MS-7231(6410) CE IT report 950214

Transcription

Test Report
Product Name ： Barebone
Model No.
： MS-6410, Hetis 945, Hetis 945 Lite
Applicant ： MICRO-STAR INTL Co., LTD.
Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien,
Taiwan, R.O.C.
Date of Receipt ： 2006/01/17
Issued Date
： 2006/02/06
Report No.
： 061L122-IT-CE-P11V04
The test results relate only to the samples tested.
The test results shown in the test report are traceable to the national/international standard through the calibration
of the equipment and evaluated measurement uncertainty herein.
This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Declaration of Conformity
The following product is herewith confirmed to comply with the requirements set out in the
Council Directive on the Approximation of the laws of the Member States relating to
Electromagnetic Compatibility Directive (89/336/EEC). The listed standards as below were
applied:
The following Equipment:
Product
: Barebone
Model Number
: MS-6410, Hetis 945, Hetis 945 Lite
Trade Name
: MSI
This product is herewith confirmed to comply with the requirements set out in the
Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding
EMC, the following standards were applied:
RFI Emission:
EN 55022:1998+A1:2000+A2:2003 Class B
: Product family standard
EN 61000-3-2:2000 Class D
: Limits for harmonic current emission
EN 61000-3-3:1995+A1:2001
: Limitation of voltage fluctuation and flicker
in low-voltage supply system
Immunity:
EN 55024:1998+A1:2001+A2:2003
The following importer/manufacturer is responsible for this declaration:
Company Name
:
Company Address :
Telephone
:
Facsimile :
Person is responsible for marking this declaration:
Name (Full Name)
Position/ Title
Date
Legal Signature
QTK No.: 0 6 1 L 1 2 2 - I T - C E - P 1 1 V 0 4
Statement of Conformity
This certifies that the following designated product:
Product
: Barebone
Model Number
: MS-6410, Hetis 945, Hetis 945 Lite
Trade Name
: MSI
Company Name
: MICRO-STAR INTL Co., LTD.
This product is herewith confirmed to comply with the requirements set out in the
Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding
EMC, the following standards were applied:
RFI Emission:
EN 55022:1998+A1:2000+A2:2003 Class B
EN 61000-3-2:2000 Class D
: Limits for harmonic current emission
EN 61000-3-3:1995+A1:2001
: Limitation of voltage fluctuation and flicker
in low-voltage supply system
Immunity:
EN 55024:1998+A1:2001+A2:2003
TEST LABORATORY
0914
Gene Chang / President
The verification is based on a single evaluation of one sample of above-mentioned products. It does
not imply an assessment of the whole production and does not permit the use of the test lab. Logo.
QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com
Report No： 061L122-IT-CE-P11V04
Test Report Certification
Issued Date
Report No.
: 2006/02/06
: 061L122-IT-CE-P11V04
Product Name
:
Barebone
Applicant
:
MICRO-STAR INTL Co., LTD.
Address
:
No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan,
R.O.C.
Manufacturer
:
MICRO-STAR INTL Co., LTD.
Model No.
:
MS-6410, Hetis 945, Hetis 945 Lite
Rated Voltage
:
AC 230 V / 50 Hz
EUT Voltage
:
AC 100~120/ 220~240V, 60/50Hz
AC 100~127V, 200~240V, 47~63Hz
Trade Name
:
MSI
Applicable Standard
:
EN 55022: 1998+A1: 2000+A2: 2003 Class B
EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2:2000,
EN 61000-3-3:1995+A1:2001 AS/NZS CISPR 22: 2004
Test Result
:
Complied
Performed Location
:
Linkou EMC laboratory
No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo
Shiang, Taipei, 244 Taiwan, R.O.C.
TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789
Documented By
Reviewed By
Approved By
:
(
Rebaca CHi
)
(
Tommy Chen
)
(
Gene Chang
)
:
:
Page: 2 of 114
Laboratory Information
We , QuieTek Corporation, are an independent EMC and safety consultancy that was
established the whole facility in our laboratories. The test facility has been accredited by the
following accreditation Bodies in compliance with ISO 17025, EN 45001 and Guide 25:
Taiwan R.O.C.
:
BSMI, DGT, CNLA
Germany
:
TUV Rheinland
Norway
:
Nemko, DNV
USA
:
FCC, NVLAP
Japan
:
VCCI
The related certificate for our laboratories about the test site and management system can be downloaded
from QuieTek Corporation’s Web Site : http://tw.quietek.com/modules/myalbum/
The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site :
http://www.quietek.com/
If you have any comments, Please don’t hesitate to contact us. Our contact information is as below:
HsinChu Testing Laboratory :
No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307,
Taiwan, R.O.C.
TEL:+886-3-592-8858 / FAX:+886-3-592-8859
E-Mail : service@quietek.com
1313
LinKou Testing Laboratory :
No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwa, R.O.C.
TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789
E-Mail : service@quietek.com
0914
Page: 3 of 114
TABLE OF CONTENTS
Description
Page
1. General Information .................................................................................................... 7
1.1. EUT Description.......................................................................................................... 7
1.2. Mode of Operation ...................................................................................................... 8
1.3. Tested System Details ................................................................................................ 9
1.4. Configuration of Tested System ................................................................................ 10
1.5. EUT Exercise Software............................................................................................. 11
2. Technical Test ........................................................................................................... 12
2.1. Summary of Test Result............................................................................................ 12
2.2. List of Test Equipment............................................................................................... 13
2.3. Measurement Uncertainty......................................................................................... 16
2.4. Test Environment ...................................................................................................... 18
3. Conducted Emission (Main Terminals)...................................................................... 19
3.1. Test Specification ...................................................................................................... 19
3.2. Test Setup................................................................................................................. 19
3.3. Limit .......................................................................................................................... 19
3.4. Test Procedure.......................................................................................................... 20
3.5. Deviation from Test Standard .................................................................................... 20
3.6. Test Result ................................................................................................................ 21
3.7. Test Photograph........................................................................................................ 33
4. Conducted Emissions (Telecommunication Ports).................................................... 35
4.2. Test Setup................................................................................................................. 35
4.3. Limit .......................................................................................................................... 35
4.4. Test Procedure.......................................................................................................... 36
4.6. Test Result ................................................................................................................ 37
4.7. Test Photograph........................................................................................................ 49
5. Radiated Emission.................................................................................................... 52
5.2. Test Setup................................................................................................................. 52
5.3. Limit .......................................................................................................................... 52
5.4. Test Procedure.......................................................................................................... 53
5.6. Test Result ................................................................................................................ 54
5.7. Test Photograph........................................................................................................ 58
6. Harmonic Current Emission ...................................................................................... 60
Page: 4 of 114
6.2. Test Setup................................................................................................................. 60
6.3. Limit .......................................................................................................................... 60
6.4. Test Procedure.......................................................................................................... 62
6.6. Test Result ................................................................................................................ 63
6.7. Test Photograph........................................................................................................ 67
7. Voltage Fluctuation and Flicker ................................................................................. 68
7.2. Test Setup................................................................................................................. 68
7.3. Limit .......................................................................................................................... 68
7.4. Test Procedure.......................................................................................................... 69
7.6. Test Result ................................................................................................................ 70
7.7. Test Photograph........................................................................................................ 72
8. Electrostatic Discharge ............................................................................................. 73
8.2. Test Setup................................................................................................................. 73
8.3. Limit .......................................................................................................................... 73
8.4. Test Procedure.......................................................................................................... 74
8.6. Test Result ................................................................................................................ 75
8.7. Test Photograph........................................................................................................ 77
9. Radiated Susceptibility ............................................................................................. 78
9.2. Test Setup................................................................................................................. 78
9.3. Limit .......................................................................................................................... 78
9.4. Test Procedure.......................................................................................................... 79
9.6. Test Result ................................................................................................................ 80
9.7. Test Photograph........................................................................................................ 82
10. Electrical Fast Transient/Burst .................................................................................. 83
10.1.
Test Specification ............................................................................................... 83
10.2.
Test Setup.......................................................................................................... 83
10.3.
Limit ................................................................................................................... 83
10.4.
Test Procedure .................................................................................................. 84
10.5.
Deviation from Test Standard............................................................................. 84
10.6.
Test Result......................................................................................................... 85
Page: 5 of 114
10.7.
Test Photograph ................................................................................................ 87
11. Surge ........................................................................................................................ 89
11.1.
11.2.
Test Setup.......................................................................................................... 89
11.3.
Limit ................................................................................................................... 89
11.4.
Test Procedure .................................................................................................. 90
11.5.
11.6.
Test Result......................................................................................................... 91
11.7.
Test Photograph ................................................................................................ 93
12. Conducted Susceptibility........................................................................................... 94
12.1.
12.2.
Test Setup.......................................................................................................... 94
12.3.
Limit ................................................................................................................... 95
12.4.
Test Procedure .................................................................................................. 95
12.5.
12.6.
Test Result......................................................................................................... 96
12.7.
Test Photograph ................................................................................................ 98
13. Power Frequency Magnetic Field ........................................................................... 100
13.1.
Test Specification ............................................................................................. 100
13.2.
