page: 91 of 141
Product
Notebook
Test Item
Power Harmonics
Test Mode
Mode 2
Date of Test
2007/04/27
Test Site
Test Result: Pass
No.3 Shielded Room
0.9
300
0.6
200
0.3
100
0.0
0
-0.3
-100
-0.6
-200
-0.9
-300
Current RMS(Amps)
Harmonics and Class D limit line
European Limits
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
Worst harmonic was #3 with 15.94% of the limit.
Page: 92 of 141
32
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Test Result: Pass
THC(A): 0.08
I-THD(%): 19.15
Highest parameter values during test:
V_RMS (Volts): 229.72
I_Peak (Amps): 0.807
I_Fund (Amps): 0.402
Power (Watts):
92.6
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.000
0.073
0.000
0.011
0.000
0.010
0.000
0.009
0.000
0.006
0.000
0.004
0.000
0.003
0.000
0.003
0.000
0.001
0.000
0.000
0.000
0.001
0.000
0.002
0.000
0.001
0.000
0.001
0.000
0.002
0.000
0.001
0.000
0.001
0.000
0.001
0.000
0.001
0.000
POHC(A): 0.004
Frequency(Hz):
I_RMS (Amps):
Crest Factor:
Power Factor:
POHC Limit(A): 0.040
50.00
0.420
1.941
0.961
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.315
23.3
0.075
0.472
15.94
Pass
0.176
6.2
0.011
0.264
4.26
Pass
0.093
10.7
0.010
0.139
7.37
Pass
0.046
19.3
0.009
0.069
13.26
Pass
0.032
19.3
0.006
0.048
13.44
Pass
0.028
14.3
0.004
0.041
10.14
Pass
0.024
11.3
0.003
0.035
7.99
Pass
0.021
11.9
0.003
0.031
8.46
Pass
0.019
6.8
0.001
0.028
5.02
Pass
0.017
2.1
0.000
0.025
1.88
Pass
0.015
7.4
0.001
0.023
5.86
Pass
0.014
11.0
0.002
0.021
8.47
Pass
0.013
7.6
0.001
0.020
6.11
Pass
0.012
12.1
0.002
0.018
8.95
Pass
0.011
14.7
0.002
0.017
10.76
Pass
0.011
9.9
0.001
0.016
7.67
Pass
0.010
11.5
0.001
0.015
8.77
Pass
0.010
12.0
0.001
0.014
9.21
Pass
0.009
7.6
0.001
0.014
6.34
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the
same window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power
>75W. Others the result should be pass.
Page: 93 of 141
Test Mode
Description
Test Mode
Description
: Mode 1
: Power Harmonics Test Setup
: Mode 2
: Power Harmonics Test Setup
Page: 94 of 141
7. Voltage Fluctuation and Flicker
According to EMC Standard : EN 61000-3-3
7.2. Test Setup
7.3. Limit
The following limits apply:
－ the value of Pst shall not be greater than 1.0;
－ the value of Plt shall not be greater than 0.65;
－ the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500
ms;
－ the relative steady-state voltage change, dc, shall not exceed 3.3 ％;
－ the maximum relative voltage change, dmax, shall not exceed;
a) 4 ％ without additional conditions;
b)
6 ％ for equipment which is:
－ switched manually, or
－ switched automatically more frequently than twice per day, and also has either a
delayed restart (the delay being not less than a few tens of seconds), or manual restart,
after a power supply interruption.
NOTE The cycling frequency will be further limited by the Pst and P1t limit.
For example: a dmax of 6％producing a rectangular voltage change characteristic twice per
hour will give a P1t of about 0.65.
Page: 95 of 141
c)
7 ％ for equipment which is:
－ attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment
such as mixers, garden equipment such as lawn mowers, portable tools such as
electric drills), or
－ switched on automatically, or is intended to be switched on manually, no more than
twice per day, and also has either a delayed restart (the delay being not less than a
few tens of seconds) or manual restart, after a power supply interruption.
Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.
7.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
No deviation.
