IT REPORT

Transcription

IT REPORT

Report No： 046L097E
Test Report
Product Name ： MEGA Book
Model No.
： MS-1006,S250,SIM2000
Applicant ： MICRO-STAR INTL Co., LTD.
Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien,
Taiwan, R.O.C.
Date of Receipt ： 2004/06/14
Date of Test
： 2004/07/15
Report No.
： 046L097E
The test results relate only to the samples tested.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Page: 1 of 101
Version:1.0
Declaration of Conformity
The following products is herewith confirmed to comply with the requirements set out in the Council
Directive on the Approximation of the laws of the Member States relating to Electromagnetic
Compatibility Directive (89/336/EEC). The listed standard as below were applied:
The following Equipment:
Product
: MEGA Book
Trade Name
: MSI
Model Number
: MS-1006,S250,SIM2000
This product is herewith confirmed to comply with the requirements set out in the Council
Compatibility Directive (89/336/EEC).For the evaluation regarding EMC, the following
standards were applied:
RFI Emission:
EN 55022:1998+A1:2000+A2:2003 Class B
EN 61000-3-2:2000 Class D
: Product family standard
EN 61000-3-3:1995+A1:2001
: Limitation of voltage fluctuation and flicker in
low-voltage supply system
: Limits for harmonic current emission
Immunity :
EN 55024:1998+A1:2001
The following importer/manufacturer is responsible for this declaration:
Company Name
:
Company Address
:
Telephone
:
Facsimile :
Person is responsible for marking this declaration:
Name (Full Name)
Position/ Title
Date
Legal Signature
EMC/Safety Test Laboratory
Accredited by DNV, Nemko and NVLAP
QTK No.:046L097E
Statement of Conformity
The certifies that the following designated product
Product
: MEGA Book
Trade Name
: MSI
Model Number
: MS-1006,S250,SIM2000
Company Name
: MICRO-STAR INTL Co., LTD.
This product is herewith confirmed to comply with the requirements set out in the Council
Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following
standards were applied:
RFI Emission:
EN 55022:1998+A1:2000+A2:2003 Class B
EN 61000-3-2:2000 Class D
: Limits for harmonic current emission
EN 61000-3-3:1995+A1:2001
: Limitation of voltage fluctuation and flicker in
low-voltage supply system
Immunity:
EN 55024:1998+A1:2001
TEST LABORATORY
Gene Chang / Manager
The verification is based on a single evaluation of one sample of above-mentioned products. It does
not imply an assessment of the whole production and does not permit the use of the test lab. Logo.
QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com
Test Report Certification
Test Date : 2004/07/15
Report No. : 046L097E
Product Name
： MEGA Book
Applicant
： MICRO-STAR INTL Co., LTD.
Address
： No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.
Manufacturer
Model No.
： MS-1006,S250,SIM2000
Rated Voltage
: AC 230 V / 50 Hz
Trade Name
： MSI
Measurement Standard
： EN 55022:1998+A1:2000+A2:2003,EN 55024:1998+A1:2001,
EN 61000-3-2:2000,EN 61000-3-3:1995+A1:2001
Measurement Procedure ： EN 55022:1998+A1:2000+A2:2003
EN 61000-3-2:2000,EN 61000-3-3:1995+A1:2001,
IEC 61000-4-2:1995+A1:1998+A2:2000,
IEC 61000-4-3:1995+A1:1998+A2:2000,
IEC 61000-4-4:1995+A1:2000+A2:2001,
IEC 61000-4-5:1995+A1:2000,IEC 61000-4-6:1996+A1:2000,
IEC 61000-4-8:1993+A1:2000,IEC 61000-4-11:1994+A1:2000
Classification
：B
Test Result
： Complied
Documented By
：
(Demi Chang)
Tested By
：
(Ian Chen )
Approved By
：
(Gene Chang)
Page: 2 of 101
Version:1.0
Test Report Certification
Test Date : 2004/07/15
Report No. : 046L097E
Product Name
： MEGA Book
Applicant
Address
： No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.
Manufacturer
Model No.
： MS-1006,S250,SIM2000
Rated Voltage
： AC 240 V / 50 Hz
Trade Name
： MSI
Measurement Standard
： AS/NZS CISPR 22: 2002 Class B
Measurement Procedure ： AS/NZS CISPR 22: 2002 Class B
Classification
： B
Test Result
： Complied
This report must not be used to claim product endorsement by NVLAP any agency of the U.S. Government
Documented By
：
(Demi Chang)
Tested By
：
(Ian Chen)
Approved By
：
(Gene Chang)
Page: 3 of 101
Version:1.0
TA B L E O F C O N T E N T S
Description
1.
1.1.
1.2.
1.3.
1.4.
1.5.
1.6.
2.
2.1.
2.2.
2.3.
2.4.
2.5.
2.6.
2.7.
2.8.
3.
3.1.
3.2.
3.3.
3.4.
3.5.
3.6.
3.7.
3.8.
4.
4.1.
4.2.
4.3.
4.4.
4.5.
4.6.
4.7.
4.8.
5.
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.
5.8.
6.
Page
General Information .................................................................................................................7
EUT Description ..........................................................................................................................7
Test Mode ....................................................................................................................................9
Tested System Details..............................................................................................................12
Configuration of tested System ..............................................................................................14
EUT Exercise Software............................................................................................................16
Test Facility ................................................................................................................................17
Conducted Emission .............................................................................................................18
Test Equipment List ..................................................................................................................18
Test Setup ..................................................................................................................................18
Limits...........................................................................................................................................19
Test Procedure ..........................................................................................................................19
Uncertainty.................................................................................................................................19
Test Specification ......................................................................................................................19
Test Result .................................................................................................................................20
Test Photo ..................................................................................................................................24
Impedance Stabilization Network.......................................................................................26
Test Setup ..................................................................................................................................26
Limits...........................................................................................................................................27
Test Procedure ..........................................................................................................................27
Uncertainty.................................................................................................................................27
Test Result .................................................................................................................................28
Test Photo ..................................................................................................................................34
Radiated Emission .................................................................................................................36
Test Setup ..................................................................................................................................36
Limits...........................................................................................................................................37
Test Procedure ..........................................................................................................................37
Uncertainty.................................................................................................................................37
Test Result .................................................................................................................................38
Test Photo ..................................................................................................................................42
Power Harmonics ...................................................................................................................44
Test Setup ..................................................................................................................................44
Limits...........................................................................................................................................45
Test Procedure ..........................................................................................................................46
Uncertainty.................................................................................................................................46
Test Result .................................................................................................................................47
Test Photo ..................................................................................................................................51
Voltage Fluctuation and Flicker ..........................................................................................52
Page: 4 of 101
Version:1.0
6.1.
6.2.
6.3.
6.4.
6.5.
6.6.
6.7.
6.8.
7.
7.1.
7.2.
7.3.
7.4.
7.5.
7.6.
7.7.
7.8.
8.
8.1.
8.2.
8.3.
8.4.
8.5.
8.6.
8.7.
8.8.
9.
9.1.
9.2.
9.3.
9.4.
9.5.
9.6.
9.7.
9.8.
10.
10.1.
10.2.
10.3.
10.4.
10.5.
10.6.
10.7.
10.8.
11.
11.1.
11.2.
Test Setup ..................................................................................................................................52
Limits...........................................................................................................................................53
Test Procedure ..........................................................................................................................53
Uncertainty.................................................................................................................................53
Test Result .................................................................................................................................54
Test Photo ..................................................................................................................................56
Electrostatic Discharge (ESD).............................................................................................57
Test Setup ..................................................................................................................................57
Limits...........................................................................................................................................58
Test Procedure ..........................................................................................................................58
Uncertainty.................................................................................................................................58
Test Result .................................................................................................................................59
Test Photo ..................................................................................................................................61
Radiated Susceptibility (RS)................................................................................................62
Test Setup ..................................................................................................................................62
Limits...........................................................................................................................................63
Test Procedure ..........................................................................................................................63
Uncertainty.................................................................................................................................63
Test Result .................................................................................................................................64
Test Photo ..................................................................................................................................66
Electrical Fast Transient/Burst (EFT/B) ............................................................................67
Test Setup ..................................................................................................................................67
Limits...........................................................................................................................................68
Test Procedure ..........................................................................................................................68
Uncertainty.................................................................................................................................68
Test Result .................................................................................................................................69
Test Photo ..................................................................................................................................71
Surge..........................................................................................................................................73
Test Setup ..................................................................................................................................73
Limits...........................................................................................................................................74
Test Procedure ..........................................................................................................................74
Uncertainty.................................................................................................................................74
Test Result .................................................................................................................................75
Test Photo ..................................................................................................................................77
Conducted Susceptibility (CS)............................................................................................78
Test Setup ....................................................................................................................................78
Page: 5 of 101
Version:1.0
11.3.
Limits...........................................................................................................................................79
11.4.
Test Procedure ..........................................................................................................................80
11.5.
Uncertainty.................................................................................................................................80
11.6.
11.7.
Test Result .................................................................................................................................81
11.8.
Test Photo ..................................................................................................................................83
12.
Power Frequency Magnetic Field.......................................................................................85
12.1.
12.2.
Test Setup ..................................................................................................................................85
12.3.
Limits...........................................................................................................................................86
12.4.
Test Procedure ..........................................................................................................................86
12.5.
Uncertainty.................................................................................................................................86
12.6.
12.7.
Test Result .................................................................................................................................87
12.8.
Test Photo ..................................................................................................................................89
13.