Test Setup........................................................................................................ 100
13.3.
Limit ................................................................................................................. 100
13.4.
Test Procedure ................................................................................................ 100
13.5.
Deviation from Test Standard........................................................................... 100
13.6.
Test Result....................................................................................................... 101
13.7.
Test Photograph .............................................................................................. 103
14. Voltage Dips and Interruption.................................................................................. 104
14.1.
Test Specification ............................................................................................. 104
14.2.
Test Setup........................................................................................................ 104
14.3.
Limit ................................................................................................................. 104
14.4.
Test Procedure ................................................................................................ 105
14.5.
Deviation from Test Standard........................................................................... 105
14.6.
Test Result....................................................................................................... 106
14.7.
Test Photograph .............................................................................................. 108
15. Attachment.............................................................................................................. 109
EUT Photograph ..................................................................................................... 109
Page: 6 of 114
1. General Information
1.1. EUT Description
Product Name
Trade Name
Model No.
Barebone
MSI
MS-6410, Hetis 945, Hetis 945 Lite
Component
Motherboard
MSI, MS-7231
VGA Card
On Board
Sound Card
On Board
LAN Card
On Board
CPU
Intel P4 (LGA 775), 3.8GHz/ 200MHz
Intel P4 (LGA 775), 3.73GHz/ 266MHz
HDD
Western Digital, WD1600JS-19MHB0
CD-ROM
TEAC, CD-540E
RAM
ELPIDA, 1GB 2RX8 PC2-4200U-444
CD-RW
MIC, CW058D
Power Supply
FSP, FSP-250-50MSP
Delta, DPS-250AB-7 B
Note:
1. The different of the each model is shown as below:
Model Number
Description
MS-6410
-Hetis 945
Marketing requirement
Hetis 945 Lite
Marketing requirement
(Without VDI, 1394, RCA, S-Video)
Page: 7 of 114
1.2. Mode of Operation
QuieTek has verified the construction and function in typical operation. All the test modes were
carried out with the EUT in normal operation, which was shown in this test report and defined as:
Pre-Test Mode
Mode 1: Intel P4 3.8GHz,D-SUB 2045*1536/75Hz+ DVI 1280*1024/75Hz (FSP)
Mode 2: Intel P4 3.73GHz,D-SUB 1600*1200/75Hz+ DVI 1024*768/75Hz (DELTA)
Mode 4: Intel P4 3.8GHz,DVI 1024*768/75Hz+ S-VIDEO 1024*768/60Hz (DELTA)
Mode 5: Intel P4 3.06GHz,DVI 800*600/60Hz+ S-VIDEO 800*600/60Hz (FSP)
Final Test Mode
Emission
Immunity
Page: 8 of 114
1.3. Tested System Details
The types for all equipments, plus descriptions of all cables used in the tested system (including
inserted cards) are:
Product
1 Modem
2 Monitor
3 Modem
4 Walkman
5 Microphone
& Earphone
6 Microphone
& Earphone
7 Keyboard
Manufacturer
ACEEX
SAMSUNG
ACEEX
AIWA
ROSA
Model No.
DM-1414
1200NF
DM-1414
HS-TA164
RSM-900
Serial No.
0102027558
800095K
0102027541
N/A
N/A
Power Cord
Non-Shielded, 1.8m
Non-Shielded, 1.8m
Non-Shielded, 1.8m
N/A
N/A
PCHOME
N/A
N/A
Non-Shielded, 2m
COMPAQ
KB-0133
M-S69
ME-910
B55940MGAPK00 N/A
M
N/A
N/A
235842
Power by PC
ME-910
235576
Power by PC
ME-910
220955
Power by PC
PVM-14M2U
ME-910
2111366
233729
Non-Shielded, 1.8m
Power by PC
ME-910
235933
Power by PC
ME-910
235484
Power by PC
SCB-2408D
42DM355288
17 Slim COMBO ASUS
SCB-2408D
N/A
18 Speaker
IBM
N/A
19 Speaker
IBM
N/A
N/A
20 Speaker
IBM
IBM FRU PN
09N5395
IBM FRU PN
09N5395
IBM FRU PN
09N5395
S80130
Non-Shielded, 1.8m,with
one ferrite core bonded.
Non-Shielded, 1.8m With
Core*1
N/A
N/A
N/A
8
9
10
11
12
13
14
15
16
Mouse
HP
COMBO
Topdisk
HDD
USB 2.0
Topdisk
HDD
USB 2.0
Topdisk
HDD
Monitor
SONY
USB 2.0
Topdisk
HDD
USB 2.0
Topdisk
HDD
USB 2.0
Topdisk
HDD
Slim COMBO ASUS
21 Cambridge Creative
SoundWorks
22 LCD Monitor CMV
23 Notebook PC DELL
CT-720D
PP01L
AM013032000009 Non-Shielded, 1.9m
42
3UC1209SSA1291 Non-Shielded, 1.8m
N/A
Non-Shielded, 1.8m
Page: 9 of 114
1.4. Configuration of Tested System
Connection Diagram
Signal Cable Type
Signal cable Description
A
RS232 Cable
Shielded, 1.5m
B
D-SUB Cable
Shielded, 1.8m, with two ferrite cores bonded, two PCS.
C
RS232 Cable
Shielded, 1.5m
D
Audio Cable
Non-Shielded, 1.6m
E
Earphone & Microphone Cable
Non-Shielded, 1.6m
F
Earphone & Microphone Cable
Non-Shielded, 1.6m
G
PS/2 Keyboard Cable
Shielded, 1.8m
H
PS/2 Mouse Cable
Shielded, 1.8m
I
USB Cable
Shielded, 1.6m, six PCS.
J
S-VIDEO Cable
Shielded, 1.5m
K
Audio Cable
Non-Shielded, 1.6m, three PCS.
L
1394 Cable
Shielded, 1.5m, two PCS.
M
RCA Cable
Shielded, 1.2m
N
DVI Cable
Shielded, 1.8m, with two ferrite cores bonded
O
LAN Cable
Non-Shielded, 7m
Page: 10 of 114
1.5. EUT Exercise Software
1
Setup the EUT and simulators as shown on 1.4.
2
Turn on the power of all equipment and EUT.
3
EUT reads data from disk.
4
EUT Computer sends “H” pattern to monitor and printer, the printer will print “H” pattern on
paper.
5
EUT reads and writes data into and from modem.
6
EUT will read data from floppy disk and then writes the data into floppy disk , same operation for hard
disk.
7
Repeat the above procedure 3 to 6
8
EUT Connect another simulation PC through LAN port and carry out Read/Write work each other.
Page: 11 of 114
2. Technical Test
2.1. Summary of Test Result
No deviations from the test standards
Deviations from the test standards as below description:
Emission
Performed Item
Normative References
Conducted Emission
EN 55022:1998+A1:2000+A2:2003 Class
Test
Performed
Deviation
Yes
No
Yes
No
Yes
No
B
AS/NZS CISPR 22: 2004
Conducted Emissions
EN 55022:1998+A1:2000+A2:2003 Class B
(Telecommunication Ports)
Radiated Emission
EN 55022:1998+A1:2000+A2:2003 Class
B
Power Harmonics
EN 61000-3-2:2000
Yes
No
Voltage Fluctuation and
EN 61000-3-3:1995+A1:2001
Yes
No
Flicker
Immunity
Test
Performed Item
Normative References
Electrostatic Discharge
IEC 61000-4-2 Edition 1.2: 2001-04
Yes
No
Radiated susceptibility
IEC 61000-4-3:2002+A1:2002
Yes
No
Electrical fast transient/burst IEC 61000-4-4:2004
Yes
No
Surge
IEC 61000-4-5 Edition 1.1: 2001-04
Yes
No
Conducted susceptibility
IEC 61000-4-6 Edition 2.1: 2004-11
Yes
No
Power frequency magnetic
IEC 61000-4-8 Edition 1.1: 2001-03
Yes
No
Yes
No
Performed
Deviation
field
Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03
Page: 12 of 114
2.2. List of Test Equipment
Conducted Emission / SR1
Instrument
EMI Test Receiver
LISN
LISN
Pulse Limiter
Manufacturer
R&S
R&S
R&S
R&S
Type No.
ESCS 30
ENV4200
ESH3-Z5
ESH3-Z2
Conducted Emissions (Telecommunication Ports) / SR2
Instrument
Manufacturer
Type No.
Absorbing Clamp
Schaffner
KEMZ 801
Capacitive Voltage Probe
Schaffner
CVP2200A
EMI Test Receiver
R&S
ESCS 30
LISN
R&S
ESH3-Z5
LISN
R&S
ESH3-Z5
lmpedance Stabilization
Schaffner
ISN T400
Network
Pulse Limiter
R&S
ESH3-Z2
F-65
RF Current Probe
FCC
10KHz~1GHz
Radiated Emission / Site3
Instrument
Bilog Antenna
Broadband Horn Antenna
EMI Test Receiver
Horn Antenna
Pre-Amplifier
Spectrum Analyzer
EMI Test Receiver
Manufacturer
Schaffner Chase
Schwarzbeck
R&S
Schwarzbeck
QTK
Advantest
R&S
Pre-Amplifier
MITEQ
Power Harmonics / SR3
Instrument
AC Power
Source(Harmonic)
IEC1000-4-X
Analyzer(Flicker)
Type No.
