IT report

Transcription

IT report

Report No： 042L008E
Test Report
Product Name ： MEGA BooK
Model No.
： MS1003xxxxxxx, M510Cxxxxxxx (x=0-9 or A-Z),
M510A
Applicant ： MICRO-STAR INTL Co., LTD.
Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien,
Taiwan, R.O.C.
Date of Receipt ： 2004/01/29
Date of Test
： 2004/02/10
Report No.
： 042L008E
The test results relate only to the samples tested.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Page: 1 of 111
Version:1.0
Declaration of Conformity
The following products is herewith confirmed to comply with the requirements set out in the Council
Directive on the Approximation of the laws of the Member States relating to Electromagnetic
Compatibility Directive (89/336/EEC). The listed standard as below were applied:
The following Equipment:
Product
: MEGA BooK
Trade Name
: MSI
Model Number
: MS1003xxxxxxx, M510Cxxxxxxx (x=0-9 or A-Z), M510A
This product is herewith confirmed to comply with the requirements set out in the Council
Compatibility Directive (89/336/EEC).For the evaluation regarding EMC, the following
standards were applied:
RFI Emission:
EN 55022:1994+A1:1995+A2:1997 Class A
EN 61000-3-2:2000 Class D
: Product family standard
EN 61000-3-3:1995+A1:2001
: Limitation of voltage fluctuation and flicker in
low-voltage supply system
: Limits for harmonic current emission
Immunity :
EN 55024:1998
The following importer/manufacturer is responsible for this declaration:
Company Name
:
Company Address
:
Telephone
:
Facsimile :
Person is responsible for marking this declaration:
Name (Full Name)
Position/ Title
Date
Legal Signature
EMC/Safety Test Laboratory
Accredited by DNV, TUV, Nemko and NVLAP
Date: Feb. 10, 2004
QTK No.:042L008E
Statement of Conformity
The certifies that the following designated product
Product
: MEGA BooK
Trade Name
: MSI
Model Number
: MS1003xxxxxxx, M510Cxxxxxxx (x=0-9 or A-Z), M510A
Company Name
: MICRO-STAR INTL Co., LTD.
This product is herewith confirmed to comply with the requirements set out in the Council
Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following
standards were applied:
RFI Emission:
EN 55022:1994+A1:1995+A2:1997 Class A
EN 61000-3-2:2000 Class D
: Limits for harmonic current emission
EN 61000-3-3:1995+A1:2001
: Limitation of voltage fluctuation and flicker in
low-voltage supply system
Immunity:
EN 55024:1998
TEST LABORATORY
Gene Chang / Manager
The verification is based on a single evaluation of one sample of above-mentioned products. It does
not imply an assessment of the whole production and does not permit the use of the test lab. Logo.
QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com
Test Report Certification
Test Date : 2004/02/10
Report No. : 042L008E
Product Name
Applicant
Address
Manufacturer
：
：
：
：
Model No.
Rated Voltage
Trade Name
Measurement Standard
：
:
：
：
Measurement Procedure ：
MEGA BooK
MICRO-STAR INTL Co., LTD.
No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.
(1) MICRO-STAR INTL Co., LTD.
(2) MSI COMPUTER (SHENZHEN) CO LTD
(3) STAR ELECTRONICS (KUNSHAN) CO LTD
MS1003xxxxxxx, M510Cxxxxxxx (x=0-9 or A-Z), M510A
AC 230 V / 50 Hz
MSI
EN 55022:1994+A1:1995+A2:1997,EN 55024:1998,
EN 61000-3-2:2000,EN 61000-3-3:1995+A1:2001
EN 55022:1994+A1:1995+A2:1997,
EN 61000-3-2:2000,EN 61000-3-3:1995+A1:2001,
IEC 61000-4-2:1995+A1:1998+A2:2000,
IEC 61000-4-3:1995+A1:1998+A2:2000,
IEC 61000-4-4:1995+A1:2000, IEC 61000-4-5:1995+A1:2000,
IEC 61000-4-6:1996+A1:2000, IEC 61000-4-8:1993+A1:2000,
IEC 61000-4-11:1994+A1:2002
B
Complied
：
Classification
：
Test Result
The test results relate only to the samples tested.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Documented By
：
(Rebaca CHi)
Tested By
：
(Gary Wu )
Approved By
：
(Gene Chang)
Page: 2 of 111
Version:1.0
TA B L E O F C O N T E N T S
Description
1.
1.1.
1.2.
1.3.
1.4.
1.5.
1.6.
2.
2.1.
2.2.
2.3.
2.4.
2.5.
2.6.
2.7.
3.
3.1.
3.2.
3.3.
3.4.
3.5.
3.6.
3.7.
4.
4.1.
4.2.
4.3.
4.4.
4.5.
4.6.
4.7.
5.
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.
6.
6.1.
6.2.
6.3.
6.4.
Page
General Information .................................................................................................................6
EUT Description ..........................................................................................................................6
Test Mode ....................................................................................................................................7
Tested System Details..............................................................................................................10
Configuration of tested System ..............................................................................................11
EUT Exercise Software............................................................................................................12
Test Facility ................................................................................................................................13
Conducted Emission .............................................................................................................14
Test Equipment List ..................................................................................................................14
Test Setup ..................................................................................................................................14
Limits...........................................................................................................................................15
Test Procedure ..........................................................................................................................15
Test Specification ......................................................................................................................15
Test Result .................................................................................................................................16
Test Photo ..................................................................................................................................22
Radiated Emission .................................................................................................................25
Test Setup ..................................................................................................................................25
Limits...........................................................................................................................................26
Test Procedure ..........................................................................................................................26
Test Result .................................................................................................................................27
Test Photo ..................................................................................................................................33
Power Harmonics ...................................................................................................................36
Test Setup ..................................................................................................................................36
Limits...........................................................................................................................................37
Test Procedure ..........................................................................................................................38
Test Result .................................................................................................................................39
Test Photo ..................................................................................................................................45
Voltage Fluctuation and Flicker ..........................................................................................47
Test Setup ..................................................................................................................................47
Limits...........................................................................................................................................48
Test Procedure ..........................................................................................................................48
Test Result .................................................................................................................................49
Test Photo ..................................................................................................................................52
Electrostatic Discharge (ESD).............................................................................................54
Test Setup ..................................................................................................................................54
Limits...........................................................................................................................................55
Test Procedure ..........................................................................................................................55
Page: 3 of 111
Version:1.0
6.5.
6.6.
6.7.
7.
7.1.
7.2.
7.3.
7.4.
7.5.
7.6.
7.7.
8.
8.1.
8.2.
8.3.
8.4.
8.5.
8.6.
8.7.
9.
9.1.
9.2.
9.3.
9.4.
9.5.
9.6.
9.7.
10.
10.1.
10.2.
10.3.
10.4.
10.5.
10.6.
10.7.
11.
11.1.
11.2.
11.3.
11.4.
11.5.
11.6.
11.7.
12.
12.1.
12.2.
12.3.
Test Result .................................................................................................................................56
Test Photo ..................................................................................................................................59
Radiated Susceptibility (RS)................................................................................................61
Test Setup ..................................................................................................................................61
Limits...........................................................................................................................................62
Test Procedure ..........................................................................................................................62
Test Result .................................................................................................................................63
Test Photo ..................................................................................................................................66
Electrical Fast Transient/Burst (EFT/B) ............................................................................68
Test Setup ..................................................................................................................................68
Limits...........................................................................................................................................69
Test Procedure ..........................................................................................................................69
Test Result .................................................................................................................................70
Test Photo ..................................................................................................................................73
Surge..........................................................................................................................................76
Test Setup ..................................................................................................................................76
Limits...........................................................................................................................................77
Test Procedure ..........................................................................................................................77
Test Result .................................................................................................................................78
Test Photo ..................................................................................................................................81
Conducted Susceptibility (CS)............................................................................................83
Test Setup ....................................................................................................................................83
Limits...........................................................................................................................................84
Test Procedure ..........................................................................................................................85
Test Result .................................................................................................................................86
Test Photo ..................................................................................................................................89
Power Frequency Magnetic Field.......................................................................................92
Test Setup ..................................................................................................................................92
Limits...........................................................................................................................................93
Test Procedure ..........................................................................................................................93
Test Result .................................................................................................................................94
Test Photo ..................................................................................................................................97
Voltage Dips and Interruption Measurement...................................................................99
Test Setup ..................................................................................................................................99
Limits.........................................................................................................................................100
Page: 4 of 111
Version:1.0
12.4.
12.5.
12.6.
12.7.
Attachement
Reference
Test Procedure ........................................................................................................................100
Test Specification ....................................................................................................................100
Test Result ...............................................................................................................................101
Test Photo ................................................................................................................................104
…………………………………………………………………………………………………106
EUT Photograph .....................................................................................................................106
:
Laboratory of License
Page: 5 of 111
Version:1.0
1.
General Information
1.1.
EUT Description
Product Name
MEGA BooK
Trade Name
MSI
Model No.
MS1003xxxxxxx, M510Cxxxxxxx (x=0-9 or A-Z), M510A
EUT Voltage
AC 100-240 V , 50 / 60 Hz
Component
Power Adapter (1)
Power Adapter (2)
Power Adapter (3)
DELTA,ADP-65DB
Input:AC 100~240V/50~60Hz,1.5A
Output:DC 19V,3.42A,Non-shielded,1.8m,with one ferrite core
bonded.