Page: 96 of 141
7.6. Test Result
Product
Notebook
Test Item
Voltage Fluctuation and Flicker
Test Mode
Mode 1
Date of Test
2007/04/27
Test Result: Pass
Test Site
No.3 Shielded Room
Status: Test Completed
Psti and limit line
European Limits
Pst
1.00
0.75
0.50
0.25
13:25:55
Plt
Plt and limit line
0.6
0.5
0.4
0.3
0.2
0.1
13:25:55
Parameter values recorded during the test:
Vrms at the end of test (Volt):
229.58
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Highest Pst (10 min. period):
0.182
Highest Plt (2 hr. period):
0.079
Test limit (%):
Test limit (mS):
Test limit (%):
Test limit (%):
Test limit:
Test limit:
Page: 97 of 141
3.30
500.0
3.30
4.00
1.000
0.650
Pass
Pass
Pass
Pass
Pass
Pass
Product
Notebook
Test Item
Voltage Fluctuation and Flicker
Test Mode
Mode 2
Date of Test
2007/04/27
Test Result: Pass
Test Site
No.3 Shielded Room
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
13:47:43
Plt
Plt and limit line
0.6
0.5
0.4
0.3
0.2
0.1
13:47:43
Parameter values recorded during the test:
Vrms at the end of test (Volt):
229.58
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Highest Pst (10 min. period):
0.160
Highest Plt (2 hr. period):
0.070
Test limit (%):
Test limit (mS):
Test limit (%):
Test limit (%):
Test limit:
Test limit:
Page: 98 of 141
3.30
500.0
3.30
4.00
1.000
0.650
Pass
Pass
Pass
Pass
Pass
Pass
Test Mode
Description
Test Mode
Description
: Mode 1
: Flicker Test Setup
: Mode 2
: Flicker Test Setup
Page: 99 of 141
8. Electrostatic Discharge
According to Standard : IEC 61000-4-2
8.2. Test Setup
8.3. Limit
Item Environmental
Units
Test Specification
Phenomena
Performance
Criteria
Enclosure Port
Electrostatic Discharge kV(Charge Voltage)
±8 Air Discharge
±4 Contact Discharge
Page: 100 of 141
B
8.4. Test Procedure
Direct application of discharges to the EUT:
Contact discharge was applied only to conductive surfaces of the EUT.
Air discharges were applied only to non-conductive surfaces of the EUT.
During the test, it was performed with single discharges. For the single discharge
time between successive single discharges will be keep longer 1 second. It was at
least ten single discharges with positive and negative at the same selected point.
The selected point, which was performed with electrostatic discharge, was marked
on the red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP):
The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned
at a distance 0.1m from, the EUT, with the Discharge Electrode touching the
coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
Horizontal Coupling Plane (HCP):
The coupling plane is placed under to the EUT. The generator shall be positioned
vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching
the coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
No deviation.
Page: 101 of 141
8.6. Test Result
Product
Notebook
Test Item
Test Mode
Mode 1
Date of Test
2007/05/11
Item
Amount of
Discharge
Test Site
Voltage
No.6 Shielded Room
Required
Criteria
Complied To
Criteria
Results
(A,B,C)
10
+8kV
B
A
Pass
10
-8kV
B
A
Pass
25
+4kV
B
A
Pass
25
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(HCP)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Front)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Left)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Back)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Right)
50
-4kV
B
A
Pass
Air Discharge
Contact Discharge
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only
highest level is shown on the report.
NR: No Requirement
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV.
No false alarms or other malfunctions were observed during or after the test.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 102 of 141
Product
Notebook
Test Item
Test Mode
Mode 2
Date of Test
2007/05/11
Item
Amount of
Discharge
Test Site
Voltage
No.6 Shielded Room
Required
Criteria
Complied To
Criteria
Results
(A,B,C)
10
+8kV
B
A
Pass
10
-8kV
B
A
Pass
25
+4kV
B
A
Pass
25
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(HCP)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Front)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Left)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Back)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Right)
50
-4kV
B
A
Pass
Air Discharge
Contact Discharge
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only
highest level is shown on the report.
NR: No Requirement
kV.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 103 of 141
Test Mode
Description
Test Mode
Description
: Mode 1
: ESD Test Setup
: Mode 2
: ESD Test Setup
Page: 104 of 141
9. Radiated Susceptibility
9.2. Test Setup
9.3. Limit
Item Environmental
Units
Phenomena
Test
Performance
Specification
Criteria
Enclosure Port
80-1000
Radio-Frequency
MHz
Electromagnetic Field
V/m(Un-modulated, rms) 3
Amplitude Modulated
% AM (1kHz)
Page: 105 of 141
80
A
9.4. Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are
placed with one coincident with the calibration plane such that the distance from
antenna to the EUT was 3 meters.