CBL6112B
BBHA9170
ESCS 30
BBHA9120D
Serial No
836858/022
833209/007
836679/020
357.88.10.52
Cal. Date
2005/07/21
2005/07/27
2005/02/17
2005/09/07
Serial No
21024
18331
100367
836679/023
836679/017
Cal. Date
2005/04/21
2005/11/11
2006/08/08
2005/07/12
2005/02/03
19099
2005/07/14
357.88.10.52
2005/09/07
198
2005/11/11
Serial No
2704
208
838251/001
305
Cal. Date
2005/09/15
2005/07/25
2005/03/22
2005/08/10
2006/01/03
2005/10/24
2005/05/25
R3162
101102468
ESI 26
838786/004
QMF-4D-18040
925974
0-45-6P
2006/01/03
Manufacturer
Type No.
Serial No
Cal. Date
Schaffner
NSG 1007
HK54148
2005/07/11
Schaffner
CCN 1000-1
X7 1887
2005/07/11
Type No.
Serial No
Cal. Date
NSG 1007
HK54148
2005/07/11
CCN 1000-1
X7 1887
2005/07/11
Voltage Fluctuation and Flicker / SR3
Instrument
Manufacturer
AC Power
Schaffner
Source(Harmonic)
IEC1000-4-X
Schaffner
Analyzer(Flicker)
Page: 13 of 114
Electrostatic Discharge / SR3
Instrument
Manufacturer
ESD simulator system
Schaffner
Horizontal Coupling
QuieTek
Plane(HCP)
Vertical Coupling
QuieTek
Plane(VCP)
Radiated susceptibility / CB5
Instrument
Manufacturer
Type No.
NSG 438
Serial No
167
Cal. Date
2005/06/07
HCP AL50
N/A
N/A
VCP AL50
N/A
N/A
Serial No
Cal. Date
100007
N/A
100137
2450
1085
2005/3/31
2006/01/03
2005/08/01
AF-BOX
R&S
Audio Analyzer
Bilog Antenna
Broad-Band Antenna
CMU200
UNIV.RADIOCOMM
Directional Coupler
Dual Microphone Supply
Mouth Simulator
Power Amplifier
Power Amplifier
Power Meter
Pre-Amplifier
Probe Microphone
R&S
Schaffner Chase
Schwarzbeck
Type No.
AF-BOX
ACCUST
UPL 16
CBL6112B
VULB 9166
R&S
CMU200
104846
2005/3/28
A&R
B&K
B&K
A&R
A&R
R&S
A&R
B&K
22735
2426784
2439692
309453
A285000010
100219
23067
2278070
2005/8/3
2005/8/3
2005/8/3
N/A
N/A
2005/1/17
N/A
2005/8/3
Signal Generator
R&S
DC 6180
5935
4227
30S1G3
100W10000M7
NRVD(P.M)
150A220
4182
SMY02(9K-208
0)
825454/028
2005/10/03
Type No.
Serial No
Cal. Date
PNW2225
200123-098SC
2005/12/28
PNW2056
200124-058SC
2005/12/28
NSG 642A
PNW 2050
PNW2003
30910014938
20532-514LU
200138-007SC
2005/12/28
2006/01/03
2006/01/02
CDN131
200124-007SC
2005/12/28
Type No.
Serial No
Cal. Date
PNW2225
200123-098SC
2005/12/28
PNW2056
200124-058SC
2005/12/28
NSG 642A
PNW 2050
PNW2003
30910014938
20532-514LU
200138-007SC
2005/12/28
2006/01/03
2006/01/02
CDN131
200124-007SC
2005/12/28
Electrical fast transient/burst / SR3
Instrument
Manufacturer
Burst 4.8KV/16A
Schaffner
Generator with CDN
Damped osc. Wave 100kHz
Schaffner
and 1MHz
Double AC Source Variator Schaffner
Hybrid surge pulse 1.2/50uS Schaffner
PQT Generator
Schaffner
Pulse COUPLING
Schaffner
NETWORK
Surge / SR3
Instrument
Manufacturer
Burst 4.8KV/16A
Schaffner
Generator with CDN
Schaffner
and 1MHz
PQT Generator
Schaffner
Pulse COUPLING
Schaffner
NETWORK
Page: 14 of 114
Conducted susceptibility / SR6
Instrument
Manufacturer
CDN
Schaffner
CDN
Schaffner
CDN M016S
Schaffner
CDN M016S
Schaffner
CDN T002
Schaffner
CDN T002
Schaffner
CDN T400
Schaffner
CDN T400
Schaffner
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
EM-CLAMP
Schaffner
N/A
N/A
Power frequency magnetic field / SR3
Instrument
Manufacturer
Induction Coil Interface
Schaffner
Magnetic Loop Coil
Schaffner
Magnetic/Electric field
Lackmann Phymetric
measuring system
TriaxialL ELF Magnetic
F.W. BELL
Field meter
Voltage dips and interruption / SR3
Instrument
Manufacturer
Burst 4.8KV/16A
Schaffner
Generator with CDN
Schaffner
and 1MHz
PQT Generator
Schaffner
Pulse COUPLING
Schaffner
NETWORK
Type No.
CAL U100A
TRA U150
CAL U100A
TRA U150
TRA U150
CAL U100
CAL U100
TRA U150
Serial No
20405
20454
20410
21167
21169
20491
17735
21166
Cal. Date
2005/04/21
2005/04/21
2005/04/21
2005/04/21
2005/04/21
2005/04/21
2005/04/21
2005/04/21
CDN M016S
20822
2005/02/23
CDN T002
19018
2005/04/21
CDN T400
21226
2005/04/21
CDN M016S
20823
2005/04/21
KEMZ 801
N/A
21024
N/A
2005/04/21
N/A
Type No.
INA 2141
INA 702
Serial No
6002
199749-020IN
Cal. Date
N/A
N/A
MV3
N/A
4090
2005/08/22
Type No.
Serial No
Cal. Date
PNW2225
200123-098SC
2005/12/28
PNW2056
200124-058SC
2005/12/28
NSG 642A
PNW 2050
PNW2003
30910014938
20532-514LU
200138-007SC
2005/12/28
2006/01/03
2006/01/02
CDN131
200124-007SC
2005/12/28
Page: 15 of 114
2.3. Measurement Uncertainty
Conducted Emission
The measurement uncertainty is evaluated as ± 2.26 dB.
Conducted Emissions (Telecommunication Ports)
Radiated Emission
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant ESD standards.
The immunity test signal from the ESD system meet the required specifications in IEC
61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of
voltage and timing as being 1.63 % and 2.76%.
1999[2], the requirements for measurement uncertainty in RS testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant RS standards.
The immunity test signal from the RS system meet the required specifications in IEC
61000-4-3 through the calibration for the uniform field strength and monitoring for the test
level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.
Electrical fast transient/burst
1999[2], the requirements for measurement uncertainty in RS testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant RS standards.
The immunity test signal from the RS system meet the required specifications in IEC
61000-4-3 through the calibration for the uniform field strength and monitoring for the test
level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.
Surge
1999[2], the requirements for measurement uncertainty in Surge testing are deemed to
have been satisfied, and the testing is reported in accordance with the relevant Surge
standards. The immunity test signal from the Surge system meet the required specifications
in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the
waveform of voltage and timing as being 1.63 % and 2.76%.
Page: 16 of 114
1999[2], the requirements for measurement uncertainty in CS testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant CS standards.
The immunity test signal from the CS system meet the required specifications in IEC
61000-4-6 through the calibration for unmodulated signal and monitoring for the test level
with the uncertainty evaluation report for the injected modulated signal level through CDN
and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.
Power frequency magnetic field
1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant PFM standards.
The immunity test signal from the PFM system meet the required specifications in IEC
61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter
to verify the output level of magnetic field strength as being 2 %.
Voltage dips and interruption
1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant DIP standards.
The immunity test signal from the DIP system meet the required specifications in IEC
61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of
voltage and timing as being 1.63 % and 2.76%.
Page: 17 of 114
2.4. Test Environment
Performed Item
Conducted
Emission
Items
Required
Actual
Temperature (°C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
Temperature (°C)
860-1060
15-35
950-1000
25
25-75
50
860-1060
15-35
950-1000
25
25-75
50
860-1060
15-35
950-1000
23.8
30-60
42
860-1060
15-35
950-1000
22
25-75
45
860-1060
15-35
950-1000
20.7
25-75
43
860-1060
15-35
10-75
860-1060
15-35
950-1000
20.8
42
950-1000
20.8
25-75
43
860-1060
15-35
950-1000
26.9
25-75
38
860-1060
15-35
950-1000
20.7
25-75
49
860-1060
950-1000
Conducted
Emissions
Humidity (%RH)
(Telecommunicati
on Ports)
Temperature (°C)
Radiated
Humidity (%RH)
Emission
Temperature (°C)
Electrostatic
Humidity (%RH)
Discharge
Temperature (°C)
Radiated
Humidity (%RH)
susceptibility
Temperature (°C)
Electrical fast
Humidity (%RH)
transient/burst
Temperature (°C)
Surge
Humidity (%RH)
Temperature (°C)
Conducted
Humidity (%RH)
susceptibility
Temperature (°C)
Power frequency
Humidity (%RH)
magnetic field
Temperature (°C)
Voltage dips and
Humidity (%RH)
interruption
Page: 18 of 114
3. Conducted Emission (Main Terminals)
3.1. Test Specification
According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2004
3.2. Test Setup
3.3. Limit
Limits
Frequency
(MHz)
QP
(dBuV)
AV
(dBuV)
0.15 - 0.50
66 - 56
56 – 46
0.50-5.0
56
46
5.0 - 30
60
50
Remarks: In the above table, the tighter limit applies at the band edges.