LITEON,PA-1650-02
Input:AC 100~240V/50~60Hz,1.6A
Output:DC 18.5V,3.5A,Non-shielded,1.8m,with one ferrite core
bonded.
LI SHIN,0335A1965
Input:AC 100~240V/50~60Hz,1.7A
Output:DC 19V,3.42A,Non-shielded,1.8m,with one ferrite core
bonded.
Note:
1. The EUT is including three models for different marketing requirement.
Page: 6 of 111
Version:1.0
1.2.
Test Mode
QuieTek has verified the construction and function in typical operation. All the test modes were
carried out with the EUT in normal operation, which was shown in this test report and defined
as:
Pre-Test Mode
EMI
Mode 1:
Mode 2:
Mode 3:
Mode 4:
Mode 5:
Mode 6:
Mode 7:
Mode 8:
Mode 9:
Final Test Mode
EMI
Mode 3:
Mode 6:
Mode 9:
EMS
Mode 3:
Mode 6:
Mode 9:
Page: 7 of 111
Version:1.0
EMC Project for MS1003
Mode
CPU
LCD Panel
1
2
3
4
Centrino 1.4GHz
Centrino 1.5GHz
Centrino 1.5GHz
Centrino 1.6GHz
(Banias)
(Banias)
(Dothan)
(Banias)
AU15" XGA TFT,
AU14.1" XGA TFT, HANNSTAR
AU15" XGA TFT,
B150XG01 v2
B141XG05
B150XG01 v2
15"XGA TFT,
HSD150PX17
HDD
Module Device
TOSHIBA
FUJITSU
FUJITSU
FUJITSU
MK3021GAS
MHT2030AT
MHT2060AT
MHT2040AT
QSI SCR-242
QSI SDR-083
TEAC
QSI SBW-242U
DW-224E-AA20
DDR Memory
APACER 128MB
APACER 256MB
KINGSTON 1GB
APACER 512MB
MT46V16M16TG-6 A2S56D30ATbP-6 KVR266X64SC25/ HYB25D256800BC
T+KINGSTON
PP +KINGSTON
128MB
256MB
1G *2
512MB
KVR333X64SC25/5
KVR333X64SC25/ KVR333X64SC25/
128
MDC Modem
Wireless Lan
-6+KINGSTON
12
256
ActiontecMD560LM CastleNet8M41300 ActiontecMD560LM CastleNet8M41300
I-2
04681(MM320)
I-2
04681(MM320)
Intel 2200BG
Intel 2200BG
Intel 2200BG
Intel 2200BG
(MOW)IEEE802.11 (MOW)IEEE802.11 (MOW)IEEE802.11 (MOW)IEEE802.11
a+b+g
a+b+g
a+b+g
a+b+g
Battery
SMP 6cell Li-ion
SMP 8cell Li-ion
SMP 6cell Li-ion
SMP 8cell Li-ion
Inverter
SumidaTWS-400-9 DeltaDAC-08B048 SumidaTWS-400-9 DeltaDAC-08B048
152
Power Adapter
Lite-on
152
DeltaADP-65DB
Li-Shin 0335A1965 Li-Shin 0335A1965
PA-1650-02MS
Page: 8 of 111
Version:1.0
Mode
CPU
LCD Panel
5
6
7
8
9
Centrino 1.6GHz Centrino 1.7GHz Centrino 1.7GHz Centrino
Centrino
(Dothan)
1.8GHz
1.7GHz
(Dothan)
(Banias)
(Banias)
(Dothan)
AU14.1" XGA
HANNSTAR
AU15" SXGA+
AU15" SXGA+ HANNSTAR
TFT, B141XG05
15"XGA TFT,
TFT, B150PG01
TFT, B150PG01 15"XGA TFT,
HSD150PX17
HSD150PX17
HDD
TOSHIBA
TOSHIBA
HITACHI
MK4025GAS
MK6021GAS
IC25N030ATMR04 MHT2060AT
Module
TEAC
TEAC
TEAC
Device
CD-224E-C92
DV-28E-CR2
DW-224E-AAM2
APACER 256MB
TRANSCEND
DDR Memory APACER 128MB
FUJITSU
TOSHIBA
MK6021GAS
MSI MS8524M QSI SDW-041
APACER 512MB APACER 256MB
HYB25D256160BT- HYB25D256800BT- 256MTS32MSD64 AP-AM3A568AC HYB25D256800B
6 +TRANSCEND
6 +TRANSCEND
V4F3(Mosel)+
128M
512M
TRANSCEND
+TRANSCEND
256MTS32MSD64
512M
V4F3(Samsung)
TS64MSD64V3F
TS16MSD64V3D5 TS64MSD64V3F
G5A *2
T-6
MDC Modem ActiontecMD560L CastleNet8M4130 ActiontecMD560L CastleNet8M41 CastleNet8M41
MI-2
Wireless Lan Intel 2200BG
(MOW)
004681(MM320) MI-2
30004681(MM3 30004681(MM3
20)
20)
Intel 2100BG
Intel 2200BG
Intel 2200BG
Intel 2100
(MOW)
(MOW)
IEEE802.11b+g (MOW)IEEE802.
IEEE802.11a+b+g IEEE802.11a+b+g IEEE802.11a+b+g
11a+b+g
(PD9WM3B200B
G)
Battery
SMP 6cell Li-ion
Inverter
SumidaTWS-400- DeltaDAC-08B04 SumidaTWS-400- DeltaDAC-08B0 DeltaDAC-08B0
Power
Adapter
SMP 8cell Li-ion
SMP 6cell Li-ion
SMP 8cell Li-ion SMP 8cell Li-ion
9152
8
9152
48
48
DeltaADP-65DB
Lite-on
Lite-on
Li-Shin
Li-Shin
PA-1650-02MS
PA-1650-02MS
0335A1965
0335A1965
Page: 9 of 111
Version:1.0
1.3.
Tested System Details
The types for all equipments, plus descriptions of all cables used in the tested system
(including inserted cards) are:
Test Mode
Product
Mode 3:
Mode 6:
Mode 9:
Manufacturer
Model No.
Serial No.
Power Cord
1 Monitor
ADI
CT1797NF
23500ET112A0021 Non-Shielded, 1.8m
2 Microphone &
Earphone
3 USB 2.0 HDD
N/A
MIC-06
N/A
N/A
Topdisk
ME-910
220952
Power by PC
4 USB 2.0 HDD
Topdisk
ME-910
235933
Power by PC
5 COMBO HDD
TeraSys
F12-UF
A0100215-24p0037 Non-Shielded, 1.8m
6 USB Mouse
Logitech
M-BE58
LZE20852002
N/A
7 Monitor
SONY
PVM-14M2U
2111366
Non-Shielded, 1.8m
8 Printer
EPSON
StyLus C63
FAPY094246
Non-Shielded, 1.9m
9 Exchange Network Sun Moon Star
PX-4
95170087
Non-Shielded, 1.8m
10 Notebook PC
ASUS
S1300
24NP035390
Non-Shielded, 1.8m
11 W/LAN Card
LEMEL
LM-WLC030
1231Q048877
N/A
Page: 10 of 111
Version:1.0
1.4.
Configuration of tested System
Test Mode
Mode 3:
Mode 6:
Mode 9:
Connection Diagram
A
B
C
D
E
F
G
H
I
J
K
Signal Cable Type
TELECOM Cable
D-SUB Cable
Earphone & Microphone Cable
USB Cable
USB Cable
USB Cable
USB MOUSE Cable
S-VIDEO Cable
Printer Cable
LAN Cable
TELECOM Cable
Signal cable Description
Non-Shielded, 7m
Shielded, 1.5m, with one ferrite core bonded
Non-Shielded, 1.8m
Shielded, 1.2m
Shielded, 1.2m
Shielded, 1.8m
Shielded, 1.8m
Shielded, 1.2m
Shielded, 1.2m
Non-Shielded, 7m
Non-Shielded, 3m
Page: 11 of 111
Version:1.0
1.5.
EUT Exercise Software
Test Mode
Mode 3:
Mode 6:
Mode 9:
1 Setup the EUT and simulators as shown on 1.3.
2 Turn on the power of all equipment.
3 Notebook reads data from disk.
4 Data will be transmitting and receiving through EUT.
5 The transmitting and received status will be shown on the monitor.
6 Repeat the above procedure (4 ) to (5).
Page: 12 of 111
Version:1.0
1.6.
Test Facility
Ambient conditions in the laboratory:
Items
Test Item
Temperature (°C)
Required (IEC 68-1) Actual
IEC 61000-4-11
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
15-35
25
Humidity (%RH)
30-60
50
860-1060
950-1000
15-35
25
Humidity (%RH)
10-75
50
860-1060
950-1000
15-35
25
Humidity (%RH)
25-75
50
860-1060
950-1000
Temperature (°C)
IEC 61000-4-2
Temperature (°C)
IEC 61000-4-5
Temperature (°C)
Site Description:
IEC 61000-4-8
July 03, 2002 Accreditation on NVLAP
NVLAP Lab Code: 200533-0
June 11, 2001 Accreditation on DNV
Statement No. : 413-99-LAB11
May 03, 2001 Accreditation on TUV Rheinland
Certificate No.: I9865712-9901
0914
ILAC MRA
April 18, 2001 Accreditation on Nemko
Site Name:
Site Address:
Certificate No.: ELA 165
Quietek Corporation
No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen,
Lin-Kou Shiang, Taipei,
Taiwa, R.O.C.
TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789
E-Mail : service@quietek.com
Page: 13 of 111
Version:1.0
2.
Conducted Emission
2.1.
Test Equipment List
The following test equipment are used during the conducted emission test:
Item Instrument
Manufacturer Type No./Serial No
Last Cal.
1
Test Receiver
R&S
ESCS 30/838251/001
Jan., 2004
2
L.I.S.N.
R&S
ESH3-Z5/836679/0023
May, 2003
3
L.I.S.N.
R&S
ENV 4200/833209/0023 May, 2003
4
Pulse Limiter
R&S
ESH3-Z2
5.
CDN
SCHAFFNER ISNT400/16596
6
No.2 Shielded Room
Remark
EUT
Peripherals
May, 2003
Feb., 2003
N/A
Note: All equipment upon which need to be calibrated are with calibration period of 1 year.
2.2.
Test Setup
Page: 14 of 111
Version:1.0
2.3.
Limits
EN 55022 AC Mains Limits (dBuV)
Frequency
MHz
Class A
Class B
QP
AV
QP
AV
0.15 - 0.50
79
66
66-56
56-46
0.50-5.0
73
60
56
46
5.0 - 30
73
60
60
50
Remarks: In the above table, the tighter limit applies at the band edges
2.4.
Test Procedure
The EUT and simulators are connected to the main power through a line impedance
stabilization network (L.I.S.N.).
This provides a 50 ohm /50uH coupling impedance for
the measuring equipment. The peripheral devices are also connected to the main power
through a LISN that provides a 50ohm /50uH coupling impedance with 50ohm
termination. (Please refers to the block diagram of the test setup and photographs.)
Both sides of A.C. line are checked for maximum conducted interference. In order to find
the maximum emission, the relative positions of equipment and all of the interface cables
must be changed according to EN 55022:1994 +A1: 1995+A2: 1997 on conducted
measurement.
Conducted emissions were investigated over the frequency range from 0.15MHz to
30MHz using a receiver bandwidth of 9kHz.
.
2.5.
Test Specification
According to EN 55022:1994+A1: 1995+A2: 1997
Page: 15 of 111
Version:1.0
2.6.
Test Result
Product
MEGA BooK
Test Mode
Mode 3:
Date of Test
2004/02/10
Test Site
No.2 Shielded Room
Test Condition
Line1
Test Range
0.15~30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
*
0.209
0.279
0.482
1.517
9.107
19.662
0.21
0.21
0.21
0.16
0.33
0.34
0.10
0.10
0.10
0.12
0.20
0.44
53.11
42.33
42.39
34.64
30.38
29.61
53.42
42.64
42.70
34.92
30.90
30.40
63.26
60.85
56.30
56.00
60.00
60.00
Average
0.209
0.279
0.21
0.21
0.10
0.10
46.80
36.30
47.11
36.61
53.24
50.85
0.21
0.16
0.33
0.34
0.10
0.12
0.20
0.44
41.50
30.20
19.00
25.10
41.81
30.48
19.52
25.89
46.30
46.00
50.00
50.00
*
0.482
1.517
9.107
19.662
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + LISN Factor + Cable loss.
Page: 16 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 3:
Date of Test
2004/02/10
Test Site
No.2 Shielded Room
Test Condition
Line2
Test Range
0.15~30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
*
0.205
0.482
1.173
5.173
11.177
19.388
0.21
0.21
0.16
0.29
0.15
0.34
0.10
0.10
0.11
0.17
0.24
0.44
51.62
41.67
35.16
30.09
29.69
29.42
51.93
41.98
35.43
30.55
30.08
30.20
63.42
56.30
56.00
60.00
60.00
60.00
Average
0.205
0.21
0.10
46.50
46.81
53.41
0.21
0.16
0.29
0.15
0.34
0.10
0.11
0.17
0.24
0.44
40.30
32.00
26.60
26.80
25.20
40.61
32.27
27.06
27.19
25.98
46.30
46.00
50.00
50.00
50.00
*
0.482
1.173
5.173
11.177
19.388
Note:
Page: 17 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 6:
Date of Test
2004/02/10
Test Site
No.2 Shielded Room
Test Condition
Line1
Test Range
0.15~30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
*
0.220
0.369
0.619
2.240
4.709
16.462
0.21
0.21
0.21
0.09
0.29
0.35
0.10
0.10
0.10
0.13
0.17
0.38
46.59
34.75
31.78
24.97
27.09
36.80
46.90
35.06
32.09
25.19
27.55
37.53
62.81
58.53
56.00
56.00
56.00
60.00
Average
0.220
0.369
0.619
2.240
4.709
*
16.462
0.21
0.21
0.21
0.09
0.29
0.35
0.10
0.10
0.10
0.13
0.17
0.38
30.40
23.20
27.30
16.70
19.30
31.70
30.71
23.51
27.61
16.92
19.76
32.43
52.82
48.52
46.00
46.00
46.00
50.00
Note:
Page: 18 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 6:
Date of Test
2004/02/10
Test Site
No.2 Shielded Room
Test Condition
Line2
Test Range
0.15~30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
*
0.228
0.353
0.611
1.841
4.420
17.029
0.21
0.21
0.21
0.09
0.17
0.41
0.10
0.10
0.10
0.13
0.16
0.39
46.03
38.91
30.68
28.54
27.35
35.30
46.34
39.22
30.99
28.75
27.69
36.11
62.52
58.89
56.00
56.00
56.00
60.00
Average
0.228
0.353
0.611
1.841
4.420
*
17.029
0.21
0.21
0.21
0.09
0.17
0.41
0.10
0.10
0.10
0.13
0.16
0.39
32.10
26.20
25.40
21.20
19.90
30.10
32.41
26.51
25.71
21.41
20.24
30.91
52.52
48.89
46.00
46.00
46.00
50.00
Note:
Page: 19 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 9:
Date of Test
2004/02/10
Test Site
No.2 Shielded Room
Test Condition
Line1
Test Range
0.15~30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
*
0.205
0.275
0.619
1.517
2.896
3.713
0.21
0.21
0.21
0.16
0.23
0.17
0.10
0.10
0.10
0.12
0.15
0.16
51.38
42.19
41.55
39.19
37.61
38.14
51.69
42.50
41.86
39.47
37.98
38.47
63.42
60.97
56.00
56.00
56.00
56.00
Average
*
0.205
0.275
0.619
1.517
2.896
3.713
0.21
0.21
0.21
0.16
0.23
0.17
0.10
0.10
0.10
0.12
0.15
0.16
48.40
39.50
38.30
31.20
25.50
26.50
48.71
39.81
38.61
31.48
25.87
26.83
53.41
50.97
46.00
46.00
46.00
46.00
Note:
Page: 20 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 9:
Date of Test
2004/02/10
Test Site
No.2 Shielded Room
Test Condition
Line2
Test Range
0.15~30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
*
0.209
0.271
0.619
1.099
1.943
3.713
0.21
0.21
0.21
0.16
0.09
0.17
0.10
0.10
0.10
0.10
0.13
0.16
51.70
43.07
41.89
40.36
36.76
38.16
52.01
43.38
42.20
40.63
36.97
38.49
63.26
61.08
56.00
56.00
56.00
56.00
Average
*
0.209
0.271
0.619
1.099
1.943
3.713
0.21
0.21
0.21
0.16
0.09
0.17
0.10
0.10
0.10
0.10
0.13
0.16
48.00
38.50
38.20
33.30
22.40
28.10
48.31
38.81
38.51
33.57
22.61
28.43
53.24
51.09
46.00
46.00
46.00
46.00
Note:
Page: 21 of 111
Version:1.0
2.7.
Test Photo
Test Mode ： Mode 3:
Description： Front View of Conducted Test - Mode 3
Description： Back View of Conducted Test - Mode 3
Page: 22 of 111
Version:1.0
Page: 23 of 111
Version:1.0
Page: 24 of 111
Version:1.0
3.
Radiated Emission
3.1.
Test Equipment List
The following test equipment are used during the radiated emission test:
Test Site
Equipment
Model No./Serial No.
Last Cal.
ESCS 30 / 836858 / 022
Jan., 2004
Spectrum Analyzer Advantest
R3162 / 100803482
May, 2003
Pre-Amplifier
Advantest
BB525C/3307A01814
May, 2003
Bilog Antenna
SCHAFFNER CBL6112B / 2705
Oct., 2003
Horn Antenna
ETS
3115 / 0005-6160
Jul., 2003
Pre-Amplifier
QTK
QTK-AMP-01/ 0001
Jul., 2003
OATS 2 Test Receiver
Note:
3.2.
Manufacturer
R&S
1. All equipments that need to be calibrate are with calibration period of 1 year.
2. Mark “X” test instruments are used to measure the final test results.
Test Setup
Page: 25 of 111
Version:1.0
3.3.
