IT report

Transcription

IT report

Report No： 04BL094E
Test Report
Product Name ： MEGA BOOK
Model No.
： S260,MS-1012
Applicant ： MICRO-STAR INTL Co., LTD.
Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien,
Taiwan, R.O.C.
Date of Receipt ： 2004/11/10
Issued Date
： 2005/01/11
Report No.
： 04BL094E
The test results relate only to the samples tested.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Page: 1 of 95
Version:1.0
Declaration of Conformity
The following products is herewith confirmed to comply with the requirements set out in the Council
Directive on the Approximation of the laws of the Member States relating to Electromagnetic
Compatibility Directive (89/336/EEC). The listed standard as below were applied:
The following Equipment:
Product
Trade Name
Model Number
:
:
:
MEGA BOOK
MSI
S260,MS-1012
This product is herewith confirmed to comply with the requirements set out in the Council
Compatibility Directive (89/336/EEC).For the evaluation regarding EMC, the following
standards were applied:
RFI Emission:
EN 55022:1998+A1: 2000 Class B
EN 61000-3-2: 2000 Class A
: Product family standard
EN 61000-3-3:1995+A1:2001
: Limitation of voltage fluctuation and flicker in
low-voltage supply system
: Limits for harmonic current emission
Immunity :
EN 55024:1998+A1:2001
Product family standard
The following importer/manufacturer is responsible for this declaration:
Company Name
:
Company Address
:
Telephone
:
Person is responsible for marking this declaration:
Name (Full Name)
Position/ Title
Date
Legal Signature
EMC/Safety Test Laboratory
Accredited by DNV, TUV, Nemko and NVLAP
QTK No.:04BL094E
Statement of Conformity
The certifies that the following designated product
Product
Trade Name
:
MEGA BOOK
:
MSI
Model Number
:
S260,MS-1012
Company Name
:
MICRO-STAR INT’L CO., LTD.
This product is herewith confirmed to comply with the requirements set out in the Council
Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following
standards were applied:
RFI Emission:
EN 55022:1998+A1: 2000 Class B
EN 61000-3-2: 2000 Class A
: Product family standard
EN 61000-3-3:1995+A1:2001
: Limitation of voltage fluctuation and flicker in low-voltage
supply system
: Limits for harmonic current emission
Immunity :
EN 55024:1998+A1:2001
Product family standard
TEST LABORATORY
Gene Chang / Manager
The verification is based on a single evaluation of one sample of above-mentioned products. It does
not imply an assessment of the whole production and does not permit the use of the test lab. Logo.
QuieTek Corporation / No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com
Test Report Certification
Issued Date : 2005/01/11
Report No. : 04BL094E
Product Name
Applicant
Address
Manufacturer
Model No.
Rated Voltage
EUT Voltage
Trade Name
Measurement Standard
MEGA BOOK
MICRO-STAR INTL Co., LTD.
No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.
MICRO-STAR INTL Co., LTD.
S260,MS-1012
: AC 230 V / 50 Hz
: AC 100-240 V, 50 / 60 Hz
： MSI
：
：
：
：
：
： EN 55022:1998+A1:2000,
EN 55024:1998+A1:2001,EN 61000-3-2:2000,
EN 61000-3-3:1995+A1:2001
Measurement Procedure ： EN 55022:1998+A1: 2000
EN 61000-3-2: 2000,EN 61000-3-3:1995+A1: 2001
IEC 61000-4-2:1995+A1: 1998+A2: 2000
IEC 61000-4-3:1995+A1: 1998+A2: 2000
IEC 61000-4-4:1995+A1: 2000+A2: 2001
IEC 61000-4-5:1995+A1: 2000
IEC 61000-4-6:1996+A1: 2000
IEC 61000-4-8:1993+A1: 2000
IEC 61000-4-11:1994+A1: 2000
：B
Classification
Test Result
： Complied
The test results relate only to the samples tested.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Documented By
：
(Demi Chang)
Tested By
：
(David Dai )
Approved By
：
(Gene Chang)
Page: 2 of 95
Version:1.0
TA B L E O F C O N T E N T S
Description
1.
1.1.
1.2.
1.3.
1.4.
1.5.
1.6.
2.
2.1.
2.2.
2.3.
2.4.
2.5.
2.6.
2.7.
2.8.
3.
3.1.
3.2.
3.3.
3.4.
3.5.
3.6.
3.7.
3.8.
4.
4.1.
4.2.
4.3.
4.4.
4.5.
4.6.
4.7.
4.8.
5.
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.
5.8.
6.
Page
General Information .................................................................................................................6
EUT Description ..........................................................................................................................6
Test Mode ....................................................................................................................................9
Tested System Details..............................................................................................................10
Configuration of tested System ..............................................................................................11
EUT Exercise Software............................................................................................................12
Test Facility ................................................................................................................................13
Conducted Emission .............................................................................................................14
Test Equipment List ..................................................................................................................14
Test Setup ..................................................................................................................................14
Limits...........................................................................................................................................15
Test Procedure ..........................................................................................................................15
Uncertainty.................................................................................................................................15
Test Specification ......................................................................................................................15
Test Result .................................................................................................................................16
Test Photo ..................................................................................................................................20
Impedance Stabilization Network.......................................................................................22
Test Setup ..................................................................................................................................22
Limits...........................................................................................................................................23
Test Procedure ..........................................................................................................................23
Uncertainty.................................................................................................................................23
Test Result .................................................................................................................................24
Test Photo ..................................................................................................................................27
Radiated Emission .................................................................................................................28
Test Setup ..................................................................................................................................28
Limits...........................................................................................................................................29
Test Procedure ..........................................................................................................................29
Uncertainty.................................................................................................................................29
Test Result .................................................................................................................................30
Test Photo ..................................................................................................................................34
Power Harmonics ...................................................................................................................36
Test Setup ..................................................................................................................................36
Limits...........................................................................................................................................37
Test Procedure ..........................................................................................................................38
Uncertainty.................................................................................................................................38
Test Result .................................................................................................................................39
Test Photo ..................................................................................................................................43
Voltage Fluctuation and Flicker ..........................................................................................44
Page: 3 of 95
Version:1.0
6.1.
6.2.
6.3.
6.4.
6.5.
6.6.
6.7.
6.8.
7.
7.1.
7.2.
7.3.
7.4.
7.5.
7.6.
7.7.
7.8.
8.
8.1.
8.2.
8.3.
8.4.
8.5.
8.6.
8.7.
8.8.
9.
9.1.
9.2.
9.3.
9.4.
9.5.
9.6.
9.7.
10.
10.1.
10.2.
10.3.
10.4.
10.5.
10.6.
10.7.
10.8.
11.
11.1.
11.2.
11.3.
Test Setup ..................................................................................................................................44
Limits...........................................................................................................................................45
Test Procedure ..........................................................................................................................45
Uncertainty.................................................................................................................................45
Test Result .................................................................................................................................46
Test Photo ..................................................................................................................................48
Electrostatic Discharge (ESD).............................................................................................49
Test Setup ..................................................................................................................................49
Limits...........................................................................................................................................50
Test Procedure ..........................................................................................................................50
Uncertainty.................................................................................................................................50
Test Result .................................................................................................................................51
Test Photo ..................................................................................................................................53
Radiated Susceptibility (RS)................................................................................................54
Test Setup ..................................................................................................................................54
Limits...........................................................................................................................................55
Test Procedure ..........................................................................................................................55
Uncertainty.................................................................................................................................55
Test Result .................................................................................................................................56
Test Photo ..................................................................................................................................58
Electrical Fast Transient/Burst (EFT/B) ............................................................................59
Test Setup ..................................................................................................................................59
Limits...........................................................................................................................................60
Test Procedure ..........................................................................................................................60
Test Result .................................................................................................................................61
Test Photo ..................................................................................................................................63
Surge..........................................................................................................................................65
Test Setup ..................................................................................................................................65
Limits...........................................................................................................................................66
Test Procedure ..........................................................................................................................66
Uncertainty.................................................................................................................................66
Test Result .................................................................................................................................67
Test Photo ..................................................................................................................................69
Conducted Susceptibility (CS)............................................................................................70
Limits...........................................................................................................................................70
Limits...........................................................................................................................................71
Page: 4 of 95
Version:1.0
11.4.
Test Procedure ..........................................................................................................................72
11.5.
Uncertainty.................................................................................................................................72
11.6.
11.7.
Test Result .................................................................................................................................73
11.8.
Test Photo ..................................................................................................................................75
12.
Power Frequency Magnetic Field.......................................................................................77
12.1.
12.2.
Test Setup ..................................................................................................................................77
12.3.
Limits...........................................................................................................................................78
12.4.
Test Procedure ..........................................................................................................................78
12.5.
Uncertainty.................................................................................................................................78
12.6.
12.7.