Voltage Dips and Interruption Measurement...................................................................90
13.1.
13.2.
Test Setup ..................................................................................................................................90
13.3.
Limits...........................................................................................................................................91
13.4.
Test Procedure ..........................................................................................................................91
13.5.
Uncertainty.................................................................................................................................91
13.6.
13.7.
Test Result .................................................................................................................................92
13.8.
Test Photo ..................................................................................................................................94
Attachement.........................................................................................................................................................95
EUT Photograph .......................................................................................................................95
Reference
:
Laboratory of License
Page: 6 of 101
Version:1.0
1.
General Information
1.1.
EUT Description
Product Name
MEGA Book
Trade Name
MSI
Model No.
MS-1006,S250,SIM2000
EUT Voltage
AC 100-240 V, 50 / 60 Hz
Component
Power Adapter (1)
Power Adapter (2)
FSP,FSP0P0-1ADC21,
Input: AC 100-240V,50/60Hz,1.6A
Output: DC 19V,4.74A,MAX
Cable In:Non-Shidlded,1.8m
Cable Out:Non-Shidlded,1.8m,with two ferrite cores bonded.
LITEON,PA-1650-02
Input: AC 100-240V,50/60Hz,1.6A
Output: DC 19V,3.42A
Cable In:Non-Shidlded,1.8m
Cable Out:Non-Shidlded,1.8m,with one ferrite core bonded.
Note: The EUT is including three models for different marketing requirement.
MS1006 Key parts List
Item
CPU
Panl
Vendor
Intel
AU
Model
MSI P/N
Celeron M 1.2GHz
A09-1220116-I06
Celeron M 1.3GHz
A09-1320116-I06
Pentium M 1.8GHz
A09-1820106-I06
B121EW01 V1
12.1" WXGA
B121EW01 V0
12.1" WXGA Glare
S78-2307020-A90
Toshiba NRL75-DEX1N111
12.1" WXGA Glare,Silm
Fujitsu MHT2040AT
40GB (Rev.A1, F/W:009A)
S71-1301030-F06
MHT2060AT
60GB (Rev.A1, F/W:009A)
S71-1301020-F06
Toshiba MK4025GAS
40GB
S71-1301060-T14
MK6021GAS
60GB
S71-1301050-T14
HDD
Seagate ST94019A
ODD
Discription
40GB
Hitachi IC25N040ATMR04
40GB
S71-1301110-H05
IC25N060ATMR04
60GB
S71-1301120-H05
DVD-ROM
SDR-083
S76-1304010-Q06
Page: 7 of 101
Version:1.0
QSI
Combo Dirve
(CD-R/RW+DVD-ROM
SBW-242B
S74-1303010-Q06
support “read DVD-RAM”)
DVD Dual
ODD
LG
DVD Dual
Lite-on
DVD Dual
MSI
SDW-042
SOSW-852S
Combo Drive
MS-8524M
(CD-R/RW+DVD)
Combo Drive
UJDA-750
(CD-R/RW+DVD)
Spuer Multi
UJ-820
DDR Module 128MB,
KVR333X64SC25/128
DDR Module 256MB,
Kingston
KVR333X64SC25/256
DDR Module 512MB,
KVR333X64SC25/512
DDR Module 1GB,
Memory
KVR266X64SC25/1G
Trancend
Apacer
Inverter
S78-2407040-K37
DDR266, Elpida chip
S78-2408010-K37
DDR Module 256MB,
S78-2407040-T10
DDR400, Mosel chip, 32M x 8
S78-2406080-T10
DDR400, Samsung chip, 32M x 8
S78-2406081-T10
DDR333, Hynix chip, 32Mx8
HY5DU56822BT-J
S78-2406061-A42
Sumida
15.4” WXGA TFT
S78-3300120-S49
Delta
15.4” WXGA TFT
S78-3300120-D04
Enterprise
SMP
AC-adapter
DDR333, Mosel chip
DDR333, Infineon chip
Gallopwire
Battery
S78-2406090-K37
SOC
TS32MSD64V4F3
tba
DDR333, Mosel chip
TS64MSD64V3F
TS32MSD64V4F3
S74-1303030-P01
S78-2401090-K37
DDR333 Mosel chip, 32M x 8,
DDR Module 256MB,
703-8524M-010
DDR333, Mosel chip
DDR Module 512MB,
DDR Module 256MB,
Adata
tba
Lite-on
FSP
DDR Module 256MB,
MS-1006
4cell (18650) Li-ion Battery/
8 cells(2nd)
Li-ion 4400mAH
PA-1650-02MS
65W, 19V
FSP090-1ADC21
90W,19V
Page: 8 of 101
S91-0300031-SB3
S93-0401010-L05
Version:1.0
Power cord
FJ
K/B
Sunrex
K33-3001020-F12
KeyBoard Sunrex
S11-00US010-SA0
K022422A1-US
Touch Pad synaptics TM42PDD211 Black
MDC
Modem
S78-3700060-SD2
Actiontec MD560LMI-2
S52-2801040-A95
CastleNet 8M4130004681(MM320)
S52-2801030-C59
Creatix CTX 605/CTX605I
Z-COM XG-650MB
WLAN
MSI
IEEE802.11g
605-6833-010
Z-COM XG-602
1.2.
Test Mode
QuieTek has verified the construction and function in typical operation. All the test modes were
carried out with the EUT in normal operation, which was shown in this test report and defined
as:
Pre-Test Mode
EMI
Mode 1:Intel Celeron M 1.2GHz,LCD+CRT(1280*800/60Hz)
Mode 2:Intel Pentium M 1.8GHz,LCD+CRT(1280*800/60Hz)
Mode 7:Intel Celeron M 1.3GHz,CRT Only(2048*1536/75Hz)
Final Test Mode
EMI
EMS
Page: 9 of 101
Version:1.0
EMC Project for MS-1006
Mode
CPU
1
Centrino 1.2GHz
LCD Panel AU12.1" WXGA TFT,
B121EW01 V1
2
3
4
Pentium M 1.8GHz
Centrino 1.3GHz
Centrino 1.2GHz
AU12.1" Glare WXGA
Toshiba 12.1" WXGA
AU12.1" Glare WXGA
TFT,B121EW01 V0
Glare NRL75-DEX1N
TFT,B121EW01 V0
111 Silm
HDD
TOSHIBA MK4025GAS TOSHIBA MK6021GAS FUJITSU MHT2040AT
FUJITSU MHT2060AT
Module
Device
QSI SBW-242B
QSI SDW-042
MSI MS8524M
Panasonic UJDA-750
Kingston
Kingston
Kingston
Trancend
DDR
Memory
KVR333X64SC25/128
KVR333X64SC25/256
KVR333X64SC25/512
TS64MSD64V3F
(Mosel)
(Mosel)
(Mosel)
(Mosel512)
MDC
Modem
Actiontec MD560LMI-2 CastleNet
Actiontec MD560LMI-2 CastleNet
8M4130004681
8M4130004681
(MM320)
(MM320)
Wireless
Lan
MSI IEEE802.11g
MSI IEEE802.11g
MSI IEEE802.11g
MSI IEEE802.11g
Battery
SMP 4cell Li-ion
SMP 8cell Li-ion
SMP 4cell Li-ion
SMP 8cell Li-ion
Inverter
Sumida
Delta
Sumida
Delta
Power
Adapter
Lite-on PA-1650-02MS FSP FSP090-1ADC21
Lite-on PA-1650-02MS FSP FSP090-1ADC21
Page: 10 of 101
Version:1.0
Mode
5
6
7
8
CPU
Centrino 1.3GHz
Pentium M 1.8GHz Centrino 1.3GHz
LCD Panel
AU12.1" WXGA
Toshiba 12.1" WXGA AU12.1" WXGA TFT, Toshiba 12.1" WXGA
TFT,B121EW01 V1
Glare NRL75-DEX1N B121EW01 V1
Glare NRL75-DEX1N
111 Silm
111 Silm
HDD
Seagate ST94019A
Pentium M 1.8GHz
Hitachi IC25N040AT Hitachi IC25N060AT Seagate ST94019A
MR04
MR04
Module Device
Panasonic UJ-820
QSI SDR-083
Lite-on SOSW-852S LG GWA 4040N
DDR Memory
Trancend
Trancend
Adata
APACER 256MB
TS32MSD64V4F3
TS32MSD64V4F3
HY5DU56822BT-J
HYB25D256800BT-6
(Mosel256)
(Samsung 256)
(Hynix)
(Infineon)
Actiontec
CastleNet
Creatix CTX
Creatix CTX
MD560LMI-2
8M4130004681
605/CTX605I
605/CTX605I
Z-COM XG-650MB
Z-COM XG-650MB
MDC Modem
(MM320)
Z-COM
Z-COM
Wireless Lan
XG-602
XG-602
Battery
SMP 4cell Li-ion
GLW 8cell Li-ion
SMP 4cell Li-ion
GLW 8cell Li-ion
Inverter
Sumida
Delta
Sumida
Delta
Lite-on
FSP
Lite-on
FSP
PA-1650-02MS
FSP090-1ADC21
PA-1650-02MS
FSP090-1ADC21
Power Adapter
Page: 11 of 101
Version:1.0
1.3.
Tested System Details
The types for all equipments, plus descriptions of all cables used in the tested system
(including inserted cards) are:
Test Mode
Product
Manufacturer
Model No.
Serial No.