Limits
EN 55022 Limits (dBuV/m)
Frequency
Class A
Class B
MHz
Distance
(m)
dBuV/m
Distance
(m)
dBuV/m
30 – 230
10
40
10
30
230 – 1000
10
47
10
37
Remarks: In the above table, the tighter limit applies at the band edges.
3.4.
Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground.
The turn table can rotate 360 degrees to determine the position of the maximum emission
level. The EUT was positioned such that the distance from antenna to the EUT was 10
meters.
The antenna can move up and down between 1 meter and 4 meters to find out the
maximum emission level.
Both horizontal and vertical polarization of the antenna are set on measurement. In order
to find the maximum emission, all of the interface cables must be manipulated according
to EN 55022:1994+A1: 1995 +A2: 1997 on radiated measurement.
Radiated emissions were investigated over the frequency range from 30MHz to1GHz
using a receiver bandwidth of 120kHz. Radiated measurement was performed at an
antenna to EUT distance of 10 meters.
3.5.
Test Specification
According to EN 55022:1994+A1: 1995+A2: 1997
Page: 26 of 111
Version:1.0
3.6.
Test Result
Product
MEGA BooK
Test Mode
Mode 3:
Date of Test
2004/02/10
Test Site
OATS 2
Test Condition
Horizontal
Test Range
30~1000MHz
Freq.
Cable
Loss
MHz
dB
Probe
PreAMP
Factor
dB/m
dB
Reading Measurement Margin Limit
Level
Level
dBuV
dBuV/m
dB
dBuV/m
=============================================================
Horizontal:
115.900
150.621
194.920
200.200
240.392
355.700
480.042
1.31
1.49
1.72
1.74
1.96
2.55
3.19
11.77
10.32
8.05
8.40
10.42
13.42
16.70
0.00
0.00
0.00
0.00
0.00
0.00
0.00
4.08
8.80
11.76
9.09
10.58
10.70
4.95
17.16
20.62
21.53
19.23
22.96
26.68
24.84
12.84
9.38
8.47
10.77
14.04
10.32
12.16
30.00
30.00
30.00
30.00
37.00
37.00
37.00
*
4.13
18.42
0.00
6.93
29.48
7.52
37.00
662.684
Note:
1.
All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average
measurements as necessary.
2. “ * ”, means this data is the worst emission level.
3. Measurement Level = Reading Level + Probe Factor + Cable Loss.
Page: 27 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 3:
Date of Test
2004/02/10
Test Site
OATS 2
Test Condition
Vertical
Test Range
30~1000MHz
Freq.
MHz
Cable
Probe
Loss
Factor
dB
dB/m
PreAMP Reading
Measurement Margin Limit
Level
dB
dBuV
Level
dBuV/m
dB
dBuV/m
==========================================================
Vertical:
116.760
120.499
159.760
194.902
250.001
375.000
480.052
584.714
1.32
1.33
1.53
1.72
2.01
2.65
3.19
3.73
10.43
10.66
8.68
8.11
11.86
14.90
16.40
19.56
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
7.80
11.18
8.89
13.70
8.78
9.57
4.81
4.00
19.55
23.17
19.10
23.53
22.65
27.11
24.40
27.30
10.45
6.83
10.90
6.47
14.35
9.89
12.60
9.70
30.00
30.00
30.00
30.00
37.00
37.00
37.00
37.00
*
4.13
17.70
0.00
8.71
30.54
6.46
37.00
662.685
Note:
1.
Page: 28 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 6:
Date of Test
2004/02/10
Test Site
OATS 2
Test Condition
Horizontal
Test Range
30~1000MHz
Freq.
Cable
Loss
MHz
dB
Probe
PreAMP
Factor
dB/m
dB
Level
Level
dBuV
dBuV/m
dB
dBuV/m
=============================================================
Horizontal:
120.784
136.715
194.900
200.103
240.395
375.000
480.047
669.159
*
761.190
914.800
1.34
1.42
1.72
1.74
1.95
2.64
3.19
4.16
11.62
11.20
8.05
8.40
10.42
14.20
16.70
18.36
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
8.57
5.69
7.86
11.25
11.56
8.65
6.93
5.10
21.53
18.31
17.63
21.39
23.93
25.49
26.82
27.61
8.47
11.69
12.37
8.61
13.07
11.51
10.18
9.39
30.00
30.00
30.00
30.00
37.00
37.00
37.00
37.00
4.63
5.43
19.54
19.77
0.00
0.00
5.60
0.04
29.78
25.24
7.22
11.76
37.00
37.00
Note:
1.
Page: 29 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 6:
Date of Test
2004/02/10
Test Site
OATS 2
Test Condition
Vertical
Test Range
30~1000MHz
Freq.
MHz
Cable
Probe
Loss
Factor
dB
dB/m
PreAMP Reading
Level
dB
dBuV
Level
dBuV/m
dB
dBuV/m
==========================================================
Vertical:
86.740
120.012
194.900
200.100
240.391
375.000
480.051
600.065
*
630.200
720.080
854.800
1.16
1.33
1.72
1.74
1.95
2.64
3.19
3.80
8.06
10.36
8.11
8.40
10.82
14.90
16.40
19.54
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
11.19
5.66
12.04
8.06
9.28
7.24
4.95
5.74
20.42
17.35
21.87
18.20
22.05
24.78
24.54
29.09
9.58
12.65
8.13
11.80
14.95
12.22
12.46
7.91
30.00
30.00
30.00
30.00
37.00
37.00
37.00
37.00
3.96
4.42
5.12
18.53
19.52
19.13
0.00
0.00
0.00
7.59
2.08
0.80
30.08
26.03
25.04
6.92
10.97
11.96
37.00
37.00
37.00
Note:
1.
Page: 30 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 9:
Date of Test
2004/02/10
Test Site
OATS 2
Test Condition
Horizontal
Test Range
30~1000MHz
Freq.
Cable
Loss
MHz
dB
Probe
PreAMP
Factor
dB/m
dB
Level
Level
dBuV
dBuV/m
dB
dBuV/m
=============================================================
Horizontal:
120.784
200.100
229.083
375.000
480.052
*
630.200
720.082
840.091
914.600
1.34
1.74
1.89
2.64
3.19
11.62
8.40
9.52
14.20
16.70
0.00
0.00
0.00
0.00
0.00
7.91
11.52
10.66
8.35
8.94
20.87
21.66
22.08
25.19
28.83
9.13
8.34
7.92
11.81
8.17
30.00
30.00
30.00
37.00
37.00
3.96
4.42
5.04
5.43
18.63
18.32
19.33
19.77
0.00
0.00
0.00
0.00
7.27
3.44
2.28
2.43
29.85
26.19
26.65
27.63
7.15
10.81
10.35
9.37
37.00
37.00
37.00
37.00
Note:
1.
Page: 31 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 9:
Date of Test
2004/02/10
Test Site
OATS 2
Test Condition
Vertical
Test Range
30~1000MHz
Freq.
MHz
Cable
Probe
Loss
Factor
dB
dB/m
PreAMP Reading
Level
dB
dBuV
Level
dBuV/m
dB
dBuV/m
==========================================================
Vertical:
120.015
194.900
240.396
375.000
480.057
600.066
*
630.200
720.083
915.600
1.33
1.72
1.95
2.64
3.19
3.80
10.36
8.11
10.82
14.90
16.40
19.54
0.00
0.00
0.00
0.00
0.00
0.00
5.24
12.38
8.32
6.54
9.48
6.22
16.93
22.21
21.09
24.08
29.07
29.57
13.07
7.79
15.91
12.92
7.93
7.43
30.00
30.00
37.00
37.00
37.00
37.00
3.96
4.42
5.43
18.53
19.52
21.37
0.00
0.00
0.00
8.12
4.48
0.98
30.61
28.43
27.78
6.39
8.57
9.22
37.00
37.00
37.00
Note:
1.
Page: 32 of 111
Version:1.0
3.7.
Test Photo
Description： Front View of Radiated Test- Mode 3
Description： Back View of Radiated Test- Mode 3
Page: 33 of 111
Version:1.0
Page: 34 of 111
Version:1.0
Page: 35 of 111
Version:1.0
4.
Power Harmonics
4.1.
Test Equipment List
Item Instrument
1
Manufacturer
Type No/Serial No.
Last Calibration
Power Harmonics SCHAFFNER
Profline 2105-400
Jun.,2003
Tester
S/N: HK54148
2
Analyzer
SCHAFFNER
3
No.3 Shielded Room
CCN 1000-1/X71887 Jun.,2003
N/A
4.2.
Test Setup
Page: 36 of 111
Version:1.0
4.3.
Limits
Limits of Class A Harmonics Currents
Harmonics
Maximum Permissible
Order
harmonic current
A
n
Harmonics Order
n
Odd harmonics
Maximum Permissible
harmonic current
A
Even harmonics
3
2.30
2
1.08
5
1.14
4
0.43
7
0.77
6
0.30
9
0.40
8 ≤ n ≤ 40
0.23 * 8/n
11
0.33
13
0.21
15 ≤ n ≤ 39
0.15 * 15/n
Limits of Class B Harmonics Currents
For Class B equipment, the harmonic of the input current shall not exceed the maximum
permissible values given in table which is the limit of Class A multiplied by a factor of 1.5.