Test Result .................................................................................................................................79
12.8.
Test Photo ..................................................................................................................................81
13.
Voltage Dips and Interruption Measurement...................................................................82
13.1.
13.2.
Test Setup ..................................................................................................................................82
13.3.
Limits...........................................................................................................................................83
13.4.
Test Procedure ..........................................................................................................................83
13.5.
Uncertainty.................................................................................................................................83
13.6.
13.7.
Test Result .................................................................................................................................84
13.8.
Test Photo ..................................................................................................................................86
Attachement.........................................................................................................................................................87
EUT Photograph .......................................................................................................................87
Reference
:
Laboratory of License
Page: 5 of 95
Version:1.0
1.
General Information
1.1.
EUT Description
Product Name
MEGA BOOK
Trade Name
MSI
Model No.
S260,MS-1012
Component
Power Adapter(1)
Power Adapter(2)
LITEON,PA-1650-02
Input: AC 100-240V,50/60Hz,1.6A
Output: DC 19V,3.42A
Cable Out:Non-Shielded,1.8m,with one ferrite core bonded.
Power Cord:Non-Shielded,1.8m
LI SHIN,0335A1965
Input: AC 100-240V,50/60Hz
Output: DC 19V,3.42A
Cable Out:Non-Shielded,1.8m,with one ferrite core bonded.
Power Cord:Non-Shielded,1.8m
Note: The EUT is including two models, The MS-1012 for MSI and the S260 for different
marketing requirement.
MS1012 Critical Part List
Item
Vendor
CPU
Intel
LCD
AU
Fujitsu
HDD
Toshiba
Model
Discription
Pentium M 1.5 GHz
Dothan Processor (400FSB)
Pentium M 1.6 GHz
Pentium M 1.6 GHz
Pentium M 1.73 GHz
Pentium M 1.86GHz
Pentium M 2.0GHz
Pentium M 2.13GHz
B121EW01 V1
12.1" WXGA
MHT2040AT
40GB (Rev.A1, F/W:009A)
MHT2060AT
60GB (Rev.A1, F/W:009A)
MK4025GAS
40GB
MK6021GAS
60GB
Page: 6 of 95
Version:1.0
DVD-ROM
SDR-083
Combo Dirve
QSI
(CD-R/RW+DVD-ROM
SBW-242B
support "read DVD-RAM")
ODD
Panasonic
Lite-on
DVD Dual
SDW-042
DVD-ROM 8x
SR-8178-CPK1
Combo Drive
(CD-R/RW+DVD)
UJDA-750
Super Multi
UJ-820B
DVD-ROM
SOSC-2483K
DDR Module 512MB
DDR400, Mosel Chip
V58C2256804SAS5
DDR Module 128MB
Apacer
Transcend
Kingston
Inverter
Sumida
Battery
SMP
K/B
HYB25D256160BT-6
DDR Module 256MB
DDR333, Infinion chip
HYB25D256800BT-6
Memory
AC-adapter
DDR333, Infinion chip
DDR Module 512MB
DDR333, Infinion chip, 32Mx8
HYB25D256800BC-6
FBGA
DDR Module 256MB,
DDR400, Samsung chip, 32M x 8
TS32MSD64V4F3
DDR Module 512MB,
DDR333, Mosel chip
KVR333X64SC25/512
12.1" WXGA TFT
4cell Li-ion Battery
Li-ion 2200mAH, Panasonic Cell
Lite-on
PA-1650-02
65W, 19V
Li-shin
0335A1965
65W, 19V
Zippy
KW-300-US
US/ Canada Keyboard
KW-300-UK
UK Keyboard
KW-300-GE
KW-300-FR
KW-300-IT
KW-300-SP
KW-300-RU
KW-300-TC
KW-300-SC
Page: 7 of 95
Version:1.0
Power Cord
Fanjet
YP-12/YC-14
Touch Pad
ALPS
KGDDFT956A-1
MDC Modem
Actiontec
WLAN
Intel
MD560LMI-2
Intel Pro/Wireless 2200BG
IEEE802.11b+g
(MOW)
Page: 8 of 95
Version:1.0
1.2.
Test Mode
QuieTek has verified the construction and function in typical operation. All the test modes were
carried out with the EUT in normal operation, which was shown in this test report and defined
as:
Pre-Test Mode
EMC Mode 1:Intel Pentium M 1.5GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LITEON)
Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN)
Mode 3:Intel Pentium M 1.6GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON)
Final Test Mode
EMI
EMS
Mode
CPU
LCD Panel
1
2
3
4
5
6
7
Pentium M
Pentium M
Pentium M
Pentium M
Pentium M
Pentium M
Pentium M
1.5 GHz(400)
1.6 GHz(400)
1.6 GHz(533)
1.73 GHz(533)
1.86GHz (533)
2.0GHz(533)
2.13GHz(533)
AU
AU
AU
AU
AU
AU
AU
B121EW01 V1
B121EW01 V1
B121EW01 V1
B121EW01 V1
B121EW01 V1
B121EW01 V1
B121EW01 V1
MHT2040AT
MHT2060AT
MK4025GAS
HDD
MHT2040AT
MHT2060AT
MK4025GAS
MK6021GAS
Module
SDR-083
SBW-242B
SDW-042
SR-8178-CPK1 UJDA-750
UJ-820B
SOSC-2483K
DDR Module
DDR Module
DDR Module
DDR Module
DDR Module
DDR Module
128MB
256MB
512MB
256MB,
512MB,
512MB
Device
DDR Memory DDR Module
512MB
V58C2256804S HYB25D256160 HYB25D256800 HYB25D256800 TS32MSD64V4F KVR333X64SC2 HYB25D256800
AS5
BT-6
BT-6
BC-6
3
5/512
BC-6
MD560LMI-2
MD560LMI-2
MD560LMI-2
MD560LMI-2
MD560LMI-2
MD560LMI-2
MD560LMI-2
Wireless LAN Intel 2200BG
Intel 2200BG
Intel 2200BG
Intel 2200BG
Intel 2200BG
Intel 2200BG
Intel 2200BG
Li-ion
Li-ion
Li-ion
Li-ion
Li-ion
Li-ion
Li-ion
4 Cell
4 Cell
4 Cell
4 Cell
4 Cell
4 Cell
4 Cell
Sumida
Sumida
Sumida
Sumida
Sumida
Sumida
Sumida
MDC
Battery
Inverter
S78-3300120-S49 S78-3300120-S49 S78-3300120-S49 S78-3300120-S49 S78-3300120-S49 S78-3300120-S49 S78-3300120-S49
Power
PA-1650-02MS 0335A1965
PA-1650-02MS 0335A1965
PA-1650-02MS 0335A1965
PA-1650-02MS
Adapter
Page: 9 of 95
Version:1.0
1.3.
Tested System Details
The types for all equipments, plus descriptions of all cables used in the tested system
(including inserted cards) are:
Product
Manufacturer
Model No.
Serial No.
Power Cord
1 Monitor
SONY
PVM-14M2U
2105742
Non-Shielded, 1.8m
2 Exchange
Network
3 Notebook PC
Sun Moon Star
PX-4
95170087
Non-Shielded, 1.8m
DELL
PP01L
N/A
Non-Shielded, 1.8m
4 Microphone &
Earphone
5 USB 2.0 HDD
ROSA
RSM-900
N/A
N/A
Topdisk
ME-910
220950
Power by PC
6 Slim COMBO
ASUS
SCB-2408D
42DM355283
7 COMBO HDD
Topdisk
ME-910
235842
Non-Shielded, 1.8m,with
one ferrite core bonded.
Power by PC
8 USB 2.0 HDD
Topdisk
ME-910
220956
Power by PC
9 W/LAN Card
LEMEL
LM-WLC030
1231Q048877
N/A
Page: 10 of 95
Version:1.0
1.4.
Configuration of tested System
Connection Diagram
A
B
C
D
E
F
G
H
I
Signal Cable Type
LAN Cable
TELECOM Cable
D-SUB Cable
Earphone & Microphone Cable
USB Cable
1394 Cable
USB Cable
USB Cable
TELECOM Cable
Signal cable Description
Non-Shielded, 7m
Non-Shielded, 7m
Shielded, 1.8m, with two ferrite cores bonded
Non-Shielded, 1.8m
Shielded, 1.8m
Shielded, 1.2m
Shielded, 1.8m
Shielded, 1.8m
Non-Shielded, 7m
Page: 11 of 95
Version:1.0
1.5.
EUT Exercise Software
1 Setup the EUT and simulators as shown on 1.4.
2 Turn on the power of all equipment.
3 Notebook reads data from disk.
4 Data will be transmitting and receiving through EUT.
5 The transmitting and received status will be shown on the monitor.
6 Repeat the above procedure (4 ) to (5).
Page: 12 of 95
Version:1.0
1.6.