Power Cord
1 Exchange
Network
2 Monitor
Sun Moon Star
PX-4
95170087
Non-Shielded, 1.8m
SONY
CPD-G500
2737939
Non-Shielded, 1.8m
3 Microphone &
Earphone
4 Slim COMBO
N/A
MIC-06
N/A
N/A
ASUS
SCB-2408D
42DM355281
5 USB 2.0 HDD
Topdisk
ME-910
235546
Non-Shielded, 1.8m,with
one ferrite core bonded.
Power by PC
6 USB 2.0 HDD
Topdisk
ME-910
235484
Power by PC
7 USB 2.0 HDD
Topdisk
ME-910
235933
Power by PC
8 Notebook PC
ASUS
S1300
26NP018680
Non-Shielded, 1.8m
9 Notebook PC
DELL
PP01L
N/A
Non-Shielded, 1.8m
Page: 12 of 101
Version:1.0
Test Mode
Product
Manufacturer
Model No.
Serial No.
Power Cord
1 Exchange
Network
2 Monitor
Sun Moon Star
PX-4
95170087
ADI
CT1797NF
23500ET112A0119 Non-Shielded, 1.8m
3 Microphone &
Earphone
4 Slim COMBO
N/A
MIC-06
N/A
N/A
ASUS
SCB-2408D
42DM355281
5 USB 2.0 HDD
Topdisk
ME-910
235546
Non-Shielded, 1.8m,with
one ferrite core bonded.
Power by PC
6 USB 2.0 HDD
Topdisk
ME-910
235484
Power by PC
7 USB 2.0 HDD
Topdisk
ME-910
235933
Power by PC
8 Notebook PC
ASUS
S1300
26NP018680
Non-Shielded, 1.8m
9 Notebook PC
DELL
PP01L
N/A
Non-Shielded, 1.8m
Page: 13 of 101
Non-Shielded, 1.8m
Version:1.0
1.4.
Configuration of tested System
Test Mode
A
B
C
D
E
F
G
H
I
Connection Diagram
Signal Cable Type
TELECOM Cable
D-SUB Cable
Earphone & Microphone Cable
1394 Cable
USB Cable
USB Cable
USB Cable
TELECOM Cable
LAN Cable
Signal cable Description
Non-Shielded, 3m
Shielded, 1.8m, with one ferrite core bonded
Non-Shielded, 1.8m
Shielded, 1.2m
Shielded, 1.2m
Shielded, 1.2m
Shielded, 1.2m
Non-Shielded, 3m
Non-Shielded, 7m
Page: 14 of 101
Version:1.0
Test Mode
A
B
C
D
E
F
G
H
I
Connection Diagram
Signal Cable Type
TELECOM Cable
D-SUB Cable
Earphone & Microphone Cable
1394 Cable
USB Cable
USB Cable
USB Cable
TELECOM Cable
LAN Cable
Signal cable Description
Non-Shielded, 3m
Shielded, 1.8m, with one ferrite core bonded
Non-Shielded, 1.8m
Shielded, 1.2m
Shielded, 1.2m
Shielded, 1.2m
Shielded, 1.2m
Non-Shielded, 3m
Non-Shielded, 7m
Page: 15 of 101
Version:1.0
1.5.
EUT Exercise Software
Test Mode
1
Setup the EUT and simulators as shown on 1.4.
2
Turn on the power of all equipment.
3
EUT get into Windows XP operating system.
4
EUT is displaying the H-pattern using Winfcc.exe and playing DVD player.
5
Notebook sends “H” pattern to printer, the printer will print “H” pattern on paper.
6
Notebook will read data from floppy disk and then writes the data into floppy disk, same
operation for hard disk.
7
Notebook sends "H" character to LCD display and external monitor at the same time, the
screen will display and fill with "H" pattern.
8
Notebook will communicate with the partner PC through the internal Fax/modem module
(Lan Module).
9
The transmitted and received status will be shown on the monitor (TV).
10
Repeat the above procedure (3) to (9).
Page: 16 of 101
Version:1.0
1.6.
Test Facility
Ambient conditions in the laboratory:
Items
Test Item
Temperature (°C)
Required (IEC 68-1) Actual
IEC 61000-4-11
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
15-35
24
Humidity (%RH)
30-60
55
860-1060
950-1000
15-35
25
Humidity (%RH)
10-75
50
860-1060
950-1000
15-35
25
Humidity (%RH)
25-75
50
860-1060
950-1000
Temperature (°C)
IEC 61000-4-2
Temperature (°C)
IEC 61000-4-5
Temperature (°C)
Site Description:
IEC 61000-4-8
July 03, 2002 Accreditation on NVLAP
NVLAP Lab Code: 200533-0
June 11, 2001 Accreditation on DNV
Statement No. : 413-99-LAB11
April 18, 2001 Accreditation on Nemko
Site Name:
Site Address:
Certificate No.: ELA 165
Quietek Corporation
No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen,
Lin-Kou Shiang, Taipei,
Taiwa, R.O.C.
TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789
E-Mail : service@quietek.com
Page: 17 of 101
0914
ILAC MRA
Version:1.0
2.
Conducted Emission
2.1.
Test Equipment List
The following test equipment are used during the conducted emission test:
Item Instrument
Manufacturer Type No./Serial No
Last Cal..
Remark
1
Test Receiver R & S
ESCS 30/838251/001
Jan.,2004
2
L.I.S.N.
R&S
ESH3-Z5/836679/0023
May,2004
EUT
3
L.I.S.N.
R&S
ENV 4200/833209/0023
May,2004
Peripherals
4
Pulse Limiter R & S
ESH3-Z2
May,2004
5
No.1 Shielded Room
N/A
Note: All equipment upon which need to be calibrated are with calibration period of 1 year.
2.2.
Test Setup
Page: 18 of 101
Version:1.0
2.3.
Limits
EN 55022:1998+A1: 2000+A2:2003 AC Mains Limits (dBuV)
Frequency
MHz
Class A
Class B
QP
AV
QP
AV
0.15 - 0.50
79
66
66-56
56-46
0.50-5.0
73
60
56
46
5.0 - 30
73
60
60
50
Remarks: In the above table, the tighter limit applies at the band edges
2.4.
Test Procedure
AC Mains:
The EUT and simulators are connected to the main power through a line impedance
stabilization network (L.I.S.N.).
This provides a 50 ohm /50uH coupling impedance for the
measuring equipment. The peripheral devices are also connected to the main power through a
LISN that provides a 50ohm /50uH coupling impedance with 50ohm termination. (Please
refers to the block diagram of the test setup and photographs.)
Both sides of AC line are checked for maximum conducted interference. In order to find the
maximum emission, the relative positions of equipment and all of the interface cables must be
changed according to EN 55022:1998+A1: 2000+A2:2003 on conducted measurement.
The bandwidth of the field strength meter (R & S Test Receiver ESCS 30) is set at 9kHz.
2.5.
Uncertainty
The measurement uncertainty is defined as ± 2.02 dB
2.6.
Test Specification
According to EN 55022:1998+A1:2000+A2:2003
Page: 19 of 101
Version:1.0
2.7.
Test Result
Product
MEGA Book
Test Mode
Date of Test
2004/06/28
Test Site
No.1 Shielded Room
Test Condition
Line 1
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
*
0.223
0.338
0.693
1.612
6.796
16.607
0.21
0.21
0.16
0.16
0.33
0.35
0.10
0.10
0.10
0.12
0.18
0.38
49.94
45.93
41.00
39.66
29.25
33.57
50.25
46.24
41.26
39.94
29.76
34.30
62.71
59.26
56.00
56.00
60.00
60.00
Average
*
0.223
0.338
0.693
1.612
6.796
16.607
0.21
0.21
0.16
0.16
0.33
0.35
0.10
0.10
0.10
0.12
0.18
0.38
45.60
41.60
37.30
34.30
24.20
28.90
45.91
41.91
37.56
34.58
24.71
29.63
52.71
49.25
46.00
46.00
50.00
50.00
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + LISN Factor + Cable loss.
Page: 20 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/28
Test Site
No.1 Shielded Room
Test Condition
Line 2
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
*
0.223
0.327
0.694
1.619
3.382
16.244
0.21
0.21
0.16
0.16
0.23
0.35
0.10
0.10
0.10
0.12
0.15
0.38
49.12
45.38
41.78
40.85
36.36
33.62
49.43
45.69
42.04
41.14
36.74
34.35
62.71
59.53
56.00
56.00
56.00
60.00
Average
0.223
0.327
0.21
0.21
0.10
0.10
44.20
40.90
44.51
41.21
52.71
49.53
0.16
0.16
0.23
0.35
0.10
0.12
0.15
0.38
38.70
37.80
30.10
28.90
38.96
38.09
30.48
29.63
46.00
46.00
46.00
50.00
*
0.694
1.619
3.382
16.244
Note:
Page: 21 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/28
Test Site
No.1 Shielded Room
Test Condition
Line 1
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
*
0.152
0.228
2.297
3.293
3.908
5.753
0.21
0.21
0.09
0.23
0.17
0.28
0.10
0.10
0.14
0.15
0.16
0.18
47.84
30.80
34.59
35.39
36.60
34.03
48.15
31.11
34.81
35.77
36.93
34.49
65.90
62.52
56.00
56.00
56.00
60.00
Average
0.152
0.228
2.297
3.293
0.21
0.21
0.09
0.23
0.10
0.10
0.14
0.15
33.60
28.30
34.20
34.50
33.91
28.61
34.42
34.88
55.89
52.52
46.00
46.00
0.17
0.28
0.16
0.18
35.40
33.00
35.73
33.46
46.00
50.00
*
3.908
5.753
Note:
Page: 22 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/28
Test Site
No.1 Shielded Room
Test Condition
Line 2
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
*
0.151
0.218
1.232
2.310
3.931
4.471
0.21
0.21
0.16
0.09
0.17
0.17
0.10
0.10
0.11
0.14
0.16
0.17
47.77
36.89
31.26
35.58
36.61
34.55
48.08
37.20
31.53
35.80
36.94
34.89
65.94
62.89
56.00
56.00
56.00
56.00
Average
0.151
0.218
1.232
2.310
0.21
0.21
0.16
0.09
0.10
0.10
0.11
0.14
30.00
24.60
30.80
34.80
30.31
24.91
31.07
35.02
55.94
52.89
46.00
46.00
0.17
0.17
0.16
0.17
35.40
33.30
35.73
33.64
46.00
46.00
*
3.931
4.471
Note:
Page: 23 of 101
Version:1.0
2.8.