Limits of Class C Harmonics Currents
Harmonics Order
n
Maximum Permissible harmonic current
Expressed as a percentage of the input
current at the fundamental frequency
％
2
2
3
30．λ
5
10
7
7
9
5
11 ≤ n ≤ 39
3
＊
(odd harmonics only)
＊λ is the circuit power factor
Page: 37 of 111
Version:1.0
Limits of Class D Harmonics Currents
Harmonics Order
n
Maximum Permissible
harmonic current per watt
mA/W
Maximum Permissible
harmonic current
A
3
3.4
2.30
5
1.9
1.14
7
1.0
0.77
9
0.5
0.40
11
0.35
0.33
11 ≤ n ≤ 39
3.85/n
See limit of Class A
(odd harmonics only)
4.4.
Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
4.5.
Test Specification
According to EN 61000-3-2:2000
Page: 38 of 111
Version:1.0
4.6.
Test Result
Date of Test
2004/02/10
Test Site
No.3 Shielded Room
Test Mode
Mode 3:
Product
MEGA BooK
Test Condition
Power Harmonics
Test Range
Test Result: Pass
Source qualification: Normal
European Limits
6
300
4
200
2
100
0
0
-2
-100
-4
-200
-6
-300
Current & voltage waveforms
Voltage (Volts)
Current (Amps)
Harmonics and Class D limit line
It is 0.0% outside Class-D envelope
Current RMS(Amps)
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
32
36
40
Worst harmonic was #0 with 0.00% of the limit.
Page: 39 of 111
Version:1.0
Test Result: Pass
Highest parameter values during test:
V_RMS (Volts): 229.91
I_Peak (Amps): 3.884
I_Fund (Amps): 0.304
Power (Watts): 71
Harm#
Harmonics
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.002
0.293
0.002
0.283
0.003
0.270
0.004
0.253
0.004
0.233
0.005
0.210
0.005
0.186
0.005
0.161
0.005
0.136
0.004
0.112
0.004
0.089
0.003
0.068
0.003
0.050
0.002
0.034
0.002
0.022
0.001
0.013
0.001
0.010
0.001
0.010
0.001
0.012
0.001
1.Dynamic limits were applied for this test.
I_RMS (Amps):
Crest Factor:
Power Factor:
0.781
4.981
0.397
Limit
% of Limit
Status
0.255
0.00
Pass
0.143
0.00
Pass
0.075
0.00
Pass
0.038
0.00
Pass
0.026
0.00
Pass
0.023
0.00
Pass
0.020
0.00
Pass
0.017
0.00
Pass
0.015
0.00
Pass
0.014
0.00
Pass
0.013
0.00
Pass
0.012
0.00
Pass
0.011
0.00
Pass
0.010
0.00
Pass
0.009
0.00
Pass
0.009
0.00
Pass
0.008
0.00
Pass
0.008
0.00
Pass
0.007
0.00
Pass
The highest harmonics values in the above table may not occur at the same window as the
maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the
result should be pass.
Page: 40 of 111
Version:1.0
Date of Test
2004/02/10
Test Site
No.3 Shielded Room
Test Mode
Mode 6:
Product
MEGA BooK
Test Condition
Power Harmonics
Test Range
Test Result: Fail
3
300
2
200
1
100
0
0
-1
-100
-2
-200
-3
-300
Current RMS(Amps)
Voltage (Volts)
Current (Amps)
European Limits
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Fail
Test Result: Fail
8
12
16 20 24
Harmonic #
28
32
36
40
Page: 41 of 111
Version:1.0
THC(A): 0.61
I-THD(pk%): 202.49
Power (Watts): 71
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.000
0.283
0.000
0.267
0.000
0.245
0.000
0.217
0.000
0.187
0.000
0.154
0.000
0.123
0.000
0.094
0.000
0.068
0.000
0.049
0.000
0.036
0.000
0.030
0.000
0.028
0.000
0.027
0.000
0.024
0.000
0.020
0.000
0.016
0.000
0.011
0.000
0.008
0.000
POHC(A): 0.075
I_RMS (Amps):
Crest Factor:
Power Factor:
POHC Limit(A): 0.028
0.683
4.398
0.455
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.241
117.4
0.290
0.362
80.14
Fail
0.135
198.3
0.274
0.202
135.45
Fail
0.071
345.2
0.251
0.106
236.15
Fail
0.035
613.1
0.223
0.053
420.07
Fail
0.025
752.0
0.192
0.037
516.56
Fail
0.021
725.9
0.160
0.031
506.99
Fail
0.018
666.1
0.127
0.027
466.93
Fail
0.016
573.6
0.098
0.024
404.85
Fail
0.014
475.2
0.072
0.022
333.05
Fail
0.013
377.3
0.052
0.020
264.52
Fail
0.012
307.2
0.038
0.018
214.53
Fail
0.011
278.8
0.032
0.016
192.60
Fail
0.010
279.0
0.029
0.015
191.51
Fail
0.009
283.8
0.027
0.014
194.58
Fail
0.009
275.2
0.025
0.013
188.82
Fail
0.008
247.5
0.021
0.012
170.06
Fail
0.008
201.7
0.016
0.012
140.71
Fail
0.007
150.4
0.012
0.011
106.14
Fail
0.007
107.4
0.008
0.010
75.93
Fail
Page: 42 of 111
Version:1.0
Date of Test
2004/02/10
Test Site
No.3 Shielded Room
Test Mode
Mode 9:
Product
MEGA BooK
Test Condition
Power Harmonics
Test Range
Test Result: Fail
6
300
4
200
2
100
0
0
-2
-100
-4
-200
-6
-300
Current RMS(Amps)
Voltage (Volts)
Current (Amps)
European Limits
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Fail
Test Result: Fail
8
12
16 20 24
Harmonic #
28
32
36
40
Page: 43 of 111
Version:1.0
THC(A): 0.72
I-THD(pk%): 233.97
Power (Watts): 72
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.000
0.290
0.000
0.280
0.000
0.266
0.000
0.249
0.000
0.228
0.000
0.204
0.000
0.180
0.000
0.154
0.000
0.129
0.000
0.105
0.000
0.083
0.000
0.062
0.000
0.045
0.000
0.031
0.000
0.020
0.000
0.014
0.000
0.012
0.000
0.012
0.000
0.013
0.000
POHC(A): 0.125
I_RMS (Amps):
Crest Factor:
Power Factor:
POHC Limit(A): 0.028
0.780
4.939
0.404
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.246
117.9
0.297
0.369
80.49
Fail
0.138
203.8
0.287
0.206
139.18
Fail
0.072
367.8
0.273
0.109
251.21
Fail
0.036
686.4
0.255
0.054
468.70
Fail
0.025
898.2
0.233
0.038
613.22
Fail
0.022
940.7
0.209
0.032
650.92
Fail
0.019
954.3
0.184
0.028
660.15
Fail
0.017
926.5
0.158
0.025
642.32
Fail
0.015
878.8
0.133
0.022
601.77
Fail
0.013
792.6
0.108
0.020
541.23
Fail
0.012
682.6
0.085
0.018
466.40
Fail
0.011
558.8
0.064
0.017
382.92
Fail
0.010
432.9
0.046
0.016
297.62
Fail
0.010
317.1
0.031
0.014
218.12
Fail
0.009
221.5
0.020
0.013
151.73
Fail
0.008
162.6
0.014
0.013
110.75
Fail
0.008
148.9
0.012
0.012
102.38
Fail
0.008
163.3
0.013
0.011
112.19
Fail
0.007
177.4
0.013
0.011
121.96
Fail
Page: 44 of 111
Version:1.0
4.7.
Test Photo
Description： Power Harmonics Test Setup -Mode3
Page: 45 of 111
Version:1.0
Page: 46 of 111
Version:1.0
5.
Voltage Fluctuation and Flicker
5.1.
Test Equipment List
Item Instrument
Manufacturer
Type No/Serial No.
Last Calibration
1
SCHAFFNER
Profline 2105-400
Jun.,2003
Power Harmonics
S/N: HK54148
Tester
2
Analyzer
SCHAFFNER
3
No.3 Shielded Room
CCN 1000-1/X71887 Jun.,2003
N/A
5.2.
Test Setup
Page: 47 of 111
Version:1.0
5.3.
Limits
Voltage Fluctuations and Flicker:
The following limits apply:
－ the value of Pst shall not be greater than 1.0;
－ the value of P1t shall not be greater than 0.65;
－ the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500 ms;
－ the relative steady-state voltage change, dc, shall not exceed 3.3 ％;
－ the maximum relative voltage change, dmax, shall not exceed;
a)
4 ％ without additional conditions;
b)
6 ％ for equipment which is:
－ switched manually, or
－ switched automatically more frequently than twice per day, and also has either a
delayed restart (the delay being not less than a few tens of seconds), or manual restart,
after a power supply interruption.
NOTE The cycling frequency will be further limited by the Pst and P1t limit. For example: a dmax
of 6％producing a rectangular voltage change characteristic twice per hour will give a
P1t of about 0.65.
c) 7 ％ for equipment which is:
－ attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment
such as mixers, garden equipment such as lawn mowers, portable tools such as electric
drills), or
－ switched on automatically, or is intended to be switched on manually, no more than twice
per day, and also has either a delayed restart (the delay being not less than a few tens of
seconds) or manual restart, after a power supply interruption.
Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.
5.4.
Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
5.5.