Both horizontal and vertical polarization of the antenna and four sides of the EUT are set
on measurement.
In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows:
Condition of Test
Remarks
1.
Field Strength
3 V/m Level 2
2.
Radiated Signal
AM 80% Modulated with 1kHz
3.
Scanning Frequency
80MHz - 1000MHz
4
Dwell Time
3 Seconds
5.
Frequency step size
6.
The rate of Swept of Frequency
∆ f :
1%
1.5 x 10-3 decades/s
No deviation.
Page: 106 of 141
9.6. Test Result
Product
Notebook
Test Item
Test Mode
Mode 1
Date of Test
2007/05/11
Test Site
Field
Chamber5
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Strength
(V/m)
Criteria
Criteria
Results
(A,B,C)
Note:
The testing performed is from lowest level up to the highest level as required by standard, but
only highest level is shown on the report.
There was no observable degradation in performance.
MHz.
at frequency
Page: 107 of 141
V/m
Product
Notebook
Test Item
Test Mode
Mode 2
Date of Test
2007/05/11
Test Site
Field
Chamber5
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Strength
(V/m)
Criteria
Criteria
Results
(A,B,C)
Note:
There was no observable degradation in performance.
at frequency
MHz.
Page: 108 of 141
V/m
Test Mode
Description
Test Mode
Description
: Mode 1
: Radiated Susceptibility Test Setup
: Mode 2
: Radiated Susceptibility Test Setup
Page: 109 of 141
10. Electrical Fast Transient/Burst
10.2. Test Setup
10.3. Limit
Item Environmental
Units
Phenomena
I/O and communication ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Input DC Power Ports
Mode
Tr/Th ns
Rep. Frequency kHz
Input AC Power Ports
Mode
Tr/Th ns
Rep. Frequency kHz
Page: 110 of 141
Test Specification Performance
Criteria
+0.5
5/50
5
B
+0.5
5/50
5
B
+1
5/50
5
B
10.4. Test Procedure
The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on
the table, and uses a 0.1m insulation between the EUT and ground reference plane.
The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and
projected beyond the EUT by at least 0.1m on all sides.
Test on I/O and communication ports:
The EFT interference signal is through a coupling clamp device couples to the signal and
control lines of the EUT with burst noise for 1minute.
Test on power supply ports:
The EUT is connected to the power mains through a coupling device that directly couples the
EFT/B interference signal.
Each of the Line and Neutral conductors is impressed with burst noise for 1 minute.
The length of the signal and power lines between the coupling device and the EUT is 0.5m.
No deviation.
Page: 111 of 141
10.6. Test Result
Product
Notebook
Test Item
Test Mode
Mode 1
Date of Test
2007/05/11
Inject
Line
Voltage
Test Site
Inject
Time
Polarity
kV
(Second)
No.2 Shielded Room
Inject
Required
Method
Criteria
Complied
to
Result
Criteria
L+N+PE
±
1kV
60
CDN
B
A
PASS
LAN
±
0.5kV
90
Clamp
B
A
PASS
Telecom
±
0.5kV
90
Clamp
B
B
PASS
Note:
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
.
Line
Page: 112 of 141
kV of
Product
Notebook
Test Item
Test Mode
Mode 2
Date of Test
2007/05/11
Inject
Line
Voltage
Test Site
Inject
Time
Polarity
kV
(Second)
No.2 Shielded Room
Inject
Required
Method
Criteria
Complied
to
Result
Criteria
L+N+PE
±
1kV
60
CDN
B
A
PASS
LAN
±
0.5kV
90
Clamp
B
A
PASS
Telecom
±
0.5kV
90
Clamp
B
B
PASS
Note:
Line
.
Page: 113 of 141
kV of
Test Mode
Description
Test Mode
Description
: Mode 1
: EFT/B Test Setup
: Mode 1
: EFT/B Test Setup-Clamp
Page: 114 of 141
Test Mode
Description
Test Mode
Description
: Mode 2
: EFT/B Test Setup
: Mode 2
: EFT/B Test Setup-Clamp
Page: 115 of 141
11. Surge
11.2. Test Setup
11.3. Limit
Item Environmental Phenomena Units
Criteria
Signal Ports and Telecommunication Ports(See 1) and 2) )
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
±1
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
± 0.5
AC Input and AC Output Power Ports
Surges
Tr/Th us
1.2/50 (8/20)
Line to Line
kV
±1
B
Line to Ground
kV
±2
Notes:
1) Applicable only to ports which according to the manufacturer’s may directly to outdoor
cables.