Test Photo
Test Mode ： Mode 7:Intel Celeron M 1.3GHz,CRT Only(2048*1536/75Hz)
Description： Front View of Conducted Test-Mode7
Description： Back View of Conducted Test-Mode7
Page: 24 of 101
Version:1.0
Test Mode ： Mode 8:Intel Pentium M 1.8GHz,LCD+CRT(1280*800/60Hz)
Description： Front View of Conducted Test-Mode8
Description： Back View of Conducted Test-Mode8
Page: 25 of 101
Version:1.0
3.
Impedance Stabilization Network
3.1.
Test Equipment List
The following test equipment are used during the conducted emission test:
Item Instrument
Manufacturer Type No./Serial No
Last Cal..
Remark
1
Test Receiver
R&S
ESCS 30/838251/001
Jan.,2004
2
L.I.S.N.
R&S
ESH3-Z5/836679/0023
May,2004 EUT
3
L.I.S.N.
R&S
ENV 4200/833209/0023 May,2004 Peripherals
4
Pulse Limiter
R&S
ESH3-Z2
5
ISN
SCHAFFNE T400/19099
6
No.1 Shielded Room
May,2004
Apr.,2004
N/A
3.2.
Test Setup
Page: 26 of 101
Version:1.0
3.3.
Limits
Telecommunication ports
EN 55022:1998+A1: 2000+A2:2003
Telecommunication ports Limits dB(uV)
Frequency
MHz
Limit for conducted emissions
from telecommunication ports of
equipment intended for use in
telecommunication centers only
Limit for conducted
emissions from
telecommunication ports
QP
AV
QP
AV
0.15 – 0.50
97-87
84-74
84-74
74-64
0.5 – 30
87
74
74
64
Remarks: In the above table, the tighter limit applies at the band edges.
3.4.
Test Procedure
Telecommunication Port:
The mains voltage shall be supplied to the EUT via the LISN when the measurement of
telecommunication port is performed. The common mode disturbances at the
telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both
alternative cables are tested related to the LCL requested. The measurement range is from
150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used
for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one.
.
3.5.
Uncertainty
3.6.
Test Specification
According to EN 55022:1998+A1: 2000+A2:2003
Page: 27 of 101
Version:1.0
3.7.
Test Result
Product
MEGA Book
Test Mode
Date of Test
2004/06/28
Test Site
No.1 Shielded Room
Test Condition
100Mbps
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
0.599
1.018
1.505
5.236
16.228
0.21
0.16
0.16
0.29
0.35
9.50
9.50
9.50
9.50
9.50
38.07
40.66
43.76
48.03
60.34
47.78
50.32
53.42
57.82
70.19
74.00
74.00
74.00
74.00
84.00
*
23.130
0.23
9.50
63.05
72.78
84.00
Average
0.599
1.018
1.505
5.236
16.228
*
23.130
0.21
0.16
0.16
0.29
0.35
0.23
9.50
9.50
9.50
9.50
9.50
9.50
35.70
36.20
39.50
46.10
58.40
61.40
45.41
45.86
49.16
55.89
68.25
71.13
64.00
64.00
64.00
64.00
74.00
74.00
Note:
Page: 28 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/28
Test Site
No.1 Shielded Room
Test Condition
10Mbps
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
0.300
1.404
3.304
*
7.502
12.498
27.176
0.21
0.16
0.23
0.33
0.15
0.30
9.50
9.50
9.50
9.50
9.50
9.50
33.35
43.97
43.95
56.10
48.85
27.35
43.06
53.63
53.68
65.93
58.50
37.15
78.25
74.00
74.00
74.00
74.00
74.00
Average
0.300
1.404
3.304
0.21
0.16
0.23
9.50
9.50
9.50
29.00
40.30
39.20
38.71
49.96
48.93
68.24
64.00
64.00
0.33
0.15
0.30
9.50
9.50
9.50
43.70
36.80
20.30
53.53
46.45
30.10
64.00
64.00
64.00
*
7.502
12.498
27.176
Note:
Page: 29 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/28
Test Site
No.1 Shielded Room
Test Condition
Telecom
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
0.304
0.456
1.599
*
2.048
6.142
26.623
0.21
0.21
0.16
0.09
0.28
0.30
9.50
9.50
9.50
9.50
9.50
9.50
35.60
39.89
47.01
49.74
42.79
35.33
45.31
49.60
56.67
59.33
52.57
45.13
78.14
74.76
74.00
74.00
74.00
74.00
Average
0.304
0.456
1.599
0.21
0.21
0.16
9.50
9.50
9.50
35.40
39.50
43.50
45.11
49.21
53.16
68.13
64.77
64.00
0.09
0.28
0.30
9.50
9.50
9.50
49.50
41.90
35.10
59.09
51.68
44.90
64.00
64.00
64.00
*
2.048
6.142
26.623
Note:
Page: 30 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/28
Test Site
No.1 Shielded Room
Test Condition
100Mbps
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
0.318
0.787
1.258
5.907
16.229
0.21
0.16
0.16
0.28
0.35
9.50
9.50
9.50
9.50
9.50
34.82
41.25
45.04
46.65
60.79
44.53
50.91
54.70
56.43
70.64
77.76
74.00
74.00
74.00
84.00
*
23.130
0.23
9.50
61.80
71.53
84.00
Average
0.318
0.787
1.258
5.907
16.229
*
23.130
0.21
0.16
0.16
0.28
0.35
0.23
9.50
9.50
9.50
9.50
9.50
9.50
31.20
40.90
44.70
44.80
59.20
59.80
40.91
50.56
54.36
54.58
69.05
69.53
67.76
64.00
64.00
64.00
74.00
74.00
Note:
Page: 31 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/28
Test Site
No.1 Shielded Room
Test Condition
10Mbps
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
0.470
*
1.254
5.024
8.791
15.074
27.484
0.21
0.16
0.29
0.33
0.32
0.30
9.50
9.50
9.50
9.50
9.50
9.50
34.49
45.22
42.68
40.24
36.03
26.58
44.20
54.88
52.47
50.07
45.85
36.38
74.51
74.00
74.00
74.00
74.00
74.00
Average
0.470
0.21
9.50
34.20
43.91
64.51
0.16
0.29
0.33
0.32
0.30
9.50
9.50
9.50
9.50
9.50
44.80
41.40
37.70
32.20
22.00
54.46
51.19
47.53
42.02
31.80
64.00
64.00
64.00
64.00
64.00
*
1.254
5.024
8.791
15.074
27.484
Note:
Page: 32 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/07/15
Test Site
No.1 Shielded Room
Test Condition
Telecom
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Quasi-Peak
0.305
0.459
1.606
*
2.047
6.143
26.623
0.21
0.21
0.16
0.09
0.28
0.30
9.50
9.50
9.50
9.50
9.50
9.50
35.68
40.15
48.51
50.34
41.82
35.13
45.39
49.86
58.17
59.93
51.60
44.93
78.11
74.72
74.00
74.00
74.00
74.00
Average
0.305
0.459
1.606
0.21
0.21
0.16
9.50
9.50
9.50
35.50
40.00
45.00
45.21
49.71
54.66
68.11
64.71
64.00
0.09
0.28
0.30
9.50
9.50
9.50
50.50
41.60
34.90
60.09
51.38
44.70
64.00
64.00
64.00
*
2.047
6.143
26.623
Note:
Page: 33 of 101
Version:1.0
3.8.
Test Photo
Description： Front View of ISN Test Mode7
Description： Back View of ISN Test Mode7
Page: 34 of 101
Version:1.0
Description： Front View of ISN Test Mode8
Description： Back View of ISN Test Mode8
Page: 35 of 101
Version:1.0
4.
Radiated Emission
4.1.
Test Equipment List
The following test equipment are used during the radiated emission test:
Test Site
Equipment
Manufacturer
OATS 3 Test Receiver R & S
Spectrum
Model No./Serial No.
ESCS 30 / 100122
Advantest
R3162 / 120300652
Last Cal.
Feb.,2004
Feb.,2004
Analyzer
Note:
4.2.
Bilog Antenna SCHAFFNER CBL6112B / 2697
May,2004
Pre-Amplifier QTK
Jul.,2004
QTK-AMP-01 / 0001
1. All equipments that need to be calibrate are with calibration period of 1 year.
2. Mark “X” test instruments are used to measure the final test results.
Test Setup
Page: 36 of 101
Version:1.0
4.3.
Limits
EN 55022: 1998+A1: 2000+A2:2003 Limits (dBuV/m)
Frequency
Class A
Class B
MHz
Distance
(m)
dBuV/m
Distance
(m)
dBuV/m
30 – 230
10
40
10
30
230 – 1000
10
47
10
37
Remarks: In the above table, the tighter limit applies at the band edges.