Test Specification
According to EN 61000-3-3:1995+A1:2001
Page: 48 of 111
Version:1.0
5.6.
Test Result
Date of Test
2004/02/10
Test Site
No.3 Shielded Room
Test Mode
Mode 3:
Product
MEGA BooK
Test Condition
Flicker
Test Range
Test Result: Pass
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
0.00
17:31:48
Time is too short for Plt plot
Parameter values recorded during the test:
Vrms at the end of test (Volt):
229.74
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Highest Pst (10 min. period):
Highest Plt (2 hr. period):
Test limit (%):
3.30
Pass
500.0
Pass
Test limit (%):
3.30
Pass
Test limit (%):
4.00
Pass
Test limit:
1.000
Pass
0.001 Test limit:
0.650
Pass
Test limit (mS):
0.001
Page: 49 of 111
Version:1.0
Date of Test
2004/02/10
Test Site
No.3 Shielded Room
Test Mode
Mode 6:
Product
MEGA BooK
Test Condition
Flicker
Test Range
Test Result: Pass
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
0.00
21:26:16
229.69
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Test limit (%):
3.30
Pass
500.0
Pass
Test limit (%):
3.30
Pass
Test limit (%):
4.00
Pass
Test limit:
1.000
Pass
0.001 Test limit:
0.650
Pass
Test limit (mS):
0.001
Page: 50 of 111
Version:1.0
Date of Test
2004/02/10
Test Site
No.3 Shielded Room
Test Mode
Mode 9:
Product
MEGA BooK
Test Condition
Flicker
Test Range
Test Result: Pass
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
0.00
21:42:38
229.80
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Test limit (%):
3.30
Pass
500.0
Pass
Test limit (%):
3.30
Pass
Test limit (%):
4.00
Pass
Test limit:
1.000
Pass
0.001 Test limit:
0.650
Pass
Test limit (mS):
0.001
Page: 51 of 111
Version:1.0
5.7.
Test Photo
Description： Flicker Test Setup -Mode3
Page: 52 of 111
Version:1.0
Page: 53 of 111
Version:1.0
6.
Electrostatic Discharge (ESD)
6.1.
Test Equipment List
Item Instrument
Manufacturer Type No/Serial No.
Last Calibration
1
ESD Simulator System SCHAFFNER NSG 438,S/N:167
Dec.,2003
2
Horizontal Coupling
Plane(HCP)
QuieTek
HCP AL50
N/A
3
Vertical Coupling
Plane(VCP)
QuieTek
VCP AL50
N/A
4
No.3 Shielded Room
N/A
6.2.
Test Setup
Page: 54 of 111
Version:1.0
6.3.
Limits
Item Environmental
Phenomena
Units
Test Specification
Performance
Criteria
Enclosure Port
Electrostatic Discharge Kv (Charge Voltage) ±8 Air Discharge
B
±4 Contact Discharge
Remark:
The Contact discharges were applied – at least total 200 discharges at a minimum of four test
points.
6.4.
Test Procedure
Direct application of discharges to the EUT:
Contact discharge was applied only to conductive surfaces of the EUT.
Air discharges were applied only to non-conductive surfaces of the EUT.
During the test, it was performed with single discharges. For the single discharge
time between successive single discharges will be keep longer 1 second. It was at
least ten single discharges with positive and negative at the same selected point.
The selected point, which was performed with electrostatic discharge, was marked
on the red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP):
The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned
at a distance 0.1m from, the EUT, with the Discharge Electrode touching the
coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
Horizontal Coupling Plane (HCP):
The coupling plane is placed under to the EUT. The generator shall be positioned
vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching
the coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
6.5.
Test Specification
According to IEC 61000-4-2:1995+A1:1998+A2:2000
Page: 55 of 111
Version:1.0
6.6.
Test Result
Product
MEGA BooK
Test Mode
Mode 3:
Date of Test
2004/02/10
Test Site
Test Condition
ESD
Test Range
Item
Amount of
Discharge
Voltage
No.3 Shielded Room
Required
Complied To
Criteria
Criteria (A,B,C)
Results
10
+8kV
B
B
Pass
10
-8kV
B
B
Pass
10
+4kV
B
B
Pass
10
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(HCP)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Front)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Left)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Back)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Right)
50
-4kV
B
B
Pass
Air Discharge
Contact Discharge
NR: No Requirement
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV.
No false alarms or other malfunctions were observed during or after the test.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 56 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 6:
Date of Test
2004/02/10
Test Site
Test Condition
ESD
Test Range
Item
Amount of
Discharge
Voltage
No.3 Shielded Room
Required
Complied To
Criteria
Criteria (A,B,C)
Results
10
+8kV
B
B
Pass
10
-8kV
B
B
Pass
10
+4kV
B
B
Pass
10
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(HCP)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Front)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Left)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Back)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Right)
50
-4kV
B
B
Pass
Air Discharge
Contact Discharge
NR: No Requirement
kV.
Remark:
Page: 57 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 9:
Date of Test
2004/02/10
Test Site
Test Condition
ESD
Test Range
Item
Amount of
Discharge
Voltage
No.3 Shielded Room
Required
Complied To
Criteria
Criteria (A,B,C)
Results
10
+8kV
B
B
Pass
10
-8kV
B
B
Pass
10
+4kV
B
B
Pass
10
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(HCP)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Front)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Left)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Back)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Right)
50
-4kV
B
B
Pass
Air Discharge
Contact Discharge
NR: No Requirement
kV.
Remark:
Page: 58 of 111
Version:1.0
6.7.
Test Photo
Description： ESD Test Setup -Mode3
Page: 59 of 111
Version:1.0
Page: 60 of 111
Version:1.0
7.
Radiated Susceptibility (RS)
7.1.
Test Equipment List
Item Instrument
Manufacturer
Type No/Serial No.
Signal Generator
IFR
2023B / 202302/581
May,2003
2
Power Amplifier
A&R
500A100AM3 /29369
Aug.,2003
3
Power Amplifier
SCHAFFNER
CBA9413B / 0006
Jun.,2003
1
4
Field Strength
Sensor
SCHAFFNER
EMC 20 / Y-0028/
Z-0003
Last Calibration
Jun.,2003
5
Power Antenna
SCHWARZBECK VULB 9166 / 1073
Sep.,2003
6
Power Meter
BOONTON
May,2003
7
No.2 EMC Fully Chamber
4232A / 42201
Jul.,2003
7.2.
Test Setup
Page: 61 of 111
Version:1.0
7.3.
Limits
Item Environmental
Phenomena
Units
Test
Specification
Enclosure Port
Radio-Frequency
MHz
Electromagnetic Field V/m(Un-modulated,
Amplitude Modulated rms)
% AM (1kHz)
7.4.
80-1000
3
80
Performance
Criteria
A
Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are
placed with one coincident with the calibration plane such that the distance from antenna
to the EUT was 3 meters.
Both horizontal and vertical polarization of the antenna and six sides of the EUT are set
on measurement.
In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows:
Condition of Test
Remarks
EN 55024:1998
1. Field Strength
3 V/M Level 2
2. Radiated Signal
AM 80% Modulated with 1kHz
3. Scanning Frequency
80MHz - 1000MHz
4 Dwell Time
3 Seconds
5. Frequency step size
∆ f :
6. The rate of Swept of Frequency
7.5.
1%
1.5 x 10-3 decades/s
Test Specification
According to IEC 61000-4-3:1995+A1:1998+A2:2000
Page: 62 of 111
Version:1.0
7.6.
Test Result
Product
MEGA BooK
Test Mode
Mode 3:
Date of Test
2004/02/10
Test Site
Chamber2
Test Condition
RS
Test Range
80-1000MHz
Field
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
REAR
H
3
A
A
PASS
80-1000
REAR
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
TOP
H
3
A
A
PASS
80-1000
TOP
V
3
A
A
PASS
80-1000
BOTTOM
H
3
A
A
PASS
80-1000
BOTTOM
V
3
A
A
PASS
Strength
(V/m)
Criteria
Criteria
Results
(A,B,C)
There was no observable degradation in performance.
at frequency
MHz.
V/m
Page: 63 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 6:
Date of Test
2004/02/10
Test Site
Chamber2
Test Condition
RS
Test Range
80-1000MHz
Field
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
REAR
H
3
A
A
PASS
80-1000
REAR
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
TOP
H
3
A
A
PASS
80-1000
TOP
V
3
A
A
PASS
80-1000
BOTTOM
H
3
A
A
PASS
80-1000
BOTTOM
V
3
A
A
PASS
Strength
(V/m)
Criteria
Criteria
Results
(A,B,C)
at frequency
MHz.
V/m
Page: 64 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 9:
Date of Test
2004/02/10
Test Site
Chamber2
Test Condition
RS
Test Range
80-1000MHz
Field
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
REAR
H
3
A
A
PASS
80-1000
REAR
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
TOP
H
3
A
A
PASS
80-1000
TOP
V
3
A
A
PASS
80-1000
BOTTOM
H
3
A
A
PASS
80-1000
BOTTOM
V
3
A
A
PASS
Strength
(V/m)
Criteria
Criteria
Results
(A,B,C)
at frequency
MHz.
V/m
Page: 65 of 111
Version:1.0
7.7.