Test Facility
Ambient conditions in the laboratory:
Items
Test Item
Temperature (°C)
Required (IEC 68-1) Actual
EN55022 CE
15-35
25
Humidity (%RH)
25-60
50
Barometric pressure (mbar)
860-1060
950-1000
15-35
25
Humidity (%RH)
25-60
50
860-1060
950-1000
15-35
23
Humidity (%RH)
25-75
51
860-1060
950-1000
15-35
25
Humidity (%RH)
30-60
50
860-1060
950-1000
15-35
23
Humidity (%RH)
10-75
51
860-1060
950-1000
15-35
22
Humidity (%RH)
25-75
50
860-1060
950-1000
Temperature (°C)
EN55022 RE
Temperature (°C)
IEC 61000-4-11
Temperature (°C)
IEC 61000-4-2
Temperature (°C)
IEC 61000-4-5
Temperature (°C)
Site Description:
IEC 61000-4-8
July 03, 2002 Accreditation on NVLAP
NVLAP Lab Code: 200533-0
June 11, 2001 Accreditation on DNV
Statement No. : 413-99-LAB11
April 18, 2001 Accreditation on Nemko
Certificate No.: ELA 165
May 03,2001 Accreditation on TUV Rheinland
Certificate No.: 10011438-1-2004
Site Name:
Quietek Corporation
Site Address:
No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen,
Lin-Kou Shiang, Taipei,
Taiwa, R.O.C.
TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789
E-Mail : service@quietek.com
Page: 13 of 95
0914
ILAC MRA
Version:1.0
2.
Conducted Emission
2.1.
Test Equipment List
The following test equipment are used during the conducted emission test:
Item Instrument
Manufacturer Type No./Serial No
Last Cal..
Remark
1
Test Receiver R & S
ESCS 30/838251/001
Jan.,2005
2
L.I.S.N.
R&S
ESH3-Z5/836679/0023
May,2004
EUT
3
L.I.S.N.
R&S
ENV 4200/833209/0023
May,2004
Peripherals
4
Pulse Limiter R & S
ESH3-Z2
May,2004
5
No.1 Shielded Room
N/A
Note: All equipment upon which need to be calibrated are with calibration period of 1 year.
2.2.
Test Setup
Page: 14 of 95
Version:1.0
2.3.
Limits
EN 55022:1998+A1: 2000 AC Mains Limits (dBuV)
Frequency
MHz
Class A
Class B
QP
AV
QP
AV
0.15 - 0.50
79
66
66-56
56-46
0.50-5.0
73
60
56
46
5.0 - 30
73
60
60
50
Remarks: In the above table, the tighter limit applies at the band edges
2.4.
Test Procedure
AC Mains:
The EUT and simulators are connected to the main power through a line impedance
stabilization network (L.I.S.N.).
This provides a 50 ohm /50uH coupling impedance for the
measuring equipment. The peripheral devices are also connected to the main power through a
LISN that provides a 50ohm /50uH coupling impedance with 50ohm termination. (Please
refers to the block diagram of the test setup and photographs.)
Both sides of AC line are checked for maximum conducted interference. In order to find the
maximum emission, the relative positions of equipment and all of the interface cables must be
changed according to EN 55022:1998+A1: 2000 on conducted measurement.
The bandwidth of the field strength meter (R & S Test Receiver ESCS 30) is set at 9kHz.
2.5.
Uncertainty
The measurement uncertainty is defined as ± 2.02 dB
2.6.
Test Specification
According to EN 55022:1998+A1:2000
Page: 15 of 95
Version:1.0
2.7.
Test Result
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/13
Test Condition Conducted Emission
Test Site
No.1 Shielded Room
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Line 1
Quasi-Peak
*
0.228
0.267
0.338
1.330
4.818
15.775
0.13
0.14
0.16
0.27
0.36
0.45
0.10
0.10
0.10
0.11
0.17
0.37
48.77
40.09
37.04
36.51
31.87
34.89
49.00
40.33
37.30
36.89
32.40
35.71
62.52
61.20
59.26
56.00
56.00
60.00
Average
*
0.228
0.267
0.338
1.330
4.818
15.775
0.13
0.14
0.16
0.27
0.36
0.45
0.10
0.10
0.10
0.11
0.17
0.37
39.10
29.50
25.20
30.20
20.70
29.70
39.33
29.74
25.46
30.58
21.23
30.52
52.52
51.21
49.25
46.00
46.00
50.00
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + LISN Factor + Cable loss.
Page: 16 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/13
Test Site
No.1 Shielded Room
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Line 2
Quasi-Peak
*
0.240
0.334
1.326
1.775
3.353
17.087
0.14
0.16
0.26
0.29
0.33
0.46
0.10
0.10
0.11
0.12
0.15
0.39
47.65
34.78
38.11
33.30
32.32
37.09
47.89
35.04
38.49
33.71
32.81
37.94
62.10
59.36
56.00
56.00
56.00
60.00
Average
0.240
0.334
0.14
0.16
0.10
0.10
36.30
24.00
36.54
24.26
52.10
49.35
0.26
0.29
0.33
0.46
0.11
0.12
0.15
0.39
32.40
24.90
24.80
32.00
32.78
25.31
25.29
32.85
46.00
46.00
46.00
50.00
*
1.326
1.775
3.353
17.087
Note:
Page: 17 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2005/01/07
Test Site
No.1 Shielded Room
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Line 1
Quasi-Peak
*
0.201
0.267
0.466
0.728
15.005
25.099
0.12
0.14
0.19
0.22
0.45
0.49
0.10
0.10
0.10
0.10
0.35
0.53
47.98
41.61
40.83
38.21
32.95
34.86
48.20
41.85
41.12
38.53
33.74
35.88
63.58
61.20
56.58
56.00
60.00
60.00
Average
0.201
0.267
0.12
0.14
0.10
0.10
44.70
39.00
44.92
39.24
53.57
51.21
0.19
0.22
0.45
0.49
0.10
0.10
0.35
0.53
40.20
30.40
29.70
29.50
40.49
30.72
30.49
30.52
46.58
46.00
50.00
50.00
*
0.466
0.728
15.005
25.099
Note:
Page: 18 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Mode 7:Intel Pentium M
2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON)
Date of Test
2005/01/07
Test Site
No.1 Shielded Room
Test Condition
Conducted Emission
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
Line 2
Quasi-Peak
0.197
0.267
0.12
0.14
0.10
0.10
47.60
42.22
47.82
42.46
63.74
61.20
0.466
0.865
1.197
25.095
0.19
0.23
0.26
0.49
0.10
0.10
0.11
0.53
41.09
39.06
37.69
35.25
41.38
39.39
38.05
36.27
56.58
56.00
56.00
60.00
Average
0.197
0.267
*
0.466
0.865
1.197
25.095
0.12
0.14
0.19
0.23
0.26
0.49
0.10
0.10
0.10
0.10
0.11
0.53
44.60
39.30
40.30
38.50
37.00
29.60
44.82
39.54
40.59
38.83
37.36
30.62
53.74
51.21
46.58
46.00
46.00
50.00
*
Note:
Page: 19 of 95
Version:1.0
2.8.
Test Photo
Test Mode ： Mode 2:Intel Pentium M
1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN)
Description： Front View of Conducted Test - Mode 2
Description： Back View of Conducted Test - Mode 2
Page: 20 of 95
Version:1.0
Description： Front View of Conducted Test - Mode 7
Description： Back View of Conducted Test - Mode 7
Page: 21 of 95
Version:1.0
3.
Impedance Stabilization Network
3.1.
Test Equipment List
The following test equipment are used during the conducted emission test:
Item Instrument
Manufacturer Type No./Serial No
1
Test Receiver
R&S
ESCS 30/838251/001
Jan.,2005
2
L.I.S.N.
R&S
ESH3-Z5/836679/0023
May,2004
EUT
3
L.I.S.N.
R&S
ENV 4200/833209/0023
May,2004
Peripherals
4
Pulse Limiter
R&S
ESH3-Z2
May,2004
5
ISN
SCHAFFNER T400/19099
Apr.,2004
6
Voltage Probe
SCHAFFNER CVP 2200A/18331
Apr.,2004
7
RF Current Probe
FCC
8
No.1 Shielded Room N/A
F-65/199
Last Cal..
Remark
Apr.,2004
3.2.
Test Setup
Page: 22 of 95
Version:1.0
3.3.
Limits
Telecommunication ports
EN 55022:1998+A1: 2000
Telecommunication ports Limits dB(uV)
Frequency
MHz
Limit for conducted emissions
from telecommunication ports of
equipment intended for use in
telecommunication centers only
Limit for conducted
emissions from
telecommunication ports
QP
AV
QP
AV
0.15 – 0.50
97-87
84-74
84-74
74-64
0.5 – 30
87
74
74
64
Remarks: In the above table, the tighter limit applies at the band edges.