Page: 19 of 114
3.4. Test Procedure
The EUT and simulators are connected to the main power through a line impedance
stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the
measuring equipment. The peripheral devices are also connected to the main power through
a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination.
(Please refers to the block diagram of the test setup and photographs.)
Both sides of A.C. line are checked for maximum conducted interference. In order to find the
maximum emission, the relative positions of equipment and all of the interface cables must
be changed on conducted measurement.
Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using
a receiver bandwidth of 9kHz.
3.5. Deviation from Test Standard
No deviation.
Page: 20 of 114
3.6. Test Result
Site : SR-1
Time : 2006/01/17 - 16:39
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Barebone
Probe : LISN-020(L) - Line1
Power : AC 230V/50Hz
Note : Mode 1
Page: 21 of 114
Site : SR-1
Time : 2006/01/17 - 16:41
Margin : 0
EUT : Barebone
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.189
0.202
37.560
37.762
-27.124
64.886
QUASIPEAK
2
2.990
0.310
36.530
36.840
-19.160
56.000
QUASIPEAK
3
4.033
0.353
36.560
36.913
-19.087
56.000
QUASIPEAK
4
7.041
0.494
46.020
46.514
-13.486
60.000
QUASIPEAK
7.818
0.534
47.300
47.834
-12.166
60.000
QUASIPEAK
8.748
0.577
43.270
43.847
-16.153
60.000
QUASIPEAK
5
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 22 of 114
Site : SR-1
Time : 2006/01/17 - 16:41
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Barebone
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.189
0.202
22.130
22.332
-32.554
54.886
AVERAGE
2
2.990
0.310
27.640
27.950
-18.050
46.000
AVERAGE
3
4.033
0.353
29.130
29.483
-16.517
46.000
AVERAGE
4
7.041
0.494
34.470
34.964
-15.036
50.000
AVERAGE
7.818
0.534
34.480
35.014
-14.986
50.000
AVERAGE
8.748
0.577
31.720
32.297
-17.703
50.000
AVERAGE
5
6
*
Note:
Page: 23 of 114
Site : SR-1
Time : 2006/01/17 - 16:41
Margin : 10
EUT : Barebone
Probe : LISN-020(N) - Line2
Note : Mode 1
Page: 24 of 114
Site : SR-1
Time : 2006/01/17 - 16:43
Margin : 0
EUT : Barebone
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.193
0.202
38.300
38.502
-26.269
64.771
QUASIPEAK
2
2.869
0.308
33.970
34.278
-21.722
56.000
QUASIPEAK
3
4.017
0.353
37.480
37.833
-18.167
56.000
QUASIPEAK
4
7.013
0.443
45.730
46.173
-13.827
60.000
QUASIPEAK
7.509
0.460
48.510
48.970
-11.030
60.000
QUASIPEAK
7.873
0.465
46.390
46.855
-13.145
60.000
QUASIPEAK
5
6
*
Note:
Page: 25 of 114
Site : SR-1
Time : 2006/01/17 - 16:43
Margin : 0
EUT : Barebone
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.193
0.202
25.930
26.132
-28.639
54.771
AVERAGE
2
2.869
0.308
21.150
21.458
-24.542
46.000
AVERAGE
4.017
0.353
32.950
33.303
-12.697
46.000
AVERAGE
4
7.013
0.443
36.610
37.053
-12.947
50.000
AVERAGE
5
7.509
0.460
34.280
34.740
-15.260
50.000
AVERAGE
6
7.873
0.465
34.180
34.645
-15.355
50.000
AVERAGE
3
*
Note:
Page: 26 of 114
Site : SR-1
Time : 2006/01/17 - 16:57
Margin : 10
EUT : Barebone
Note : Mode 2
Page: 27 of 114
Site : SR-1
Time : 2006/01/17 - 16:59
Margin : 0
EUT : Barebone
Note : Mode 2
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.642
0.218
32.660
32.878
-23.122
56.000
QUASIPEAK
2
1.462
0.249
33.410
33.659
-22.341
56.000
QUASIPEAK
3
1.716
0.262
31.980
32.242
-23.758
56.000
QUASIPEAK
4
6.888
0.489
42.910
43.399
-16.601
60.000
QUASIPEAK
7.576
0.521
48.380
48.901
-11.099
60.000
QUASIPEAK
8.974
0.585
42.490
43.075
-16.925
60.000
QUASIPEAK
5
6
*
Note:
Page: 28 of 114
Site : SR-1
Time : 2006/01/17 - 16:59
Margin : 0
EUT : Barebone
Note : Mode 2
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.642
0.218
32.650
32.868
-13.132
46.000
AVERAGE
2
1.462
0.249
29.590
29.839
-16.161
46.000
AVERAGE
3
1.716
0.262
27.430
27.692
-18.308
46.000
AVERAGE
4
6.888
0.489
35.450
35.939
-14.061
50.000
AVERAGE
5
7.576
0.521
33.190
33.711
-16.289
50.000
AVERAGE
6
8.974
0.585
31.020
31.605
-18.395
50.000
AVERAGE
Note:
Page: 29 of 114
Site : SR-1
Time : 2006/01/17 - 17:00
Margin : 10
EUT : Barebone
Note : Mode 2
Page: 30 of 114
Site : SR-1
Time : 2006/01/17 - 17:02
Margin : 0
EUT : Barebone
Note : Mode 2
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.787
0.230
32.900
33.130
-22.870
56.000
QUASIPEAK
2
0.998
0.233
34.100
34.333
-21.667
56.000
QUASIPEAK
3
1.572
0.260
34.500
34.760
-21.240
56.000
QUASIPEAK
4
7.130
0.445
47.000
47.445
-12.555
60.000
QUASIPEAK
7.634
0.461
48.860
49.321
-10.679
60.000
QUASIPEAK
8.384
0.481
47.010
47.491
-12.509
60.000
QUASIPEAK
5
6
*
Note:
Page: 31 of 114
Site : SR-1
Time : 2006/01/17 - 17:02
Margin : 0
EUT : Barebone
Note : Mode 2
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.787
0.230
32.120
32.350
-13.650
46.000
AVERAGE
0.998
0.233
33.730
33.963
-12.037
46.000
AVERAGE
3
1.572
0.260
32.530
32.790
-13.210
46.000
AVERAGE
4
7.130
0.445
32.320
32.765
-17.235
50.000
AVERAGE
5
7.634
0.461
34.330
34.791
-15.209
50.000
AVERAGE
6
8.384
0.481
35.630
36.111
-13.889
50.000
AVERAGE
2
*
Note:
Page: 32 of 114
3.7. Test Photograph
Test Mode
Description
Test Mode
Description
: Mode 1: Intel P4 3.8GHz,D-SUB 2045*1536/75Hz+ DVI 1280*1024/75Hz (FSP)
: Front View of Conducted Test
: Back View of Conducted Test
Page: 33 of 114
Test Mode
Description
Test Mode
Description
: Mode 2: Intel P4 3.73GHz,D-SUB 1600*1200/75Hz+ DVI 1024*768/75Hz (DELTA)
: Front View of Conducted Test
: Back View of Conducted Test
Page: 34 of 114
4. Conducted Emissions (Telecommunication Ports)
According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2004
4.2. Test Setup
4.3. Limit
Limits
Frequency
(MHz)
QP
(dBuV)
AV
(dBuV)
0.15 - 0.50
84 – 74
74 – 64
0.50 - 30
74
64
Remarks:
The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50
MHz.
Page: 35 of 114
4.4. Test Procedure
Telecommunication Port:
The mains voltage shall be supplied to the EUT via the LISN when the measurement of
telecommunication port is performed. The common mode disturbances at the
telecommunication port shall be connected to the ISN, which is 150 ohm impedance.
Both alternative cables are tested related to the LCL requested. The measurement range is
from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz.
The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is
used for alternative one.
No deviation.