Test Photo
Description： Radiated Susceptibility Test Setup
-Mode 1
-Mode 6
Page: 66 of 111
Version:1.0
Page: 67 of 111
-Mode 9
Version:1.0
8.
Electrical Fast Transient/Burst (EFT/B)
8.1.
Test Equipment List
Item Instrument
1
2
Manufacturer
Type No/Serial No.
Last Calibration
Fast Transient/Burst SCHAFFNER
NSG 2050
Jun.,2003
Generator
S/N: 200124-031AR
N/A
No.3 Shielded Room
8.2.
Test Setup
Page: 68 of 111
Version:1.0
8.3.
Limits
Item Environmental
Phenomena
Units
Test Specification Performance
Criteria
Signal Ports and Telecommunication Ports
Fast Transients
kV (Peak)
Common Mode
Tr/Ts ns
Rep. Frequency
kHz
Input DC Power Ports
Fast Transients
Common Mode
Input AC Power Ports
Fast Transients
Common Mode
8.4.
±0.5
5/50
5
B
kV (Peak)
Tr/Ts ns
Rep. Frequency
kHz
±0.5
5/50
5
B
kV (Peak)
Tr/Ts ns
Rep. Frequency
kHz
±1
5/50
5
B
Test Procedure
The EUT and load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides.
For Signal Ports and Telecommunication Ports:
The EFT interference signal is through a coupling clamp device couples to the signal
and control lines of the EUT with burst noise for 1min.
For Input DC and AC Power Ports:
The EUT is connected to the power mains through a coupling device that directly
couples the EFT interference signal.
Each of the Line and Neutral conductors is impressed with burst noise for 1 min.
The length of power cord between the coupling device and the EUT shall be 1m.
8.5.
Test Specification
According to IEC 61000-4-4:1995+A1:2000
Page: 69 of 111
Version:1.0
8.6.
Test Result
Product
MEGA BooK
Test Mode
Mode 3:
Date of Test
2004/02/10
Test Site
Test Condition
EFT/B
Test Range
Inject
Line
Voltage
Inject
Time
Polarity
kV
(Second)
No.3 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L
±
1kV
60
CDN
B
B
PASS
N
±
1kV
60
CDN
B
B
PASS
PE
±
1kV
60
CDN
B
B
PASS
L-N
±
1kV
60
CDN
B
B
PASS
L-PE
±
1kV
60
CDN
B
B
PASS
N-PE
±
1kV
60
CDN
B
B
PASS
L+N+PE
±
1kV
60
CDN
B
B
PASS
LAN
±
0.5kV
90
CDN
B
A
PASS
Telecom
±
0.5kV
90
CDN
B
A
PASS
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Line
kV of
.
Page: 70 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 6:
Date of Test
2004/02/10
Test Site
Test Condition
EFT/B
Test Range
Inject
Line
Voltage
Inject
Time
Polarity
kV
(Second)
No.3 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L
±
1kV
60
CDN
B
B
PASS
N
±
1kV
60
CDN
B
B
PASS
PE
±
1kV
60
CDN
B
B
PASS
L-N
±
1kV
60
CDN
B
B
PASS
L-PE
±
1kV
60
CDN
B
B
PASS
N-PE
±
1kV
60
CDN
B
B
PASS
L+N+PE
±
1kV
60
CDN
B
B
PASS
LAN
±
0.5kV
90
CDN
B
A
PASS
Telecom
±
0.5kV
90
CDN
B
A
PASS
Line
kV of
.
Page: 71 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 9:
Date of Test
2004/02/10
Test Site
Test Condition
EFT/B
Test Range
Inject
Line
Voltage
Inject
Time
Polarity
kV
(Second)
No.3 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L
±
1kV
60
CDN
B
B
PASS
N
±
1kV
60
CDN
B
B
PASS
PE
±
1kV
60
CDN
B
B
PASS
L-N
±
1kV
60
CDN
B
B
PASS
L-PE
±
1kV
60
CDN
B
B
PASS
N-PE
±
1kV
60
CDN
B
B
PASS
L+N+PE
±
1kV
60
CDN
B
B
PASS
LAN
±
0.5kV
90
CDN
B
A
PASS
Telecom
±
0.5kV
90
CDN
B
A
PASS
Line
kV of
.
Page: 72 of 111
Version:1.0
8.7.
Test Photo
Description： EFT/B Test Setup -Mode 3
Description： EFT/B Test Setup Clamp-Mode 3
Page: 73 of 111
Version:1.0
Description： EFT/B Test Setup Clamp-Mode 6
Page: 74 of 111
Version:1.0
Description： EFT/B Test Setup
Clamp-Mode 9
Page: 75 of 111
Version:1.0
9.
Surge
9.1.
Test Equipment List
Item Instrument
Manufacturer
Type No/Serial No.
Last Calibration
1
SCHAFFNER
NSG 2050
Jun.,2003
Surge
Generator
2
S/N: 200124-031AR
No.3 Shielded Room
N/A
9.2.
Test Setup
Page: 76 of 111
Version:1.0
9.3.
Limits
Item Environmental
Phenomena
Units
Criteria
Signal Ports and Telecommunication Ports (See 1) and 2))
Surges
Tr/Ts uS
1.2/50 (8/20)
Line to Ground
kV
±1
B
Surges
Line to Ground
Tr/Ts uS
kV
1.2/50 (8/20)
± 0.5
B
AC Input and AC Output Power Ports
Surges
Tr/Ts uS
Line to Line
kV
Line to Ground
kV
1.2/50 (8/20)
±1
±2
B
Notes:
1) Applicable only to ports which according to the manufacturer’s may directly to outdoor
cables.
2) Where normal functioning cannot be achieved because of the impact of the CDN on the
EUT,no test shall be required.
9.4.
Test Procedure
The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m
on all sides. The length of power cord between the coupling device and the EUT shall be 2m
or less.
For Input and Output AC Power or DC Input and DC Output Power Ports:
The EUT is connected to the power mains through a coupling device that directly couples
the Surge interference signal.
The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700
and the peak value of the a.c. voltage wave. (Positive and negative)
Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with
interval of 1 min.
9.5.
Test Specification
Page: 77 of 111
Version:1.0
9.6.
Test Result
Product
MEGA BooK
Test Mode
Mode 3:
Date of Test
2004/02/10
Test Site
Test Condition
Surge
Test Range
Inject
Line
Time
Voltage
Interval
Polarity Angle
kV
(Second)
No.3 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Line
kV of
.
Page: 78 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 6:
Date of Test
2004/02/10
Test Site
Test Condition
Surge
Test Range
Inject
Line
Time
Voltage
Interval
Polarity Angle
kV
(Second)
No.3 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Line
kV of
.
Page: 79 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 9:
Date of Test
2004/02/10
Test Site
Test Condition
Surge
Test Range
Inject
Line
Time
Voltage
Interval
Polarity Angle
kV
(Second)
No.3 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Line
kV of
.
Page: 80 of 111
Version:1.0
9.7.
Test Photo
Description： SURGE Test Setup-Mode 3
Page: 81 of 111
Version:1.0
Page: 82 of 111
Version:1.0
10.
Conducted Susceptibility (CS)
10.1.
Test Equipment List
Item Instrument
Manufacturer
Type No/Serial No.
Last Calibration
Signal Generator
IFR
2023B / 202302/581
May,2003
2
Power Amplifier
A&R
3
Power Amplifier
SCHAFFNER
4
CDN 1
Schwarzbeck
L801 M2/3 / 1549
Jun.,2003
5
CDN 2
Schwarzbeck
L801 S1 / 1574
Jun.,2003
6
CDN 3
Schwarzbeck
L801 AF4 / 1064
Jun.,2003
7
CDN 4
Schwarzbeck
L801 AF8 / 1070
Jun.,2003
8
CDN 5
FCC
FCC-801-S9 / 9837
Jun.,2003
9
CDN 6
FCC
FCC-801-S15 / 9838
Jun.,2003
10
CDN 7
FCC
FCC-801-S25 / 9839
Jun.,2003
11
50 ohm Terminator
RES-NET
RCX6BM
Jun.,2003
12
6dB Attenuator
BIRD
13
EM Clamp
Schwarzbeck
1
14
500A100AM3 /29369
Aug.,2003
CBA9413B / 0006
Jun.,2003
No.2 EMC Fully
RFA250NFF10
Jun.,2003
KEMZ 801 / 15928
Jun.,2003
N/N
Chamber
10.2.
Test Setup
Page: 83 of 111
Version:1.0
10.3.
Limits
Item Environmental
Phenomena
Units
Criteria
Signal Ports and Telecommunication Ports
MHz
Radio-Frequency
V (rms,
Continuous Conducted
Un-modulated)
% AM (1kHz)
MHz
Radio-Frequency
V (rms,
Continuous Conducted
Un-modulated)
% AM (1kHz)
MHz
Radio-Frequency
V (rms,
Continuous Conducted Un-modulated)
% AM (1kHz)
Page: 84 of 111
0.15-80
3
80
A
0.15-80
3
80
A
0.15-80
3
80
A
Version:1.0
10.4.
Test Procedure
The EUT are placed on a table that is 0.8 meter height, and a ground reference plane on
the table, EUT are placed upon table and use a 10cm insulation between the EUT and
ground reference plane.
For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) or
EM-clamp device couples to the signal and Telecommunication lines of the EUT.