3.4.
Test Procedure
Telecommunication Port:
The mains voltage shall be supplied to the EUT via the LISN when the measurement of
telecommunication port is performed. The common mode disturbances at the
telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both
alternative cables are tested related to the LCL requested. The measurement range is from
150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used
for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one.
.
3.5.
Uncertainty
3.6.
Test Specification
According to EN 55022:1998+A1: 2000
Page: 23 of 95
Version:1.0
3.7.
Test Result
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/19
Test Condition Impedance Stabilization Network (LAN)
Test Site
No.1 Shielded Room
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
100Mbps
Quasi-Peak
1.334
5.236
10.795
16.228
0.27
0.37
0.42
0.45
9.50
9.50
9.50
9.50
47.28
49.40
52.46
56.50
57.05
59.27
62.38
66.45
74.00
74.00
84.00
84.00
23.127
26.486
0.48
0.49
9.50
9.50
60.42
57.10
70.40
67.09
84.00
84.00
Average
1.334
5.236
10.795
16.228
*
23.127
26.486
0.27
0.37
0.42
0.45
0.48
0.49
9.50
9.50
9.50
9.50
9.50
9.50
47.00
47.00
50.20
55.40
57.70
54.40
56.77
56.87
60.12
65.35
67.68
64.39
64.00
64.00
74.00
74.00
74.00
74.00
*
Note:
Page: 24 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/19
Test Condition Impedance Stabilization Network (LAN)
Test Site
No.1 Shielded Room
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
10Mbps
Quasi-Peak
1.138
*
10.002
10.634
12.498
15.002
16.248
0.25
0.42
0.42
0.43
0.45
0.45
9.50
9.50
9.50
9.50
9.50
9.50
46.04
64.69
55.21
62.92
47.87
38.50
55.79
74.61
65.13
72.85
57.82
48.45
74.00
84.00
84.00
84.00
84.00
84.00
Average
1.138
0.25
9.50
46.00
55.75
74.00
0.42
0.42
0.43
0.45
0.45
9.50
9.50
9.50
9.50
9.50
62.69
55.01
62.90
47.80
38.00
72.61
64.93
72.83
57.75
47.95
74.00
84.00
84.00
84.00
74.00
*
10.002
10.634
12.498
15.002
16.248
Note:
Page: 25 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2005/01/11
Test Condition Impedance Stabilization Network (Telecom)
Test Site
No.1 Shielded Room
Test Range
0.15-30MHz
Frequency
Cable
LISN
Reading
Measurement
Limits
Loss
Factor
Level
Level
MHz
dB
dB
dBuV
dBuV
dBuV
==============================================================
100Mbps
Quasi-Peak
0.349
0.560
0.990
0.16
0.20
0.24
9.50
9.50
9.50
51.36
43.94
41.79
61.02
53.64
51.53
76.99
74.00
74.00
2.048
4.732
7.244
0.30
0.36
0.39
9.50
9.50
9.50
52.35
36.22
23.56
62.15
46.08
33.45
74.00
74.00
74.00
Average
0.349
0.560
0.990
*
2.048
4.732
7.244
0.16
0.20
0.24
0.30
0.36
0.39
9.50
9.50
9.50
9.50
9.50
9.50
48.20
41.90
41.10
52.00
28.00
20.60
57.86
51.60
50.84
61.80
37.86
30.49
66.99
64.00
64.00
64.00
64.00
64.00
*
Note:
Page: 26 of 95
Version:1.0
3.8.
Test Photo
Description： Front View of ISN Test
Description： Back View of ISN Test
Page: 27 of 95
Version:1.0
4.
Radiated Emission
4.1.
Test Equipment List
The following test equipment are used during the radiated emission test:
Test Site
Equipment
Manufacturer
OATS 3 Test Receiver R & S
Spectrum
Advantest
Model No./Serial No.
Last Cal.
ESCS 30 / 100122
Feb.,2004
R3162 / 120300652
Feb.,2004
Analyzer
Note:
4.2.
Bilog Antenna SCHAFFNER CBL6112B / 2697
May,2004
Pre-Amplifier QTK
Jul.,2004
QTK-AMP-01 / 0001
1. All equipments that need to be calibrate are with calibration period of 1 year.
2. Mark “X” test instruments are used to measure the final test results.
Test Setup
Page: 28 of 95
Version:1.0
4.3.
Limits
EN 55022: 1998+A1: 2000 Limits (dBuV/m)
Frequency
Class A
Class B
MHz
Distance
(m)
dBuV/m
Distance
(m)
dBuV/m
30 – 230
10
40
10
30
230 – 1000
10
47
10
37
Remarks: In the above table, the tighter limit applies at the band edges.
4.4.
Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground.
The turn table can rotate 360 degrees to determine the position of the maximum emission
level. The EUT was positioned such that the distance from antenna to the EUT was 10
meters.
The antenna can move up and down between 1 meter and 4 meters to find out the
maximum emission level.
Both horizontal and vertical polarization of the antenna are set on measurement. In order
to find the maximum emission, all of the interface cables must be manipulated according
to EN 55022: 1998+A1: 2000 on radiated measurement.
Radiated emissions were investigated over the frequency range from 30MHz to1GHz
using a receiver bandwidth of 120kHz. Radiated measurement was performed at an
antenna to EUT distance of 10 meters.
4.5.
Uncertainty
4.6.
Test Specification
According to EN 55022: 1998+A1: 2000
Page: 29 of 95
Version:1.0
4.7.
Test Result
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/10
Test Condition Radiated Emission
Freq.
Cable
Loss
MHz
dB
Probe
PreAMP
Factor
dB/m
dB
Test Site
OATS 3
Test Range
30-1000MHz
Reading Measurement Margin Limit
Level
Level
dBuV
dBuV/m
dB
dBuV/m
=============================================================
Horizontal:
150.008
166.580
200.136
360.025
401.350
*
600.057
840.068
1.49
1.57
1.74
2.57
2.78
10.32
9.09
8.40
13.68
14.76
0.00
0.00
0.00
0.00
0.00
6.35
10.49
9.96
7.75
6.38
18.16
21.15
20.10
24.01
23.93
11.84
8.85
9.90
12.99
13.07
30.00
30.00
30.00
37.00
37.00
3.80
5.04
17.65
19.33
0.00
0.00
8.71
4.64
30.16
29.01
6.84
7.99
37.00
37.00
Note:
1.
All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average
measurements as necessary.
2. “ * ”, means this data is the worst emission level.
3. Measurement Level = Reading Level + Probe Factor + Cable Loss.
Page: 30 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/10
Test Condition Radiated Emission
Freq.
MHz
Cable
Probe
Loss
Factor
dB
dB/m
PreAMP Reading
OATS 3
Test Range
30-1000MHz
Measurement Margin Limit
Level
dB
Test Site
dBuV
Level
dBuV/m
dB
dBuV/m
==========================================================
Vertical:
132.220
150.000
*
165.932
199.980
250.000
600.057
666.550
995.800
1.39
1.49
10.59
9.13
0.00
0.00
5.97
9.37
17.96
19.99
12.04
10.01
30.00
30.00
1.57
1.74
2.00
3.80
4.14
5.85
8.42
8.40
11.86
19.54
17.63
19.97
0.00
0.00
0.00
0.00
0.00
0.00
15.01
10.62
6.32
6.17
8.49
2.51
25.00
20.76
20.18
29.52
30.26
28.32
5.00
9.24
16.82
7.48
6.74
8.68
30.00
30.00
37.00
37.00
37.00
37.00
Note:
1.
Page: 31 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2005/01/05
Test Site
OATS 3
Test Condition
Radiated Emission
Test Range
30-1000MHz
Freq.
Cable
Loss
MHz
dB
Probe
PreAMP
Factor
dB/m
dB
Reading Measurement Margin Limit
Level
Level
dBuV
dBuV/m
dB
dBuV/m
=============================================================
Horizontal:
108.840
132.980
166.440
*
200.000
360.036
480.029
532.970
600.062
840.086
1.28
1.40
1.57
11.87
11.49
9.09
0.00
0.00
0.00
4.06
6.30
7.18
17.21
19.19
17.84
12.79
10.81
12.16
30.00
30.00
30.00
1.74
2.58
3.19
3.47
3.81
5.04
8.40
13.68
16.70
16.62
17.65
19.33
0.00
0.00
0.00
0.00
0.00
0.00
12.16
4.22
8.30
1.54
7.39
1.62
22.30
20.48
28.19
21.63
28.85
26.00
7.70
16.52
8.81
15.37
8.15
11.00
30.00
37.00
37.00
37.00
37.00
37.00
Note:
1.
Page: 32 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2005/01/05
Test Site
OATS 3
Test Condition
Radiated Emission
Test Range
30-1000MHz
Freq.