2) Where normal functioning cannot be achieved because of the impact of the CDN on the
EUT, no immunity test shall be required.
Page: 116 of 141
The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The length of power cord between the coupling device and the EUT shall
be 2m or less.
For Input and Output AC Power or DC Input and DC Output Power Ports:
The EUT is connected to the power mains through a coupling device that directly couples the
Surge interference signal.
The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and
the peak value of the a.c. voltage wave. (Positive and negative)
Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with
interval of 1 min.
No deviation.
Page: 117 of 141
11.6. Test Result
Product
Notebook
Test Item
Surge
Test Mode
Mode 1
Date of Test
2007/05/11
Inject
Line
Test Site
Voltage
Polarity
Time
Interval
Angle
kV
(Second)
No.2 Shielded Room
Inject
Required
Method
Criteria
Complied
to
Result
Criteria
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Note:
.
Line
Page: 118 of 141
kV of
Product
Notebook
Test Item
Surge
Test Mode
Mode 2
Date of Test
2007/05/11
Inject
Line
Test Site
Voltage
Polarity
Time
Interval
Angle
kV
(Second)
No.2 Shielded Room
Inject
Required
Method
Criteria
Complied
to
Result
Criteria
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Note:
.
Line
Page: 119 of 141
kV of
Test Mode
Description
Test Mode
Description
: Mode 1
: SURGE Test Setup
: Mode 2
: SURGE Test Setup
Page: 120 of 141
12. Conducted Susceptibility
12.2. Test Setup
CDN Test Mode
EM Clamp Test Mode
Page: 121 of 141
12.3. Limit
Item Environmental Phenomena Units
Test
Specification
Signal Ports and Telecommunication Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
Radio-Frequency
MHz
V (rms,
Un-modulated)
% AM (1kHz)
Radio-Frequency
MHz
V (rms,
Un-modulated)
% AM (1kHz)
0.15-80
3
80
0.15-80
3
80
0.15-80
3
80
Performance
Criteria
A
A
A
The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the
table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground
reference plane.
For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp
device couples to the signal and Telecommunication lines of the EUT.
For Input DC and AC Power Ports
The EUT is connected to the power mains through a coupling and decoupling networks for
power supply lines. And directly couples the disturbances signal into EUT.
Used CDN-M2 for two wires or CDN-M3 for three wires.
All the scanning conditions are as follows:
Condition of Test
1. Field Strength
2. Radiated Signal
3. Scanning Frequency
4 Dwell Time
5. Frequency step size
∆ f :
6. The rate of Swept of Frequency
Remarks
130dBuV(3V) Level 2
AM 80% Modulated with 1kHz
0.15MHz – 80MHz
3 Seconds
1%
1.5 x 10-3 decades/s
No deviation.
Page: 122 of 141
12.6. Test Result
Product
Notebook
Test Item
Test Mode
Mode 1
Date of Test
2007/05/11
Test Site
No.6 Shielded Room
Required Performance
Result
Frequency
Voltage
Inject
Tested Port
Range
Applied
Method
of
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
CDN
LAN
A
A
PASS
0.15~80
130 (3V)
CDN
Telecom
A
A
PASS
0.15~80
130 (3V)
CDN
LAN GIGA
A
A
PASS
Criteria
Criteria
Complied To
EUT
Note:
dBuV(V) at
frequency
MHz.
No false alarms or other malfunctions were observed during or after the test. The
acceptance criteria were met, and the EUT passed the test.
Page: 123 of 141
Product
Notebook
Test Item
Test Mode
Mode 2
Date of Test
2007/05/11
Test Site
No.6 Shielded Room
Required Performance
Result
Frequency
Voltage
Inject
Tested Port
Range
Applied
Method
of
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
CDN
LAN
A
A
PASS
0.15~80
130 (3V)
CDN
Telecom
A
A
PASS
0.15~80
130 (3V)
CDN
LAN GIGA
A
A
PASS
Criteria
Criteria
Complied To
EUT
Note:
dBuV(V) at
frequency
MHz.
No false alarms or other malfunctions were observed during or after the test. The
acceptance criteria were met, and the EUT passed the test.