Page: 36 of 114
4.6. Test Result
Site : SR-2
Time : 2006/01/20 - 14:13
Limit : ISN_Voltage_B_10db_00M_QP
Margin : 10
EUT : Barebone
Probe :
Note : Mode 1,LAN 100M
Page: 37 of 114
- Line1
Site : SR-2
Time : 2006/01/20 - 14:17
Margin : 0
EUT : Barebone
Probe : ISN-T400 - Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.201
9.893
40.660
50.553
-31.990
82.543
QUASIPEAK
2
0.318
9.884
38.090
47.974
-31.226
79.200
QUASIPEAK
3
0.701
9.850
54.060
63.910
-10.090
74.000
QUASIPEAK
0.752
9.840
59.730
69.570
-4.430
74.000
QUASIPEAK
5
6.943
9.790
61.170
70.960
-13.040
84.000
QUASIPEAK
6
8.099
9.790
58.490
68.280
-15.720
84.000
QUASIPEAK
4
*
Note:
Page: 38 of 114
Site : SR-2
Time : 2006/01/20 - 14:17
Limit : ISN_Voltage_B_10db_00M_AV
Margin : 0
EUT : Barebone
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.201
9.893
38.360
48.253
-24.290
72.543
AVERAGE
2
0.318
9.884
32.130
42.014
-27.186
69.200
AVERAGE
3
0.701
9.850
45.300
55.150
-8.850
64.000
AVERAGE
0.752
9.840
50.270
60.110
-3.890
64.000
AVERAGE
5
6.943
9.790
45.790
55.580
-18.420
74.000
AVERAGE
6
8.099
9.790
43.370
53.160
-20.840
74.000
AVERAGE
4
*
Note:
Page: 39 of 114
Site : SR-2
Time : 2006/01/20 - 13:55
Margin : 10
EUT : Barebone
Probe :
Page: 40 of 114
- Line1
Site : SR-2
Time : 2006/01/20 - 13:57
Margin : 0
EUT : Barebone
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.201
9.893
39.200
49.093
-33.450
82.543
QUASIPEAK
2
0.443
9.870
42.290
52.160
-23.469
75.629
QUASIPEAK
3
1.322
9.820
49.090
58.910
-15.090
74.000
QUASIPEAK
4
3.951
9.810
48.080
57.890
-16.110
74.000
QUASIPEAK
5
7.763
9.790
60.960
70.750
-13.250
84.000
QUASIPEAK
10.002
9.780
64.870
74.650
-9.350
84.000
QUASIPEAK
6
*
Note:
Page: 41 of 114
Site : SR-2
Time : 2006/01/20 - 13:57
Limit : ISN_Voltage_B_10db_00M_AV
Margin : 0
EUT : Barebone
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.201
9.893
37.860
47.753
-24.790
72.543
AVERAGE
2
0.443
9.870
33.950
43.820
-21.809
65.629
AVERAGE
1.322
9.820
39.360
49.180
-14.820
64.000
AVERAGE
4
3.951
9.810
33.930
43.740
-20.260
64.000
AVERAGE
5
7.763
9.790
44.640
54.430
-19.570
74.000
AVERAGE
6
10.002
9.780
48.580
58.360
-15.640
74.000
AVERAGE
3
*
Note:
Page: 42 of 114
Site : SR-2
Time : 2006/01/20 - 14:41
Limit : ISN_Current_B_00M_QP
Margin : 10
EUT : Barebone
Probe :
Note : Mode 1,LAN 1.0 GB,Current
Page: 43 of 114
- Line1
Site : SR-2
Time : 2006/01/20 - 14:46
Limit : ISN_Current_B_00M_QP
Margin : 0
EUT : Barebone
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.243
0.200
0.980
1.180
-36.163
37.343
QUASIPEAK
2
0.357
0.200
0.680
0.880
-33.206
34.086
QUASIPEAK
3
2.509
0.200
5.750
5.950
-24.050
30.000
QUASIPEAK
6.822
0.200
11.130
11.330
-18.670
30.000
QUASIPEAK
5
9.427
0.200
7.970
8.170
-21.830
30.000
QUASIPEAK
6
16.923
0.400
1.540
1.940
-28.060
30.000
QUASIPEAK
4
*
Note:
Page: 44 of 114
Site : SR-2
Time : 2006/01/20 - 14:55
Limit : ISN_Current_B_00M_AV
Margin : 0
EUT : Barebone
Probe :
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.243
0.200
0.380
0.580
-26.763
27.343
AVERAGE
2
0.357
0.200
0.130
0.330
-23.756
24.086
AVERAGE
3
2.509
0.200
2.100
2.300
-17.700
20.000
AVERAGE
6.822
0.200
3.630
3.830
-16.170
20.000
AVERAGE
5
9.427
0.200
3.380
3.580
-16.420
20.000
AVERAGE
6
16.923
0.400
0.820
1.220
-18.780
20.000
AVERAGE
4
*
Note:
Page: 45 of 114
Site : SR-2
Time : 2006/01/20 - 15:11
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Barebone
Probe :
Note : Mode 1,LAN 1.0 GB,Voltage
Page: 46 of 114
- Line1
Site : SR-2
Time : 2006/01/20 - 15:14
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Barebone
Probe : CVP-2200A - Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.240
20.200
19.860
40.060
-41.369
81.429
QUASIPEAK
2
0.357
20.200
14.940
35.140
-42.946
78.086
QUASIPEAK
3
1.252
20.200
12.320
32.520
-41.480
74.000
QUASIPEAK
4
5.330
20.200
15.030
35.230
-38.770
74.000
QUASIPEAK
7.673
20.200
31.160
51.360
-22.640
74.000
QUASIPEAK
10.345
20.200
24.180
44.380
-29.620
74.000
QUASIPEAK
5
6
*
Note:
Page: 47 of 114
Site : SR-2
Time : 2006/01/20 - 15:14
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Barebone
Probe : CVP-2200A - Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.240
20.200
19.550
39.750
-31.679
71.429
AVERAGE
2
0.357
20.200
13.870
34.070
-34.016
68.086
AVERAGE
3
1.252
20.200
1.720
21.920
-42.080
64.000
AVERAGE
4
5.330
20.200
1.800
22.000
-42.000
64.000
AVERAGE
7.673
20.200
14.730
34.930
-29.070
64.000
AVERAGE
10.345
20.200
10.380
30.580
-33.420
64.000
AVERAGE
5
6
*
Note:
Page: 48 of 114
Test Mode
Description
Test Mode
Description
: Front View of ISN Test
: Back View of ISN Test
Page: 49 of 114
Test Mode
Description
Test Mode
Description
: Front View of ISN Test - GIGA CUR
: Back View of ISN Test - GIGA CUR
Page: 50 of 114
Test Mode
Description
Test Mode
Description
: Front View of ISN Test - GIGA VOL
: Back View of ISN Test - GIGA VOL
Page: 51 of 114
5. Radiated Emission
According to EMC Standard : EN 55022 and AS/NZS CISPR 22
5.2. Test Setup
5.3. Limit
Limits
Frequency
(MHz)
Distance (m)
dBuV/m
30 – 230
10
30
230 – 1000
10
37
Remark:
1. The tighter limit shall apply at the edge between two frequency bands.
2. Distance refers to the distance in meters between the measuring instrument antenna
and the closed point of any part of the device or system.
Page: 52 of 114
5.4. Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The
turn table can rotate 360 degrees to determine the position of the maximum emission level.
The EUT was positioned such that the distance from antenna to the EUT was 10 meters.
The antenna can move up and down between 1 meter and 4 meters to find out the maximum
emission level.
Both horizontal and vertical polarization of the antenna are set on measurement. In order to
find the maximum emission, all of the interface cables must be manipulated on radiated
measurement.
Radiated emissions were invested over the frequency range from 30MHz to1GHz using a
receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10
meters.
No deviation.