MHz
Cable
Probe
Loss
Factor
dB
dB/m
PreAMP Reading
Measurement Margin Limit
Level
dB
dBuV
Level
dBuV/m
dB
dBuV/m
==========================================================
Vertical:
108.620
132.700
152.040
180.015
200.000
300.031
499.100
531.630
*
666.485
798.620
1.28
1.40
1.51
1.64
1.74
2.26
3.30
3.45
10.65
10.55
9.18
8.41
8.40
12.06
16.34
17.17
0.00
0.00
0.00
0.00
0.00
0.00
0.00
0.00
9.62
11.90
7.20
8.71
10.68
3.60
1.12
5.34
21.55
23.85
17.89
18.76
20.82
17.92
20.75
25.96
8.45
6.15
12.11
11.24
9.18
19.08
16.25
11.04
30.00
30.00
30.00
30.00
30.00
37.00
37.00
37.00
4.14
4.83
17.63
19.34
0.00
0.00
9.40
3.76
31.17
27.93
5.83
9.07
37.00
37.00
Note:
1.
Page: 33 of 95
Version:1.0
4.8.
Test Photo
Description： Front View of Radiated Test- Mode 2
Description： Back View of Radiated Test- Mode 2
Page: 34 of 95
Version:1.0
Description： Front View of Radiated Test- Mode 7
Description： Back View of Radiated Test- Mode 7
Page: 35 of 95
Version:1.0
5.
Power Harmonics
5.1.
Test Equipment List
Item Instrument
1
Manufacturer
Type No/Serial No.
Last Calibration
Power Harmonics SCHAFFNER
Profline 2105-400
Feb.,2004
Tester
S/N: HK54148
2
Analyzer
SCHAFFNER
3
No.3 Shielded Room
CCN 1000-1/X71887 Feb.,2004
N/A
5.2.
Test Setup
Page: 36 of 95
Version:1.0
5.3.
Limits
Limits of Class A Harmonics Currents
Harmonics
Maximum Permissible
Order
harmonic current
A
n
Harmonics Order
n
Odd harmonics
Maximum Permissible
harmonic current
A
Even harmonics
3
2.30
2
1.08
5
1.14
4
0.43
7
0.77
6
0.30
9
0.40
8 ≤ n ≤ 40
0.23 * 8/n
11
0.33
13
0.21
15 ≤ n ≤ 39
0.15 * 15/n
Limits of Class B Harmonics Currents
For Class B equipment, the harmonic of the input current shall not exceed the maximum
permissible values given in table which is the limit of Class A multiplied by a factor of 1.5.
Limits of Class C Harmonics Currents
Harmonics Order
n
Maximum Permissible harmonic current
Expressed as a percentage of the input
current at the fundamental frequency
％
2
2
3
30．λ
5
10
7
7
9
5
11 ≤ n ≤ 39
3
＊
(odd harmonics only)
＊λ is the circuit power factor
Page: 37 of 95
Version:1.0
Limits of Class D Harmonics Currents
Harmonics Order
n
Maximum Permissible
harmonic current per watt
mA/W
Maximum Permissible
harmonic current
A
3
3.4
2.30
5
1.9
1.14
7
1.0
0.77
9
0.5
0.40
11
0.35
0.33
11 ≤ n ≤ 39
3.85/n
See limit of Class A
(odd harmonics only)
5.4.
Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
5.5.
Uncertainty
The measurement uncertainty is defined as ± 3.23 %
5.6.
Test Specification
According to EN 61000-3-2:2000
Page: 38 of 95
Version:1.0
5.7.
Test Result
Date of Test
2005/01/07
Test Site
Test Mode
Product
1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI
SHIN)
Test Condition Power Harmonics
Test Result: Pass
No.3 Shielded
Room
MEGA BOOK
Test Range
Source qualification: Normal
3
300
2
200
1
100
0
0
-1
-100
-2
-200
-3
-300
European Limits
Harmonics and Class D limit line
Current RMS(Amps)
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
32
36
40
Worst harmonic was #0 with 0.00% of the limit.
Page: 39 of 95
Version:1.0
Test Result: Pass
THC(A): 0.00
I-THD(pk%): 0.00
POHC(A): 0.000
Highest parameter values during test:
V_RMS (Volts): 229.85
Frequency(Hz): 50.00
I_Peak (Amps): 2.915
I_RMS (Amps): 0.639
I_Fund (Amps): 0.272
Crest Factor:
4.564
Power (Watts): 62
Power Factor:
0.422
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.004
0.259
0.004
0.247
0.004
0.230
0.004
0.209
0.005
0.184
0.005
0.158
0.004
0.132
0.004
0.106
0.004
0.081
0.003
0.060
0.003
0.042
0.002
0.030
0.002
0.022
0.002
0.020
0.001
0.019
0.001
0.019
0.001
0.017
0.001
0.014
0.001
0.011
0.001
POHC Limit(A): 0.000
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.211
0.0
0.261
0.316
0.00
Pass
0.118
0.0
0.249
0.177
0.00
Pass
0.062
0.0
0.232
0.093
0.00
Pass
0.031
0.0
0.211
0.046
0.00
Pass
0.022
0.0
0.187
0.033
0.00
Pass
0.019
0.0
0.160
0.028
0.00
Pass
0.016
0.0
0.133
0.024
0.00
Pass
0.014
0.0
0.107
0.021
0.00
Pass
0.013
0.0
0.083
0.019
0.00
Pass
0.011
0.0
0.061
0.017
0.00
Pass
0.010
0.0
0.043
0.016
0.00
Pass
0.010
0.0
0.030
0.014
0.00
Pass
0.009
0.0
0.023
0.013
0.00
Pass
0.008
0.0
0.020
0.012
0.00
Pass
0.008
0.0
0.020
0.012
0.00
Pass
0.007
0.0
0.019
0.011
0.00
Pass
0.007
0.0
0.017
0.010
0.00
Pass
0.006
0.0
0.015
0.010
0.00
Pass
0.006
0.0
0.011
0.009
0.00
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same
window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W.
Others the result should be pass.
Page: 40 of 95
Version:1.0
Date of Test 2005/01/07
Test Site
No.3 Shielded Room
Test Mode
2.13GHz(533),LCD+CRT(1208*800/60Hz),
Adapter(LITEON)
Product
MEGA BOOK
Test
Condition
Power Harmonics
Test Range
Test Result: Pass
6
300
4
200
2
100
0
0
-2
-100
-4
-200
-6
-300
European Limits
Harmonics and Class D limit line
Current RMS(Amps)
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
32
36
40
Worst harmonic was #0 with 0.00% of the limit.
Page: 41 of 95
Version:1.0
Test Result: Pass
THC(A): 0.00
I-THD(pk%): 0.00
POHC(A): 0.000
Highest parameter values during test:
V_RMS (Volts): 229.86
Frequency(Hz): 50.00
I_Peak (Amps): 3.420
I_RMS (Amps): 0.688
I_Fund (Amps): 0.268
Crest Factor:
5.143
Power (Watts): 61
Power Factor:
0.388
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.005
0.257
0.005
0.248
0.006
0.237
0.006
0.222
0.006
0.204
0.007
0.184
0.007
0.163
0.007
0.141
0.006
0.119
0.006
0.098
0.005
0.078
0.004
0.059
0.004
0.043
0.003
0.029
0.002
0.018
0.001
0.010
0.001
0.008
0.001
0.009
0.001
0.011
0.001
POHC Limit(A): 0.000
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.208
0.0
0.259
0.312
0.00
Pass
0.116
0.0
0.251
0.174
0.00
Pass
0.061
0.0
0.239
0.092
0.00
Pass
0.031
0.0
0.224
0.046
0.00
Pass
0.021
0.0
0.206
0.032
0.00
Pass
0.018
0.0
0.186
0.027
0.00
Pass
0.016
0.0
0.165
0.024
0.00
Pass
0.014
0.0
0.142
0.021
0.00
Pass
0.012
0.0
0.120
0.019
0.00
Pass
0.011
0.0
0.099
0.017
0.00
Pass
0.010
0.0
0.078
0.015
0.00
Pass
0.009
0.0
0.060
0.014
0.00
Pass
0.009
0.0
0.043
0.013
0.00
Pass
0.008
0.0
0.029
0.012
0.00
Pass
0.008
0.0
0.018
0.011
0.00
Pass
0.007
0.0
0.010
0.011
0.00
Pass
0.007
0.0
0.008
0.010
0.00
Pass
0.006
0.0
0.009
0.010
0.00
Pass
0.006
0.0
0.011
0.009
0.00
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same
window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W.
Others the result should be pass.
Page: 42 of 95
Version:1.0
5.8.
Test Photo
Description： Power Harmonics Test Setup -Mode 2
Description： Power Harmonics Test Setup -Mode 7
Page: 43 of 95
Version:1.0
6.