4.4.
Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground.
The turn table can rotate 360 degrees to determine the position of the maximum emission
level. The EUT was positioned such that the distance from antenna to the EUT was 10
meters.
The antenna can move up and down between 1 meter and 4 meters to find out the
maximum emission level.
Both horizontal and vertical polarization of the antenna are set on measurement. In order
to find the maximum emission, all of the interface cables must be manipulated according
to EN 55022: 1998+A1: 2000+A2:2003 on radiated measurement.
Radiated emissions were investigated over the frequency range from 30MHz to1GHz
using a receiver bandwidth of 120kHz. Radiated measurement was performed at an
antenna to EUT distance of 10 meters.
4.5.
Uncertainty
4.6.
Test Specification
According to EN 55022: 1998+A1: 2000+A2:2003
Page: 37 of 101
Version:1.0
4.7.
Test Result
Product
MEGA Book
Test Mode
Date of Test
2004/05/04
Test Site
OATS 3
Test Condition
Horizontal
Test Range
30-1000MHz
Freq.
Cable
Loss
MHz
dB
Probe
PreAMP
Factor
dB/m
dB
Reading Measurement Margin Limit
Level
Level
dBuV
dBuV/m
dB
dBuV/m
=============================================================
Horizontal:
83.740
110.591
166.315
197.480
*
208.896
240.001
300.032
389.330
420.044
471.293
864.620
1.15
1.28
1.57
1.73
8.50
12.01
9.12
8.20
0.00
0.00
0.00
0.00
5.80
4.23
14.82
12.56
15.45
17.52
25.51
22.49
14.55
12.48
4.49
7.51
30.00
30.00
30.00
30.00
1.78
1.96
2.26
2.73
2.88
3.14
5.18
8.46
10.42
12.46
14.09
15.90
16.70
19.53
0.00
0.00
0.00
0.00
0.00
0.00
0.00
15.48
15.77
10.95
7.23
10.11
10.10
3.91
25.72
28.15
25.67
24.04
28.90
29.94
28.62
4.28
8.85
11.33
12.96
8.10
7.06
8.38
30.00
37.00
37.00
37.00
37.00
37.00
37.00
Note:
1.
All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average
measurements as necessary.
2. “ * ”, means this data is the worst emission level.
3. Measurement Level = Reading Level + Probe Factor + Cable Loss.
Page: 38 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/05/04
Test Site
OATS 3
Test Condition
Vertical
Test Range
30-1000MHz
Freq.
MHz
Cable
Probe
Loss
Factor
dB
dB/m
PreAMP Reading
Measurement Margin Limit
Level
dB
dBuV
Level
dBuV/m
dB
dBuV/m
==========================================================
Vertical:
78.160
166.320
180.017
233.472
240.006
346.025
471.284
500.680
667.360
1.12
1.57
1.64
1.92
1.96
2.50
3.14
3.30
4.16
7.23
8.42
8.41
10.01
10.82
13.15
16.38
16.26
17.64
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
16.59
15.38
7.89
11.12
19.42
10.83
5.79
7.86
9.01
24.94
25.37
17.94
23.05
32.20
26.48
25.31
27.42
30.81
5.06
4.63
12.06
13.95
4.80
10.52
11.69
9.58
6.19
30.00
30.00
30.00
37.00
37.00
37.00
37.00
37.00
37.00
*
4.86
19.27
0.00
8.25
32.38
4.62
37.00
803.410
Note:
1.
Page: 39 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/15
Test Site
OATS 3
Test Condition
Horizontal
Test Range
30-1000MHz
Freq.
Cable
Loss
MHz
dB
Probe
PreAMP
Factor
dB/m
dB
Reading Measurement Margin Limit
Level
Level
dBuV
dBuV/m
dB
dBuV/m
=============================================================
Horizontal:
135.168
* 159.746
208.896
233.478
258.051
331.779
420.038
665.000
1.41
1.53
1.78
1.92
2.05
2.42
2.88
4.14
11.59
9.62
8.46
9.71
12.72
12.44
15.90
18.34
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
5.29
13.80
6.73
10.03
4.99
13.20
10.97
2.96
18.29
24.95
16.97
21.66
19.76
28.06
29.76
25.45
11.71
5.05
13.03
15.34
17.24
8.94
7.24
11.55
30.00
30.00
30.00
37.00
37.00
37.00
37.00
37.00
Note:
1.
Page: 40 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/15
Test Site
OATS 3
Test Condition
Vertical
Test Range
30-1000MHz
Freq.
MHz
Cable
Probe
Loss
Factor
dB
dB/m
PreAMP Reading
Measurement Margin Limit
Level
dB
dBuV
Level
dBuV/m
dB
dBuV/m
==========================================================
Vertical:
125.013
135.171
159.746
166.400
172.035
*
208.898
233.476
258.050
331.780
468.920
720.073
1.36
1.41
1.53
1.57
1.60
10.19
10.59
8.68
8.47
8.46
0.00
0.00
0.00
0.00
0.00
7.85
4.98
15.16
13.39
10.91
19.40
16.99
25.37
23.43
20.97
10.60
13.01
4.63
6.57
9.03
30.00
30.00
30.00
30.00
30.00
1.78
1.92
2.05
2.42
3.14
4.42
8.72
10.01
12.77
12.69
16.45
19.52
0.00
0.00
0.00
0.00
0.00
0.00
16.35
14.99
14.02
8.74
5.46
0.67
26.85
26.92
28.84
23.85
25.05
24.61
3.15
10.08
8.16
13.15
11.95
12.39
30.00
37.00
37.00
37.00
37.00
37.00
Note:
1.
Page: 41 of 101
Version:1.0
4.8.
Test Photo
Description： Front View of Radiated Test-Mode7
Description： Back View of Radiated Test-Mode7
Page: 42 of 101
Version:1.0
Description： Front View of Radiated Test-Mode8
Description： Back View of Radiated Test-Mode8
Page: 43 of 101
Version:1.0
5.
Power Harmonics
5.1.
Test Equipment List
Item Instrument
1
Manufacturer
Type No/Serial No.
Last Calibration
Power Harmonics SCHAFFNER
Profline 2105-400
Feb.,2004
Tester
S/N: HK54148
2
Analyzer
SCHAFFNER
3
No.3 Shielded Room
CCN 1000-1/X71887 Feb.,2004
N/A
5.2.
Test Setup
Page: 44 of 101
Version:1.0
5.3.
Limits
Limits of Class A Harmonics Currents
Harmonics
Maximum Permissible
Order
harmonic current
A
n
Harmonics Order
n
Odd harmonics
Maximum Permissible
harmonic current
A
Even harmonics
3
2.30
2
1.08
5
1.14
4
0.43
7
0.77
6
0.30
9
0.40
8 ≤ n ≤ 40
0.23 * 8/n
11
0.33
13
0.21
15 ≤ n ≤ 39
0.15 * 15/n
Limits of Class B Harmonics Currents
For Class B equipment, the harmonic of the input current shall not exceed the maximum
permissible values given in table which is the limit of Class A multiplied by a factor of 1.5.
Limits of Class C Harmonics Currents
Harmonics Order
n
Maximum Permissible harmonic current
Expressed as a percentage of the input
current at the fundamental frequency
％
2
2
3
30．λ
5
10
7
7
9
5
11 ≤ n ≤ 39
3
＊
(odd harmonics only)
＊λ is the circuit power factor
Page: 45 of 101
Version:1.0
Limits of Class D Harmonics Currents
Harmonics Order
n
Maximum Permissible
harmonic current per watt
mA/W
Maximum Permissible
harmonic current
A
3
3.4
2.30
5
1.9
1.14
7
1.0
0.77
9
0.5
0.40
11
0.35
0.33
11 ≤ n ≤ 39
3.85/n
See limit of Class A
(odd harmonics only)
5.4.
Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
5.5.
Uncertainty
The measurement uncertainty is defined as ± 3.23 %
5.6.
Test Specification
According to EN 61000-3-2:2000
Page: 46 of 101
Version:1.0
5.7.
Test Result
Date of Test
2004/07/01
Test Site
No.3 Shielded Room
Test Mode
Mode 7:Intel Celeron M 1.3GHz,CRT
Only(2048*1536/75Hz)
Product
MEGA Book
Test Condition
Power Harmonics
Test Range
Test Result: Pass
Source qualification: Normal
6
300
4
200
2
100
0
0
-2
-100
-4
-200
-6
-300
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
European Limits
Harmonics and Class D limit line
Current RMS(Amps)
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
32
36
40
Worst harmonic was #0 with 0.00% of the limit.