Page: 124 of 141
Test Mode
Description
Test Mode
Description
: Mode 1
: Conducted Susceptibility Test Setup
: Mode 1
: Conducted Susceptibility Test Setup-CDN
Page: 125 of 141
Test Mode
Description
Test Mode
Description
: Mode 2
: Conducted Susceptibility Test Setup
: Mode 2
: Conducted Susceptibility Test Setup-CDN
Page: 126 of 141
13. Power Frequency Magnetic Field
13.2. Test Setup
13.3. Limit
Item
Environmental
Phenomena
Enclosure Port
Power-Frequency
Magnetic Field
Units
Criteria
Hz
A/m (r.m.s.)
50
1
A
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured at least 1m*1m min. The test magnetic field shall be placed at central
of the induction coil.
The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.
And the induction coil shall be rotated by 90° in order to expose the EUT to the test field
with different orientation (X, Y, Z Orientations).
No deviation.
Page: 127 of 141
13.6. Test Result
Product
Notebook
Test Item
Test Mode
Mode 1
Date of Test
2007/05/11
Polarization
Test Site
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
kV
of Line
.
No false alarms or other malfunctions were observed during or after the test. The acceptance
criteria were met, and the EUT passed the test.
Page: 128 of 141
Product
Notebook
Test Item
Test Mode
Mode 2
Date of Test
2007/05/11
Polarization
Test Site
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
kV
of Line
.
Page: 129 of 141
Test Mode
Description
Test Mode
Description
: Mode 1
: Power Frequency Magnetic Field Test Setup
: Mode 2
: Power Frequency Magnetic Field Test Setup
Page: 130 of 141
14. Voltage Dips and Interruption
14.2. Test Setup
14.3. Limit
Item Environmental
Units
Phenomena
Voltage Dips
Criteria
% Reduction
30
Period
25
% Reduction
Period
Voltage Interruptions
>95
0.5
% Reduction
> 95
Period
250
Page: 131 of 141
C
B
C
The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane
measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The power cord shall be used the shortest power cord as specified by the
manufacturer.
For Voltage Dips/ Interruptions test:
The selection of test voltage is based on the rated power range. If the operation range is
large than 20% of lower power range, both end of specified voltage shall be tested.
Otherwise, the typical voltage specification is selected as test voltage.
The EUT is connected to the power mains through a coupling device that directly couples to
the Voltage Dips and Interruption Generator.
The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods,
for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three
voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied
voltage and duration 250 Periods with a sequence of three voltage interruptions with
intervals of 10 seconds.
Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the
voltage.
No deviation.
Page: 132 of 141
14.6. Test Result
Product
Notebook
Test Item
Test Mode
Mode 1
Date of Test
2007/05/11
Voltage Dips and
Angle
Interruption
Test Site
Test Duration
Required
Performance
(Periods)
Performance
Criteria
Criteria
Complied To
C
C
C
C
C
C
C
C
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
Reduction(%)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
No.2 Shielded Room
25
25
25
25
25
25
25
25
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
250
250
250
250
250
250
250
250
Test Result
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
The nominal voltage of EUT is 230V.
kV
of Line
.
Page: 133 of 141
Product
Notebook
Test Item
Test Mode
Mode 2
Date of Test
2007/05/11
Voltage Dips and
Angle
Interruption
Test Site
Test Duration
Required
Performance
(Periods)
Performance
Criteria
Criteria
Complied To
C
C
C
C
C
C
C
C
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
C
C
C
C
C
C
C
C
Reduction(%)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
No.2 Shielded Room
25
25
25
25
25
25
25
25
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
250
250
250
250
250
250
250
250
Test Result
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
The nominal voltage of EUT is 230V.
kV
of Line
.
Page: 134 of 141
Test Mode
Description
Test Mode
Description
: Mode 1
: Voltage Dips Test Setup
: Mode 2
: Voltage Dips Test Setup
Page: 135 of 141
Attachment
EUT Photograph
(1) EUT Photo
(2) EUT Photo
Page: 136 of 141
(3) EUT Photo
(4) EUT Photo
Page: 137 of 141
(5) EUT Photo
(6) EUT Photo
Page: 138 of 141
(7) EUT Photo
(8) EUT Photo
Page: 139 of 141
(9) EUT Photo
(10) EUT Photo
Page: 140 of 141
(11) EUT Photo
Page: 141 of 141

IT Report---960719

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