Voltage Fluctuation and Flicker
6.1.
Test Equipment List
Item Instrument
Manufacturer
Type No/Serial No.
Last Calibration
1
EMCPRO PLUS
KeyTek
EMC Immunity
Feb.,2004
2
No.6 Shielded Room
6.2.
Test Setup
Page: 44 of 95
Version:1.0
6.3.
Limits
Voltage Fluctuations and Flicker:
The following limits apply:
－ the value of Pst shall not be greater than 1.0;
－ the value of P1t shall not be greater than 0.65;
－ the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500 ms;
－ the relative steady-state voltage change, dc, shall not exceed 3.3 ％;
－ the maximum relative voltage change, dmax, shall not exceed;
a)
4 ％ without additional conditions;
b)
6 ％ for equipment which is:
－ switched manually, or
－ switched automatically more frequently than twice per day, and also has either a
delayed restart (the delay being not less than a few tens of seconds), or manual restart,
after a power supply interruption.
NOTE The cycling frequency will be further limited by the Pst and P1t limit. For example: a dmax
of 6％producing a rectangular voltage change characteristic twice per hour will give a
P1t of about 0.65.
c) 7 ％ for equipment which is:
－ attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment
such as mixers, garden equipment such as lawn mowers, portable tools such as electric
drills), or
－ switched on automatically, or is intended to be switched on manually, no more than twice
per day, and also has either a delayed restart (the delay being not less than a few tens of
seconds) or manual restart, after a power supply interruption.
Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.
6.4.
Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
6.5.
Uncertainty
6.6.
Test Specification
According to EN 61000-3-3:1995+A1:2001
Page: 45 of 95
Version:1.0
6.7.
Test Result
Date of Test
2005/01/07
Test Site
No.3 Shielded Room
Test Mode
1.6GHz(400),LCD+CRT(1208*800/60Hz),
Adapter(LI SHIN)
Product
MEGA BOOK
Test Condition Flicker
Test Result: Pass
Test Range
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
0.00
12:07:40
Time is too short for Plt plot
Parameter values recorded during the test:
Vrms at the end of test (Volt):
229.73
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Test limit (%):
3.30
Pass
500.0
Pass
Test limit (%):
3.30
Pass
Test limit (%):
4.00
Pass
Test limit (mS):
Highest Pst (10 min. period):
0.001
Test limit:
1.000
Pass
Highest Plt (2 hr. period):
0.001
Test limit:
0.650
Pass
Page: 46 of 95
Version:1.0
Date of Test 2005/01/07
Test Site
No.3 Shielded Room
Test Mode
2.13GHz(533),LCD+CRT(1208*800/60Hz),
Adapter(LITEON)
Product
MEGA BOOK
Test
Condition
Flicker
Test Range
Test Result: Pass
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
0.00
3:02:50
Time is too short for Plt plot
Parameter values recorded during the test:
Vrms at the end of test (Volt):
229.71
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Test limit (%):
3.30
Pass
500.0
Pass
Test limit (%):
3.30
Pass
Test limit (%):
4.00
Pass
Test limit (mS):
Highest Pst (10 min. period):
0.001
Test limit:
1.000
Pass
Highest Plt (2 hr. period):
0.001
Test limit:
0.650
Pass
Page: 47 of 95
Version:1.0
6.8.
Test Photo
Description： Flicker Test Setup -Mode 2
Description： Flicker Test Setup -Mode 7
Page: 48 of 95
Version:1.0
7.
Electrostatic Discharge (ESD)
7.1.
Test Equipment List
Item Instrument
Manufacturer Type No/Serial No.
Last Calibration
1
ESD Simulator System SCHAFFNER NSG 438,S/N:167
Mar.,2004
2
Horizontal Coupling
Plane(HCP)
QuieTek
HCP AL50
N/A
3
Vertical Coupling
Plane(VCP)
QuieTek
VCP AL50
N/A
4
No.3 Shielded Room
N/A
7.2.
Test Setup
Page: 49 of 95
Version:1.0
7.3.
Limits
Item Environmental
Phenomena
Units
Test Specification
Performance
Criteria
Enclosure Port
Electrostatic Discharge Kv (Charge Voltage) ±8 Air Discharge
B
±4 Contact Discharge
Remark:
The Contact discharges were applied – at least total 200 discharges at a minimum of four test points.
7.4.
Test Procedure
Direct application of discharges to the EUT:
Contact discharge was applied only to conductive surfaces of the EUT.
Air discharges were applied only to non-conductive surfaces of the EUT.
During the test, it was performed with single discharges. For the single discharge
time between successive single discharges will be keep longer 1 second. It was at
least ten single discharges with positive and negative at the same selected point.
The selected point, which was performed with electrostatic discharge, was marked
on the red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP):
The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned
at a distance 0.1m from, the EUT, with the Discharge Electrode touching the
coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
Horizontal Coupling Plane (HCP):
The coupling plane is placed under to the EUT. The generator shall be positioned
vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching
the coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
7.5.
Uncertainty
7.6.
Test Specification
According to IEC 61000-4-2:1995 +A1:1998+A2:2000
Page: 50 of 95
Version:1.0
7.7.
Test Result
Product
MEGA BOOK
Test Mode
Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI
SHIN)
Date of Test
2004/11/22
Test Site
Test Condition
Electrostatic Discharge
Test Range
Item
Amount of
Discharge
Voltage
No.3 Shielded Room
Required
Complied To
Criteria
Criteria (A,B,C)
Results
10
+8kV
B
B
Pass
10
-8kV
B
A
Pass
25
+4kV
B
A
Pass
25
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(HCP)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Front)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Left)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Back)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Right)
50
-4kV
B
A
Pass
Air Discharge
Contact Discharge
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest
level is shown on the report.
NR: No Requirement
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV.
No false alarms or other malfunctions were observed during or after the test.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 51 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2005/01/06
Test Site
Test Condition
Electrostatic Discharge
Test Range
Item
Amount of
Discharge
Voltage
No.3 Shielded Room
Required
Complied To
Criteria
Criteria (A,B,C)
Results
10
+8kV
B
B
Pass
10
-8kV
B
A
Pass
25
+4kV
B
A
Pass
25
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(HCP)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Front)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Left)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Back)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Right)
50
-4kV
B
A
Pass
Air Discharge
Contact Discharge
Note:
NR: No Requirement
kV.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 52 of 95
Version:1.0
7.8.
Test Photo
Description： ESD Test Setup -Mode 2
Description： ESD Test Setup -Mode 7
Page: 53 of 95
Version:1.0
8.
Radiated Susceptibility (RS)
8.1.
Test Equipment List
The following test equipment are used during the test:
Item Equipment
Manufacturer
Model No. / Serial No. Last Cal.
1
Signal Generator
R&S
SYM02 / 825454/029
Jan.,2005
2
Power Amplifier
A&R
100W10000M7 /
A285000010
N/A
3
RF Power Amplifier
OPHIRRF
5022F / 1075
N/A
4
Bilog Antenna
Chase
CBL6112B / 2452
Sep.,2004
5
Power Meter
R&S
NRVD / 100219
Sep.,2004
6
Directional Coupler
A&R
DC6180 / 22735
Feb.,2004
7
No.2 EMC Fully Chamber
Jul.,2004
Note: All equipment upon which need to calibrated are with calibration period of 1 year.
8.2.
Test Setup
Page: 54 of 95
Version:1.0
8.3.
Limits
Item Environmental
Phenomena
Units
Test
Specification
Enclosure Port
Radio-Frequency
MHz
Electromagnetic Field V/m(Un-modulated,
Amplitude Modulated rms)
% AM (1kHz)
8.4.
80-1000
3
80
Performance
Criteria
A
Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are
placed with one coincident with the calibration plane such that the distance from antenna
to the EUT was 3 meters.
Both horizontal and vertical polarization of the antenna and six sides of the EUT are set
on measurement.
In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows:
Condition of Test
Remarks
1. Field Strength
3 V/M Level 2
2. Radiated Signal
AM 80% Modulated with 1kHz
3. Scanning Frequency
80MHz - 1000MHz
4 Dwell Time
3 Seconds
5. Frequency step size
∆ f :
6. The rate of Swept of Frequency
8.5.
1%
-3
1.5 x 10 decades/s
Uncertainty
8.6.
Test Specification
According to IEC 61000-4-3:1995+A1:1998+A2:2000
Page: 55 of 95
Version:1.0
8.7.
Test Result
Product
MEGA BOOK
Test Mode
Date of Test
2005/01/06
Test Site
Chamber2
Test Condition
Radiated Susceptibility
Test Range
80-1000MHz
Field
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
REAR
H
3
A
A
PASS
80-1000
REAR
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
TOP
H
3
A
A
PASS
80-1000
TOP
V
3
A
A
PASS
80-1000
BOTTOM
H
3
A
A
PASS
80-1000
BOTTOM
V
3
A
A
PASS
Strength
(V/m)
Criteria
Criteria
Results
(A,B,C)
Note:
There was no observable degradation in performance.
at frequency
MHz.