Page: 47 of 101
Version:1.0
Test Result: Pass
THC(A): 0.00
I-THD(pk%): 0.00
POHC(A): 0.000
Highest parameter values during test:
V_RMS (Volts): 229.88
Frequency(Hz): 50.00
I_Peak (Amps): 3.168
I_RMS (Amps): 0.693
I_Fund (Amps): 0.299
Crest Factor:
4.573
Power (Watts): 68
Power Factor:
0.426
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.003
0.284
0.004
0.270
0.004
0.250
0.004
0.225
0.004
0.197
0.005
0.167
0.004
0.138
0.004
0.109
0.004
0.084
0.004
0.063
0.003
0.047
0.003
0.037
0.002
0.031
0.002
0.028
0.002
0.025
0.001
0.022
0.001
0.018
0.001
0.014
0.001
0.010
0.001
POHC Limit(A): 0.000
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.230
0.0
0.287
0.345
0.00
Pass
0.129
0.0
0.272
0.193
0.00
Pass
0.068
0.0
0.252
0.102
0.00
Pass
0.034
0.0
0.227
0.051
0.00
Pass
0.024
0.0
0.199
0.036
0.00
Pass
0.020
0.0
0.170
0.030
0.00
Pass
0.018
0.0
0.140
0.026
0.00
Pass
0.016
0.0
0.111
0.023
0.00
Pass
0.014
0.0
0.086
0.021
0.00
Pass
0.012
0.0
0.064
0.019
0.00
Pass
0.011
0.0
0.048
0.017
0.00
Pass
0.010
0.0
0.037
0.016
0.00
Pass
0.010
0.0
0.031
0.014
0.00
Pass
0.009
0.0
0.028
0.013
0.00
Pass
0.008
0.0
0.026
0.013
0.00
Pass
0.008
0.0
0.022
0.012
0.00
Pass
0.007
0.0
0.019
0.011
0.00
Pass
0.007
0.0
0.014
0.011
0.00
Pass
0.007
0.0
0.010
0.010
0.00
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same
window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W.
Others the result should be pass.
Page: 48 of 101
Version:1.0
Date of Test
2004/06/24
Test Site
No.3 Shielded Room
Test Mode
Mode 8:Intel Pentium M
1.8GHz,LCD+CRT(1280*800/60Hz)
Product
MEGA Book
Test Condition
Power Harmonics
Test Range
Test Result: Pass
0.6
300
0.4
200
0.2
100
0.0
0
-0.2
-100
-0.4
-200
-0.6
-300
Current RMS(Amps)
Harmonics and Class D limit line
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
European Limits
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
32
36
40
Worst harmonic was #0 with 0.00% of the limit.
Page: 49 of 101
Version:1.0
Test Result: Pass
THC(A): 0.00
I-THD(pk%): 0.00
POHC(A): 0.000
Highest parameter values during test:
V_RMS (Volts): 229.88
Frequency(Hz): 50.00
I_Peak (Amps): 0.523
I_RMS (Amps): 0.293
I_Fund (Amps): 0.283
Crest Factor:
1.787
Power (Watts): 63
Power Factor:
0.936
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.000
0.056
0.000
0.025
0.000
0.009
0.000
0.002
0.000
0.002
0.000
0.004
0.000
0.004
0.000
0.002
0.000
0.002
0.000
0.002
0.000
0.002
0.000
0.002
0.000
0.001
0.000
0.001
0.000
0.002
0.000
0.001
0.000
0.001
0.000
0.001
0.000
0.001
0.000
POHC Limit(A): 0.000
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.214
0.0
0.056
0.321
0.00
Pass
0.120
0.0
0.025
0.179
0.00
Pass
0.063
0.0
0.009
0.094
0.00
Pass
0.031
0.0
0.002
0.047
0.00
Pass
0.022
0.0
0.003
0.033
0.00
Pass
0.019
0.0
0.004
0.028
0.00
Pass
0.016
0.0
0.004
0.024
0.00
Pass
0.014
0.0
0.002
0.021
0.00
Pass
0.013
0.0
0.002
0.019
0.00
Pass
0.012
0.0
0.002
0.017
0.00
Pass
0.011
0.0
0.002
0.016
0.00
Pass
0.010
0.0
0.002
0.015
0.00
Pass
0.009
0.0
0.001
0.013
0.00
Pass
0.008
0.0
0.001
0.013
0.00
Pass
0.008
0.0
0.002
0.012
0.00
Pass
0.007
0.0
0.001
0.011
0.00
Pass
0.007
0.0
0.001
0.010
0.00
Pass
0.007
0.0
0.001
0.010
0.00
Pass
0.006
0.0
0.001
0.009
0.00
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same
window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W.
Others the result should be pass.
Page: 50 of 101
Version:1.0
5.8.
Test Photo
Description： Power Harmonics Test Setup -Mode 7
Description： Power Harmonics Test Setup -Mode 8
Page: 51 of 101
Version:1.0
6.
Voltage Fluctuation and Flicker
6.1.
Test Equipment List
Item Instrument
Manufacturer
Type No/Serial No.
Last Calibration
1
SCHAFFNER
Profline 2105-400
Feb.,2004
Power Harmonics
S/N: HK54148
Tester
2
Analyzer
SCHAFFNER
3
No.3 Shielded Room
CCN 1000-1/X71887 Feb.,2004
N/A
6.2.
Test Setup
Page: 52 of 101
Version:1.0
6.3.
Limits
Voltage Fluctuations and Flicker:
The following limits apply:
－ the value of Pst shall not be greater than 1.0;
－ the value of P1t shall not be greater than 0.65;
－ the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500 ms;
－ the relative steady-state voltage change, dc, shall not exceed 3.3 ％;
－ the maximum relative voltage change, dmax, shall not exceed;
a)
4 ％ without additional conditions;
b)
6 ％ for equipment which is:
－ switched manually, or
－ switched automatically more frequently than twice per day, and also has either a
delayed restart (the delay being not less than a few tens of seconds), or manual restart,
after a power supply interruption.
NOTE The cycling frequency will be further limited by the Pst and P1t limit. For example: a dmax
of 6％producing a rectangular voltage change characteristic twice per hour will give a
P1t of about 0.65.
c) 7 ％ for equipment which is:
－ attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment
such as mixers, garden equipment such as lawn mowers, portable tools such as electric
drills), or
－ switched on automatically, or is intended to be switched on manually, no more than twice
per day, and also has either a delayed restart (the delay being not less than a few tens of
seconds) or manual restart, after a power supply interruption.
Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.
6.4.
Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
6.5.
Uncertainty
6.6.
Test Specification
According to EN 61000-3-3:1995+A1:2001
Page: 53 of 101
Version:1.0
6.7.
Test Result
Date of Test
2004/07/01
Test Site
No.3 Shielded Room
Test Mode
Mode 7:Intel Celeron M 1.3GHz,CRT
Only(2048*1536/75Hz)
Product
MEGA Book
Test Condition
Flicker
Test Range
Test Result: Pass
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
0.00
2:05:56
Time is too short for Plt plot
Parameter values recorded during the test:
Vrms at the end of test (Volt):
229.83
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Test limit (%):
3.30
Pass
500.0
Pass
Test limit (%):
3.30
Pass
Test limit (%):
4.00
Pass
Test limit (mS):
Highest Pst (10 min. period):
0.001
Test limit:
1.000
Pass
Highest Plt (2 hr. period):
0.001
Test limit:
0.650
Pass
Page: 54 of 101
Version:1.0
Date of Test
2004/06/24
Test Site
No.3 Shielded Room
Test Mode
Mode 8:Intel Pentium M
1.8GHz,LCD+CRT(1280*800/60Hz)
Product
MEGA Book
Test Condition
Flicker
Test Range
Test Result: Pass
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
0.00
20:58:17
Time is too short for Plt plot
Parameter values recorded during the test:
Vrms at the end of test (Volt):
229.79
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Test limit (%):
3.30
Pass
500.0
Pass
Test limit (%):
3.30
Pass
Test limit (%):
4.00
Pass
Test limit (mS):
Highest Pst (10 min. period):
0.001
Test limit:
1.000
Pass
Highest Plt (2 hr. period):
0.001
Test limit:
0.650
Pass
Page: 55 of 101
Version:1.0
6.8.
Test Photo
Description： Flicker Test Setup -Mode 7
Description： Flicker Test Setup -Mode 8
Page: 56 of 101
Version:1.0
7.
Electrostatic Discharge (ESD)
7.1.
Test Equipment List
Item Instrument
Manufacturer Type No/Serial No.
Last Calibration
1
ESD Simulator System SCHAFFNER NSG 438,S/N:167
Mar.,2004
2
ESD Simulator System KeyTek
MZ-15/EC
S/N:0112372
Mar.,2004
3
Horizontal Coupling
Plane(HCP)
QuieTek
HCP AL50
N/A
4
Vertical Coupling
Plane(VCP)
QuieTek
VCP AL50
N/A
5
No.3 Shielded Room
N/A
7.2.
Test Setup
Page: 57 of 101
Version:1.0
7.3.
Limits
Item Environmental
Phenomena
Units
Test Specification
Performance
Criteria
Enclosure Port
Electrostatic Discharge Kv (Charge Voltage) ±8 Air Discharge
B
±4 Contact Discharge
Remark:
The Contact discharges were applied – at least total 200 discharges at a minimum of four test points.
7.4.
Test Procedure
Direct application of discharges to the EUT:
Contact discharge was applied only to conductive surfaces of the EUT.
Air discharges were applied only to non-conductive surfaces of the EUT.
During the test, it was performed with single discharges. For the single discharge
time between successive single discharges will be keep longer 1 second. It was at
least ten single discharges with positive and negative at the same selected point.
The selected point, which was performed with electrostatic discharge, was marked
on the red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP):
The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned
at a distance 0.1m from, the EUT, with the Discharge Electrode touching the
coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
Horizontal Coupling Plane (HCP):
The coupling plane is placed under to the EUT. The generator shall be positioned
vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching
the coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
7.5.
Uncertainty
7.6.
Test Specification
According to IEC 61000-4-2:1995 +A1:1998+A2:2000
Page: 58 of 101
Version:1.0
7.7.