For Input DC and AC Power Ports
The EUT is connected to the power mains through a coupling and decoupling networks
for power supply lines. And directly couples the disturbances signal into EUT.
Used CDN-M2 for two wires or CDN-M3 for three wires.
All the scanning conditions are as follows:
Condition of Test
Remarks
1. Field Strength
130dBuV(3V) Level 2
2. Radiated Signal
AM 80% Modulated with 1kHz
3. Scanning Frequency
0.15MHz – 80MHz
4 Dwell Time
3 Seconds
5. Frequency step size
∆ f :
6. The rate of Swept of Frequency
1%
1.5 x 10-3 decades/s
.
10.5.
Test Specification
Page: 85 of 111
Version:1.0
10.6.
Test Result
Product
MEGA BooK
Test Mode
Mode 3:
Date of Test
2004/02/10
Test Site
Chamber2
Test Condition
CS
Test Range
0.15-80MHz
Frequency
Voltage
Inject
Tested Port of
Required
Performance
Result
Range
Applied
Method
EUT
Criteria
Criteria Complied
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
Clamp
LAN
A
A
PASS
0.15~80
130 (3V)
Clamp
Telecom
A
A
PASS
To
dBuV(V) at frequency
MHz.
No false alarms or other malfunctions were observed during or after the test. The acceptance criteria
were met, and the EUT passed the test.
Page: 86 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 6:
Date of Test
2004/02/10
Test Site
Chamber2
Test Condition
CS
Test Range
0.15-80MHz
Frequency
Voltage
Inject
Tested Port of
Required
Performance
Result
Range
Applied
Method
EUT
Criteria
Criteria Complied
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
Clamp
LAN
A
A
PASS
0.15~80
130 (3V)
Clamp
Telecom
A
A
PASS
To
MHz.
Page: 87 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 9:
Date of Test
2004/02/10
Test Site
Chamber2
Test Condition
CS
Test Range
0.15-80MHz
Frequency
Voltage
Inject
Tested Port of
Required
Performance
Result
Range
Applied
Method
EUT
Criteria
Criteria Complied
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
Clamp
LAN
A
A
PASS
0.15~80
130 (3V)
Clamp
Telecom
A
A
PASS
To
MHz.
Page: 88 of 111
Version:1.0
10.7.
Test Photo
Description： Conducted Susceptibility Test Setup –Mode 3
Description： Conducted Susceptibility Test Setup Clamp-Mode 3
Page: 89 of 111
Version:1.0
Description： Conducted Susceptibility Test Setup -Mode 6
Description： Conducted Susceptibility Test Setup Clamp -Mode 6
Page: 90 of 111
Version:1.0
Description： Conducted Susceptibility Test Setup -Mode 9
Description： Conducted Susceptibility Test Setup Clamp-Mode 9
Page: 91 of 111
Version:1.0
11.
Power Frequency Magnetic Field
11.1.
Test Equipment List
Item Instrument
Manufacturer Type No/Serial No.
Last Calibration
1
SCHAFFNER INA 2141
Jun.,2003
Power Line Maganetics
S/N: 6002
2
Gauss Meter
F.W.BELL
4090
3
Magnetic Field Coil
SCHAFFNER INA702
Jun.,2003
Jun.,2003
S/N: 199749-020 IN
4
No.3 Shielded Room
N/A
11.2.
Test Setup
Page: 92 of 111
Version:1.0
11.3.
Limits
Item Environmental
Phenomena
Units
Criteria
Hz
A/m (r.m.s.)
50
1
Enclosure Port
Power-Frequency
Magnetic Field
11.4.
A
Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured at least 1m*1m min. The test magnetic field shall be placed at central of
the induction coil.
The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.
And the induction coil shall be rotated by 90° in order to expose the EUT to the test field
with different orientation (X, Y, Z Orientations).
11.5.
Test Specification
Page: 93 of 111
Version:1.0
11.6.
Test Result
Product
MEGA BooK
Test Mode
Mode 3:
Date of Test
2004/02/10
Test Site
Test Condition
PMag
Test Range
Polarization
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Line
kV of
.
No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were
met, and the EUT passed the test.
Page: 94 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 6:
Date of Test
2004/02/10
Test Site
Test Condition
PMag
Test Range
Polarization
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Line
kV of
.
Page: 95 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 9:
Date of Test
2004/02/10
Test Site
Test Condition
PMag
Test Range
Polarization
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Line
kV of
.
Page: 96 of 111
Version:1.0
11.7.
Test Photo
Description： Power Frequency Magnetic Field Test Setup -Mode 3
Page: 97 of 111
Version:1.0
Page: 98 of 111
Version:1.0
12.
Voltage Dips and Interruption Measurement
12.1.
Test Equipment List
Item Instrument
Manufacturer
Type No/Serial No.
Last Calibration
1
SCHAFFNER
NSG 2050
Jun.,2003
Voltage Dips
Generator
2
S/N: 200124-031AR
No.3 Shielded Room
N/A
12.2.
Test Setup
Page: 99 of 111
Version:1.0
12.3.
Limits
Item Environmental
Phenomena
Units
Criteria
>95
0.5
30
25
> 95
250
% Reduction
Period
% Reduction
Periods
% Reduction
Periods
Voltage Dips
Voltage Interruptions
12.4.
B
C
C
Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at
least 0.1m on all sides. The power cord shall be used the shortest power cord as
specified by the manufacturer.
For Voltage Dips/ Interruptions test:
The selection of test voltage is based on the rated power range. If the operation
range is large than 20% of lower power range, both end of specified voltage shall be
tested. Otherwise, the typical voltage specification is selected as test voltage.
The EUT is connected to the power mains through a coupling device that directly
couples to the Voltage Dips and Interruption Generator.
The EUT shall be tested for 30% voltage dip of supplied voltage and duration 10ms,
for 60% voltage dip of supplied voltage and duration 100ms with a sequence of three
voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied
voltage and duration 5000ms with a sequence of three voltage interruptions with
intervals of 10 seconds.
Voltage phase shifting are shall occur at 0O, 45O, 90O, 135O, 180O, 225O, 270O, 315O
of the voltage.
12.5.
Test Specification
Page: 100 of 111
Version:1.0
12.6.
Test Result
Product
MEGA BooK
Test Mode
Mode 3:
Date of Test
2004/02/10
Test Site
Test Condition
Dip
Test Range
Voltage Dips and
Interruption
Reduction(%)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test
Duration
(Periods)
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
25
25
25
25
25
25
25
25
250
250
250
250
250
250
250
250
Required
Performance
Criteria
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
Performance
Criteria
Complied To
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
No.3 Shielded Room
Test Result
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
The nominal voltage of EUT is 230V.
Line
.
kV of
Page: 101 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 6:
Date of Test
2004/02/10
Test Site
Test Condition
Dip
Test Range
Voltage Dips and
Interruption
Reduction(%)
>35(149.5V)
>35(149.5V)
>35(149.5V)
>35(149.5V)
>35(149.5V)
>35(149.5V)
>35(149.5V)
>35(149.5V)
25(172.5V)
25(172.5V)
25(172.5V)
25(172.5V)
25(172.5V)
25(172.5V)
25(172.5V)
25(172.5V)
>100(0V)
>100(0V)
>100(0V)
>100(0V)
>100(0V)
>100(0V)
>100(0V)
>100(0V)
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test
Duration
(Periods)
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
25
25
25
25
25
25
25
25
250
250
250
250
250
250
250
250
Required
Performance
Criteria
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
Performance
Criteria
Complied To
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
No.3 Shielded Room
Test Result
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Line
.
kV of
Page: 102 of 111
Version:1.0
Product
MEGA BooK
Test Mode
Mode 9:
Date of Test
2004/02/10
Test Site
Test Condition
Dip
Test Range
Voltage Dips and
Interruption
Reduction(%)
>35(149.5V)
>35(149.5V)
>35(149.5V)
>35(149.5V)
>35(149.5V)
>35(149.5V)
>35(149.5V)
>35(149.5V)
25(172.5V)
25(172.5V)
25(172.5V)
25(172.5V)
25(172.5V)
25(172.5V)
25(172.5V)
25(172.5V)
>100(0V)
>100(0V)
>100(0V)
>100(0V)
>100(0V)
>100(0V)
>100(0V)
>100(0V)
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test
Duration
(Periods)
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
25
25
25
25
25
25
25
25
250
250
250
250
250
250
250
250
Required
Performance
Criteria
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
Performance
Criteria
Complied To
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
No.3 Shielded Room
Test Result
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Line
.
kV of
Page: 103 of 111
Version:1.0
12.7.
Test Photo
Description： Voltage Dips Test Setup -Mode 3
Page: 104 of 111
Version:1.0
Page: 105 of 111
Version:1.0
Attachement
EUT Photograph
(1) EUT Photo
(2) EUT Photo
Page: 106 of 111
Version:1.0
(3) EUT Photo
(4) EUT Photo
Page: 107 of 111
Version:1.0
(5) EUT Photo
(6) EUT Photo
Page: 108 of 111
Version:1.0
(7) EUT Photo
(8) EUT Photo
Page: 109 of 111
Version:1.0
(9) EUT Photo
Page: 110 of 111
Version:1.0
Reference
:
Laboratory of License
Page: 111 of 111
Version:1.0

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