Page: 53 of 114
5.6. Test Result
Site : OATS-3
Time : 2006/01/24 - 14:28
Margin : 6
EUT : Barebone
Probe : CBL6112B-(2918) - HORIZONTAL
Note : Mode1
Frequency (MHz)
Correct Factor
Reading Level
Measure Level
(dB)
(dBuV)
(dBuV/m)
Margin (dB)
Limit (dBuV/m)
Detector Type
1
125.000
14.027
6.910
20.937
-9.063
30.000
QUASIPEAK
2
233.300
13.229
7.490
20.719
-16.281
37.000
QUASIPEAK
240.000
14.124
16.310
30.434
-6.566
37.000
QUASIPEAK
4
368.625
19.293
6.450
25.743
-11.257
37.000
QUASIPEAK
5
480.050
22.174
6.630
28.803
-8.197
37.000
QUASIPEAK
6
656.573
24.790
4.390
29.180
-7.820
37.000
QUASIPEAK
7
799.900
26.894
2.000
28.894
-8.106
37.000
QUASIPEAK
3
*
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
Page: 54 of 114
Site : OATS-3
Time : 2006/01/24 - 14:16
Margin : 6
EUT : Barebone
Probe : CBL6112B-(2918) - VERTICAL
Note : Mode1
Frequency (MHz)
Correct Factor
Reading Level
Measure Level
(dB)
(dBuV)
(dBuV/m)
Margin (dB)
Limit (dBuV/m)
Detector Type
1
67.970
6.801
15.900
22.701
-7.299
30.000
QUASIPEAK
2
132.928
13.826
10.900
24.726
-5.274
30.000
QUASIPEAK
3
180.010
11.114
5.400
16.514
-13.486
30.000
QUASIPEAK
4
233.303
13.230
9.450
22.680
-14.320
37.000
QUASIPEAK
5
360.030
18.924
8.470
27.394
-9.606
37.000
QUASIPEAK
6
480.040
22.173
7.410
29.583
-7.417
37.000
QUASIPEAK
7
540.047
23.840
3.740
27.580
-9.420
37.000
QUASIPEAK
600.000
24.440
9.550
33.990
-3.010
37.000
QUASIPEAK
783.000
26.612
7.200
33.812
-3.188
37.000
QUASIPEAK
8
9
*
Note:
Page: 55 of 114
Site : OATS-3
Time : 2006/01/24 - 15:31
Margin : 6
EUT : Barebone
Probe : CBL6112B-(2918) - HORIZONTAL
Note : Mode2
Frequency (MHz)
Correct Factor
Reading Level
Measure Level
(dB)
(dBuV)
(dBuV/m)
Margin (dB)
Limit (dBuV/m)
Detector Type
1
186.473
11.132
10.340
21.472
-8.528
30.000
QUASIPEAK
2
225.008
12.148
9.590
21.738
-8.262
30.000
QUASIPEAK
3
315.010
17.369
12.590
29.959
-7.041
37.000
QUASIPEAK
4
525.010
23.074
5.960
29.034
-7.966
37.000
QUASIPEAK
5
540.000
23.837
6.550
30.387
-6.613
37.000
QUASIPEAK
6
615.025
24.550
4.500
29.050
-7.950
37.000
QUASIPEAK
1000.000
28.918
4.500
33.418
-3.582
37.000
QUASIPEAK
7
*
Note:
Page: 56 of 114
Site : OATS-3
Time : 2006/01/24 - 14:53
Margin : 6
EUT : Barebone
Probe : CBL6112B-(2918) - VERTICAL
Note : Mode2
Frequency (MHz)
Correct Factor
Reading Level
Measure Level
(dB)
(dBuV)
(dBuV/m)
Margin (dB)
Limit (dBuV/m)
Detector Type
1
52.757
8.242
13.650
21.893
-8.107
30.000
QUASIPEAK
2
125.600
14.031
5.770
19.800
-10.200
30.000
QUASIPEAK
3
213.100
11.425
9.340
20.764
-9.236
30.000
QUASIPEAK
4
393.195
20.099
0.770
20.870
-16.130
37.000
QUASIPEAK
5
480.050
22.174
6.550
28.723
-8.277
37.000
QUASIPEAK
705.025
25.378
5.660
31.038
-5.962
37.000
QUASIPEAK
6
*
Note:
Page: 57 of 114
Test Mode
Description
Test Mode
Description
: Front View of Radiated Test
: Back View of Radiated Test
Page: 58 of 114
Test Mode
Description
Test Mode
Description
: Front View of Radiated Test
: Back View of Radiated Test
Page: 59 of 114
6. Harmonic Current Emission
According to EMC Standard : EN 61000-3-2
6.2. Test Setup
6.3. Limit
(a) Limits of Class A Harmonics Currents
Harmonics
Maximum Permissible
Harmonics
Maximum Permissible
Order
harmonic current
Order
harmonic current
n
A
n
A
Odd harmonics
Even harmonics
3
2.30
2
1.08
5
1.14
4
0.43
7
0.77
6
0.30
9
0.40
8 ≤ n ≤ 40
0.23 * 8/n
11
0.33
13
0.21
15 ≤ n ≤ 39
0.15 * 15/n
Page: 60 of 114
(b) Limits of Class B Harmonics Currents
For Class B equipment, the harmonic of the input current shall not exceed the maximum
permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.
(c) Limits of Class C Harmonics Currents
Harmonics Order
Maximum Permissible harmonic current
Expressed as a percentage of the input
current at the fundamental frequency
n
％
2
2
3
30．λ
5
10
7
7
9
5
11 ≤ n ≤ 39
＊
3
(odd harmonics only)
＊λ is the circuit power factor
(d) Limits of Class D Harmonics Currents
Harmonics Order
Maximum Permissible
Maximum Permissible
harmonic current per watt
harmonic current
n
mA/W
A
3
3.4
2.30
5
1.9
1.14
7
1.0
0.77
9
0.5
0.40
11
0.35
0.33
3.85/n
See limit of Class A
11 ≤ n ≤ 39
(odd harmonics only)
Page: 61 of 114
6.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
No deviation.
Page: 62 of 114
6.6. Test Result
Product
Barebone
Test Item
Power Harmonics
Test Mode
Date of Test
2006/01/23
Test Site
Test Result: Pass
No.3 Shielded Room
Source qualification: Normal
1.5
300
1.0
200
0.5
100
0.0
0
-0.5
-100
-1.0
-200
-1.5
-300
Current RMS(Amps)
Harmonics and Class D limit line
European Limits
0.6
0.5
0.4
0.3
0.2
0.1
0.0
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
Worst harmonic was #3 with 55.42% of the limit.
Page: 63 of 114
32
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Test Result: Pass
THC(A): 0.38
I-THD(pk%): 70.52
Highest parameter values during test:
V_RMS (Volts): 229.79
I_Peak (Amps): 1.484
I_Fund (Amps): 0.557
Power (Watts):
125
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.000
0.343
0.000
0.120
0.000
0.054
0.000
0.024
0.000
0.021
0.000
0.008
0.000
0.014
0.000
0.006
0.000
0.010
0.000
0.004
0.000
0.007
0.000
0.003
0.000
0.005
0.000
0.003
0.000
0.004
0.000
0.003
0.000
0.003
0.000
0.003
0.000
0.002
0.000
POHC(A): 0.012
POHC Limit(A): 0.054
Frequency(Hz):
I_RMS (Amps):
Crest Factor:
Power Factor:
50.00
0.675
2.230
0.804
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.424
81.0
0.348
0.628
55.42
Pass
0.237
50.8
0.122
0.351
34.66
Pass
0.125
43.4
0.055
0.185
29.60
Pass
0.062
38.9
0.024
0.092
26.50
Pass
0.044
48.8
0.021
0.065
33.22
Pass
0.037
22.7
0.009
0.055
15.66
Pass
0.032
44.4
0.015
0.047
30.77
Pass
0.029
20.2
0.006
0.042
14.03
Pass
0.025
39.8
0.010
0.038
27.25
Pass
0.023
18.4
0.004
0.034
12.61
Pass
0.021
32.2
0.007
0.031
21.96
Pass
0.019
16.7
0.003
0.029
11.93
Pass
0.018
28.7
0.005
0.026
19.82
Pass
0.017
17.6
0.003
0.025
12.50
Pass
0.015
26.5
0.004
0.023
18.26
Pass
0.014
19.9
0.003
0.022
13.90
Pass
0.014
22.6
0.003
0.020
15.65
Pass
0.013
21.3
0.003
0.019
14.98
Pass
0.012
20.0
0.003
0.018
13.93
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the
same window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power
>75W. Others the result should be pass.
Page: 64 of 114
Product
Barebone
Test Item
Power Harmonics
Test Mode
Date of Test
2006/01/23
Test Site
Test Result: Pass
No.3 Shielded Room
1.5
300
1.0
200
0.5
100
0.0
0
-0.5
-100
-1.0
-200
-1.5
-300
Harmonics and Class D limit line
European Limits
Current RMS(Amps)
0.6
0.5
0.4
0.3
0.2
0.1
0.0
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
Worst harmonic was #3 with 60.24% of the limit.
Page: 65 of 114
32
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Test Result: Pass
THC(A): 0.40
I-THD(pk%): 79.78
Highest parameter values during test:
V_RMS (Volts): 229.80
I_Peak (Amps): 1.562
I_Fund (Amps): 0.527
Power (Watts):
118
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.000
0.354
0.000
0.153
0.000
0.062
0.000
0.038
0.000
0.020
0.000
0.013
0.000
0.007
0.000
0.009
0.000
0.004
0.000
0.007
0.000
0.002
0.000
0.005
0.000
0.003
0.000
0.003
0.000
0.003
0.000
0.002
0.000
0.003
0.000
0.001
0.000
0.003
0.000
POHC(A): 0.012
Frequency(Hz):
I_RMS (Amps):
Crest Factor:
Power Factor:
POHC Limit(A): 0.051
50.00
0.665
2.402
0.771
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.400
88.3
0.358
0.595
60.24
Pass
0.224
68.3
0.154
0.332
46.56
Pass
0.118
52.4
0.062
0.175
35.69
Pass
0.059
65.0
0.039
0.087
44.28
Pass
0.041
48.2
0.020
0.061
32.82
Pass
0.035
36.7
0.013
0.052
25.33
Pass
0.031
22.1
0.007
0.045
15.33
Pass
0.027
34.2
0.009
0.040
23.63
Pass
0.024
15.3
0.004
0.036
10.59
Pass
0.022
34.0
0.007
0.032
23.15
Pass
0.020
12.1
0.002
0.029
8.45
Pass
0.018
27.9
0.005
0.027
19.10
Pass
0.017
16.6
0.003
0.025
11.61
Pass
0.016
21.1
0.003
0.023
14.61
Pass
0.015
21.2
0.003
0.022
14.69
Pass
0.014
14.3
0.002
0.021
10.09
Pass
0.013
26.1
0.003
0.019
17.93
Pass
0.012
7.0
0.001
0.018
5.34
Pass
0.012
27.4
0.003
0.017
18.75
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the
same window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power
>75W. Others the result should be pass.