Test Result
Product
MEGA Book
Test Mode
Date of Test
2004/06/29
Test Site
Test Condition
ESD
Test Range
Item
Amount of
Discharge
Voltage
No.3 Shielded Room
Required
Complied To
Criteria
Criteria (A,B,C)
Results
10
+8kV
B
B
Pass
10
-8kV
B
B
Pass
25
+4kV
B
B
Pass
25
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(HCP)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Front)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Left)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Back)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Right)
50
-4kV
B
A
Pass
Air Discharge
Contact Discharge
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest
level is shown on the report.
NR: No Requirement
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV.
No false alarms or other malfunctions were observed during or after the test.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 59 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/29
Test Site
Test Condition
ESD
Test Range
Item
Amount of
Discharge
Voltage
No.3 Shielded Room
Required
Complied To
Criteria
Criteria (A,B,C)
Results
10
+8kV
B
B
Pass
10
-8kV
B
B
Pass
25
+4kV
B
B
Pass
25
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(HCP)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Front)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Left)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Back)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Right)
50
-4kV
B
A
Pass
Air Discharge
Contact Discharge
Note:
NR: No Requirement
kV.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 60 of 101
Version:1.0
7.8.
Test Photo
Description： ESD Test Setup -Mode 7
Description： ESD Test Setup -Mode 8
Page: 61 of 101
Version:1.0
8.
Radiated Susceptibility (RS)
8.1.
Test Equipment List
The following test equipment are used during the test:
Item Equipment
Manufacturer
Model No. / Serial No. Last Cal.
1
Signal Generator
R&S
SYM02 / 825454/029
Jan.,2004
2
Power Amplifier
A&R
100W10000M7 /
A285000010
N/A
3
RF Power Amplifier
OPHIRRF
5022F / 1075
N/A
4
Bilog Antenna
Chase
CBL6112B / 2452
Sep.,2003
5
Power Meter
R&S
NRVD / 100219
Sep.,2003
6
Directional Coupler
A&R
DC6180 / 22735
Feb.,2004
7
No.2 EMC Fully Chamber
Jul.,2004
Note: All equipment upon which need to calibrated are with calibration period of 1 year.
8.2.
Test Setup
Page: 62 of 101
Version:1.0
8.3.
Limits
Item Environmental
Phenomena
Units
Test
Specification
Enclosure Port
Radio-Frequency
MHz
Electromagnetic Field V/m(Un-modulated,
Amplitude Modulated rms)
% AM (1kHz)
8.4.
80-1000
3
80
Performance
Criteria
A
Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are
placed with one coincident with the calibration plane such that the distance from antenna
to the EUT was 3 meters.
Both horizontal and vertical polarization of the antenna and six sides of the EUT are set
on measurement.
In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows:
Condition of Test
Remarks
1. Field Strength
3 V/M Level 2
2. Radiated Signal
AM 80% Modulated with 1kHz
3. Scanning Frequency
80MHz - 1000MHz
4 Dwell Time
3 Seconds
5. Frequency step size
∆ f :
6. The rate of Swept of Frequency
8.5.
1%
1.5 x 10-3 decades/s
Uncertainty
8.6.
Test Specification
According to IEC 61000-4-3:1995+A1:1998+A2:2000
Page: 63 of 101
Version:1.0
8.7.
Test Result
Product
MEGA Book
Test Mode
Date of Test
2004/07/01
Test Site
Chamber2
Test Condition
RS
Test Range
80-1000MHz
Field
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Strength
(V/m)
Criteria
Criteria
Results
(A,B,C)
Note:
There was no observable degradation in performance.
at frequency
MHz.
V/m
Page: 64 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/07/01
Test Site
Chamber2
Test Condition
RS
Test Range
80-1000MHz
Field
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Strength
(V/m)
Criteria
Criteria
Results
(A,B,C)
Note:
There was no observable degradation in performance.
at frequency
MHz.
V/m
Page: 65 of 101
Version:1.0
8.8.
Test Photo
Description： Radiated Susceptibility Test Setup -Mode 7
Description： Radiated Susceptibility Test Setup -Mode 8
Page: 66 of 101
Version:1.0
9.
Electrical Fast Transient/Burst (EFT/B)
9.1.
Test Equipment List
Item Instrument
1
Fast Transient/Burst SCHAFFNER
Generator
2
Manufacturer
Type No/Serial No.
NSG 2050
Last Calibration
Nov.,2003
S/N: 200124-031AR
N/A
No.3 Shielded Room
9.2.
Test Setup
Page: 67 of 101
Version:1.0
9.3.
Limits
Item Environmental
Phenomena
Units
Test Specification Performance
Criteria
Signal Ports and Telecommunication Ports
Fast Transients
kV (Peak)
Common Mode
Tr/Ts ns
Rep. Frequency
kHz
Input DC Power Ports
Fast Transients
Common Mode
Input AC Power Ports
Fast Transients
Common Mode
9.4.
±0.5
5/50
5
B
kV (Peak)
Tr/Ts ns
Rep. Frequency
kHz
±0.5
5/50
5
B
kV (Peak)
Tr/Ts ns
Rep. Frequency
kHz
±1
5/50
5
B
Test Procedure
The EUT and load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides.
For Signal Ports and Telecommunication Ports:
The EFT interference signal is through a coupling clamp device couples to the signal
and control lines of the EUT with burst noise for 1min.
For Input DC and AC Power Ports:
The EUT is connected to the power mains through a coupling device that directly
couples the EFT interference signal.
Each of the Line and Neutral conductors is impressed with burst noise for 1 min.
The length of power cord between the coupling device and the EUT shall be 1m.
9.5.
Uncertainty
9.6.
Test Specification
According to IEC 61000-4-4:1995+A1:2000+A2:2001
Page: 68 of 101
Version:1.0
9.7.
Test Result
Product
MEGA Book
Test Mode
Date of Test
2004/07/01
Test Site
Test Condition
EFT/B
Test Range
Inject
Line
Voltage
Inject
Time
Polarity
kV
(Second)
No.3 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L
±
1kV
60
CDN
B
A
PASS
N
±
1kV
60
CDN
B
A
PASS
PE
±
1kV
60
CDN
B
A
PASS
L-N
±
1kV
60
CDN
B
A
PASS
L-PE
±
1kV
60
CDN
B
A
PASS
N-PE
±
1kV
60
CDN
B
A
PASS
L+N+PE
±
1kV
60
CDN
B
A
PASS
LAN
±
0.5kV
90
CDN
B
B
PASS
Telecom
±
0.5kV
90
CDN
B
A
PASS
Note:
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Line
kV of
.
Page: 69 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/07/01
Test Site
Test Condition
EFT/B
Test Range
Inject
Line
Voltage
Inject
Time
Polarity
kV
(Second)
No.3 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L
±
1kV
60
CDN
B
A
PASS
N
±
1kV
60
CDN
B
A
PASS
L-N
±
1kV
60
CDN
B
A
PASS
LAN
±
0.5kV
90
CDN
B
A
PASS
Telecom
±
0.5kV
90
CDN
B
A
PASS
Note:
Line
kV of
.
Page: 70 of 101
Version:1.0
9.8.
Test Photo
Description： EFT/B Test Setup -Mode 7
Description： EFT/B Test Setup -Mode 7-Clamp
Page: 71 of 101
Version:1.0
Description： EFT/B Test Setup -Mode 8
Description： EFT/B Test Setup -Mode 8-Clamp
Page: 72 of 101
Version:1.0
10.
Surge
10.1.
Test Equipment List
Item Instrument
Manufacturer
Type No/Serial No.
Last Calibration
1
SCHAFFNER
NSG 2050
Nov.,2003
Surge
Generator
2
S/N: 200124-031AR
No.3 Shielded Room
N/A
10.2.
Test Setup
Page: 73 of 101
Version:1.0
10.3.
Limits
Item Environmental
Phenomena
Units
Criteria
Signal Ports and Telecommunication Ports (See 1) and 2))
Surges
Tr/Ts uS
1.2/50 (8/20)
Line to Ground
kV
±1
B
Surges
Line to Ground
Tr/Ts uS
kV
1.2/50 (8/20)
± 0.5
B
AC Input and AC Output Power Ports
Surges
Tr/Ts uS
Line to Line
kV
Line to Ground
kV
1.2/50 (8/20)
±1
±2
B
Notes:
1) Applicable only to ports which according to the manufacturer’s may directly to outdoor
cables.
2) Where normal functioning cannot be achieved because of the impact of the CDN on the
EUT,no test shall be required.
10.4.
Test Procedure
The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m
on all sides. The length of power cord between the coupling device and the EUT shall be 2m
or less.
For Input and Output AC Power or DC Input and DC Output Power Ports:
The EUT is connected to the power mains through a coupling device that directly couples
the Surge interference signal.
The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700
and the peak value of the a.c. voltage wave. (Positive and negative)
Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with
interval of 1 min.
10.5.
Uncertainty
10.6.
Test Specification
According to IEC 61000-4-5:1995+A1:2000
Page: 74 of 101
Version:1.0
10.7.
Test Result
Product
MEGA Book
Test Mode
Date of Test
2004/07/01
Test Site
Test Condition
Surge
Test Range
Inject
Line
Voltage
Time
Interval
Polarity Angle
kV
(Second)
No.3 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Note:
Line
.
Page: 75 of 101
kV of
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/24
Test Site
Test Condition
Surge
Test Range
Inject
Line
Time
Voltage
Interval
Polarity Angle
kV
(Second)
No.3 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
Note:
Line
kV of
.
Page: 76 of 101
Version:1.0
10.8.
Test Photo
Description： SURGE Test Setup-Mode 7
Description： SURGE Test Setup-Mode 8
Page: 77 of 101
Version:1.0
11.