V/m
Page: 56 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/14
Test Condition Radiated Susceptibility
Field
Test Site
Chamber2
Test Range
80-1000MHz
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
REAR
H
3
A
A
PASS
80-1000
REAR
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
TOP
H
3
A
A
PASS
80-1000
TOP
V
3
A
A
PASS
80-1000
BOTTOM
H
3
A
A
PASS
80-1000
BOTTOM
V
3
A
A
PASS
Strength
(V/m)
Criteria
Criteria
Results
(A,B,C)
Note:
There was no observable degradation in performance.
MHz.
at frequency
V/m
Page: 57 of 95
Version:1.0
8.8.
Test Photo
Description： Radiated Susceptibility Test Setup -Mode 2
Description： Radiated Susceptibility Test Setup -Mode 7
Page: 58 of 95
Version:1.0
9.
Electrical Fast Transient/Burst (EFT/B)
9.1.
Test Equipment List
Item Instrument
1
Fast
Manufacturer
Type No/Serial No.
Last Calibration
SCHAFFNER
NSG 2050
Jun.,2004
Transient/Burst
S/N: 200124-031AR
Generator
2
N/A
No.3 Shielded Room
9.2.
Test Setup
Page: 59 of 95
Version:1.0
9.3.
Limits
Item Environmental
Phenomena
Units
Test Specification Performance
Criteria
Signal Ports and Telecommunication Ports
Fast Transients
kV (Peak)
Common Mode
Tr/Ts ns
Rep. Frequency
kHz
Input DC Power Ports
Fast Transients
Common Mode
Input AC Power Ports
Fast Transients
Common Mode
9.4.
±0.5
5/50
5
B
kV (Peak)
Tr/Ts ns
Rep. Frequency
kHz
±0.5
5/50
5
B
kV (Peak)
Tr/Ts ns
Rep. Frequency
kHz
±1
5/50
5
B
Test Procedure
The EUT and load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides.
For Signal Ports and Telecommunication Ports:
The EFT interference signal is through a coupling clamp device couples to the signal
and control lines of the EUT with burst noise for 1min.
For Input DC and AC Power Ports:
The EUT is connected to the power mains through a coupling device that directly
couples the EFT interference signal.
Each of the Line and Neutral conductors is impressed with burst noise for 1 min.
The length of power cord between the coupling device and the EUT shall be 1m.
9.5.
Test Specification
According to IEC 61000-4-4:1995+A1: 2000+A2: 2001
Page: 60 of 95
Version:1.0
9.6.
Test Result
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/14
Test Site
Test Condition
Electrical Fast Transient/Burst
Test Range
Inject
Line
Voltage
Inject
Time
Polarity
kV
(Second)
No.6 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L
±
1kV
60
CDN
B
A
PASS
N
±
1kV
60
CDN
B
A
PASS
PE
±
1kV
60
CDN
B
A
PASS
L-N
±
1kV
60
CDN
B
A
PASS
L-PE
±
1kV
60
CDN
B
A
PASS
N-PE
±
1kV
60
CDN
B
A
PASS
L+N+PE
±
1kV
60
CDN
B
A
PASS
LAN
±
0.5kV
90
Clamp
B
A
PASS
Telecom
±
0.5kV
90
Clamp
B
B
PASS
Note:
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Line
.
Page: 61 of 95
kV of
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2005/01/06
Test Site
Test Condition
Electrical Fast Transient/Burst
Test Range
Inject
Line
Voltage
Inject
Time
Polarity
kV
(Second)
No.6 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L
±
1kV
60
CDN
B
B
PASS
N
±
1kV
60
CDN
B
B
PASS
PE
±
1kV
60
CDN
B
B
PASS
L-N
±
1kV
60
CDN
B
B
PASS
L-PE
±
1kV
60
CDN
B
B
PASS
N-PE
±
1kV
60
CDN
B
B
PASS
L+N+PE
±
1kV
60
CDN
B
B
PASS
LAN
±
0.5kV
90
Clamp
B
A
PASS
Telecom
±
0.5kV
90
Clamp
B
A
PASS
Note:
Line
.
Page: 62 of 95
kV of
Version:1.0
9.7.
Test Photo
Description： EFT/B Test Setup -Mode 2
Description： EFT/B Test Setup -Mode 2-Clamp
Page: 63 of 95
Version:1.0
Description： EFT/B Test Setup -Mode 7
Description： EFT/B Test Setup -Mode 7-Clamp
Page: 64 of 95
Version:1.0
10.
Surge
10.1.
Test Equipment List
Item Instrument
Manufacturer
1
EMCPRO PLUS SchaHner
2
No.6 Shielded Room
Type No/Serial No.
Last Calibration
EMC Immunity
Nov.,2004
10.2.
Test Setup
Page: 65 of 95
Version:1.0
10.3.
Limits
Item Environmental
Phenomena
Units
Criteria
Signal Ports and Telecommunication Ports (See 1) and 2))
Surges
Tr/Ts uS
1.2/50 (8/20)
Line to Ground
kV
±1
B
Surges
Line to Ground
Tr/Ts uS
kV
1.2/50 (8/20)
± 0.5
B
AC Input and AC Output Power Ports
Surges
Tr/Ts uS
Line to Line
kV
Line to Ground
kV
1.2/50 (8/20)
±1
±2
B
Notes:
1) Applicable only to ports which according to the manufacturer’s may directly to outdoor
cables.
2) Where normal functioning cannot be achieved because of the impact of the CDN on the
EUT,no test shall be required.
10.4.
Test Procedure
The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m
on all sides. The length of power cord between the coupling device and the EUT shall be 2m
or less.
For Input and Output AC Power or DC Input and DC Output Power Ports:
The EUT is connected to the power mains through a coupling device that directly couples
the Surge interference signal.
0
0
0
The surge noise shall be applied synchronized to the voltage phase at 0 , 90 , 180 , 270
0
and the peak value of the a.c. voltage wave. (Positive and negative)
Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with
interval of 1 min.
10.5.
Uncertainty
10.6.
Test Specification
According to IEC 61000-4-5:1995+A1:2000
Page: 66 of 95
Version:1.0
10.7.
Test Result
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/14
Test Site
Test Condition
Surge
Test Range
Inject
Line
Voltage
Time
Interval
Polarity Angle
kV
(Second)
No.6 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Note:
.
Line
kV of
Page: 67 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2005/01/07
Test Site
Test Condition
Surge
Test Range
Inject
Line
Voltage
Time
Interval
Polarity Angle
kV
(Second)
No.6 Shielded Room
Inject
Required
Complied to
Method
Criteria
Criteria
Result
L-N
±
0
0.5kV
60
Direct
B
A
PASS
L-N
±
90
0.5kV
60
Direct
B
A
PASS
L-N
±
180
0.5kV
60
Direct
B
A
PASS
L-N
±
270
0.5kV
60
Direct
B
A
PASS
L-PE
±
0
1kV
60
Direct
B
A
PASS
L-PE
±
90
1kV
60
Direct
B
A
PASS
L-PE
±
180
1kV
60
Direct
B
A
PASS
L-PE
±
270
1kV
60
Direct
B
A
PASS
N-PE
±
0
1kV
60
Direct
B
A
PASS
N-PE
±
90
1kV
60
Direct
B
A
PASS
N-PE
±
180
1kV
60
Direct
B
A
PASS
N-PE
±
270
1kV
60
Direct
B
A
PASS
Note:
.
Line
kV of
Page: 68 of 95
Version:1.0
10.8.
Test Photo
Description： SURGE Test Setup-Mode 2
Description： SURGE Test Setup-Mode 7
Page: 69 of 95
Version:1.0
11.
Conducted Susceptibility (CS)
11.1.
Test Equipment List
The following test equipment are used during the test:
Item Equipment
Manufacturer
Model No. / Serial No.
Last Cal.
1
Signal Generator
R&S
SYM01 / 10065
Jan.,2005
2
Power Amplifier
A&R
150A220 / 23076
N/A
3
Power Meter
HP
EPM-4418A / GB37482040 Feb.,2004
4
Power Sensor
Agilent
8482A / MY41091031
Aug.,2004
5
Directional Coupler
A&R
DC2600 / 23325
Feb.,2004
6
CDN
Lüthi
CDN L-801 M1 / 2047
Jun.,2004
7
CDN
Lüthi
CDN L-801 M2/M3 / 2043 Jun.,2004
8
FIXED PAD
TRILITHIC
HFP-525-3/6-NF/NF / N/A N/A
9
EM Clamp
Lüthi
EM101 / 3552C
10
No.2 EMC Fully Chamber
Apr.,2004
N/A
Note: All equipment upon which need to calibrated are with calibration period of 1 year.