Page: 66 of 114
Test Mode
Description
Test Mode
Description
: Power Harmonics Test Setup
: Power Harmonics Test Setup
Page: 67 of 114
7. Voltage Fluctuation and Flicker
According to EMC Standard : EN 61000-3-3
7.2. Test Setup
7.3. Limit
The following limits apply:
－ the value of Pst shall not be greater than 1.0;
－ the value of Plt shall not be greater than 0.65;
－ the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500
ms;
－ the relative steady-state voltage change, dc, shall not exceed 3.3 ％;
－ the maximum relative voltage change, dmax, shall not exceed;
a) 4 ％ without additional conditions;
b)
6 ％ for equipment which is:
－ switched manually, or
－ switched automatically more frequently than twice per day, and also has either a
delayed restart (the delay being not less than a few tens of seconds), or manual restart,
after a power supply interruption.
NOTE The cycling frequency will be further limited by the Pst and P1t limit.
For example: a dmax of 6％producing a rectangular voltage change characteristic twice per
hour will give a P1t of about 0.65.
Page: 68 of 114
c)
7 ％ for equipment which is:
－ attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment
such as mixers, garden equipment such as lawn mowers, portable tools such as
electric drills), or
－ switched on automatically, or is intended to be switched on manually, no more than
twice per day, and also has either a delayed restart (the delay being not less than a
few tens of seconds) or manual restart, after a power supply interruption.
Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.
7.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
No deviation.
Page: 69 of 114
7.6. Test Result
Product
Barebone
Test Item
Voltage Fluctuation and Flicker
Test Mode
Date of Test
2006/01/23
Test Result: Pass
Test Site
No.3 Shielded Room
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
0.00
11:15:25
Time is too short for Plt plot
Parameter values recorded during the test:
Vrms at the end of test (Volt):
Highest dt (%):
Time(mS) > dt:
Highest dc (%):
Highest dmax (%):
Highest Pst (10 min. period):
Highest Plt (2 hr. period):
229.55
0.00
0.0
0.00
0.00
0.001
0.001
Test limit (%):
Test limit (mS):
Test limit (%):
Test limit (%):
Test limit:
Test limit:
Page: 70 of 114
3.30
500.0
3.30
4.00
1.000
0.650
Pass
Pass
Pass
Pass
Pass
Pass
Product
Barebone
Test Item
Voltage Fluctuation and Flicker
Test Mode
Date of Test
2006/01/23
Test Result: Pass
Test Site
No.3 Shielded Room
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
0.00
10:26:23
Time is too short for Plt plot
Parameter values recorded during the test:
Vrms at the end of test (Volt):
Highest dt (%):
Time(mS) > dt:
Highest dc (%):
Highest dmax (%):
Highest Pst (10 min. period):
Highest Plt (2 hr. period):
229.52
0.00
0.0
0.00
0.00
0.001
0.001
Test limit (%):
Test limit (mS):
Test limit (%):
Test limit (%):
Test limit:
Test limit:
Page: 71 of 114
3.30
500.0
3.30
4.00
1.000
0.650
Pass
Pass
Pass
Pass
Pass
Pass
Test Mode
Description
Test Mode
Description
: Flicker Test Setup
: Flicker Test Setup
Page: 72 of 114
8. Electrostatic Discharge
According to Standard : IEC 61000-4-2
8.2. Test Setup
8.3. Limit
Item Environmental
Units
Test Specification
Phenomena
Performance
Criteria
Enclosure Port
Electrostatic Discharge kV(Charge Voltage)
±8 Air Discharge
±4 Contact Discharge
Page: 73 of 114
B
8.4. Test Procedure
Direct application of discharges to the EUT:
Contact discharge was applied only to conductive surfaces of the EUT.
Air discharges were applied only to non-conductive surfaces of the EUT.
During the test, it was performed with single discharges. For the single discharge
time between successive single discharges will be keep longer 1 second. It was at
least ten single discharges with positive and negative at the same selected point.
The selected point, which was performed with electrostatic discharge, was marked
on the red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP):
The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned
at a distance 0.1m from, the EUT, with the Discharge Electrode touching the
coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
Horizontal Coupling Plane (HCP):
The coupling plane is placed under to the EUT. The generator shall be positioned
vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching
the coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
No deviation.
Page: 74 of 114
8.6. Test Result
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/24
Item
Amount of
Discharge
Test Site
Voltage
No.3 Shielded Room
Required
Criteria
Complied To
Criteria
Results
(A,B,C)
10
+8kV
B
A
Pass
10
-8kV
B
A
Pass
25
+4kV
B
A
Pass
25
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(HCP)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Front)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Left)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Back)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Right)
50
-4kV
B
A
Pass
Air Discharge
Contact Discharge
Note:
The testing performed is from lowest level up to the highest level as required by standard,
but only highest level is shown on the report.
NR: No Requirement
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV.
No false alarms or other malfunctions were observed during or after the test.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four
test points.
Page: 75 of 114
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/24
Test Site
No.3 Shielded Room
Voltage
Required
Criteria
Complied To
Criteria
(A,B,C)
Results
10
+8kV
B
A
Pass
10
-8kV
B
A
Pass
25
+4kV
B
A
Pass
25
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(HCP)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Front)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Left)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Back)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Right)
50
-4kV
B
A
Pass
Item
Air Discharge
Contact Discharge
Amount of
Discharge
Note:
The testing performed is from lowest level up to the highest level as required by standard,
but only highest level is shown on the report.
NR: No Requirement
kV.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four
test points.
Page: 76 of 114
Test Mode
Description
Test Mode
Description
: ESD Test Setup
: ESD Test Setup
Page: 77 of 114
9. Radiated Susceptibility
9.2. Test Setup
9.3. Limit
Item Environmental
Units
Phenomena
Test
Performance
Specification
Criteria
Enclosure Port
80-1000
Radio-Frequency
MHz
Electromagnetic Field
V/m(Un-modulated, rms) 3
Amplitude Modulated
% AM (1kHz)
Page: 78 of 114
80
A
9.4. Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are
placed with one coincident with the calibration plane such that the distance from
antenna to the EUT was 3 meters.
Both horizontal and vertical polarization of the antenna and four sides of the EUT are set
on measurement.
In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows:
Condition of Test
Remarks
1.
Field Strength
3 V/m Level 2
2.
Radiated Signal
AM 80% Modulated with 1kHz
3.
Scanning Frequency
80MHz - 1000MHz
4
Dwell Time
3 Seconds
5.
Frequency step size
6.
The rate of Swept of Frequency
∆ f :
1%
1.5 x 10-3 decades/s
No deviation.
Page: 79 of 114
9.6. Test Result
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/25
Test Site
Chamber5
Frequency
(MHz)
Position
(Angle)
Polarity
(H or V)
Field
Strength
(V/m)
Required
Criteria
Complied
To Criteria
(A,B,C)
Results
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Note:
The testing performed is from lowest level up to the highest level as required by
standard, but only highest level is shown on the report.
There was no observable degradation in performance.
MHz.
at frequency
Page: 80 of 114
V/m
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/25
Test Site
Chamber5
Frequency
(MHz)
Position
(Angle)
Polarity
(H or V)
Field
Strength
(V/m)
Required
Criteria
Complied
To Criteria
(A,B,C)
Results
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Note:
There was no observable degradation in performance.
at frequency
MHz.
Page: 81 of 114
V/m
Test Mode
Description
Test Mode
Description
: Radiated Susceptibility Test Setup
: Radiated Susceptibility Test Setup
Page: 82 of 114
10. Electrical Fast Transient/Burst
10.2. Test Setup
10.3. Limit
Item Environmental
Units
Phenomena
I/O and communication ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Input DC Power Ports
Mode
Tr/Th ns
Rep. Frequency kHz
Input AC Power Ports
Mode
Tr/Th ns
Rep. Frequency kHz
Page: 83 of 114
Test Specification Performance
Criteria
+0.5
5/50
5
B
+0.5
5/50
5
B
+1
5/50
5
B
10.4. Test Procedure
The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on
the table, and uses a 0.1m insulation between the EUT and ground reference plane.
The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and
projected beyond the EUT by at least 0.1m on all sides.
Test on I/O and communication ports:
The EFT interference signal is through a coupling clamp device couples to the signal and
control lines of the EUT with burst noise for 1minute.
Test on power supply ports:
The EUT is connected to the power mains through a coupling device that directly couples the
EFT/B interference signal.
Each of the Line and Neutral conductors is impressed with burst noise for 1 minute.
The length of the signal and power lines between the coupling device and the EUT is 0.5m.
No deviation.
Page: 84 of 114
10.6. Test Result
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/24
Voltage
Test Site
No.3 Shielded Room
Inject
Method
Required
Criteria
Complied
to
Criteria
Result
kV
Inject
Time
(Second)
±
1kV
60
CDN
B
A
PASS
±
0.5 kV
90
Clamp
B
A
PASS
Inject
Line
Polarity
AC In
LAN
Note:
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Line
.