Conducted Susceptibility (CS)
11.1.
Test Equipment List
The following test equipment are used during the test:
Item Equipment
Manufacturer
Model No. / Serial No.
Last Cal.
1
Signal Generator
R&S
SYM01 / 10065
Jan.,2004
2
Power Amplifier
A&R
150A220 / 23076
N/A
3
Power Meter
HP
EPM-4418A / GB37482040 Feb.,2004
4
Power Sensor
Agilent
8482A / MY41091031
Aug.,2003
5
Directional Coupler
A&R
DC2600 / 23325
Feb.,2004
6
CDN
Lüthi
CDN L-801 M1 / 2047
Jun.,2004
7
CDN
Lüthi
CDN L-801 M2/M3 / 2043 Jun.,2004
8
FIXED PAD
TRILITHIC
HFP-525-3/6-NF/NF / N/A N/A
9
EM Clamp
Lüthi
EM101 / 3552C
10
No.2 EMC Fully Chamber
Apr.,2004
N/A
Note: All equipment upon which need to calibrated are with calibration period of 1 year.
11.2.
Test Setup
Page: 78 of 101
Version:1.0
11.3.
Limits
Item Environmental
Phenomena
Units
Criteria
Signal Ports and Telecommunication Ports
MHz
Radio-Frequency
V (rms,
Continuous Conducted
Un-modulated)
% AM (1kHz)
MHz
Radio-Frequency
V (rms,
Continuous Conducted
Un-modulated)
% AM (1kHz)
MHz
Radio-Frequency
V (rms,
Continuous Conducted Un-modulated)
% AM (1kHz)
Page: 79 of 101
0.15-80
3
80
A
0.15-80
3
80
A
0.15-80
3
80
A
Version:1.0
11.4.
Test Procedure
The EUT are placed on a table that is 0.8 meter height, and a ground reference plane on
the table, EUT are placed upon table and use a 10cm insulation between the EUT and
ground reference plane.
For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) or
EM-clamp device couples to the signal and Telecommunication lines of the EUT.
For Input DC and AC Power Ports
The EUT is connected to the power mains through a coupling and decoupling networks
for power supply lines. And directly couples the disturbances signal into EUT.
Used CDN-M2 for two wires or CDN-M3 for three wires.
All the scanning conditions are as follows:
Condition of Test
Remarks
1. Field Strength
130dBuV(3V) Level 2
2. Radiated Signal
AM 80% Modulated with 1kHz
3. Scanning Frequency
0.15MHz – 80MHz
4 Dwell Time
3 Seconds
5. Frequency step size
∆ f :
6. The rate of Swept of Frequency
1%
1.5 x 10-3 decades/s
.
11.5.
Uncertainty
11.6.
Test Specification
Page: 80 of 101
Version:1.0
11.7.
Test Result
Product
MEGA Book
Test Mode
Date of Test
2004/07/01
Test Site
Chamber2
Test Condition
CS
Test Range
0.15-80MHz
Frequency
Voltage
Inject
Tested Port of
Required
Performance
Result
Range
Applied
Method
EUT
Criteria
Criteria Complied
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
Clamp
LAN
A
A
PASS
0.15~80
130 (3V)
Clamp
Telecom
A
A
PASS
To
Note:
dBuV(V) at frequency
MHz.
No false alarms or other malfunctions were observed during or after the test. The acceptance criteria
were met, and the EUT passed the test.
Page: 81 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/24
Test Site
Chamber2
Test Condition
CS
Test Range
0.15-80MHz
Frequency
Voltage
Inject
Tested Port of
Required
Performance
Result
Range
Applied
Method
EUT
Criteria
Criteria Complied
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
Clamp
LAN
A
A
PASS
0.15~80
130 (3V)
Clamp
Telecom
A
A
PASS
To
Note:
dBuV(V) at frequency
MHz.
No false alarms or other malfunctions were observed during or after the test. The acceptance criteria
were met, and the EUT passed the test.
Page: 82 of 101
Version:1.0
11.8.
Test Photo
Description： Conducted Susceptibility Test Setup -Mode 7
Description： Conducted Susceptibility Test Setup -Mode 7-Clamp
Page: 83 of 101
Version:1.0
Description： Conducted Susceptibility Test Setup -Mode 8
Description： Conducted Susceptibility Test Setup -Mode 8-Clamp
Page: 84 of 101
Version:1.0
12.
Power Frequency Magnetic Field
12.1.
Test Equipment List
Item Instrument
Manufacturer Type No/Serial No.
Last Calibration
1
SCHAFFNER INA 2141
Jun.,2004
Power Line Maganetics
S/N: 6002
2
Gauss Meter
F.W.BELL
4090
3
Magnetic Field Coil
SCHAFFNER INA702
Jun.,2004
Jun.,2004
S/N: 199749-020 IN
4
No.3 Shielded Room
N/A
12.2.
Test Setup
Page: 85 of 101
Version:1.0
12.3.
Limits
Item Environmental
Phenomena
Units
Criteria
Hz
A/m (r.m.s.)
50
1
Enclosure Port
Power-Frequency
Magnetic Field
12.4.
A
Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured at least 1m*1m min. The test magnetic field shall be placed at central of
the induction coil.
The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.
And the induction coil shall be rotated by 90° in order to expose the EUT to the test field
with different orientation (X, Y, Z Orientations).
12.5.
Uncertainty
12.6.
Test Specification
Page: 86 of 101
Version:1.0
12.7.
Test Result
Product
MEGA Book
Test Mode
Date of Test
2004/07/01
Test Site
Test Condition
PMag
Test Range
Polarization
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Line
kV of
.
No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were
met, and the EUT passed the test.
Page: 87 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/24
Test Site
Test Condition
PMag
Test Range
Polarization
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Line
kV of
.
Page: 88 of 101
Version:1.0
12.8.
Test Photo
Description： Power Frequency Magnetic Field Test Setup -Mode 7
Description： Power Frequency Magnetic Field Test Setup -Mode 8
Page: 89 of 101
Version:1.0
13.
Voltage Dips and Interruption Measurement
13.1.
Test Equipment List
Item Instrument
Manufacturer
Type No/Serial No.
Last Calibration
1
SCHAFFNER
NSG 2050
Nov.,2003
Voltage Dips
Generator
2
S/N: 200124-031AR
No.3 Shielded Room
N/A
13.2.
Test Setup
Page: 90 of 101
Version:1.0
13.3.
Limits
Item Environmental
Phenomena
Units
Criteria
>95
0.5
30
25
> 95
250
% Reduction
Period
% Reduction
Periods
% Reduction
Periods
Voltage Dips
Voltage Interruptions
13.4.
B
C
C
Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at
least 0.1m on all sides. The power cord shall be used the shortest power cord as
specified by the manufacturer.
For Voltage Dips/ Interruptions test:
The selection of test voltage is based on the rated power range. If the operation
range is large than 20% of lower power range, both end of specified voltage shall be
tested. Otherwise, the typical voltage specification is selected as test voltage.
The EUT is connected to the power mains through a coupling device that directly
couples to the Voltage Dips and Interruption Generator.
The EUT shall be tested for 30% voltage dip of supplied voltage and duration 10ms,
for 60% voltage dip of supplied voltage and duration 100ms with a sequence of three
voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied
voltage and duration 5000ms with a sequence of three voltage interruptions with
intervals of 10 seconds.
Voltage phase shifting are shall occur at 0O, 45O, 90O, 135O, 180O, 225O, 270O, 315O
of the voltage.
13.5.
Uncertainty
13.6.
Test Specification
Page: 91 of 101
Version:1.0
13.7.
Test Result
Product
MEGA Book
Test Mode
Date of Test
2004/07/01
Test Site
Test Condition
DIP
Test Range
Voltage Dips and
Interruption
Reduction(%)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test
Duration
(Periods)
25
25
25
25
25
25
25
25
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
250
250
250
250
250
250
250
250
Required
Performance
Criteria
C
C
C
C
C
C
C
C
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
Performance
Criteria
Complied To
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
No.3 Shielded Room
Test Result
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
The nominal voltage of EUT is 230V.
Line
.
kV of
Page: 92 of 101
Version:1.0
Product
MEGA Book
Test Mode
Date of Test
2004/06/24
Test Site
Test Condition
DIP
Test Range
Voltage Dips and
Interruption
Reduction(%)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test
Duration
(Periods)
25
25
25
25
25
25
25
25
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
250
250
250
250
250
250
250
250
Required
Performance
Criteria
C
C
C
C
C
C
C
C
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
Performance
Criteria
Complied To
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
No.3 Shielded Room
Test Result
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
The nominal voltage of EUT is 230V.
Line
.
kV of
Page: 93 of 101
Version:1.0
13.8.
Test Photo
Description： Voltage Dips Test Setup -Mode 7
Description： Voltage Dips Test Setup -Mode 8
Page: 94 of 101
Version:1.0
Attachement
EUT Photograph
(1) EUT Photo
(2) EUT Photo
Page: 95 of 101
Version:1.0
(3) EUT Photo
(4) EUT Photo
Page: 96 of 101
Version:1.0
(5) EUT Photo
(6) EUT Photo
Page: 97 of 101
Version:1.0
(7) EUT Photo
(8) EUT Photo
Page: 98 of 101
Version:1.0
(9) EUT Photo
(10) EUT Photo
Page: 99 of 101
Version:1.0
(11) EUT Photo
Page: 100 of 101
Version:1.0
Reference
:
Laboratory of License
Page: 101 of 101
Version:1.0

IT REPORT

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