11.2.
Limits
Page: 70 of 95
Version:1.0
11.3.
Limits
Item Environmental
Phenomena
Units
Criteria
Signal Ports and Telecommunication Ports
MHz
Radio-Frequency
V (rms,
Continuous Conducted
Un-modulated)
% AM (1kHz)
MHz
Radio-Frequency
V (rms,
Continuous Conducted
Un-modulated)
% AM (1kHz)
MHz
Radio-Frequency
V (rms,
Continuous Conducted Un-modulated)
% AM (1kHz)
Page: 71 of 95
0.15-80
3
80
A
0.15-80
3
80
A
0.15-80
3
80
A
Version:1.0
11.4.
Test Procedure
The EUT are placed on a table that is 0.8 meter height, and a ground reference plane on
the table, EUT are placed upon table and use a 10cm insulation between the EUT and
ground reference plane.
For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) or
EM-clamp device couples to the signal and Telecommunication lines of the EUT.
For Input DC and AC Power Ports
The EUT is connected to the power mains through a coupling and decoupling networks
for power supply lines. And directly couples the disturbances signal into EUT.
Used CDN-M2 for two wires or CDN-M3 for three wires.
All the scanning conditions are as follows:
Condition of Test
Remarks
1. Field Strength
130dBuV(3V) Level 2
2. Radiated Signal
AM 80% Modulated with 1kHz
3. Scanning Frequency
0.15MHz – 80MHz
4 Dwell Time
3 Seconds
5. Frequency step size
∆ f :
6. The rate of Swept of Frequency
1%
-3
1.5 x 10 decades/s
.
11.5.
Uncertainty
11.6.
Test Specification
Page: 72 of 95
Version:1.0
11.7.
Test Result
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/22
Test Site
Chamber2
Test Condition
Conducted Susceptibility
Test Range
0.15-80MHz
Frequency
Voltage
Inject
Tested Port of
Required
Performance
Result
Range
Applied
Method
EUT
Criteria
Criteria Complied
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
Clamp
LAN
A
A
PASS
0.15~80
130 (3V)
Clamp
Telecom
A
A
PASS
To
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only
highest level is shown on the report.
dBuV(V) at frequency
MHz.
No false alarms or other malfunctions were observed during or after the test. The acceptance criteria
were met, and the EUT passed the test.
Page: 73 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2005/01/06
Test Site
Chamber2
Test Condition
Conducted Susceptibility
Test Range
0.15-80MHz
Frequency
Voltage
Inject
Tested Port of
Required
Performance
Result
Range
Applied
Method
EUT
Criteria
Criteria Complied
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
Clamp
LAN
A
A
PASS
0.15~80
130 (3V)
Clamp
Telecom
A
A
PASS
To
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only
highest level is shown on the report.
dBuV(V) at frequency
MHz.
No false alarms or other malfunctions were observed during or after the test. The acceptance criteria
were met, and the EUT passed the test.
Page: 74 of 95
Version:1.0
11.8.
Test Photo
Description： Conducted Susceptibility Test Setup -Mode 2
Description： Conducted Susceptibility Test Setup -Mode 2-Clamp
Page: 75 of 95
Version:1.0
Description： Conducted Susceptibility Test Setup -Mode 7
Description： Conducted Susceptibility Test Setup -Mode 7-Clamp
Page: 76 of 95
Version:1.0
12.
Power Frequency Magnetic Field
12.1.
Test Equipment List
Item Instrument
Manufacturer Type No/Serial No.
Last Calibration
1
SCHAFFNER INA 2141
Jun.,2004
Power Line Maganetics
S/N: 6002
2
Gauss Meter
F.W.BELL
4090
3
Magnetic Field Coil
SCHAFFNER INA702
Jun.,2004
Jun.,2004
S/N: 199749-020 IN
4
No.3 Shielded Room
N/A
12.2.
Test Setup
Page: 77 of 95
Version:1.0
12.3.
Limits
Item Environmental
Phenomena
Units
Criteria
Hz
A/m (r.m.s.)
50
1
Enclosure Port
Power-Frequency
Magnetic Field
12.4.
A
Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured at least 1m*1m min. The test magnetic field shall be placed at central of
the induction coil.
The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.
And the induction coil shall be rotated by 90° in order to expose the EUT to the test field
with different orientation (X, Y, Z Orientations).
12.5.
Uncertainty
12.6.
Test Specification
Page: 78 of 95
Version:1.0
12.7.
Test Result
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/14
Test Site
Test Condition
Test Range
Polarization
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Line
kV of
.
No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were
met, and the EUT passed the test.
Page: 79 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2005/01/06
Test Site
Test Condition
Test Range
Polarization
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Line
kV of
.
Page: 80 of 95
Version:1.0
12.8.
Test Photo
Description： Power Frequency Magnetic Field Test Setup -Mode 2
Description： Power Frequency Magnetic Field Test Setup -Mode 7
Page: 81 of 95
Version:1.0
13.
Voltage Dips and Interruption Measurement
13.1.
Test Equipment List
Item Instrument
Manufacturer
Type No/Serial No.
Last Calibration
1
EMCPRO PLUS
KeyTek
EMC Immunity
Nov.,2004
2
No.6 Shielded Room
13.2.
Test Setup
Page: 82 of 95
Version:1.0
13.3.
Limits
Item Environmental
Phenomena
Units
Criteria
>95
0.5
30
25
> 95
250
% Reduction
Period
% Reduction
Periods
% Reduction
Periods
Voltage Dips
Voltage Interruptions
13.4.
B
C
C
Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at
least 0.1m on all sides. The power cord shall be used the shortest power cord as
specified by the manufacturer.
For Voltage Dips/ Interruptions test:
The selection of test voltage is based on the rated power range. If the operation
range is large than 20% of lower power range, both end of specified voltage shall be
tested. Otherwise, the typical voltage specification is selected as test voltage.
The EUT is connected to the power mains through a coupling device that directly
couples to the Voltage Dips and Interruption Generator.
The EUT shall be tested for 30% voltage dip of supplied voltage and duration 10ms,
for 60% voltage dip of supplied voltage and duration 100ms with a sequence of three
voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied
voltage and duration 5000ms with a sequence of three voltage interruptions with
intervals of 10 seconds.
O
O
O
O
O
O
O
Voltage phase shifting are shall occur at 0 , 45 , 90 , 135 , 180 , 225 , 270 , 315
O
of the voltage.
13.5.
Uncertainty
13.6.
Test Specification
Page: 83 of 95
Version:1.0
13.7.
Test Result
Product
MEGA BOOK
Test Mode
Date of Test
2004/11/14
Test Condition
Voltage Dips and Interruption Measurement Test Range
Voltage Dips and
Interruption
Reduction(%)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test Site
Test
Duration
(Periods)
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
25
25
25
25
25
25
25
25
250
250
250
250
250
250
250
250
Required
Performance
Criteria
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
Performance
Criteria
Complied To
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
No.6 Shielded Room
Test Result
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
The nominal voltage of EUT is 230V.
Line
.
kV of
Page: 84 of 95
Version:1.0
Product
MEGA BOOK
Test Mode
Date of Test
2005/01/07
Test Condition
Voltage Dips and Interruption Measurement Test Range
Voltage Dips and
Interruption
Reduction(%)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test Site
Test
Duration
(Periods)
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
25
25
25
25
25
25
25
25
250
250
250
250
250
250
250
250
Required
Performance
Criteria
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
Performance
Criteria
Complied To
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
No.6 Shielded Room
Test Result
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
The nominal voltage of EUT is 230V.
Line
.
kV of
Page: 85 of 95
Version:1.0
13.8.
Test Photo
Description： Voltage Dips Test Setup -Mode 2
Description： Voltage Dips Test Setup -Mode 7
Page: 86 of 95
Version:1.0
Attachement
EUT Photograph
(1) EUT Photo
(2) EUT Photo
Page: 87 of 95
Version:1.0
(3) EUT Photo
(4) EUT Photo
Page: 88 of 95
Version:1.0
(5) EUT Photo
(6) EUT Photo
Page: 89 of 95
Version:1.0
(7) EUT Photo
(8) EUT Photo
Page: 90 of 95
Version:1.0
(9) EUT Photo
(10) EUT Photo
Page: 91 of 95
Version:1.0
(11) EUT Photo
(12) EUT Photo
Page: 92 of 95
Version:1.0
(13) EUT Photo
(14) EUT Photo
Page: 93 of 95
Version:1.0
(15) EUT Photo
(16) EUT Photo
Page: 94 of 95
Version:1.0
Reference
:
Laboratory of License
Page: 95 of 95
Version:1.0

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