Page: 85 of 114
kV of
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/24
Test Site
Voltage
No.3 Shielded Room
Inject
Method
Required
Criteria
Complied
to
Criteria
Result
kV
Inject
Time
(Second)
±
1kV
60
CDN
B
A
PASS
±
0.5 kV
90
Clamp
B
A
PASS
Inject
Line
Polarity
L+N+PE
LAN
Note:
.
Line
Page: 86 of 114
kV of
Test Mode
Description
Test Mode
Description
: EFT/B Test Setup
: EFT/B Test Setup-Clamp
Page: 87 of 114
Test Mode
Description
Test Mode
Description
: EFT/B Test Setup
: EFT/B Test Setup-Clamp
Page: 88 of 114
11. Surge
11.2. Test Setup
11.3. Limit
Item Environmental Phenomena Units
Criteria
Signal Ports and Telecommunication Ports(See 1) and 2) )
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
±1
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
± 0.5
AC Input and AC Output Power Ports
Surges
Tr/Th us
1.2/50 (8/20)
Line to Line
kV
±1
B
Line to Ground
kV
±2
Notes:
1) Applicable only to ports which according to the manufacturer’s may directly to outdoor
cables.
2) Where normal functioning cannot be achieved because of the impact of the CDN on the
EUT, no immunity test shall be required.
Page: 89 of 114
The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The length of power cord between the coupling device and the EUT shall
be 2m or less.
For Input and Output AC Power or DC Input and DC Output Power Ports:
The EUT is connected to the power mains through a coupling device that directly couples the
Surge interference signal.
The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and
the peak value of the a.c. voltage wave. (Positive and negative)
Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with
interval of 1 min.
No deviation.
Page: 90 of 114
11.6. Test Result
Product
Barebone
Test Item
Surge
Test Mode
Date of Test
2006/01/23
Test Site
Voltage
No.3 Shielded Room
Time
Complie
Inject Required
Interval
d to
Method Criteria
(Second)
Criteria
Inject
Line
Polarity
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Angle
kV
Result
Note:
Line
.
kV of
Page: 91 of 114
Product
Barebone
Test Item
Surge
Test Mode
Date of Test
2006/01/23
Test Site
Voltage
No.3 Shielded Room
Time
Complie
Inject Required
Interval
d to
Method Criteria
(Second)
Criteria
Inject
Line
Polarity
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Angle
kV
Result
Note:
.
Line
kV of
Page: 92 of 114
Test Mode
Description
Test Mode
Description
: SURGE Test Setup
: SURGE Test Setup
Page: 93 of 114
12. Conducted Susceptibility
12.2. Test Setup
CDN Test Mode
EM Clamp Test Mode
Page: 94 of 114
12.3. Limit
Item Environmental Phenomena Units
Test
Specification
Signal Ports and Telecommunication Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
Radio-Frequency
MHz
V (rms,
Un-modulated)
% AM (1kHz)
Radio-Frequency
MHz
V (rms,
Un-modulated)
% AM (1kHz)
0.15-80
3
80
0.15-80
3
80
0.15-80
3
80
Performance
Criteria
A
A
A
The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the
table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground
reference plane.
For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp
device couples to the signal and Telecommunication lines of the EUT.
For Input DC and AC Power Ports
The EUT is connected to the power mains through a coupling and decoupling networks for
power supply lines. And directly couples the disturbances signal into EUT.
Used CDN-M2 for two wires or CDN-M3 for three wires.
All the scanning conditions are as follows:
Condition of Test
1. Field Strength
2. Radiated Signal
3. Scanning Frequency
4 Dwell Time
5. Frequency step size
∆ f :
6. The rate of Swept of Frequency
Remarks
130dBuV(3V) Level 2
AM 80% Modulated with 1kHz
0.15MHz – 80MHz
3 Seconds
1%
1.5 x 10-3 decades/s
No deviation.
Page: 95 of 114
12.6. Test Result
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/24
Frequency
Range
Test Site
No.6 Shielded Room
Inject
Method
Tested Port
of
EUT
Required
Criteria
Performanc
e Criteria
Complied
To
Result
(MHz)
Voltage
Applied
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
Clamp
LAN
A
A
PASS
Note:
dBuV(V) at
frequency
MHz.
No false alarms or other malfunctions were observed during or after the test. The
acceptance criteria were met, and the EUT passed the test.
Page: 96 of 114
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/24
Frequency
Range
Test Site
No.6 Shielded Room
Inject
Method
Tested Port
of
EUT
Required
Criteria
Performanc
e Criteria
Complied
To
Result
(MHz)
Voltage
Applied
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
Clamp
LAN
A
A
PASS
Note:
dBuV(V) at
MHz.
frequency
Page: 97 of 114
Test Mode
Description
Test Mode
Description
: Conducted Susceptibility Test Setup
: Conducted Susceptibility Test Setup-Clamp
Page: 98 of 114
Test Mode
Description
Test Mode
Description
: Conducted Susceptibility Test Setup
: Conducted Susceptibility Test Setup-Clamp
Page: 99 of 114
13. Power Frequency Magnetic Field
13.2. Test Setup
13.3. Limit
Item
Environmental
Phenomena
Enclosure Port
Power-Frequency
Magnetic Field
Units
Criteria
Hz
A/m (r.m.s.)
50
1
A
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured at least 1m*1m min. The test magnetic field shall be placed at central
of the induction coil.
The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.
And the induction coil shall be rotated by 90° in order to expose the EUT to the test field
with different orientation (X, Y, Z Orientations).
No deviation.
Page: 100 of 114
13.6. Test Result
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/24
Polarization
Frequency
(Hz)
Test Site
Magnetic
Strength
(A/m)
No.3 Shielded Room
Required
Performance
Performance
Criteria
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
of Line
.
Page: 101 of 114
kV
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/24
Polarization
Frequency
(Hz)
Test Site
Magnetic
Strength
(A/m)
No.3 Shielded Room
Required
Performance
Performance
Criteria
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
of Line
.
Page: 102 of 114
kV
Test Mode
Description
Test Mode
Description
: Power Frequency Magnetic Field Test Setup
: Power Frequency Magnetic Field Test Setup
Page: 103 of 114
14. Voltage Dips and Interruption
14.2. Test Setup
14.3. Limit
Item Environmental
Units
Phenomena
Voltage Dips
Criteria
% Reduction
30
Period
25
% Reduction
Period
Voltage Interruptions
>95
0.5
% Reduction
> 95
Period
250
Page: 104 of 114
C
B
C
The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane
measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The power cord shall be used the shortest power cord as specified by the
manufacturer.
For Voltage Dips/ Interruptions test:
The selection of test voltage is based on the rated power range. If the operation range is
large than 20% of lower power range, both end of specified voltage shall be tested.
Otherwise, the typical voltage specification is selected as test voltage.
The EUT is connected to the power mains through a coupling device that directly couples to
the Voltage Dips and Interruption Generator.
The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods,
for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three
voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied
voltage and duration 250 Periods with a sequence of three voltage interruptions with
intervals of 10 seconds.
Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the
voltage.
No deviation.
Page: 105 of 114
14.6. Test Result
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/23
Voltage Dips and
Interruption
Reduction(%)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test Site
Test
Duration
(Periods)
25
25
25
25
25
25
25
25
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
250
250
250
250
250
250
250
250
No.3 Shielded Room
Required Performance Test Result
Performance
Criteria
Criteria
Complied To
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
C
C
PASS
C
C
PASS
C
C
PASS
C
C
PASS
C
C
PASS
C
C
PASS
C
C
PASS
C
C
PASS
The nominal voltage of EUT is 230V.
of Line
.
Page: 106 of 114
kV
Product
Barebone
Test Item
Test Mode
Date of Test
2006/01/23
Voltage Dips and
Interruption
Reduction(%)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test Site
Test
Duration
(Periods)
25
25
25
25
25
25
25
25
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
250
250
250
250
250
250
250
250
No.3 Shielded Room
Required Performance Test Result
Performance
Criteria
Criteria
Complied To
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
C
C
PASS
C
C
PASS
C
C
PASS
C
C
PASS
C
C
PASS
C
C
PASS
C
C
PASS
C
C
PASS
The nominal voltage of EUT is 230V.
of Line
.
Page: 107 of 114
kV
Test Mode
Description
Test Mode
Description
: Voltage Dips Test Setup
: Voltage Dips Test Setup
Page: 108 of 114
15. Attachment
EUT Photograph
(1) EUT Photo
(2) EUT Photo
Page: 109 of 114
(3) EUT Photo
(4) EUT Photo
Page: 110 of 114
(5) EUT Photo
(6) EUT Photo
Page: 111 of 114
(7) EUT Photo
(8) EUT Photo
Page: 112 of 114
(9) EUT Photo
(10) EUT Photo
Page: 113 of 114
(11) EUT Photo
Page: 114 of 114

MS-7231(6410) CE IT report 950214

Transcription

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